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M. Arnaud Delcorte

SST/EPL - Ecole Polytechnique de Louvain
SST/IMCN - Institute of Condensed Matter and Nanosciences (IMCN)
BSMA - Bio and soft matter (BSMA)

Adresse courrier
  BSMA - Croix du Sud 1 bte L7.04.01 à 1348 Louvain-la-Neuve
Email
 
BSMA
  Téléphone : 010 47 35 96
  Télécopie : 010 47 34 52
  Bâtiment : Boltzmann; Etage 01; Local A 183.13; Site Louvain-la-Neuve




Diplômes

année

intitulé

établissement

1990Candidat ingénieur civilUniversité catholique de Louvain
1993Ingénieur civil - orientation sciences des matériauxUniversité catholique de Louvain
1999Docteur en sciences appliquéesUniversité catholique de Louvain


2014
Article de périodique (Journal article)
  • Wehbe, N. ; Mouhib, Taoufiq ; Delcorte, Arnaud ; Bertrand, Patrick ; Moellers, R. ; Niehuis, E. ; Houssiau, L.. Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers. In: Analytical and Bioanalytical Chemistry, Vol. 406, p. 201-211 (2014). doi:10.1007/s00216-013-7408-x. http://hdl.handle.net/2078.1/139485

  • Wahoud, Fouad ; Guillot, J. ; Audinot, J.N. ; Bertrand, Patrick ; Delcorte, Arnaud ; Migeon, H.N.. Dielectric breakdown during Cs+ sputtering of polyvinyl chloride. In: Applied Surface Science, Vol. 293, p. 85-89 (2014). doi:10.1016/j.apsusc.2013.12.104. http://hdl.handle.net/2078.1/145929

  • Mesfin, Henok Mebratie ; Baudouin, Anne-Christine ; hermans, sophie ; Delcorte, Arnaud ; Huynen, Isabelle ; Bailly, Christian. Frequency selective microwave absorption induced by controlled orientation of graphene-like nanoplatelets in thin polymer films. In: Applied Physics Letters, (2014) (Accepté/Sous presse). http://hdl.handle.net/2078.1/150373

  • Vidick, D. ; Leonard, A.F. ; Poleunis, Claude ; Delcorte, Arnaud ; Devillers, Michel ; Hermans, Sophie. Phosphine- and ammonium-functionalized ordered mesoporous carbons as supports for cluster-derived metal nanoparticles. In: Catalysis Today, Vol. 235, p. 112-126 (2014). http://hdl.handle.net/2078.1/150057

  • Lebec, Victor ; Boujday, S. ; Poleunis, Claude ; Pradier, C.-M. ; Delcorte, Arnaud. Time-of-flight secondary ion mass spectrometry investigation of the orientation of adsorbed antibodies on sams correlated to biorecognition tests. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 118, no.4, p. 2085-2092 (2014). doi:10.1021/jp410845g. http://hdl.handle.net/2078.1/145931

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud. Invited talk : Apport des agrégats massifs d’Ar pour l’analyse chimique de films minces organiques. 6ème conférence francophone sur les spectroscopies d'électrons (Fès (Morocco), 05/2014). http://hdl.handle.net/2078.1/145939

  • Delcorte, Arnaud. Invited talk : Fundamentals of soft matter desorption by large Ar clusters. SIMS Europe 2014 (Münster (Germany), 09/2014). http://hdl.handle.net/2078.1/145942

  • Delcorte, Arnaud. Keynote lecture : (Massive) cluster bombardment of organics: molecular dynamics, sputtering yields, chemistry. 26th Annual Workshop on Secondary Ion Mass Spectrometry (National Harbor, Maryland (USA), 05/2014). http://hdl.handle.net/2078.1/139583

  • 2013
    Article de périodique (Journal article)
  • Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud. Argon cluster sputtering of a hybrid metal-organic surface: A microscopic view. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 117, no.2, p. 1189-1196 (2013). doi:10.1021/jp3110503. http://hdl.handle.net/2078.1/125151

  • Poleunis, Claude ; Dupont-Gillain, Christine C. ; Demoustier-Champagne, Sophie ; Delcorte, Arnaud ; Kalaskar, Deepak. Characterisation of protein nanotubes by ToF-SIMS imaging. In: Surface and Interface Analysis, Vol. 45, p. 333-337 (2013). doi:10.1002/sia.5037. http://hdl.handle.net/2078.1/120724

  • Delcorte, Arnaud ; van Hoecke, E. ; Restrepo-Gutiérrez, Oscar Antonio. Cluster-induced desorption from metal organic surfaces: Structural effects. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 303, p. 174-178 (2013). doi:10.1016/j.nimb.2012.10.039. http://hdl.handle.net/2078.1/130082

  • Vidick, Deborah ; Herlitschke, Marcus ; Poleunis, Claude ; Delcorte, Arnaud ; Hermann, Raphael P. ; Devillers, Michel ; Hermans, Sophie. Comparison of functionalized carbon nanofibers and multi-walled carbon nanotubes as supports for Fe–Co nanoparticles. In: Journal of Materials Chemistry A, Vol. 1, no.6, p. 2050-2063 (2013). doi:10.1039/c2ta00131d. http://hdl.handle.net/2078.1/125410

  • Restrepo-Gutiérrez, Oscar Antonio ; Gonze, Xavier ; Bertrand, Patrick ; Delcorte, Arnaud. Computer simulations of cluster impacts : effect of the atomic masses of the projectile and target. In: Physical Chemistry Chemical Physics, Vol. 15, p. 7621-7627 (25 Feb 2013). doi:10.1039/C3CP50346A. http://hdl.handle.net/2078.1/129183

  • Delcorte, Arnaud ; Leblanc, Ch. ; Poleunis, Claude ; Hamraoui, K.. Computer simulations of the sputtering of metallic, organic, and metal-organic surfaces with Bin and C60 projectiles. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 117, no.6, p. 2740-2752 (2013). doi:10.1021/jp308411r. http://hdl.handle.net/2078.1/125141

  • Lherbier, Aurélien ; Roche, Stephan ; Restrepo-Gutiérrez, Oscar Antonio ; Niquet, Yann-Michel ; Delcorte, Arnaud ; Charlier, Jean-Christophe. Highly defective graphene: A key prototype of two-dimensional Anderson insulators. In: Nano Research, Vol. 0, no. 0, p. 1-9- (2013). doi:10.1007/s12274-013-0309-7. http://hdl.handle.net/2078.1/128185

  • Havelund, R. ; Licciardello, A. ; Bailey, J. ; Tuccitto, N. ; Sapuppo, D. ; Gilmore, I.S. ; Sharp, J.S. ; Lee, J.L.S. ; Mouhib, Taoufiq ; Delcorte, Arnaud. Improving secondary ion mass spectrometry C60 n+ sputter depth profiling of challenging polymers with nitric oxide gas dosing. In: Analytical Chemistry, Vol. 85, no.10, p. 5064-5070 (2013). doi:10.1021/ac4003535. http://hdl.handle.net/2078.1/130164

  • Nittler, L. ; Delcorte, Arnaud ; Bertrand, Patrick ; Migeon, H.-N.. Insights into the yield enhancement and ion emission process in metal-assisted SIMS. In: Surface and Interface Analysis, Vol. 45, no.1, p. 18-21 (2013). doi:10.1002/sia.5045. http://hdl.handle.net/2078.1/125248

  • Debord, J.D. ; Prabhakaran Nair Syamala Amma, Aneesh ; Eller, M.J. ; Verkhoturov, S.V. ; Delcorte, Arnaud ; Schweikert, E.A.. Metal-assisted SIMS with hypervelocity gold cluster projectiles. In: International Journal of Mass Spectrometry, Vol. 343-344, p. 28-36 (2013). doi:10.1016/j.ijms.2013.03.012. http://hdl.handle.net/2078/130088

  • Mouhib, T. ; Poleunis, Claude ; Wehbe, N. ; Michels, J. J. ; Galagan, Y. ; Houssiau, L. ; Bertrand, Patrick ; Delcorte, Arnaud. Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams. In: The Analyst, Vol. 138, no.22, p. 6801-6810 (2013). doi:10.1039/c3an01035j. http://hdl.handle.net/2078.1/139512

  • Czerwinski, Bartlomiej Piotr ; Delcorte, Arnaud. Molecular dynamics study of fullerite cross-linking under keV C 60 and Arn cluster bombardment. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 117, no.7, p. 3595-3604 (2013). doi:10.1021/jp310635g. http://hdl.handle.net/2078.1/125971

  • Czerwinski, Bartlomiej Piotr ; Postawa, Zbigniew ; Garrison, Barbara J. ; Delcorte, Arnaud. Molecular dynamics study of polystyrene bond-breaking and crosslinking under C60 and Arn cluster bombardment. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 303, p. 22-26 (2013). doi:10.1016/j.nimb.2012.11.030. http://hdl.handle.net/2078.1/130041

  • Mouhib, Taoufiq ; Poleunis, Claude ; Möllers, R. ; Niehuis, E. ; Defrance, Pierre ; Bertrand, Patrick ; Delcorte, Arnaud. Organic depth profiling of C60 and C60/phthalocyanine layers using argon clusters. In: Surface and Interface Analysis, Vol. 45, no.1, p. 163-166 (2013). doi:10.1002/sia.5052. http://hdl.handle.net/2078.1/125257

  • Mouhib, Taoufiq ; Delcorte, Arnaud ; Poleunis, Claude ; Bertrand, Patrick. Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection. In: Surface and Interface Analysis, Vol. 45, no.1, p. 46-49 (2013). doi:10.1002/sia.5043. http://hdl.handle.net/2078.1/125179

  • Hubert, J. ; Poleunis, Claude ; Delcorte, Arnaud ; Laha, P. ; Bossert, J. ; Lambeets, S. ; Ozkan, A. ; Bertrand, P. ; Terryn, H. ; Reniers, F.. Plasma polymerization of C4Cl6 and C 2H2Cl4 at atmospheric pressure. In: Polymer, Vol. 54, no.16, p. 4085-4092 (2013). doi:10.1016/j.polymer.2013.05.068. http://hdl.handle.net/2078.1/138874

  • Lebec, Victor ; Landoulsi, J. ; Boujday, S. ; Poleunis, Claude ; Pradier, C.-M. ; Delcorte, Arnaud. Probing the orientation of β-lactoglobulin on gold surfaces modified by alkyl thiol self-assembled monolayers. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 117, no.22, p. 11569-11577 (2013). doi:10.1021/jp311964g. http://hdl.handle.net/2078.1/139511

  • Delcorte, Arnaud ; Restrepo-Gutiérrez, Oscar Antonio ; Czerwinski, Bartlomiej Piotr ; Garrison, B.J.. Surface sputtering with nanoclusters: The relevant parameters. In: Surface and Interface Analysis, Vol. 45, no.1, p. 9-13 (2013). doi:10.1002/sia.4926. http://hdl.handle.net/2078.1/125252

  • Wehbe, N. ; Tabarrant, T. ; Brison, J. ; Mouhib, Taoufiq ; Delcorte, Arnaud ; Bertrand, Patrick ; Moellers, R. ; Niehuis, E. ; Houssiau, L.. TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn. In: Surface and Interface Analysis, Vol. 45, no. 1, p. 178-180 (2013). doi:10.1002/sia.5121. http://hdl.handle.net/2078.1/125255

  • Delcorte, Arnaud ; Garrison, B.J.. Water nanodroplet impacts on surfaces: Effect of the substrate nature. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 303, p. 179–183 (2013). doi:10.1016/j.nimb.2012.10.029. http://hdl.handle.net/2078.1/130081

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud. Invited talk : Cluster-induced sputtering: Microscopic models and universal velocity dependences. 19th International Conference on Secondary Ion Mass Spectrometry (SIMS XIX), (September 2013). (Jeju (Korea), 09/2013). http://hdl.handle.net/2078.1/139579

  • Delcorte, Arnaud. Invited talk : Massive clusters for surface analysis: A microscopic view. 6th International Symposium on Practical Surface Analysis - PSA-13 (Naha city, Okinawa (Japan), 11/2013). http://hdl.handle.net/2078.1/139580

  • Delcorte, Arnaud. Invited talk : Soft sputtering with supercluster beams: From nanoimpacts to molecular tomography. Particle-surface interactions: from surface analysis to materials processing-PASI 2013 (Luxemburg city (Luxemburg), du 03/06/2013 au 05/06/2013). http://hdl.handle.net/2078/126882

  • Delcorte, Arnaud. Invited talk : Supercluster beams: From nanocraters to new frontiers in 3D molecular imaging. AnalytiX 2013, 2nd Annual Conference and EXPO (Suzhou (China), du 21/03/2013 au 23/03/2013). http://hdl.handle.net/2078.1/129284

  • Contribution à ouvrage collectif (Book Chapter)
  • Delcorte, Arnaud ; Restrepo-Gutiérrez, Oscar Antonio ; Czerwinski, Bartlomiej Piotr. Cluster SIMS of organic materials: Theoretical insights. In: Ch. Mahoney, Cluster Secondary Ion Mass Spectrometry: Principles and Applications (Wiley series on mass spectrometry), John Wiley & Sons, Inc.: Hoboken, NJ, USA, 2013, p. 13-55. 978-0-470-88605-2. http://hdl.handle.net/2078.1/129115

  • Delcorte, Arnaud. Fundamentals of organic SIMS: insights from experiments and models. In: John C. Vickerman and David Briggs, ToF-SIMS: Surface Analysis by Mass Spectrometry, 2nd Edition, SurfaceSpectra Ltd/IM Publications: Manchester, 2013, p. 37. 978-1-906715-17-5. doi:10.1255/tofch4 (Accepté/Sous presse). http://hdl.handle.net/2078.1/129111

  • 2012
    Article de périodique (Journal article)
  • Desmet, T. ; Poleunis, Claude ; Delcorte, Arnaud ; Dubruel, Peter. Double protein functionalized poly-ε-caprolactone surfaces: in depth ToF–SIMS and XPS characterization. In: Journal of Materials Science: Materials in Medicine, Vol. 23, no. 2, p. 293-305. doi:10.1007/s10856-011-4527-9. http://hdl.handle.net/2078.1/107509

  • Prabhakaran Nair Syamala Amma, Aneesh ; Yin, Jun ; Nysten, Bernard ; Degand, Hervé ; Morsomme, Pierre ; Mouhib, Taoufiq ; Yunus, Sami ; Bertrand, Patrick ; Delcorte, Arnaud. Metal condensates for low-molecular-weight matrix-free laser desorption/ionization. In: International Journal of Mass Spectrometry, Vol. 315, p. 22-30 (2012). doi:10.1016/j.ijms.2012.02.009. http://hdl.handle.net/2078.1/110342

  • Nittler, L. ; Delcorte, Arnaud ; Bertrand, Patrick ; Migeon, H.-N.. Morphology study of small amounts of evaporated gold on polymers. In: Surface and Interface Analysis, Vol. 44, no.8, p. 1072-1075 (2012). doi:10.1002/sia.4866. http://hdl.handle.net/2078.1/124557

  • Amalric, Julien ; Poleunis, Claude ; Delcorte, Arnaud ; Marchand-Brynaert, Jacqueline. Static SIMS study on surfaces of chalcogenide glasses modified by an organic layer. In: Surface Science, Vol. 606, no./, p. 1071-1077 (2012). doi:10.1016/j.susc.2012.03.005. http://hdl.handle.net/2078.1/124632

  • Communication à un colloque (Conference Paper)
  • Lherbier, Aurélien ; Roche, Stephan ; Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud ; Niquet, Yann-Michel ; Charlier, Jean-Christophe. Highly Defective Graphene: An Anderson insulating membrane.. APS March Meeting, 2012 (Boston, United-States, du 27/02/2012 au 02/03/2012). http://hdl.handle.net/2078/121316

  • Delcorte, Arnaud. Invited talk : 3D molecular analysis by secondary ion mass spectrometry: New frontiers. Colloque commun de la division de Physique Atomique et Moléculaire et Optique de la SFP et des Journées de Spectroscopie Moléculaire, PAMO-JSM (Metz (France), 00/07/2012). http://hdl.handle.net/2078.1/129288

  • Delcorte, Arnaud. Invited talk : High-resolution 3D molecular analysis by cluster ToF-SIMS: The new frontiers. European Materials Research Society 2012 Fall Meeting (Warsaw (Poland), 00/09/2012). http://hdl.handle.net/2078.1/129286

  • Delcorte, Arnaud. Invited talk : Kiloelectronvolt cluster bombardment of organic materials: Experiments and simulations. Joint IAEA-SPIRIT-Japan Technical Meeting on Development and Utilization of MeV-SIMS (Dubrovnik (Croatia), 05/2012). http://hdl.handle.net/2078.1/129292

  • Delcorte, Arnaud. Invited talk : Massive cluster sputtering of organic and nanocomposite materials. 14th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS 14) (Tokyo (Japan), 00/06/2012). http://hdl.handle.net/2078.1/129291

  • Delcorte, Arnaud. Invited talk : Molecular surface analysis by secondary ion mass spectrometry: Going 3D. 12ème journée scientifique du GFP section grand Est (Besançon (France), 00/06/2012). http://hdl.handle.net/2078.1/129290

  • Lherbier, Aurélien ; Roche, Stephan ; Dubois, Simon M.-M. ; Declerck, Xavier ; Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud ; Niquet, Yann-Michel ; Charlier, Jean-Christophe. Simulation of electronic transport in defective graphene. From point defects to amorphous structures.. GRAPHENE 2012 International Conference (Bruxelles, du 09/04/2012 au 13/04/2012). http://hdl.handle.net/2078.1/121168

  • Lherbier, Aurélien ; Roche, Stephan ; Dubois, Simon M.-M. ; Declerck, Xavier ; Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud ; Niquet, Yann-Michel ; Charlier, Jean-Christophe. Simulation of electronic transport in defective graphene. From point defects to amorphous structures.. 17th ETSF Workshop on ElectronicExcitations. Advanced Green function methods (Coimbra, Portugal, du 01/10/2012 au 05/10/2012). http://hdl.handle.net/2078/121314

  • Lherbier, Aurélien ; Roche, Stephan ; Dubois, Simon M.-M. ; Declerck, Xavier ; Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud ; Niquet, Yann-Michel ; Charlier, Jean-Christophe. Simulation of electronic transport in defective graphene. From point defects to amorphous structures.. Young Researcher Meeting YRM 2012, ETSF meeting series (Bruxelles, Belgium, du 21/05/2012 au 25/05/2012). http://hdl.handle.net/2078/121315

  • Contribution à ouvrage collectif (Book Chapter)
  • Mouhib, Taoufiq ; Delcorte, Arnaud. SIMS for Organic Film Analysis. In: M. S. Lee, Mass Spectrometry Handbook, John Wiley & Sons, Inc.: Hoboken, NJ, USA, 2012, p. 961-1015. doi:10.1002/9781118180730.ch42. http://hdl.handle.net/2078.1/126058

  • 2011
    Article de périodique (Journal article)
  • Willocq, Christopher ; Vidick, Deborah ; Tinant, Bernard ; Delcorte, Arnaud ; Bertrand, Patrick ; Devillers, Michel ; Hermans, Sophie. Anchoring of Ru–Pt and Ru–Au Clusters onto a Phosphane-Functionalized Carbon Support. In: European Journal of Inorganic Chemistry, Vol. 2011, no. 30, p. 4721-4729 (2011). doi:10.1002/ejic.201100384. http://hdl.handle.net/2078.1/107496

  • Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud. Au400 Sputtering of a Polymer with Adsorbed Metal Nanoparticles: A Molecular Dynamics Study. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interface, Vol. 115, no. 26, p. 12751-12759 (2011). doi:10.1021/jp201183a. http://hdl.handle.net/2078.1/95063

  • Mouhib, Taoufiq ; Bertrand, Patrick ; Poleunis, Claude ; Delcorte, Arnaud. C-60 molecular depth profiling of bilayered polymer films using ToF-SIMS. In: Surface and Interface Analysis, Vol. 43, no. 1-2, p. 175-178 (2011). doi:10.1002/sia.3539. http://hdl.handle.net/2078.1/76173

  • Delcorte, Arnaud ; Garrison, Barbara J. Desorption of large molecules with light-element clusters: Effects of cluster size and substrate nature. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 269, no. 14, p. 1572-1577 (15 July 2011). doi:10.1016/j.nimb.2010.11.023. http://hdl.handle.net/2078.1/95084

  • Restrepo-Gutiérrez, Oscar Antonio ; Prabhakaran Nair Syamala Amma, Aneesh ; Delcorte, Arnaud. Interaction of energetic clusters (Au3, Au400 and C60) with organic material and adsorbed gold nanoparticles. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 269, no. 14, p. 1595-1599 (15 July 2011). doi:10.1016/j.nimb.2010.11.014. http://hdl.handle.net/2078.1/95075

  • Nittler, Laurent ; Delcorte, Arnaud ; Bertrand, Patrick ; Migeon, Henry-Noël. Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMS. In: Surface and Interface Analysis, Vol. 43, no. 1-2, p. 103-106 (2011). doi:10.1002/sia.3425. http://hdl.handle.net/2078.1/76177

  • Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud. Molecular dynamics study of metal-organic samples bombarded by kiloelectronvolt projectiles. In: Surface and Interface Analysis, Vol. 43 , no. 1-2, p. 70–73 (2011). doi:10.1002/sia.3411. http://hdl.handle.net/2078.1/95085

  • Prabhakaran Nair Syamala Amma, Aneesh ; Yunus, Sami ; Wehbe, Nimer ; Bertrand, Patrick ; Delcorte, Arnaud. Secondary ion yield enhancement in organic samples due to Au/Pt nanoparticle condensation and their substrate effects. In: Surface and Interface Analysis, Vol. 43, no. 1-2, p. 74-77 (2011). doi:10.1002/sia.3477. http://hdl.handle.net/2078.1/76178

  • Delcorte, Arnaud ; Garrison, B.J. ; Hamraoui, K.. Sputtering soft materials with molecular projectiles: A microscopic view. In: Surface and Interface Analysis, Vol. 43, p. 16–19 (2011). doi:10.1002/sia.3405. http://hdl.handle.net/2078.1/95086

  • Wahoud, Fouad ; Mouhib, Taoufiq ; Audinot, J.N. ; Delcorte, Arnaud ; Migeon, H.N.. Study of charge effect during Cs+ sputtering of polystyrene in the pre-equilibrium regime. In: Surface and Interface Analysis, Vol. 43 , p. 201–203 (2011). doi:10.1002/sia.3419. http://hdl.handle.net/2078.1/95087

  • Reckinger, Nicolas ; Poleunis, Claude ; Dubois, Emmanuel ; Dutu, Constantin Augustin ; Tang, Xiaohui ; Delcorte, Arnaud ; Raskin, Jean-Pierre. Very low effective Schottky barrier height for erbium disilicide contacts on n-Si through arsenic segregation. In: Applied Physics Letters, Vol. 99, no. 1, p. 012110 (1-3) (16/06/2011). doi:10.1063/1.3608159. http://hdl.handle.net/2078.1/84993

  • Communication à un colloque (Conference Paper)
  • Poleunis, Claude ; Dupont-Gillain, Christine C. ; Demoustier-Champagne, Sophie ; Delcorte, Arnaud ; Kalaskar, Deepak. Characterization of protein nanotubes by ToF-SIMS imaging.. 18th International Conference on Secondary Ion Mass Spectroscopy, SIMS XVIII (Trentino (Italy), du 18/09/2011 au 23/09/2011). http://hdl.handle.net/2078.1/145000

  • Delcorte, Arnaud. Invited talk : Clusters for organic mass spectrometry: From small and hard to huge and soft. Annual Workshop on Secondary Ion Mass Spectrometry (Baltimore, Maryland (USA), 05/2011). http://hdl.handle.net/2078.1/129295

  • Delcorte, Arnaud. Invited talk : Surface sputtering with nanoclusters: The relevant parameters. 18th International Conference on Secondary Ion Mass Spectrometry (SIMS XVIII) (Riva del Garda (Italy), 09/2011). http://hdl.handle.net/2078.1/129294

  • 2010
    Article de périodique (Journal article)
  • Mouhib, Taoufiq ; Delcorte, Arnaud ; Poleunis, Claude ; Henry, Marie ; Bertrand, Patrick. C-60 SIMS depth profiling of bovine serum albumin protein-coating films: a conformational study. In: Surface and Interface Analysis, Vol. 42, no. 6-7, p. 641-644 (2010). doi:10.1002/sia.3349. http://hdl.handle.net/2078.1/58488

  • Hamraoui, Karim ; Delcorte, Arnaud. Effects of Molecular Orientation and Size in Sputtering of Model Organic Crystals. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 114, no. 12, p. 5458-5467 (2010). doi:10.1021/jp906004v. http://hdl.handle.net/2078.1/34024

  • Restrepo-Gutiérrez, Oscar Antonio ; Prabhakaran Nair Syamala Amma, Aneesh ; Hamraoui, Karim ; Wehbe, Nimer ; Yunus, Sami ; Bertrand, Patrick ; Delcorte, Arnaud. Mechanisms of metal-assisted secondary ion mass spectrometry: a mixed theoretical and experimental study. In: Surface and Interface Analysis, Vol. 42, no. 6-7, p. 1030-1034 (2010). doi:10.1002/sia.3203. http://hdl.handle.net/2078.1/58724

  • Mouhib, Taoufiq ; Delcorte, Arnaud ; Poleunis, Claude ; Bertrand, Patrick. Organic Secondary Ion Mass Spectrometry: Signal Enhancement by Water Vapor Injection. In: Journal of the american society for mass spectrometry, Vol. 21, no. 12, p. 2005-2010 (2010). doi:10.1016/j.jasms.2010.08.013. http://hdl.handle.net/2078.1/76235

  • Delcorte, Arnaud ; Bertrand, Patrick ; Garrison, B. J. ; Hamraoui, Karim ; Mouhib, Taoufiq ; Restrepo, O. A. ; Santos, C. N. ; Yunus, Sami. Probing soft materials with energetic ions and molecules: from microscopic models to the real world. In: Surface and Interface Analysis, Vol. 42, no. 8, p. 1380-1386 (2010). doi:10.1002/sia.3270. http://hdl.handle.net/2078.1/33616

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud. Invited talk : Interaction of energetic cluster with organic solids: From molecular dynamics to 3D molecular analysis. 4è Congrès International Physique des Interactions Rayonnement-Matière (Dakhla (Morocco), 04/2010). http://hdl.handle.net/2078.1/129299

  • Delcorte, Arnaud. Invited talk : Mechanisms of molecular desorption upon small and massive cluster impacts: Insights from computer simulation. International Conference on Desorption 2010 (Seillac (France), 05/2010). http://hdl.handle.net/2078.1/129298

  • Delcorte, Arnaud. Invited talk : ToF-SIMS of organic and bio materials, from static analysis and imaging to 3D molecular analysis. Inaugural ToF-SIMS LEIS Workshop (Imperial College, London (UK), 24/11/2010). http://hdl.handle.net/2078.1/129297

  • Contribution à ouvrage collectif (Book Chapter)
  • Delcorte, Arnaud. Sputtering and Ionization Basics. In: D. Beauchemin and D. Matthews, The Encyclopedia of Mass Spectrometry Vol. 5, Elemental and Isotope Ratio Mass Spectrometry, Elsevier Science, 2010, p. 397-411. 0-08-043804-0. http://hdl.handle.net/2078.1/95088

  • 2009
    Article de périodique (Journal article)
  • Nieuwjaer, Nicolas ; Poleunis, Claude ; Delcorte, Arnaud ; Bertrand, Patrick. Depth profiling of polymer samples using Ga+ and C-60(+) ion beams. In: Surface and Interface Analysis, Vol. 41, no. 1, p. 6-10 (2009). doi:10.1002/sia.2931. http://hdl.handle.net/2078.1/59052

  • Delcorte, Arnaud ; Garrison, B J ; Hamraoui, Karim. Dynamics of molecular impacts on soft materials: from fullerenes to organic nanodrops.. In: Analytical Chemistry, Vol. 81, no. 16, p. 6676-6686 (2009). doi:10.1021/ac900746x. http://hdl.handle.net/2078.1/30691

  • Wehbe, Nimer ; Mouhib, Taoufiq ; Prabhakaran Nair Syamala Amma, Aneesh ; Bertrand, Patrick ; Delcorte, Arnaud. Influence of the Organic Layer Thickness in (Metal-Assisted) Secondary Ion Mass Spectrometry Using Ga(+) and C(60)(+) Projectiles.. In: Journal of the American society for mass spectrometry, Vol. 20, no. 12, p. 2294-2303 (2009). doi:10.1016/j.jasms.2009.08.022. http://hdl.handle.net/2078.1/24980

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud. Invited talk : Kiloelectronvolt molecular impacts on soft materials: From nanocraters to 3D chemical analysis. 9th workshop on Cluster Ion Beam Technology (Tokyo (Japan), 03/2009). http://hdl.handle.net/2078.1/129302

  • Delcorte, Arnaud. Invited talk : Sputtering soft materials with energetic molecules: From microscopic models to the real world. 7th International Symposium on Atomic Level Characterizations (Maui (USA), 12/2009). http://hdl.handle.net/2078.1/129300

  • Delcorte, Arnaud. Invited talk : Theoretical study of molecular impacts on organic surfaces: Effects of projectile size and target structure. 19th International Conference on Ion-Surface Interactions (ISI-2009) (Zvenigorod (Russia), 08/2009). http://hdl.handle.net/2078.1/129301

  • 2008
    Article de périodique (Journal article)
  • Dague, Etienne ; Delcorte, Arnaud ; Latgé, Jean-Paul ; Dufrêne, Yves. Combined use of atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry for cell surface analysis.. In: Langmuir : the A C S journal of surfaces and colloids, Vol. 24, no. 7, p. 2955-2959 (2008). doi:10.1021/la703741y. http://hdl.handle.net/2078.1/11267

  • Wehbe, Nimer ; Heile, Andreas ; Arlinghaus, Heinrich ; Bertrand, Patrick ; Delcorte, Arnaud. Effects of Metal Nanoparticles on the Secondary Ion Yields of a Model Alkane Molecule upon Atomic and Polyatomic Projectiles in Secondary Ion Mass Spectrometry.. In: Analytical Chemistry, Vol. 80, no. 16, p. 6235-6244 (2008). doi:10.1021/ac800568y. http://hdl.handle.net/2078.1/14123

  • Heile, A. ; Lipinsky, D. ; Wehbe, Nimer ; Delcorte, Arnaud ; Bertrand, Patrick ; Felten, Alexandre ; Houssiau, L. ; Pireaux, Jean-Jacques ; De Mondt, R. ; Van Royen, P. ; Van Vaeck, L. ; Arlinghaus, H. F.. Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples. In: Surface and Interface Analysis, Vol. 40, no. 3-4, p. 538-542 (2008). doi:10.1002/sia.2810. http://hdl.handle.net/2078.1/36618

  • De Mondt, Roel ; Van Vaeck, Luc ; Heile, Andreas ; Arlinghaus, Heinrich F. ; Nieuwjaer, Nicolas ; Delcorte, Arnaud ; Bertrand, Patrick ; Lenaerts, Jens ; Vangaever, Frank. Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions. In: Rapid Communications in Mass Spectrometry, Vol. 22, no. 10, p. 1481-1496 (2008). doi:10.1002/rcm.3533. http://hdl.handle.net/2078.1/36558

  • Heile, A. ; Lipinsky, D. ; Wehbe, Nimer ; Delcorte, Arnaud ; Bertrand, Patrick ; Felten, Alexandre ; Houssiau, L. ; Pireaux, Jean-Jacques ; De Mondt, R. ; Van Vaeck, L. ; Arlinghaus, H. F.. Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement. In: Applied Surface Science, Vol. 255, no. 4, p. 941-943 (2008). doi:10.1016/j.apsusc.2008.05.007. http://hdl.handle.net/2078.1/59431

  • Legent, G ; Delaune, A ; Norris, V ; Delcorte, Arnaud ; Gibouin, D ; Lefebvre, F. ; Misevic, G ; Thellier, M ; Ripoll, C. Method for Macromolecular Colocalization Using Atomic Recombination in Dynamic SIMS.. In: Russian Journal of Physical Chemistry B, Vol. 112, no. 17, p. 5534-5546 (2008). doi:10.1021/jp7100489. http://hdl.handle.net/2078.1/11366

  • Wehbe, Nimer ; Delcorte, Arnaud ; Heile, Andreas ; Arlinghaus, Heinrich F. ; Bertrand, Patrick. Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometry. In: Applied Surface Science, Vol. 255, no. 4, p. 824-827 (2008). doi:10.1016/j.apsusc.2008.05.068. http://hdl.handle.net/2078.1/59138

  • Delcorte, Arnaud. On the road to high-resolution 3D molecular imaging. In: Applied Surface Science, Vol. 255, no. 4, p. 954-958 (2008). doi:10.1016/j.apsusc.2008.05.111. http://hdl.handle.net/2078.1/59139

  • Delcorte, Arnaud ; Wehbe, Nimer ; Bertrand, Patrick ; Garrison, B. J.. Sputtering of organic molecules by clusters, with focus on fullerenes. In: Applied Surface Science, Vol. 255, no. 4, p. 1229-1234 (2008). doi:10.1016/j.apsusc.2008.05.107. http://hdl.handle.net/2078.1/35531

  • Communication à un colloque (Conference Paper)
  • Vidick, Deborah ; Willocq, Christopher ; Hermans, Sophie ; Delcorte, Arnaud ; Bertrand, Patrick ; Devillers, Michel. Chemical grafting of mixed-metal clusters on phosphine-functionalized active carbon for the preparation of supported nanoparticles (poster). 2nd EuChemS Chemistry Congress, Nanomaterials Session (Torino (Italy), du 16 au 20 September). http://hdl.handle.net/2078.1/91108

  • Delcorte, Arnaud. Invited talk : Molecular analysis of organic layers with fullerene beams: Fundamentals and applications. 17th International Conference on Inelastic Ion-Surface Collisions (IISC-17) (Porquerolles (France), 09/2008). http://hdl.handle.net/2078.1/129303

  • Willocq, Christopher ; Vidick, Deborah ; Hermans, Sophie ; Delcorte, Arnaud ; Bertrand, Patrick ; Dubois, Vincent ; Devillers, Michel. Molecular approach for the synthesis of supported nanoparticles on active carbon using noble metal clusters. Nanotechnology 2008: Materials, Fabrication, Particles, and Characterization. 2008 NSTI Nanotechnology Conference and Trade Show (Boston, MA, USA, 1-5 June 2008). In: Nanotechnology 2008: Materials, Fabrication, Particles, and Characterization. 2008 NSTI Nanotechnology Conference and Trade Show, Nano science and technology institute, 2008. 978-1-4200-8503-7, p. 807-810. http://hdl.handle.net/2078.1/67517

  • 2007
    Article de périodique (Journal article)
  • Yunus, Sami ; Delcorte, Arnaud ; Poleunis, Claude ; Bertrand, Patrick ; Bolognesi, Alberto ; Botta, Chiara. A route to self-organized honeycomb microstructured polystyrene films and their chemical characterization by ToF-SIMS imaging. In: Advanced Functional Materials, Vol. 17, no. 7, p. 1079-1084 (2007). doi:10.1002/adfm.200600470. http://hdl.handle.net/2078.1/37614

  • Yunus, Sami ; de Crombrugghe de Looringhe, C. ; Poleunis, Claude ; Delcorte, Arnaud. Diffusion of oligomers from polydimethylsiloxane stamps in microcontact printing: Surface analysis and possible application. In: Surface and Interface Analysis, Vol. 39, no. 12-13, p. 922-925 (2007). doi:10.1002/sia.2623. http://hdl.handle.net/2078.1/59357

  • Delcorte, Arnaud ; Yunus, Sami ; Wehbe, Nimer ; Nieuwjaer, Nicolas ; Poleunis, Claude ; Felten, Alexandre ; Houssiau, L. ; Pireaux, Jean-Jacques ; Bertrand, Patrick. Metal-assisted secondary ion mass spectrometry using atomic (Ga+, In+) and fullerene projectiles.. In: Analytical Chemistry, Vol. 79, no. 10, p. 3673-3689 (2007). doi:10.1021/ac062406l. http://hdl.handle.net/2078.1/10922

  • Delcorte, Arnaud ; Garrison, Barbara J.. Sputtering polymers with buckminsterfullerene projectiles: A Coarse-Grain molecular dynamics study. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 111, no. 42, p. 15312-15324 (2007). doi:10.1021/jp074536j. http://hdl.handle.net/2078.1/59518

  • Delcorte, Arnaud ; Garrison, Barbara J.. keV fullerene interaction with hydrocarbon targets: Projectile penetration, damage creation and removal. In: Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 255, no. 1, p. 223-228 (2007). doi:10.1016/j.nimb.2006.11.070. http://hdl.handle.net/2078.1/59652

  • Communication à un colloque (Conference Paper)
  • Willocq, Christopher ; Vidick, Deborah ; Hermans, Sophie ; Delcorte, Arnaud ; Bertrand, Patrick ; Devillers, Michel. Grafting of metal clusters on chemically functionalized active carbon for the synthesis of supported nanoalloys (poster). Faraday Discussions 138 - "Nanoalloys - From theory to Application" (Birmingham (UK), September). http://hdl.handle.net/2078.1/91126

  • Delcorte, Arnaud. Invited talk : Fullerene interactions with polymers: from fundamentals to surface analysis. 18th International Conference on Ion-Surface Interactions (ISI-2007) (Zvenigorod (Russia), 08/2007). http://hdl.handle.net/2078.1/129305

  • Delcorte, Arnaud. Invited talk : On the road to 3 D molecular imaging. 16th International Conference on Secondary Ion Mass Spectrometry (SIMS XVI) (Kanazawa (Japan), 10/2007). http://hdl.handle.net/2078.1/129306

  • Delcorte, Arnaud. Invited talk : Probing molecular solids and polymers with fullerenes: Computer simulations and chemical surface analysis, A. Delcorte,. 44th IUVTSA Workshop: Sputtering and Ion Emission by Cluster Ion Beams (Barony Castle (Scotland, UK), 04/2007). http://hdl.handle.net/2078.1/129313

  • 2006
    Article de périodique (Journal article)
  • Poleunis, Claude ; Everaert, Emmanuel P. ; Delcorte, Arnaud ; Bertrand, Patrick. Characterisation of human hair surfaces by means of static ToF-SIMS: A comparison between Ga+ and C-60(+) primary ions. In: Applied Surface Science, Vol. 252, no. 19, p. 6761-6764 (2006). doi:10.1016/j.apsusc.2006.02.174. http://hdl.handle.net/2078.1/59950

  • Poleunis, Claude ; Delcorte, Arnaud ; Bertrand, Patrick. Determination of organic contaminations on Si wafer surfaces by static ToF-SIMS: Improvement of the detection limit with C-60(+) primary ions. In: Applied Surface Science, Vol. 252, no. 19, p. 7258-7261 (2006). doi:10.1016/j.apsusc.2006.02.267. http://hdl.handle.net/2078.1/59952

  • Delcorte, Arnaud ; Poleunis, Claude ; Bertrand, Patrick. Energy distributions of atomic and molecular ions sputtered by C-60(+) projectiles. In: Applied Surface Science, Vol. 252, no. 19, p. 6542-6546 (2006). doi:10.1016/j.apsusc.2006.02.260. http://hdl.handle.net/2078.1/59947

  • Delcorte, Arnaud. Matrix-enhanced secondary ion mass spectrometry: The Alchemist's solution?. In: Applied Surface Science, Vol. 252, no. 19, p. 6582-6587 (2006). doi:10.1016/j.apsusc.2006.02.076. http://hdl.handle.net/2078.1/59948

  • Solomko, Vadim ; Verstraete, Matthieu J. ; Delcorte, Arnaud ; Garrison, B. J. ; Gonze, Xavier ; Bertrand, Patrick. Modeling the dissociation and ionization of a sputtered organic molecule. In: Applied Surface Science, Vol. 252, no. 19, p. 6459-6462 (2006). doi:10.1016/j.apsusc.2006.02.075. http://hdl.handle.net/2078.1/59945

  • Delcorte, Arnaud ; Poleunis, Claude ; Bertrand, Patrick. Stretching the limits of static SIMS with C-60(+). In: Applied Surface Science, Vol. 252, no. 19, p. 6494-6497 (2006). doi:10.1016/j.apsusc.2006.02.259. http://hdl.handle.net/2078.1/59946

  • Bertrand, Patrick ; Delcorte, Arnaud. Surface characterization of organic materials by ToF-SIMS: How to improve the sensitivity. In: American Chemical Society. Abstracts of Papers (at the National Meeting), Vol. 231 (2006). http://hdl.handle.net/2078.1/59955

  • Arezki, Bahia ; Delcorte, Arnaud ; Garrison, B J ; Bertrand, Patrick. Understanding gold-thiolate cluster emission from self-assembled monolayers upon kiloelectronvolt ion bombardment.. In: The Journal of Physical Chemistry Part B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, Vol. 110, no. 13, p. 6832-6840 (2006). doi:10.1021/jp058252f. http://hdl.handle.net/2078.1/10536

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud. Invited talk : Simulation of Mono- and Polyatomic Projectile Interactions with Molecular and Polymeric Surfaces. 8th International Conference Computer Simulation of Radiation Effects in Solids (COSIRES 2006) (Richland (USA), 06/2006). http://hdl.handle.net/2078.1/129314

  • Czerwinski, B. ; Delcorte, Arnaud ; Garrison, Bt ; Samson, R. ; Winograd, N. ; Postawa, Z.. Sputtering of thin benzene and polystyrene overlayers by keV Ga and C-60 bombardment. 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) (Univ Manchester, Manchester(England), du 12/09/2005 au 16/09/2005). In: Applied Surface Science, Vol. 252, no. 19, p. 6419-6422 (2006). doi:10.1016/j.apsusc.2006.02.002. http://hdl.handle.net/2078.1/59944

  • 2005
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Bertrand, Patrick. Metal salts for molecular ion yield enhancement in organic secondary ion mass spectrometry: a critical assessment.. In: Analytical Chemistry, Vol. 77, no. 7, p. 2107-2115 (2005). doi:10.1021/ac040158s. http://hdl.handle.net/2078.1/10149

  • Delcorte, Arnaud. Modeling keV particle interactions with molecular and polymeric samples. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 236, p. 1-10 (2005). doi:10.1016/j.nimb.2005.03.242. http://hdl.handle.net/2078.1/60923

  • Willocq, Christopher ; Delcorte, Arnaud ; Hermans, Sophie ; Bertrand, Patrick ; Devillers, Michel. Multitechnique investigation of the physisorption and thermal treatment of mixed-metal clusters on carbon.. In: The Journal of Physical Chemistry Part B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, Vol. 109, no. 19, p. 9482-9489 (2005). doi:10.1021/jp050560q. http://hdl.handle.net/2078.1/10653

  • Delcorte, Arnaud. Organic surfaces excited by low-energy ions: atomic collisions, molecular desorption and buckminsterfullerenes.. In: Physical Chemistry Chemical Physics, Vol. 7, no. 19, p. 3395-3406 (2005). doi:10.1039/b509238h. http://hdl.handle.net/2078.1/10380

  • Communication à un colloque (Conference Paper)
  • Aubriet, Frédéric ; Lourette, N. ; Muller, J.-F. ; Husson, Jérôme ; Beley, M. ; Willocq, Christopher ; Hermans, Sophie ; Devillers, Michel ; Delcorte, Arnaud ; Bertrand, Patrick. Capabilities of laser desorption mass spectrometry to characterize hybrid ruthenium complexes (poster). Journées Françaises de Spectrométrie de Masse (Montpellier, France, September). http://hdl.handle.net/2078.1/91410

  • Delcorte, Arnaud. Invited talk : Energy dissipation and molecular emission processes induced in organic surfaces by keV projectiles, including C60: Recent theoretical and experimental progress. 17th International Conference on Ion-Surface Interactions 2005 (ISI-2005) (Zvenigorod (Russia), 08/2005). http://hdl.handle.net/2078.1/129318

  • Delcorte, Arnaud. Invited talk : Interaction of keV monoatomic and fullerene ions with organic materials: Recent experiments and simulations. 5th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC'05) (Hawaii (USA), 12/2005). http://hdl.handle.net/2078.1/129315

  • Delcorte, Arnaud. Invited talk : Matrix Enhanced SIMS: The alchemist's solution?. 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) (Manchester (UK), 09/2005). http://hdl.handle.net/2078.1/129317

  • 2004
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Hermans, Sophie ; Devillers, Michel ; Lourette, N ; Aubriet, F ; Muller, JF ; Bertrand, Patrick. Desorption/ionization of molecular nanoclusters: SIMS versus MALDI. In: Applied Surface Science, Vol. 231-232, p. 131-135 (2004). doi:10.1016/j.apsusc.2004.03.092. http://hdl.handle.net/2078.1/61269

  • Arezki, Bahia ; Delcorte, Arnaud ; Bertrand, Patrick. Emission processes of molecule-metal cluster ions from self-assembled monolayers of octanethiols on gold and silver. In: Applied Surface Science, Vol. 231-2, p. 122-126 (2004). doi:10.1016/j.apsusc.2004.03.087. http://hdl.handle.net/2078.1/61268

  • Delcorte, Arnaud ; Bertrand, Patrick. Interest of silver and gold metallization for molecular SIMS and SIMS imaging. In: Applied Surface Science, Vol. 231-2, p. 250-255 (2004). doi:10.1016/j.apsusc.2004.03.029. http://hdl.handle.net/2078.1/61270

  • Delcorte, Arnaud ; Garrison, BJ. Kiloelectronvolt argon-induced molecular desorption from a bulk polystyrene solid. In: The Journal of Physical Chemistry Part B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, Vol. 108, no. 40, p. 15652-15661 (2004). doi:10.1021/jp0402131. http://hdl.handle.net/2078.1/39953

  • Solomko, Vadim ; Delcorte, Arnaud ; Garrison, BJ ; Bertrand, Patrick. Sputtering of a polycyclic hydrocarbon molecule: TOF-SIMS experiments and molecular dynamic simulations. In: Applied Surface Science, Vol. 231-2, p. 48-53 (2004). doi:10.1016/j.apsusc.2004.03.024. http://hdl.handle.net/2078.1/61267

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Garrison, B.J.. Invited talk : Insights into organic molecule emission: recent computer simulations and experiments. Nano-molecular Analysis for Emerging Technologies (Teddington (UK), 11/2004). http://hdl.handle.net/2078.1/129320

  • Delcorte, Arnaud. Invited talk : Modeling of low-energy ion interactions with molecular and polymeric samples. 6th International Symposium on Ionizing Radiation and Polymers (Houffalize (Belgium), 09/2004). http://hdl.handle.net/2078.1/130230

  • Delcorte, Arnaud. Invited talk : Surfaces locally excited by energetic particles: Energy transfer and molecular ejection. International workshop on materials under extreme conditions: experimental validation of atomistic modeling, at the European Centre for Atomic and Molecular Computations (CECAM) (Lyon (France), 05/2004). http://hdl.handle.net/2078.1/130231

  • Contribution à ouvrage collectif (Book Chapter)
  • Delcorte, Arnaud ; Befahy, Stéphane ; Poleunis, Claude ; Troosters, Michel ; Bertrand, Patrick. Improvement of metal adhesion to silicone films : a ToF-SIMS study. In: K.L. Mittal, Adhesion Aspects of Thin Films, Volume 2, VSP: MST Conferences (Firm), 2004, p. 155-167. 9789067644211. http://hdl.handle.net/2078.1/77668

  • 2003
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Garrison, BJ. A microscopic view of organic sample sputtering. In: Applied Surface Science, Vol. 203, p. 166-169 (2003). http://hdl.handle.net/2078.1/61621

  • Garrison, BJ ; Delcorte, Arnaud ; Zhigilei, L ; Itina, TE ; Krantzman, KD ; Yingling, YG ; McQuaw, CM ; Smiley, EJ ; Winograd, N.. Big molecule ejection - SIMS vs. MALDI. In: Applied Surface Science, Vol. 203, p. 69-71 (2003). http://hdl.handle.net/2078.1/61618

  • Arezki, Bahia ; Delcorte, Arnaud ; Chami, AC ; Garrison, BJ ; Bertrand, Patrick. Gold-thiolate cluster emission from SAMs under keV ion bombardment: Experiments and molecular dynamics simulations. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 212, p. 369-375 (2003). doi:10.1016/S0168-583X(03)01457-5. http://hdl.handle.net/2078.1/61444

  • Delcorte, Arnaud ; Arezki, Bahia ; Garrison, BJ. Matrix and substrate effects on the sputtering of a 2 kDa molecule: Insights from molecular dynamics. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 212, p. 414-419 (2003). doi:10.1016/S0168-583X(03)01492-7. http://hdl.handle.net/2078.1/61445

  • Wojciechowski, Igor ; Delcorte, Arnaud ; Gonze, Xavier ; Bertrand, Patrick. Mechanism of metal cationization in organic SIMS. In: Applied Surface Science, Vol. 203/204, p. 102-105 (2003). doi:10.1016/S0169-4332(02)00708-0. http://hdl.handle.net/2078.1/77737

  • Bertrand, Patrick ; Delcorte, Arnaud ; Garrison, BJ. Molecular SIMS for organic layers: new insights. In: Applied Surface Science, Vol. 203, p. 160-165 (2003). http://hdl.handle.net/2078.1/61620

  • Delcorte, Arnaud ; Garrison, BJ. Particle-induced desorption of kilodalton molecules embedded in a matrix: A molecular dynamics study. In: The Journal of Physical Chemistry Part B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, Vol. 107, no. 10, p. 2297-2310 (2003). doi:10.1021/jp022142g. http://hdl.handle.net/2078.1/41168

  • Delcorte, Arnaud ; Bour, J ; Aubriet, F ; Muller, J-F ; Bertrand, Patrick. Sample metallization for performance improvement in desorption/ionization of kilodalton molecules: quantitative evaluation, imaging secondary ion MS, and laser ablation.. In: Analytical chemistry, Vol. 75, no. 24, p. 6875-85 (2003). doi:10.1021/ac0302105. http://hdl.handle.net/2078.1/9690

  • Delcorte, Arnaud ; Wojciechowski, I. ; Gonze, Xavier ; Garrison, B.J. ; Bertrand, Patrick. The formation of single and double cationization of organic molecules in SIMS. In: Applied Surface Science, Vol. 203-204, p. 106-109 (2003). http://hdl.handle.net/2078.1/113047

  • Krantzman, KD ; Fenno, R ; Delcorte, Arnaud ; Garrison, BJ. Theoretical simulations of atomic and polyatomic bombardment of an organic overlayer on a metallic substrate. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 202, p. 201-205 (2003). doi:10.1016/S0168-583X(02)01858-X. http://hdl.handle.net/2078.1/61597

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud ; Hermans, Sophie ; Devillers, Michel ; Lourette, N. ; Aubriet, Frédéric ; Muller, J.-F. ; Bertrand, Patrick. Desorption / ionization of molecular nanoclusters : SIMS versus MALDI (poster). 14th International Conference on Secondary Ion Mass Spectrometry (SIMS XIV) (San Diego, USA, September). http://hdl.handle.net/2078.1/91458

  • Delcorte, Arnaud ; Befahy, S. ; Poleunis, Claude ; Troosters, M. ; Bertrand, Patrick. Invited talk : Adhesion improvement for metallized silicone films. International Symposium on Adhesion Aspects of Thin Films (Orlando (USA), 12/2003). http://hdl.handle.net/2078.1/130232

  • Delcorte, Arnaud ; Bertrand, Patrick ; Garrison, B.J.. Invited talk : Molecular dynamics for surface mass spectrometry. International workshop on reactive classical potentials versus hybrid methods: toward chemical complexity, at the European Centre for Atomic and Molecular Computations (CECAM) (Lyon (France), 06/2003). http://hdl.handle.net/2078.1/130233

  • 2002
    Article de périodique (Journal article)
  • Arezki, Bahia ; Delcorte, Arnaud ; Bertrand, Patrick. Kinetic energy distributions of molecular and cluster ions sputtered from self-assembled monolayers of octanethiol on gold. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 193, p. 755-761 (2004). http://hdl.handle.net/2078.1/61738

  • Garrison, B.J. ; Delcorte, Arnaud ; Krantzman, K.D.. Modeling sputtering of organic molecules. In: Izvestiâ Akademii nauk SSSR. Seriâ fizičeskaâ, Vol. 66, no.4, p. 472-474 (2002). http://hdl.handle.net/2078.1/130663

  • Delcorte, Arnaud ; Médard, N ; Bertrand, Patrick. Organic secondary ion mass spectrometry: sensitivity enhancement by gold deposition.. In: Analytical Chemistry, Vol. 74, no. 19, p. 4955-4968 (2002). doi:10.1021/ac020125h. http://hdl.handle.net/2078.1/9272

  • Delcorte, Arnaud ; Wojciechowski, I. ; Gonze, Xavier ; Garrison, BJ ; Bertrand, Patrick. Single and double cationization of organic molecules in SIMS. In: International Journal of Mass Spectrometry, Vol. 214, no. 2, p. 213-232 (2002). http://hdl.handle.net/2078.1/42070

  • Delcorte, Arnaud ; Arezki, Bahia ; Bertrand, Patrick ; Garrison, BJ. Sputtering kilodalton fragments from polymers. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 193, p. 768-774 (2002). http://hdl.handle.net/2078.1/61739

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud ; Garrison, B.J.. Keynote lecture : A microscopic view of organic SIMS. 15th Annual SIMS Workshop - Plenary Session. (Clearwater (Florida), du 04/2002 au 05/2002). http://hdl.handle.net/2078.1/130234

  • 2001
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Garrison, B.J.. Desorption of large organic molecules induced by keV projectiles. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 180, p. 37-43 (2001). http://hdl.handle.net/2078.1/126482

  • Delcorte, Arnaud ; Bertrand, Patrick ; Garrison, BJ. Collision cascade and sputtering process in a polymer. In: The Journal of Physical Chemistry Part B: Materials, Surfaces, Interfaces & Biophysical, Vol. 105, no. 39, p. 9474-9486 (2001). doi:10.1021/jp011099e. http://hdl.handle.net/2078.1/42483

  • Wojciechowski, I. ; Delcorte, Arnaud ; Gonze, Xavier ; Bertrand, Patrick. Mechanism of metal cationization in organic SIMS. In: Chemical Physics Letters, Vol. 346, no. 1-2, p. 1-8 (2001). doi:10.1016/S0009-2614(01)00931-9. http://hdl.handle.net/2078.1/42497

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud. Invited talk : Fundamentals of fragment ion emission (workshop). 13th International Conference on Secondary Ion Mass Spectrometry (Nara (Japan), 11/2001). http://hdl.handle.net/2078.1/130235

  • Delcorte, Arnaud. Invited talk : Molecular dynamics in organic SIMS. VIèmes Rencontres du Club Jeunes de la Société Française de Spectrométrie de Masse (Les Rives de Thau (France), 03/2001). http://hdl.handle.net/2078.1/130236

  • Contribution à ouvrage collectif (Book Chapter)
  • Delcorte, Arnaud. Fundamental aspects of organic SIMS. In: J.C. Vickerman, D. Briggs, ToF-SIMS: Surface Analysis by Mass Spectrometry, SurfaceSpectra Ltd/IM Publications: Manchester, 2001, p. 161-194. 1901019039. http://hdl.handle.net/2078.1/130665

  • 2000
    Article de périodique (Journal article)
  • Segda, B.G. ; Delcorte, Arnaud ; Bertrand, Patrick. Application de ToF-SIMS à l'étude des surfaces de polymères: cas du polystyrène, dibenzanthracène et triacontane. In: J. Soc. Ouest-Afr. Chim., Vol. 10, p. 51-73 (2000). http://hdl.handle.net/2078.1/78050

  • Delcorte, Arnaud ; Garrison, B.J.. High yield events of molecule emission induced by keV particle bombardment. In: The Journal of Physical Chemistry Part B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, Vol. 104, p. 6785-6800 (2000). doi:10.1021/jp001374h. http://hdl.handle.net/2078.1/126484

  • Delcorte, Arnaud ; Segda, BG ; Garrison, BJ ; Bertrand, Patrick. Inferring ejection distances and a surface energy profile in keV particle bombardment experiments. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 171, no. 3, p. 277-290 (2000). http://hdl.handle.net/2078.1/43214

  • Delcorte, Arnaud ; Vanden Eynde, X. ; Bertrand, Patrick ; Vickerman, J.C. ; Garrison, B.J.. Kiloelectronvolt particle-induced emission and fragmentation of polystyrene molecules adsorbed on silver: Insights from molecular dynamics. In: The Journal of Physical Chemistry Part B: Materials, Surfaces, Interfaces & Biophysical, Vol. 104, no. 12, p. 2673-2691 (2000). doi:10.1021/jp993539w. http://hdl.handle.net/2078.1/43633

  • Garrison, B.J. ; Delcorte, Arnaud ; Krantzman, K.D.. Molecule liftoff from surfaces. In: Accounts of Chemical Research, Vol. 33, no.2, p. 69-77 (2000). doi:10.1021/ar970135i. http://hdl.handle.net/2078.1/130258

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Vickerman, J. C. ; Garrison, B.J.. Invited talk : Fundamental aspects in SIMS of complex molecules. 11th International Conference on Quantitative Surface Analysis (Guildford (England), 07/2000). http://hdl.handle.net/2078.1/130237

  • Contribution à ouvrage collectif (Book Chapter)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Vickerman, J.C. ; Garrison, B.J.. How do large organic molecules sputter? Insights from TOF-SIMS and molecular dynamics simulations. In: A. Benninghoven, P. Bertrand, H.-N. Migeon and H. Werner, Secondary Ion Mass Spectrometry, SIMS XII, Elsevier Science Publ.: Amsterdam, 2000, p. 27-32. 0-444-50323-4. http://hdl.handle.net/2078.1/78742

  • Arezki, B. ; Delcorte, Arnaud ; Bertrand, Patrick. Substrate and structural effects on the kinetic energy of molecular fragments in SIMS of polymer overlayers. In: A. Benninghoven, P. Bertrand, H.-N. Migeon, Secondary Ion Mass Spectrometry, SIMS XII proceedings, Elsevier: Amsterdam, 2000, p. 199-202. 0-444-50323-4. http://hdl.handle.net/2078.1/130673

  • 1999
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Vanden Eynde, X ; Bertrand, Patrick ; Reich, DF. Influence of the primary ion beam parameters (nature, energy, and angle) on the kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) by kiloelectron volt ions. In: International Journal of Mass Spectrometry, Vol. 189, no. 2-3, p. 133-146 (1999). doi:10.1016/S1387-3806(99)00063-9. http://hdl.handle.net/2078.1/44228

  • Delcorte, Arnaud ; Vanden Eynde, X ; Bertrand, Patrick ; Reich, DF. Kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) under indium ion bombardment: effects of the primary beam energy and angle. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 157, no. 1-4, p. 138-143 (1999). http://hdl.handle.net/2078.1/62265

  • Delcorte, Arnaud ; Bertrand, Patrick. Metastable decay of molecular fragment ions sputtered from hydrocarbon polymers under keV ion bombardment. In: International Journal of Mass Spectrometry, Vol. 184, no. 2-3, p. 217-231 (1999). doi:10.1016/S1387-3806(99)00012-3. http://hdl.handle.net/2078.1/62333

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Vickerman, J.C. ; Garrison, B.J.. Invited talk : How do large organic molecules sputter? Insights from ToF-SIMS and Molecular Dynamics simulations. 12th International Conference on Secondary Ion Mass Spectrometry (Brussels (Belgium), 09/1999). http://hdl.handle.net/2078.1/130239

  • Franquet, A. ; Terryn, H. ; Vereecken, Jean ; Bertrand, Patrick ; Delcorte, Arnaud. Study of non-functional silane coatings by means of complementary surface analysis methods (poster). 8th European Conference on Applications of Surface and Interface Analysis, ECASIA=99 (Sevilla, Spain, du 04/10/1998 au 08/10/1999). http://hdl.handle.net/2078.1/80480

  • 1998
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Bertrand, Patrick. Influence of chemical structure and beam degradation on the kinetic energy of molecular secondary ions in keV ion sputtering of polymers. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 135, no. 1-4, p. 430-435 (1998). doi:10.1016/S0168-583X(97)00652-6. http://hdl.handle.net/2078.1/62492

  • Delcorte, Arnaud ; Bertrand, Patrick. Sputtering of parent-like ions from large organic adsorbates on metals under keV ion bombardment. In: Surface Science, Vol. 413, p. 97-124 (1998). doi:10.1016/S0039-6028(98)00373-2. http://hdl.handle.net/2078.1/45062

  • Contribution à ouvrage collectif (Book Chapter)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Wischerhoff, Erik ; Laschewsky, André. Characterization of alternate polyelectrolyte thin films by ToF-SIMS and XPS. In: J.-J. Pireaux, J. Delhalle and P. Rudolf, ICPSI - 2, Polymer-Solid Interfaces : From Model to Real Systems, Presses Universitaires de Namur: Namur, 1998, p. 65-76. http://hdl.handle.net/2078.1/83737

  • Bertrand, Patrick ; Delcorte, Arnaud. Secondary molecular emission in static SIMS of organic materials. In: G. Gillen, R. Lareau, J. Bennett, F. Stevie, Secondary Ion Mass Spectrometry: SIMS XI, John Wiley & Sons: Chichester, 1998, p. 437-442. 0-471-97826-4. http://hdl.handle.net/2078.1/78816

  • Delcorte, Arnaud ; Bertrand, Patrick ; Wischerhoff, Erik ; Laschewsky, André. ToF-SIMS and XPS study of thin multilayered coatings realized by successive adsorption and functionalization of charged polymer layers. In: G. Gillen, R. Lareau, J. Bennett, F. Stevie, Secondary Ion Mass Spectrometry: SIMS XI, John Wiley & Sons Publs: New York, USA, 1998, p. 533-536. 0-471-97826-4. http://hdl.handle.net/2078.1/78813

  • Delcorte, Arnaud ; Bertrand, Patrick. Unimolecular dissociation of metastable secondary ions in SIMS of polymers. In: G. Gillen, R. Lareau, J. Bennett, F. Stevie, Secondary Ion Mass Spectrometry: SIMS XI, J. Wiley & Sons publs.: New York, USA, 1998, p. 447-450. 0-471-97826-4. http://hdl.handle.net/2078.1/78809

  • 1997
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Wischerhoff, Erik ; Laschewsky, A.. Adsorption of polyelectrolyte multilayers on polymer surfaces. In: Langmuir : the A C S journal of surfaces and colloids, Vol. 13, no. 19, p. 5125-5136 (1997). doi:10.1021/la970105o. http://hdl.handle.net/2078.1/46022

  • Delcorte, Arnaud ; Bertrand, Patrick. Energy Distributions of Molecular Secondary Ion from Polymer Thin Films under keV Ion Bombardment. In: SIMS X proceedings, p. 731-734 (1997). http://hdl.handle.net/2078.1/83794

  • Laschewsky, A. ; Wischerhoff, Erik ; Denzinger, S ; Ringsdorf, H ; Delcorte, Arnaud ; Bertrand, Patrick. Molecular recognition by hydrogen bonding in polyelectrolyte multilayers. In: Chemistry: A European Journal, Vol. 3, no. 1, p. 34-38 (1997). doi:10.1002/chem.19970030107. http://hdl.handle.net/2078.1/46311

  • Hendlinger, P. ; Laschewsky, A. ; Bertrand, Patrick ; Delcorte, Arnaud ; Legras, Roger ; Nysten, Bernard ; Mobius, D. Partially fluorinated maleimide copolymers for Langmuir films of improved stability .2. Spreading behavior and multilayer formation. In: Langmuir : the A C S journal of surfaces and colloids, Vol. 13, no. 2, p. 310-319 (1997). doi:10.1021/la960639+. http://hdl.handle.net/2078.1/46538

  • Laschewsky, A. ; Wischerhoff, Erik ; Bertrand, Patrick ; Delcorte, Arnaud. Polyelectrolyte multilayers containing photoreactive groups. In: Macromolecular Chemistry and Physics, Vol. 198, no. 10, p. 3239-3253 (1997). doi:10.1002/macp.1997.021981021. http://hdl.handle.net/2078.1/45898

  • Delcorte, Arnaud ; Segda, BG ; Bertrand, Patrick. ToF-SIMS analyses of polystyrene and dibenzanthracene: Evidence for fragmentation and metastable decay processes in molecular secondary ion emission. In: Surface Science, Vol. 381, no. 1, p. 18-32 (1997). doi:10.1016/S0039-6028(97)00070-8. http://hdl.handle.net/2078.1/46186

  • Delcorte, Arnaud ; Segda, BG ; Bertrand, Patrick. ToF-SIMS analyses of polystyrene and dibenzanthracene: Evidence of the fragmentation and metastable decay processes in the molecular secondary ion emission (vol 381, pg 18, 1997). In: Surface Science, Vol. 389, no. 1-3, p. 393-394 (1997). doi:10.1016/S0039-6028(97)00468-8. http://hdl.handle.net/2078.1/45866

  • Communication à un colloque (Conference Paper)
  • Bertrand, Patrick ; Delcorte, Arnaud. Secondary molecular ion emission in static SIMS of organic materials. 11th International Conference on Secondary Ion Mass Spectrometry (Orlando (U.S.A.), 09/1997). http://hdl.handle.net/2078.1/130240

  • 1996
    Article de périodique (Journal article)
  • Laschewsky, A. ; Mayer, B. ; Wischerhoff, Erik ; Arys, X ; Bertrand, Patrick ; Delcorte, Arnaud ; Jonas, Alain. A new route to thin polymeric, non-centrosymmetric coatings. In: Thin Solid Films, Vol. 284-285, p. 334-337 (1996). doi:10.1016/S0040-6090(95)08336-7. http://hdl.handle.net/2078.1/62829

  • Delcorte, Arnaud ; Bertrand, Patrick. Energy distributions of hydrocarbon secondary ions from thin organic films under keV ion bombardment: Correlation between kinetic and formation energy of ions sputtered from tricosenoic acid. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 117, no. 3, p. 235-242 (1996). doi:10.1016/0168-583X(96)00306-0. http://hdl.handle.net/2078.1/46933

  • Delcorte, Arnaud ; Bertrand, Patrick. Kinetic energy distributions of secondary molecular ions from thin organic films under ion bombardment. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 115, no. 1-4, p. 246-250 (1996). http://hdl.handle.net/2078.1/62875

  • Delcorte, Arnaud ; Bertrand, Patrick ; Arys, X ; Jonas, Alain ; Wischerhoff, Erik ; Mayer, B. ; Laschewsky, A.. ToF-SIMS study of alternate polyelectrolyte thin films: Chemical surface characterization and molecular secondary ions sampling depth. In: Surface Science, Vol. 366, no. 1, p. 149-165 (1996). doi:10.1016/0039-6028(96)00779-0. http://hdl.handle.net/2078.1/46897

  • 1995
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Weng, L.T. ; Bertrand, Patrick. Secondary Molecular Ion Emission From Aliphatic Polymers Bombarded With Low-energy Ions - Effects of the Molecular-structure and the Ion-beam-induced Surface Degradation. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 100, no. 2-3, p. 213-216 (1995). http://hdl.handle.net/2078.1/63105


  • Biographie


    Diplômes

    année

    intitulé

    établissement

    1990Candidat ingénieur civilUniversité catholique de Louvain
    1993Ingénieur civil - orientation sciences des matériauxUniversité catholique de Louvain
    1999Docteur en sciences appliquéesUniversité catholique de Louvain



    Enseignement


    Cours

    Année académique 2014 - 2015
    LMAPR 2011 Methods of Physical and Chemical Analysis
    LMAPR 2631 Analyse et traitement des surfaces solides



    Publications


    2014
    Article de périodique (Journal article)
  • Wehbe, N. ; Mouhib, Taoufiq ; Delcorte, Arnaud ; Bertrand, Patrick ; Moellers, R. ; Niehuis, E. ; Houssiau, L.. Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers. In: Analytical and Bioanalytical Chemistry, Vol. 406, p. 201-211 (2014). doi:10.1007/s00216-013-7408-x. http://hdl.handle.net/2078.1/139485

  • Wahoud, Fouad ; Guillot, J. ; Audinot, J.N. ; Bertrand, Patrick ; Delcorte, Arnaud ; Migeon, H.N.. Dielectric breakdown during Cs+ sputtering of polyvinyl chloride. In: Applied Surface Science, Vol. 293, p. 85-89 (2014). doi:10.1016/j.apsusc.2013.12.104. http://hdl.handle.net/2078.1/145929

  • Mesfin, Henok Mebratie ; Baudouin, Anne-Christine ; hermans, sophie ; Delcorte, Arnaud ; Huynen, Isabelle ; Bailly, Christian. Frequency selective microwave absorption induced by controlled orientation of graphene-like nanoplatelets in thin polymer films. In: Applied Physics Letters, (2014) (Accepté/Sous presse). http://hdl.handle.net/2078.1/150373

  • Vidick, D. ; Leonard, A.F. ; Poleunis, Claude ; Delcorte, Arnaud ; Devillers, Michel ; Hermans, Sophie. Phosphine- and ammonium-functionalized ordered mesoporous carbons as supports for cluster-derived metal nanoparticles. In: Catalysis Today, Vol. 235, p. 112-126 (2014). http://hdl.handle.net/2078.1/150057

  • Lebec, Victor ; Boujday, S. ; Poleunis, Claude ; Pradier, C.-M. ; Delcorte, Arnaud. Time-of-flight secondary ion mass spectrometry investigation of the orientation of adsorbed antibodies on sams correlated to biorecognition tests. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 118, no.4, p. 2085-2092 (2014). doi:10.1021/jp410845g. http://hdl.handle.net/2078.1/145931

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud. Invited talk : Apport des agrégats massifs d’Ar pour l’analyse chimique de films minces organiques. 6ème conférence francophone sur les spectroscopies d'électrons (Fès (Morocco), 05/2014). http://hdl.handle.net/2078.1/145939

  • Delcorte, Arnaud. Invited talk : Fundamentals of soft matter desorption by large Ar clusters. SIMS Europe 2014 (Münster (Germany), 09/2014). http://hdl.handle.net/2078.1/145942

  • Delcorte, Arnaud. Keynote lecture : (Massive) cluster bombardment of organics: molecular dynamics, sputtering yields, chemistry. 26th Annual Workshop on Secondary Ion Mass Spectrometry (National Harbor, Maryland (USA), 05/2014). http://hdl.handle.net/2078.1/139583

  • 2013
    Article de périodique (Journal article)
  • Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud. Argon cluster sputtering of a hybrid metal-organic surface: A microscopic view. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 117, no.2, p. 1189-1196 (2013). doi:10.1021/jp3110503. http://hdl.handle.net/2078.1/125151

  • Poleunis, Claude ; Dupont-Gillain, Christine C. ; Demoustier-Champagne, Sophie ; Delcorte, Arnaud ; Kalaskar, Deepak. Characterisation of protein nanotubes by ToF-SIMS imaging. In: Surface and Interface Analysis, Vol. 45, p. 333-337 (2013). doi:10.1002/sia.5037. http://hdl.handle.net/2078.1/120724

  • Delcorte, Arnaud ; van Hoecke, E. ; Restrepo-Gutiérrez, Oscar Antonio. Cluster-induced desorption from metal organic surfaces: Structural effects. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 303, p. 174-178 (2013). doi:10.1016/j.nimb.2012.10.039. http://hdl.handle.net/2078.1/130082

  • Vidick, Deborah ; Herlitschke, Marcus ; Poleunis, Claude ; Delcorte, Arnaud ; Hermann, Raphael P. ; Devillers, Michel ; Hermans, Sophie. Comparison of functionalized carbon nanofibers and multi-walled carbon nanotubes as supports for Fe–Co nanoparticles. In: Journal of Materials Chemistry A, Vol. 1, no.6, p. 2050-2063 (2013). doi:10.1039/c2ta00131d. http://hdl.handle.net/2078.1/125410

  • Restrepo-Gutiérrez, Oscar Antonio ; Gonze, Xavier ; Bertrand, Patrick ; Delcorte, Arnaud. Computer simulations of cluster impacts : effect of the atomic masses of the projectile and target. In: Physical Chemistry Chemical Physics, Vol. 15, p. 7621-7627 (25 Feb 2013). doi:10.1039/C3CP50346A. http://hdl.handle.net/2078.1/129183

  • Delcorte, Arnaud ; Leblanc, Ch. ; Poleunis, Claude ; Hamraoui, K.. Computer simulations of the sputtering of metallic, organic, and metal-organic surfaces with Bin and C60 projectiles. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 117, no.6, p. 2740-2752 (2013). doi:10.1021/jp308411r. http://hdl.handle.net/2078.1/125141

  • Lherbier, Aurélien ; Roche, Stephan ; Restrepo-Gutiérrez, Oscar Antonio ; Niquet, Yann-Michel ; Delcorte, Arnaud ; Charlier, Jean-Christophe. Highly defective graphene: A key prototype of two-dimensional Anderson insulators. In: Nano Research, Vol. 0, no. 0, p. 1-9- (2013). doi:10.1007/s12274-013-0309-7. http://hdl.handle.net/2078.1/128185

  • Havelund, R. ; Licciardello, A. ; Bailey, J. ; Tuccitto, N. ; Sapuppo, D. ; Gilmore, I.S. ; Sharp, J.S. ; Lee, J.L.S. ; Mouhib, Taoufiq ; Delcorte, Arnaud. Improving secondary ion mass spectrometry C60 n+ sputter depth profiling of challenging polymers with nitric oxide gas dosing. In: Analytical Chemistry, Vol. 85, no.10, p. 5064-5070 (2013). doi:10.1021/ac4003535. http://hdl.handle.net/2078.1/130164

  • Nittler, L. ; Delcorte, Arnaud ; Bertrand, Patrick ; Migeon, H.-N.. Insights into the yield enhancement and ion emission process in metal-assisted SIMS. In: Surface and Interface Analysis, Vol. 45, no.1, p. 18-21 (2013). doi:10.1002/sia.5045. http://hdl.handle.net/2078.1/125248

  • Debord, J.D. ; Prabhakaran Nair Syamala Amma, Aneesh ; Eller, M.J. ; Verkhoturov, S.V. ; Delcorte, Arnaud ; Schweikert, E.A.. Metal-assisted SIMS with hypervelocity gold cluster projectiles. In: International Journal of Mass Spectrometry, Vol. 343-344, p. 28-36 (2013). doi:10.1016/j.ijms.2013.03.012. http://hdl.handle.net/2078/130088

  • Mouhib, T. ; Poleunis, Claude ; Wehbe, N. ; Michels, J. J. ; Galagan, Y. ; Houssiau, L. ; Bertrand, Patrick ; Delcorte, Arnaud. Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams. In: The Analyst, Vol. 138, no.22, p. 6801-6810 (2013). doi:10.1039/c3an01035j. http://hdl.handle.net/2078.1/139512

  • Czerwinski, Bartlomiej Piotr ; Delcorte, Arnaud. Molecular dynamics study of fullerite cross-linking under keV C 60 and Arn cluster bombardment. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 117, no.7, p. 3595-3604 (2013). doi:10.1021/jp310635g. http://hdl.handle.net/2078.1/125971

  • Czerwinski, Bartlomiej Piotr ; Postawa, Zbigniew ; Garrison, Barbara J. ; Delcorte, Arnaud. Molecular dynamics study of polystyrene bond-breaking and crosslinking under C60 and Arn cluster bombardment. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 303, p. 22-26 (2013). doi:10.1016/j.nimb.2012.11.030. http://hdl.handle.net/2078.1/130041

  • Mouhib, Taoufiq ; Poleunis, Claude ; Möllers, R. ; Niehuis, E. ; Defrance, Pierre ; Bertrand, Patrick ; Delcorte, Arnaud. Organic depth profiling of C60 and C60/phthalocyanine layers using argon clusters. In: Surface and Interface Analysis, Vol. 45, no.1, p. 163-166 (2013). doi:10.1002/sia.5052. http://hdl.handle.net/2078.1/125257

  • Mouhib, Taoufiq ; Delcorte, Arnaud ; Poleunis, Claude ; Bertrand, Patrick. Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection. In: Surface and Interface Analysis, Vol. 45, no.1, p. 46-49 (2013). doi:10.1002/sia.5043. http://hdl.handle.net/2078.1/125179

  • Hubert, J. ; Poleunis, Claude ; Delcorte, Arnaud ; Laha, P. ; Bossert, J. ; Lambeets, S. ; Ozkan, A. ; Bertrand, P. ; Terryn, H. ; Reniers, F.. Plasma polymerization of C4Cl6 and C 2H2Cl4 at atmospheric pressure. In: Polymer, Vol. 54, no.16, p. 4085-4092 (2013). doi:10.1016/j.polymer.2013.05.068. http://hdl.handle.net/2078.1/138874

  • Lebec, Victor ; Landoulsi, J. ; Boujday, S. ; Poleunis, Claude ; Pradier, C.-M. ; Delcorte, Arnaud. Probing the orientation of β-lactoglobulin on gold surfaces modified by alkyl thiol self-assembled monolayers. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 117, no.22, p. 11569-11577 (2013). doi:10.1021/jp311964g. http://hdl.handle.net/2078.1/139511

  • Delcorte, Arnaud ; Restrepo-Gutiérrez, Oscar Antonio ; Czerwinski, Bartlomiej Piotr ; Garrison, B.J.. Surface sputtering with nanoclusters: The relevant parameters. In: Surface and Interface Analysis, Vol. 45, no.1, p. 9-13 (2013). doi:10.1002/sia.4926. http://hdl.handle.net/2078.1/125252

  • Wehbe, N. ; Tabarrant, T. ; Brison, J. ; Mouhib, Taoufiq ; Delcorte, Arnaud ; Bertrand, Patrick ; Moellers, R. ; Niehuis, E. ; Houssiau, L.. TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn. In: Surface and Interface Analysis, Vol. 45, no. 1, p. 178-180 (2013). doi:10.1002/sia.5121. http://hdl.handle.net/2078.1/125255

  • Delcorte, Arnaud ; Garrison, B.J.. Water nanodroplet impacts on surfaces: Effect of the substrate nature. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 303, p. 179–183 (2013). doi:10.1016/j.nimb.2012.10.029. http://hdl.handle.net/2078.1/130081

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud. Invited talk : Cluster-induced sputtering: Microscopic models and universal velocity dependences. 19th International Conference on Secondary Ion Mass Spectrometry (SIMS XIX), (September 2013). (Jeju (Korea), 09/2013). http://hdl.handle.net/2078.1/139579

  • Delcorte, Arnaud. Invited talk : Massive clusters for surface analysis: A microscopic view. 6th International Symposium on Practical Surface Analysis - PSA-13 (Naha city, Okinawa (Japan), 11/2013). http://hdl.handle.net/2078.1/139580

  • Delcorte, Arnaud. Invited talk : Soft sputtering with supercluster beams: From nanoimpacts to molecular tomography. Particle-surface interactions: from surface analysis to materials processing-PASI 2013 (Luxemburg city (Luxemburg), du 03/06/2013 au 05/06/2013). http://hdl.handle.net/2078/126882

  • Delcorte, Arnaud. Invited talk : Supercluster beams: From nanocraters to new frontiers in 3D molecular imaging. AnalytiX 2013, 2nd Annual Conference and EXPO (Suzhou (China), du 21/03/2013 au 23/03/2013). http://hdl.handle.net/2078.1/129284

  • Contribution à ouvrage collectif (Book Chapter)
  • Delcorte, Arnaud ; Restrepo-Gutiérrez, Oscar Antonio ; Czerwinski, Bartlomiej Piotr. Cluster SIMS of organic materials: Theoretical insights. In: Ch. Mahoney, Cluster Secondary Ion Mass Spectrometry: Principles and Applications (Wiley series on mass spectrometry), John Wiley & Sons, Inc.: Hoboken, NJ, USA, 2013, p. 13-55. 978-0-470-88605-2. http://hdl.handle.net/2078.1/129115

  • Delcorte, Arnaud. Fundamentals of organic SIMS: insights from experiments and models. In: John C. Vickerman and David Briggs, ToF-SIMS: Surface Analysis by Mass Spectrometry, 2nd Edition, SurfaceSpectra Ltd/IM Publications: Manchester, 2013, p. 37. 978-1-906715-17-5. doi:10.1255/tofch4 (Accepté/Sous presse). http://hdl.handle.net/2078.1/129111

  • 2012
    Article de périodique (Journal article)
  • Desmet, T. ; Poleunis, Claude ; Delcorte, Arnaud ; Dubruel, Peter. Double protein functionalized poly-ε-caprolactone surfaces: in depth ToF–SIMS and XPS characterization. In: Journal of Materials Science: Materials in Medicine, Vol. 23, no. 2, p. 293-305. doi:10.1007/s10856-011-4527-9. http://hdl.handle.net/2078.1/107509

  • Prabhakaran Nair Syamala Amma, Aneesh ; Yin, Jun ; Nysten, Bernard ; Degand, Hervé ; Morsomme, Pierre ; Mouhib, Taoufiq ; Yunus, Sami ; Bertrand, Patrick ; Delcorte, Arnaud. Metal condensates for low-molecular-weight matrix-free laser desorption/ionization. In: International Journal of Mass Spectrometry, Vol. 315, p. 22-30 (2012). doi:10.1016/j.ijms.2012.02.009. http://hdl.handle.net/2078.1/110342

  • Nittler, L. ; Delcorte, Arnaud ; Bertrand, Patrick ; Migeon, H.-N.. Morphology study of small amounts of evaporated gold on polymers. In: Surface and Interface Analysis, Vol. 44, no.8, p. 1072-1075 (2012). doi:10.1002/sia.4866. http://hdl.handle.net/2078.1/124557

  • Amalric, Julien ; Poleunis, Claude ; Delcorte, Arnaud ; Marchand-Brynaert, Jacqueline. Static SIMS study on surfaces of chalcogenide glasses modified by an organic layer. In: Surface Science, Vol. 606, no./, p. 1071-1077 (2012). doi:10.1016/j.susc.2012.03.005. http://hdl.handle.net/2078.1/124632

  • Communication à un colloque (Conference Paper)
  • Lherbier, Aurélien ; Roche, Stephan ; Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud ; Niquet, Yann-Michel ; Charlier, Jean-Christophe. Highly Defective Graphene: An Anderson insulating membrane.. APS March Meeting, 2012 (Boston, United-States, du 27/02/2012 au 02/03/2012). http://hdl.handle.net/2078/121316

  • Delcorte, Arnaud. Invited talk : 3D molecular analysis by secondary ion mass spectrometry: New frontiers. Colloque commun de la division de Physique Atomique et Moléculaire et Optique de la SFP et des Journées de Spectroscopie Moléculaire, PAMO-JSM (Metz (France), 00/07/2012). http://hdl.handle.net/2078.1/129288

  • Delcorte, Arnaud. Invited talk : High-resolution 3D molecular analysis by cluster ToF-SIMS: The new frontiers. European Materials Research Society 2012 Fall Meeting (Warsaw (Poland), 00/09/2012). http://hdl.handle.net/2078.1/129286

  • Delcorte, Arnaud. Invited talk : Kiloelectronvolt cluster bombardment of organic materials: Experiments and simulations. Joint IAEA-SPIRIT-Japan Technical Meeting on Development and Utilization of MeV-SIMS (Dubrovnik (Croatia), 05/2012). http://hdl.handle.net/2078.1/129292

  • Delcorte, Arnaud. Invited talk : Massive cluster sputtering of organic and nanocomposite materials. 14th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS 14) (Tokyo (Japan), 00/06/2012). http://hdl.handle.net/2078.1/129291

  • Delcorte, Arnaud. Invited talk : Molecular surface analysis by secondary ion mass spectrometry: Going 3D. 12ème journée scientifique du GFP section grand Est (Besançon (France), 00/06/2012). http://hdl.handle.net/2078.1/129290

  • Lherbier, Aurélien ; Roche, Stephan ; Dubois, Simon M.-M. ; Declerck, Xavier ; Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud ; Niquet, Yann-Michel ; Charlier, Jean-Christophe. Simulation of electronic transport in defective graphene. From point defects to amorphous structures.. GRAPHENE 2012 International Conference (Bruxelles, du 09/04/2012 au 13/04/2012). http://hdl.handle.net/2078.1/121168

  • Lherbier, Aurélien ; Roche, Stephan ; Dubois, Simon M.-M. ; Declerck, Xavier ; Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud ; Niquet, Yann-Michel ; Charlier, Jean-Christophe. Simulation of electronic transport in defective graphene. From point defects to amorphous structures.. 17th ETSF Workshop on ElectronicExcitations. Advanced Green function methods (Coimbra, Portugal, du 01/10/2012 au 05/10/2012). http://hdl.handle.net/2078/121314

  • Lherbier, Aurélien ; Roche, Stephan ; Dubois, Simon M.-M. ; Declerck, Xavier ; Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud ; Niquet, Yann-Michel ; Charlier, Jean-Christophe. Simulation of electronic transport in defective graphene. From point defects to amorphous structures.. Young Researcher Meeting YRM 2012, ETSF meeting series (Bruxelles, Belgium, du 21/05/2012 au 25/05/2012). http://hdl.handle.net/2078/121315

  • Contribution à ouvrage collectif (Book Chapter)
  • Mouhib, Taoufiq ; Delcorte, Arnaud. SIMS for Organic Film Analysis. In: M. S. Lee, Mass Spectrometry Handbook, John Wiley & Sons, Inc.: Hoboken, NJ, USA, 2012, p. 961-1015. doi:10.1002/9781118180730.ch42. http://hdl.handle.net/2078.1/126058

  • 2011
    Article de périodique (Journal article)
  • Willocq, Christopher ; Vidick, Deborah ; Tinant, Bernard ; Delcorte, Arnaud ; Bertrand, Patrick ; Devillers, Michel ; Hermans, Sophie. Anchoring of Ru–Pt and Ru–Au Clusters onto a Phosphane-Functionalized Carbon Support. In: European Journal of Inorganic Chemistry, Vol. 2011, no. 30, p. 4721-4729 (2011). doi:10.1002/ejic.201100384. http://hdl.handle.net/2078.1/107496

  • Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud. Au400 Sputtering of a Polymer with Adsorbed Metal Nanoparticles: A Molecular Dynamics Study. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interface, Vol. 115, no. 26, p. 12751-12759 (2011). doi:10.1021/jp201183a. http://hdl.handle.net/2078.1/95063

  • Mouhib, Taoufiq ; Bertrand, Patrick ; Poleunis, Claude ; Delcorte, Arnaud. C-60 molecular depth profiling of bilayered polymer films using ToF-SIMS. In: Surface and Interface Analysis, Vol. 43, no. 1-2, p. 175-178 (2011). doi:10.1002/sia.3539. http://hdl.handle.net/2078.1/76173

  • Delcorte, Arnaud ; Garrison, Barbara J. Desorption of large molecules with light-element clusters: Effects of cluster size and substrate nature. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 269, no. 14, p. 1572-1577 (15 July 2011). doi:10.1016/j.nimb.2010.11.023. http://hdl.handle.net/2078.1/95084

  • Restrepo-Gutiérrez, Oscar Antonio ; Prabhakaran Nair Syamala Amma, Aneesh ; Delcorte, Arnaud. Interaction of energetic clusters (Au3, Au400 and C60) with organic material and adsorbed gold nanoparticles. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 269, no. 14, p. 1595-1599 (15 July 2011). doi:10.1016/j.nimb.2010.11.014. http://hdl.handle.net/2078.1/95075

  • Nittler, Laurent ; Delcorte, Arnaud ; Bertrand, Patrick ; Migeon, Henry-Noël. Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMS. In: Surface and Interface Analysis, Vol. 43, no. 1-2, p. 103-106 (2011). doi:10.1002/sia.3425. http://hdl.handle.net/2078.1/76177

  • Restrepo-Gutiérrez, Oscar Antonio ; Delcorte, Arnaud. Molecular dynamics study of metal-organic samples bombarded by kiloelectronvolt projectiles. In: Surface and Interface Analysis, Vol. 43 , no. 1-2, p. 70–73 (2011). doi:10.1002/sia.3411. http://hdl.handle.net/2078.1/95085

  • Prabhakaran Nair Syamala Amma, Aneesh ; Yunus, Sami ; Wehbe, Nimer ; Bertrand, Patrick ; Delcorte, Arnaud. Secondary ion yield enhancement in organic samples due to Au/Pt nanoparticle condensation and their substrate effects. In: Surface and Interface Analysis, Vol. 43, no. 1-2, p. 74-77 (2011). doi:10.1002/sia.3477. http://hdl.handle.net/2078.1/76178

  • Delcorte, Arnaud ; Garrison, B.J. ; Hamraoui, K.. Sputtering soft materials with molecular projectiles: A microscopic view. In: Surface and Interface Analysis, Vol. 43, p. 16–19 (2011). doi:10.1002/sia.3405. http://hdl.handle.net/2078.1/95086

  • Wahoud, Fouad ; Mouhib, Taoufiq ; Audinot, J.N. ; Delcorte, Arnaud ; Migeon, H.N.. Study of charge effect during Cs+ sputtering of polystyrene in the pre-equilibrium regime. In: Surface and Interface Analysis, Vol. 43 , p. 201–203 (2011). doi:10.1002/sia.3419. http://hdl.handle.net/2078.1/95087

  • Reckinger, Nicolas ; Poleunis, Claude ; Dubois, Emmanuel ; Dutu, Constantin Augustin ; Tang, Xiaohui ; Delcorte, Arnaud ; Raskin, Jean-Pierre. Very low effective Schottky barrier height for erbium disilicide contacts on n-Si through arsenic segregation. In: Applied Physics Letters, Vol. 99, no. 1, p. 012110 (1-3) (16/06/2011). doi:10.1063/1.3608159. http://hdl.handle.net/2078.1/84993

  • Communication à un colloque (Conference Paper)
  • Poleunis, Claude ; Dupont-Gillain, Christine C. ; Demoustier-Champagne, Sophie ; Delcorte, Arnaud ; Kalaskar, Deepak. Characterization of protein nanotubes by ToF-SIMS imaging.. 18th International Conference on Secondary Ion Mass Spectroscopy, SIMS XVIII (Trentino (Italy), du 18/09/2011 au 23/09/2011). http://hdl.handle.net/2078.1/145000

  • Delcorte, Arnaud. Invited talk : Clusters for organic mass spectrometry: From small and hard to huge and soft. Annual Workshop on Secondary Ion Mass Spectrometry (Baltimore, Maryland (USA), 05/2011). http://hdl.handle.net/2078.1/129295

  • Delcorte, Arnaud. Invited talk : Surface sputtering with nanoclusters: The relevant parameters. 18th International Conference on Secondary Ion Mass Spectrometry (SIMS XVIII) (Riva del Garda (Italy), 09/2011). http://hdl.handle.net/2078.1/129294

  • 2010
    Article de périodique (Journal article)
  • Mouhib, Taoufiq ; Delcorte, Arnaud ; Poleunis, Claude ; Henry, Marie ; Bertrand, Patrick. C-60 SIMS depth profiling of bovine serum albumin protein-coating films: a conformational study. In: Surface and Interface Analysis, Vol. 42, no. 6-7, p. 641-644 (2010). doi:10.1002/sia.3349. http://hdl.handle.net/2078.1/58488

  • Hamraoui, Karim ; Delcorte, Arnaud. Effects of Molecular Orientation and Size in Sputtering of Model Organic Crystals. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 114, no. 12, p. 5458-5467 (2010). doi:10.1021/jp906004v. http://hdl.handle.net/2078.1/34024

  • Restrepo-Gutiérrez, Oscar Antonio ; Prabhakaran Nair Syamala Amma, Aneesh ; Hamraoui, Karim ; Wehbe, Nimer ; Yunus, Sami ; Bertrand, Patrick ; Delcorte, Arnaud. Mechanisms of metal-assisted secondary ion mass spectrometry: a mixed theoretical and experimental study. In: Surface and Interface Analysis, Vol. 42, no. 6-7, p. 1030-1034 (2010). doi:10.1002/sia.3203. http://hdl.handle.net/2078.1/58724

  • Mouhib, Taoufiq ; Delcorte, Arnaud ; Poleunis, Claude ; Bertrand, Patrick. Organic Secondary Ion Mass Spectrometry: Signal Enhancement by Water Vapor Injection. In: Journal of the american society for mass spectrometry, Vol. 21, no. 12, p. 2005-2010 (2010). doi:10.1016/j.jasms.2010.08.013. http://hdl.handle.net/2078.1/76235

  • Delcorte, Arnaud ; Bertrand, Patrick ; Garrison, B. J. ; Hamraoui, Karim ; Mouhib, Taoufiq ; Restrepo, O. A. ; Santos, C. N. ; Yunus, Sami. Probing soft materials with energetic ions and molecules: from microscopic models to the real world. In: Surface and Interface Analysis, Vol. 42, no. 8, p. 1380-1386 (2010). doi:10.1002/sia.3270. http://hdl.handle.net/2078.1/33616

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud. Invited talk : Interaction of energetic cluster with organic solids: From molecular dynamics to 3D molecular analysis. 4è Congrès International Physique des Interactions Rayonnement-Matière (Dakhla (Morocco), 04/2010). http://hdl.handle.net/2078.1/129299

  • Delcorte, Arnaud. Invited talk : Mechanisms of molecular desorption upon small and massive cluster impacts: Insights from computer simulation. International Conference on Desorption 2010 (Seillac (France), 05/2010). http://hdl.handle.net/2078.1/129298

  • Delcorte, Arnaud. Invited talk : ToF-SIMS of organic and bio materials, from static analysis and imaging to 3D molecular analysis. Inaugural ToF-SIMS LEIS Workshop (Imperial College, London (UK), 24/11/2010). http://hdl.handle.net/2078.1/129297

  • Contribution à ouvrage collectif (Book Chapter)
  • Delcorte, Arnaud. Sputtering and Ionization Basics. In: D. Beauchemin and D. Matthews, The Encyclopedia of Mass Spectrometry Vol. 5, Elemental and Isotope Ratio Mass Spectrometry, Elsevier Science, 2010, p. 397-411. 0-08-043804-0. http://hdl.handle.net/2078.1/95088

  • 2009
    Article de périodique (Journal article)
  • Nieuwjaer, Nicolas ; Poleunis, Claude ; Delcorte, Arnaud ; Bertrand, Patrick. Depth profiling of polymer samples using Ga+ and C-60(+) ion beams. In: Surface and Interface Analysis, Vol. 41, no. 1, p. 6-10 (2009). doi:10.1002/sia.2931. http://hdl.handle.net/2078.1/59052

  • Delcorte, Arnaud ; Garrison, B J ; Hamraoui, Karim. Dynamics of molecular impacts on soft materials: from fullerenes to organic nanodrops.. In: Analytical Chemistry, Vol. 81, no. 16, p. 6676-6686 (2009). doi:10.1021/ac900746x. http://hdl.handle.net/2078.1/30691

  • Wehbe, Nimer ; Mouhib, Taoufiq ; Prabhakaran Nair Syamala Amma, Aneesh ; Bertrand, Patrick ; Delcorte, Arnaud. Influence of the Organic Layer Thickness in (Metal-Assisted) Secondary Ion Mass Spectrometry Using Ga(+) and C(60)(+) Projectiles.. In: Journal of the American society for mass spectrometry, Vol. 20, no. 12, p. 2294-2303 (2009). doi:10.1016/j.jasms.2009.08.022. http://hdl.handle.net/2078.1/24980

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud. Invited talk : Kiloelectronvolt molecular impacts on soft materials: From nanocraters to 3D chemical analysis. 9th workshop on Cluster Ion Beam Technology (Tokyo (Japan), 03/2009). http://hdl.handle.net/2078.1/129302

  • Delcorte, Arnaud. Invited talk : Sputtering soft materials with energetic molecules: From microscopic models to the real world. 7th International Symposium on Atomic Level Characterizations (Maui (USA), 12/2009). http://hdl.handle.net/2078.1/129300

  • Delcorte, Arnaud. Invited talk : Theoretical study of molecular impacts on organic surfaces: Effects of projectile size and target structure. 19th International Conference on Ion-Surface Interactions (ISI-2009) (Zvenigorod (Russia), 08/2009). http://hdl.handle.net/2078.1/129301

  • 2008
    Article de périodique (Journal article)
  • Dague, Etienne ; Delcorte, Arnaud ; Latgé, Jean-Paul ; Dufrêne, Yves. Combined use of atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry for cell surface analysis.. In: Langmuir : the A C S journal of surfaces and colloids, Vol. 24, no. 7, p. 2955-2959 (2008). doi:10.1021/la703741y. http://hdl.handle.net/2078.1/11267

  • Wehbe, Nimer ; Heile, Andreas ; Arlinghaus, Heinrich ; Bertrand, Patrick ; Delcorte, Arnaud. Effects of Metal Nanoparticles on the Secondary Ion Yields of a Model Alkane Molecule upon Atomic and Polyatomic Projectiles in Secondary Ion Mass Spectrometry.. In: Analytical Chemistry, Vol. 80, no. 16, p. 6235-6244 (2008). doi:10.1021/ac800568y. http://hdl.handle.net/2078.1/14123

  • Heile, A. ; Lipinsky, D. ; Wehbe, Nimer ; Delcorte, Arnaud ; Bertrand, Patrick ; Felten, Alexandre ; Houssiau, L. ; Pireaux, Jean-Jacques ; De Mondt, R. ; Van Royen, P. ; Van Vaeck, L. ; Arlinghaus, H. F.. Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples. In: Surface and Interface Analysis, Vol. 40, no. 3-4, p. 538-542 (2008). doi:10.1002/sia.2810. http://hdl.handle.net/2078.1/36618

  • De Mondt, Roel ; Van Vaeck, Luc ; Heile, Andreas ; Arlinghaus, Heinrich F. ; Nieuwjaer, Nicolas ; Delcorte, Arnaud ; Bertrand, Patrick ; Lenaerts, Jens ; Vangaever, Frank. Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions. In: Rapid Communications in Mass Spectrometry, Vol. 22, no. 10, p. 1481-1496 (2008). doi:10.1002/rcm.3533. http://hdl.handle.net/2078.1/36558

  • Heile, A. ; Lipinsky, D. ; Wehbe, Nimer ; Delcorte, Arnaud ; Bertrand, Patrick ; Felten, Alexandre ; Houssiau, L. ; Pireaux, Jean-Jacques ; De Mondt, R. ; Van Vaeck, L. ; Arlinghaus, H. F.. Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement. In: Applied Surface Science, Vol. 255, no. 4, p. 941-943 (2008). doi:10.1016/j.apsusc.2008.05.007. http://hdl.handle.net/2078.1/59431

  • Legent, G ; Delaune, A ; Norris, V ; Delcorte, Arnaud ; Gibouin, D ; Lefebvre, F. ; Misevic, G ; Thellier, M ; Ripoll, C. Method for Macromolecular Colocalization Using Atomic Recombination in Dynamic SIMS.. In: Russian Journal of Physical Chemistry B, Vol. 112, no. 17, p. 5534-5546 (2008). doi:10.1021/jp7100489. http://hdl.handle.net/2078.1/11366

  • Wehbe, Nimer ; Delcorte, Arnaud ; Heile, Andreas ; Arlinghaus, Heinrich F. ; Bertrand, Patrick. Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometry. In: Applied Surface Science, Vol. 255, no. 4, p. 824-827 (2008). doi:10.1016/j.apsusc.2008.05.068. http://hdl.handle.net/2078.1/59138

  • Delcorte, Arnaud. On the road to high-resolution 3D molecular imaging. In: Applied Surface Science, Vol. 255, no. 4, p. 954-958 (2008). doi:10.1016/j.apsusc.2008.05.111. http://hdl.handle.net/2078.1/59139

  • Delcorte, Arnaud ; Wehbe, Nimer ; Bertrand, Patrick ; Garrison, B. J.. Sputtering of organic molecules by clusters, with focus on fullerenes. In: Applied Surface Science, Vol. 255, no. 4, p. 1229-1234 (2008). doi:10.1016/j.apsusc.2008.05.107. http://hdl.handle.net/2078.1/35531

  • Communication à un colloque (Conference Paper)
  • Vidick, Deborah ; Willocq, Christopher ; Hermans, Sophie ; Delcorte, Arnaud ; Bertrand, Patrick ; Devillers, Michel. Chemical grafting of mixed-metal clusters on phosphine-functionalized active carbon for the preparation of supported nanoparticles (poster). 2nd EuChemS Chemistry Congress, Nanomaterials Session (Torino (Italy), du 16 au 20 September). http://hdl.handle.net/2078.1/91108

  • Delcorte, Arnaud. Invited talk : Molecular analysis of organic layers with fullerene beams: Fundamentals and applications. 17th International Conference on Inelastic Ion-Surface Collisions (IISC-17) (Porquerolles (France), 09/2008). http://hdl.handle.net/2078.1/129303

  • Willocq, Christopher ; Vidick, Deborah ; Hermans, Sophie ; Delcorte, Arnaud ; Bertrand, Patrick ; Dubois, Vincent ; Devillers, Michel. Molecular approach for the synthesis of supported nanoparticles on active carbon using noble metal clusters. Nanotechnology 2008: Materials, Fabrication, Particles, and Characterization. 2008 NSTI Nanotechnology Conference and Trade Show (Boston, MA, USA, 1-5 June 2008). In: Nanotechnology 2008: Materials, Fabrication, Particles, and Characterization. 2008 NSTI Nanotechnology Conference and Trade Show, Nano science and technology institute, 2008. 978-1-4200-8503-7, p. 807-810. http://hdl.handle.net/2078.1/67517

  • 2007
    Article de périodique (Journal article)
  • Yunus, Sami ; Delcorte, Arnaud ; Poleunis, Claude ; Bertrand, Patrick ; Bolognesi, Alberto ; Botta, Chiara. A route to self-organized honeycomb microstructured polystyrene films and their chemical characterization by ToF-SIMS imaging. In: Advanced Functional Materials, Vol. 17, no. 7, p. 1079-1084 (2007). doi:10.1002/adfm.200600470. http://hdl.handle.net/2078.1/37614

  • Yunus, Sami ; de Crombrugghe de Looringhe, C. ; Poleunis, Claude ; Delcorte, Arnaud. Diffusion of oligomers from polydimethylsiloxane stamps in microcontact printing: Surface analysis and possible application. In: Surface and Interface Analysis, Vol. 39, no. 12-13, p. 922-925 (2007). doi:10.1002/sia.2623. http://hdl.handle.net/2078.1/59357

  • Delcorte, Arnaud ; Yunus, Sami ; Wehbe, Nimer ; Nieuwjaer, Nicolas ; Poleunis, Claude ; Felten, Alexandre ; Houssiau, L. ; Pireaux, Jean-Jacques ; Bertrand, Patrick. Metal-assisted secondary ion mass spectrometry using atomic (Ga+, In+) and fullerene projectiles.. In: Analytical Chemistry, Vol. 79, no. 10, p. 3673-3689 (2007). doi:10.1021/ac062406l. http://hdl.handle.net/2078.1/10922

  • Delcorte, Arnaud ; Garrison, Barbara J.. Sputtering polymers with buckminsterfullerene projectiles: A Coarse-Grain molecular dynamics study. In: The Journal of Physical Chemistry Part C: Nanomaterials and Interfaces, Vol. 111, no. 42, p. 15312-15324 (2007). doi:10.1021/jp074536j. http://hdl.handle.net/2078.1/59518

  • Delcorte, Arnaud ; Garrison, Barbara J.. keV fullerene interaction with hydrocarbon targets: Projectile penetration, damage creation and removal. In: Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 255, no. 1, p. 223-228 (2007). doi:10.1016/j.nimb.2006.11.070. http://hdl.handle.net/2078.1/59652

  • Communication à un colloque (Conference Paper)
  • Willocq, Christopher ; Vidick, Deborah ; Hermans, Sophie ; Delcorte, Arnaud ; Bertrand, Patrick ; Devillers, Michel. Grafting of metal clusters on chemically functionalized active carbon for the synthesis of supported nanoalloys (poster). Faraday Discussions 138 - "Nanoalloys - From theory to Application" (Birmingham (UK), September). http://hdl.handle.net/2078.1/91126

  • Delcorte, Arnaud. Invited talk : Fullerene interactions with polymers: from fundamentals to surface analysis. 18th International Conference on Ion-Surface Interactions (ISI-2007) (Zvenigorod (Russia), 08/2007). http://hdl.handle.net/2078.1/129305

  • Delcorte, Arnaud. Invited talk : On the road to 3 D molecular imaging. 16th International Conference on Secondary Ion Mass Spectrometry (SIMS XVI) (Kanazawa (Japan), 10/2007). http://hdl.handle.net/2078.1/129306

  • Delcorte, Arnaud. Invited talk : Probing molecular solids and polymers with fullerenes: Computer simulations and chemical surface analysis, A. Delcorte,. 44th IUVTSA Workshop: Sputtering and Ion Emission by Cluster Ion Beams (Barony Castle (Scotland, UK), 04/2007). http://hdl.handle.net/2078.1/129313

  • 2006
    Article de périodique (Journal article)
  • Poleunis, Claude ; Everaert, Emmanuel P. ; Delcorte, Arnaud ; Bertrand, Patrick. Characterisation of human hair surfaces by means of static ToF-SIMS: A comparison between Ga+ and C-60(+) primary ions. In: Applied Surface Science, Vol. 252, no. 19, p. 6761-6764 (2006). doi:10.1016/j.apsusc.2006.02.174. http://hdl.handle.net/2078.1/59950

  • Poleunis, Claude ; Delcorte, Arnaud ; Bertrand, Patrick. Determination of organic contaminations on Si wafer surfaces by static ToF-SIMS: Improvement of the detection limit with C-60(+) primary ions. In: Applied Surface Science, Vol. 252, no. 19, p. 7258-7261 (2006). doi:10.1016/j.apsusc.2006.02.267. http://hdl.handle.net/2078.1/59952

  • Delcorte, Arnaud ; Poleunis, Claude ; Bertrand, Patrick. Energy distributions of atomic and molecular ions sputtered by C-60(+) projectiles. In: Applied Surface Science, Vol. 252, no. 19, p. 6542-6546 (2006). doi:10.1016/j.apsusc.2006.02.260. http://hdl.handle.net/2078.1/59947

  • Delcorte, Arnaud. Matrix-enhanced secondary ion mass spectrometry: The Alchemist's solution?. In: Applied Surface Science, Vol. 252, no. 19, p. 6582-6587 (2006). doi:10.1016/j.apsusc.2006.02.076. http://hdl.handle.net/2078.1/59948

  • Solomko, Vadim ; Verstraete, Matthieu J. ; Delcorte, Arnaud ; Garrison, B. J. ; Gonze, Xavier ; Bertrand, Patrick. Modeling the dissociation and ionization of a sputtered organic molecule. In: Applied Surface Science, Vol. 252, no. 19, p. 6459-6462 (2006). doi:10.1016/j.apsusc.2006.02.075. http://hdl.handle.net/2078.1/59945

  • Delcorte, Arnaud ; Poleunis, Claude ; Bertrand, Patrick. Stretching the limits of static SIMS with C-60(+). In: Applied Surface Science, Vol. 252, no. 19, p. 6494-6497 (2006). doi:10.1016/j.apsusc.2006.02.259. http://hdl.handle.net/2078.1/59946

  • Bertrand, Patrick ; Delcorte, Arnaud. Surface characterization of organic materials by ToF-SIMS: How to improve the sensitivity. In: American Chemical Society. Abstracts of Papers (at the National Meeting), Vol. 231 (2006). http://hdl.handle.net/2078.1/59955

  • Arezki, Bahia ; Delcorte, Arnaud ; Garrison, B J ; Bertrand, Patrick. Understanding gold-thiolate cluster emission from self-assembled monolayers upon kiloelectronvolt ion bombardment.. In: The Journal of Physical Chemistry Part B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, Vol. 110, no. 13, p. 6832-6840 (2006). doi:10.1021/jp058252f. http://hdl.handle.net/2078.1/10536

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud. Invited talk : Simulation of Mono- and Polyatomic Projectile Interactions with Molecular and Polymeric Surfaces. 8th International Conference Computer Simulation of Radiation Effects in Solids (COSIRES 2006) (Richland (USA), 06/2006). http://hdl.handle.net/2078.1/129314

  • Czerwinski, B. ; Delcorte, Arnaud ; Garrison, Bt ; Samson, R. ; Winograd, N. ; Postawa, Z.. Sputtering of thin benzene and polystyrene overlayers by keV Ga and C-60 bombardment. 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) (Univ Manchester, Manchester(England), du 12/09/2005 au 16/09/2005). In: Applied Surface Science, Vol. 252, no. 19, p. 6419-6422 (2006). doi:10.1016/j.apsusc.2006.02.002. http://hdl.handle.net/2078.1/59944

  • 2005
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Bertrand, Patrick. Metal salts for molecular ion yield enhancement in organic secondary ion mass spectrometry: a critical assessment.. In: Analytical Chemistry, Vol. 77, no. 7, p. 2107-2115 (2005). doi:10.1021/ac040158s. http://hdl.handle.net/2078.1/10149

  • Delcorte, Arnaud. Modeling keV particle interactions with molecular and polymeric samples. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 236, p. 1-10 (2005). doi:10.1016/j.nimb.2005.03.242. http://hdl.handle.net/2078.1/60923

  • Willocq, Christopher ; Delcorte, Arnaud ; Hermans, Sophie ; Bertrand, Patrick ; Devillers, Michel. Multitechnique investigation of the physisorption and thermal treatment of mixed-metal clusters on carbon.. In: The Journal of Physical Chemistry Part B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, Vol. 109, no. 19, p. 9482-9489 (2005). doi:10.1021/jp050560q. http://hdl.handle.net/2078.1/10653

  • Delcorte, Arnaud. Organic surfaces excited by low-energy ions: atomic collisions, molecular desorption and buckminsterfullerenes.. In: Physical Chemistry Chemical Physics, Vol. 7, no. 19, p. 3395-3406 (2005). doi:10.1039/b509238h. http://hdl.handle.net/2078.1/10380

  • Communication à un colloque (Conference Paper)
  • Aubriet, Frédéric ; Lourette, N. ; Muller, J.-F. ; Husson, Jérôme ; Beley, M. ; Willocq, Christopher ; Hermans, Sophie ; Devillers, Michel ; Delcorte, Arnaud ; Bertrand, Patrick. Capabilities of laser desorption mass spectrometry to characterize hybrid ruthenium complexes (poster). Journées Françaises de Spectrométrie de Masse (Montpellier, France, September). http://hdl.handle.net/2078.1/91410

  • Delcorte, Arnaud. Invited talk : Energy dissipation and molecular emission processes induced in organic surfaces by keV projectiles, including C60: Recent theoretical and experimental progress. 17th International Conference on Ion-Surface Interactions 2005 (ISI-2005) (Zvenigorod (Russia), 08/2005). http://hdl.handle.net/2078.1/129318

  • Delcorte, Arnaud. Invited talk : Interaction of keV monoatomic and fullerene ions with organic materials: Recent experiments and simulations. 5th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC'05) (Hawaii (USA), 12/2005). http://hdl.handle.net/2078.1/129315

  • Delcorte, Arnaud. Invited talk : Matrix Enhanced SIMS: The alchemist's solution?. 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) (Manchester (UK), 09/2005). http://hdl.handle.net/2078.1/129317

  • 2004
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Hermans, Sophie ; Devillers, Michel ; Lourette, N ; Aubriet, F ; Muller, JF ; Bertrand, Patrick. Desorption/ionization of molecular nanoclusters: SIMS versus MALDI. In: Applied Surface Science, Vol. 231-232, p. 131-135 (2004). doi:10.1016/j.apsusc.2004.03.092. http://hdl.handle.net/2078.1/61269

  • Arezki, Bahia ; Delcorte, Arnaud ; Bertrand, Patrick. Emission processes of molecule-metal cluster ions from self-assembled monolayers of octanethiols on gold and silver. In: Applied Surface Science, Vol. 231-2, p. 122-126 (2004). doi:10.1016/j.apsusc.2004.03.087. http://hdl.handle.net/2078.1/61268

  • Delcorte, Arnaud ; Bertrand, Patrick. Interest of silver and gold metallization for molecular SIMS and SIMS imaging. In: Applied Surface Science, Vol. 231-2, p. 250-255 (2004). doi:10.1016/j.apsusc.2004.03.029. http://hdl.handle.net/2078.1/61270

  • Delcorte, Arnaud ; Garrison, BJ. Kiloelectronvolt argon-induced molecular desorption from a bulk polystyrene solid. In: The Journal of Physical Chemistry Part B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, Vol. 108, no. 40, p. 15652-15661 (2004). doi:10.1021/jp0402131. http://hdl.handle.net/2078.1/39953

  • Solomko, Vadim ; Delcorte, Arnaud ; Garrison, BJ ; Bertrand, Patrick. Sputtering of a polycyclic hydrocarbon molecule: TOF-SIMS experiments and molecular dynamic simulations. In: Applied Surface Science, Vol. 231-2, p. 48-53 (2004). doi:10.1016/j.apsusc.2004.03.024. http://hdl.handle.net/2078.1/61267

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Garrison, B.J.. Invited talk : Insights into organic molecule emission: recent computer simulations and experiments. Nano-molecular Analysis for Emerging Technologies (Teddington (UK), 11/2004). http://hdl.handle.net/2078.1/129320

  • Delcorte, Arnaud. Invited talk : Modeling of low-energy ion interactions with molecular and polymeric samples. 6th International Symposium on Ionizing Radiation and Polymers (Houffalize (Belgium), 09/2004). http://hdl.handle.net/2078.1/130230

  • Delcorte, Arnaud. Invited talk : Surfaces locally excited by energetic particles: Energy transfer and molecular ejection. International workshop on materials under extreme conditions: experimental validation of atomistic modeling, at the European Centre for Atomic and Molecular Computations (CECAM) (Lyon (France), 05/2004). http://hdl.handle.net/2078.1/130231

  • Contribution à ouvrage collectif (Book Chapter)
  • Delcorte, Arnaud ; Befahy, Stéphane ; Poleunis, Claude ; Troosters, Michel ; Bertrand, Patrick. Improvement of metal adhesion to silicone films : a ToF-SIMS study. In: K.L. Mittal, Adhesion Aspects of Thin Films, Volume 2, VSP: MST Conferences (Firm), 2004, p. 155-167. 9789067644211. http://hdl.handle.net/2078.1/77668

  • 2003
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Garrison, BJ. A microscopic view of organic sample sputtering. In: Applied Surface Science, Vol. 203, p. 166-169 (2003). http://hdl.handle.net/2078.1/61621

  • Garrison, BJ ; Delcorte, Arnaud ; Zhigilei, L ; Itina, TE ; Krantzman, KD ; Yingling, YG ; McQuaw, CM ; Smiley, EJ ; Winograd, N.. Big molecule ejection - SIMS vs. MALDI. In: Applied Surface Science, Vol. 203, p. 69-71 (2003). http://hdl.handle.net/2078.1/61618

  • Arezki, Bahia ; Delcorte, Arnaud ; Chami, AC ; Garrison, BJ ; Bertrand, Patrick. Gold-thiolate cluster emission from SAMs under keV ion bombardment: Experiments and molecular dynamics simulations. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 212, p. 369-375 (2003). doi:10.1016/S0168-583X(03)01457-5. http://hdl.handle.net/2078.1/61444

  • Delcorte, Arnaud ; Arezki, Bahia ; Garrison, BJ. Matrix and substrate effects on the sputtering of a 2 kDa molecule: Insights from molecular dynamics. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 212, p. 414-419 (2003). doi:10.1016/S0168-583X(03)01492-7. http://hdl.handle.net/2078.1/61445

  • Wojciechowski, Igor ; Delcorte, Arnaud ; Gonze, Xavier ; Bertrand, Patrick. Mechanism of metal cationization in organic SIMS. In: Applied Surface Science, Vol. 203/204, p. 102-105 (2003). doi:10.1016/S0169-4332(02)00708-0. http://hdl.handle.net/2078.1/77737

  • Bertrand, Patrick ; Delcorte, Arnaud ; Garrison, BJ. Molecular SIMS for organic layers: new insights. In: Applied Surface Science, Vol. 203, p. 160-165 (2003). http://hdl.handle.net/2078.1/61620

  • Delcorte, Arnaud ; Garrison, BJ. Particle-induced desorption of kilodalton molecules embedded in a matrix: A molecular dynamics study. In: The Journal of Physical Chemistry Part B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, Vol. 107, no. 10, p. 2297-2310 (2003). doi:10.1021/jp022142g. http://hdl.handle.net/2078.1/41168

  • Delcorte, Arnaud ; Bour, J ; Aubriet, F ; Muller, J-F ; Bertrand, Patrick. Sample metallization for performance improvement in desorption/ionization of kilodalton molecules: quantitative evaluation, imaging secondary ion MS, and laser ablation.. In: Analytical chemistry, Vol. 75, no. 24, p. 6875-85 (2003). doi:10.1021/ac0302105. http://hdl.handle.net/2078.1/9690

  • Delcorte, Arnaud ; Wojciechowski, I. ; Gonze, Xavier ; Garrison, B.J. ; Bertrand, Patrick. The formation of single and double cationization of organic molecules in SIMS. In: Applied Surface Science, Vol. 203-204, p. 106-109 (2003). http://hdl.handle.net/2078.1/113047

  • Krantzman, KD ; Fenno, R ; Delcorte, Arnaud ; Garrison, BJ. Theoretical simulations of atomic and polyatomic bombardment of an organic overlayer on a metallic substrate. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 202, p. 201-205 (2003). doi:10.1016/S0168-583X(02)01858-X. http://hdl.handle.net/2078.1/61597

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud ; Hermans, Sophie ; Devillers, Michel ; Lourette, N. ; Aubriet, Frédéric ; Muller, J.-F. ; Bertrand, Patrick. Desorption / ionization of molecular nanoclusters : SIMS versus MALDI (poster). 14th International Conference on Secondary Ion Mass Spectrometry (SIMS XIV) (San Diego, USA, September). http://hdl.handle.net/2078.1/91458

  • Delcorte, Arnaud ; Befahy, S. ; Poleunis, Claude ; Troosters, M. ; Bertrand, Patrick. Invited talk : Adhesion improvement for metallized silicone films. International Symposium on Adhesion Aspects of Thin Films (Orlando (USA), 12/2003). http://hdl.handle.net/2078.1/130232

  • Delcorte, Arnaud ; Bertrand, Patrick ; Garrison, B.J.. Invited talk : Molecular dynamics for surface mass spectrometry. International workshop on reactive classical potentials versus hybrid methods: toward chemical complexity, at the European Centre for Atomic and Molecular Computations (CECAM) (Lyon (France), 06/2003). http://hdl.handle.net/2078.1/130233

  • 2002
    Article de périodique (Journal article)
  • Arezki, Bahia ; Delcorte, Arnaud ; Bertrand, Patrick. Kinetic energy distributions of molecular and cluster ions sputtered from self-assembled monolayers of octanethiol on gold. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 193, p. 755-761 (2004). http://hdl.handle.net/2078.1/61738

  • Garrison, B.J. ; Delcorte, Arnaud ; Krantzman, K.D.. Modeling sputtering of organic molecules. In: Izvestiâ Akademii nauk SSSR. Seriâ fizičeskaâ, Vol. 66, no.4, p. 472-474 (2002). http://hdl.handle.net/2078.1/130663

  • Delcorte, Arnaud ; Médard, N ; Bertrand, Patrick. Organic secondary ion mass spectrometry: sensitivity enhancement by gold deposition.. In: Analytical Chemistry, Vol. 74, no. 19, p. 4955-4968 (2002). doi:10.1021/ac020125h. http://hdl.handle.net/2078.1/9272

  • Delcorte, Arnaud ; Wojciechowski, I. ; Gonze, Xavier ; Garrison, BJ ; Bertrand, Patrick. Single and double cationization of organic molecules in SIMS. In: International Journal of Mass Spectrometry, Vol. 214, no. 2, p. 213-232 (2002). http://hdl.handle.net/2078.1/42070

  • Delcorte, Arnaud ; Arezki, Bahia ; Bertrand, Patrick ; Garrison, BJ. Sputtering kilodalton fragments from polymers. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 193, p. 768-774 (2002). http://hdl.handle.net/2078.1/61739

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud ; Garrison, B.J.. Keynote lecture : A microscopic view of organic SIMS. 15th Annual SIMS Workshop - Plenary Session. (Clearwater (Florida), du 04/2002 au 05/2002). http://hdl.handle.net/2078.1/130234

  • 2001
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Garrison, B.J.. Desorption of large organic molecules induced by keV projectiles. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 180, p. 37-43 (2001). http://hdl.handle.net/2078.1/126482

  • Delcorte, Arnaud ; Bertrand, Patrick ; Garrison, BJ. Collision cascade and sputtering process in a polymer. In: The Journal of Physical Chemistry Part B: Materials, Surfaces, Interfaces & Biophysical, Vol. 105, no. 39, p. 9474-9486 (2001). doi:10.1021/jp011099e. http://hdl.handle.net/2078.1/42483

  • Wojciechowski, I. ; Delcorte, Arnaud ; Gonze, Xavier ; Bertrand, Patrick. Mechanism of metal cationization in organic SIMS. In: Chemical Physics Letters, Vol. 346, no. 1-2, p. 1-8 (2001). doi:10.1016/S0009-2614(01)00931-9. http://hdl.handle.net/2078.1/42497

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud. Invited talk : Fundamentals of fragment ion emission (workshop). 13th International Conference on Secondary Ion Mass Spectrometry (Nara (Japan), 11/2001). http://hdl.handle.net/2078.1/130235

  • Delcorte, Arnaud. Invited talk : Molecular dynamics in organic SIMS. VIèmes Rencontres du Club Jeunes de la Société Française de Spectrométrie de Masse (Les Rives de Thau (France), 03/2001). http://hdl.handle.net/2078.1/130236

  • Contribution à ouvrage collectif (Book Chapter)
  • Delcorte, Arnaud. Fundamental aspects of organic SIMS. In: J.C. Vickerman, D. Briggs, ToF-SIMS: Surface Analysis by Mass Spectrometry, SurfaceSpectra Ltd/IM Publications: Manchester, 2001, p. 161-194. 1901019039. http://hdl.handle.net/2078.1/130665

  • 2000
    Article de périodique (Journal article)
  • Segda, B.G. ; Delcorte, Arnaud ; Bertrand, Patrick. Application de ToF-SIMS à l'étude des surfaces de polymères: cas du polystyrène, dibenzanthracène et triacontane. In: J. Soc. Ouest-Afr. Chim., Vol. 10, p. 51-73 (2000). http://hdl.handle.net/2078.1/78050

  • Delcorte, Arnaud ; Garrison, B.J.. High yield events of molecule emission induced by keV particle bombardment. In: The Journal of Physical Chemistry Part B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, Vol. 104, p. 6785-6800 (2000). doi:10.1021/jp001374h. http://hdl.handle.net/2078.1/126484

  • Delcorte, Arnaud ; Segda, BG ; Garrison, BJ ; Bertrand, Patrick. Inferring ejection distances and a surface energy profile in keV particle bombardment experiments. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 171, no. 3, p. 277-290 (2000). http://hdl.handle.net/2078.1/43214

  • Delcorte, Arnaud ; Vanden Eynde, X. ; Bertrand, Patrick ; Vickerman, J.C. ; Garrison, B.J.. Kiloelectronvolt particle-induced emission and fragmentation of polystyrene molecules adsorbed on silver: Insights from molecular dynamics. In: The Journal of Physical Chemistry Part B: Materials, Surfaces, Interfaces & Biophysical, Vol. 104, no. 12, p. 2673-2691 (2000). doi:10.1021/jp993539w. http://hdl.handle.net/2078.1/43633

  • Garrison, B.J. ; Delcorte, Arnaud ; Krantzman, K.D.. Molecule liftoff from surfaces. In: Accounts of Chemical Research, Vol. 33, no.2, p. 69-77 (2000). doi:10.1021/ar970135i. http://hdl.handle.net/2078.1/130258

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Vickerman, J. C. ; Garrison, B.J.. Invited talk : Fundamental aspects in SIMS of complex molecules. 11th International Conference on Quantitative Surface Analysis (Guildford (England), 07/2000). http://hdl.handle.net/2078.1/130237

  • Contribution à ouvrage collectif (Book Chapter)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Vickerman, J.C. ; Garrison, B.J.. How do large organic molecules sputter? Insights from TOF-SIMS and molecular dynamics simulations. In: A. Benninghoven, P. Bertrand, H.-N. Migeon and H. Werner, Secondary Ion Mass Spectrometry, SIMS XII, Elsevier Science Publ.: Amsterdam, 2000, p. 27-32. 0-444-50323-4. http://hdl.handle.net/2078.1/78742

  • Arezki, B. ; Delcorte, Arnaud ; Bertrand, Patrick. Substrate and structural effects on the kinetic energy of molecular fragments in SIMS of polymer overlayers. In: A. Benninghoven, P. Bertrand, H.-N. Migeon, Secondary Ion Mass Spectrometry, SIMS XII proceedings, Elsevier: Amsterdam, 2000, p. 199-202. 0-444-50323-4. http://hdl.handle.net/2078.1/130673

  • 1999
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Vanden Eynde, X ; Bertrand, Patrick ; Reich, DF. Influence of the primary ion beam parameters (nature, energy, and angle) on the kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) by kiloelectron volt ions. In: International Journal of Mass Spectrometry, Vol. 189, no. 2-3, p. 133-146 (1999). doi:10.1016/S1387-3806(99)00063-9. http://hdl.handle.net/2078.1/44228

  • Delcorte, Arnaud ; Vanden Eynde, X ; Bertrand, Patrick ; Reich, DF. Kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) under indium ion bombardment: effects of the primary beam energy and angle. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 157, no. 1-4, p. 138-143 (1999). http://hdl.handle.net/2078.1/62265

  • Delcorte, Arnaud ; Bertrand, Patrick. Metastable decay of molecular fragment ions sputtered from hydrocarbon polymers under keV ion bombardment. In: International Journal of Mass Spectrometry, Vol. 184, no. 2-3, p. 217-231 (1999). doi:10.1016/S1387-3806(99)00012-3. http://hdl.handle.net/2078.1/62333

  • Communication à un colloque (Conference Paper)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Vickerman, J.C. ; Garrison, B.J.. Invited talk : How do large organic molecules sputter? Insights from ToF-SIMS and Molecular Dynamics simulations. 12th International Conference on Secondary Ion Mass Spectrometry (Brussels (Belgium), 09/1999). http://hdl.handle.net/2078.1/130239

  • Franquet, A. ; Terryn, H. ; Vereecken, Jean ; Bertrand, Patrick ; Delcorte, Arnaud. Study of non-functional silane coatings by means of complementary surface analysis methods (poster). 8th European Conference on Applications of Surface and Interface Analysis, ECASIA=99 (Sevilla, Spain, du 04/10/1998 au 08/10/1999). http://hdl.handle.net/2078.1/80480

  • 1998
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Bertrand, Patrick. Influence of chemical structure and beam degradation on the kinetic energy of molecular secondary ions in keV ion sputtering of polymers. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 135, no. 1-4, p. 430-435 (1998). doi:10.1016/S0168-583X(97)00652-6. http://hdl.handle.net/2078.1/62492

  • Delcorte, Arnaud ; Bertrand, Patrick. Sputtering of parent-like ions from large organic adsorbates on metals under keV ion bombardment. In: Surface Science, Vol. 413, p. 97-124 (1998). doi:10.1016/S0039-6028(98)00373-2. http://hdl.handle.net/2078.1/45062

  • Contribution à ouvrage collectif (Book Chapter)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Wischerhoff, Erik ; Laschewsky, André. Characterization of alternate polyelectrolyte thin films by ToF-SIMS and XPS. In: J.-J. Pireaux, J. Delhalle and P. Rudolf, ICPSI - 2, Polymer-Solid Interfaces : From Model to Real Systems, Presses Universitaires de Namur: Namur, 1998, p. 65-76. http://hdl.handle.net/2078.1/83737

  • Bertrand, Patrick ; Delcorte, Arnaud. Secondary molecular emission in static SIMS of organic materials. In: G. Gillen, R. Lareau, J. Bennett, F. Stevie, Secondary Ion Mass Spectrometry: SIMS XI, John Wiley & Sons: Chichester, 1998, p. 437-442. 0-471-97826-4. http://hdl.handle.net/2078.1/78816

  • Delcorte, Arnaud ; Bertrand, Patrick ; Wischerhoff, Erik ; Laschewsky, André. ToF-SIMS and XPS study of thin multilayered coatings realized by successive adsorption and functionalization of charged polymer layers. In: G. Gillen, R. Lareau, J. Bennett, F. Stevie, Secondary Ion Mass Spectrometry: SIMS XI, John Wiley & Sons Publs: New York, USA, 1998, p. 533-536. 0-471-97826-4. http://hdl.handle.net/2078.1/78813

  • Delcorte, Arnaud ; Bertrand, Patrick. Unimolecular dissociation of metastable secondary ions in SIMS of polymers. In: G. Gillen, R. Lareau, J. Bennett, F. Stevie, Secondary Ion Mass Spectrometry: SIMS XI, J. Wiley & Sons publs.: New York, USA, 1998, p. 447-450. 0-471-97826-4. http://hdl.handle.net/2078.1/78809

  • 1997
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Bertrand, Patrick ; Wischerhoff, Erik ; Laschewsky, A.. Adsorption of polyelectrolyte multilayers on polymer surfaces. In: Langmuir : the A C S journal of surfaces and colloids, Vol. 13, no. 19, p. 5125-5136 (1997). doi:10.1021/la970105o. http://hdl.handle.net/2078.1/46022

  • Delcorte, Arnaud ; Bertrand, Patrick. Energy Distributions of Molecular Secondary Ion from Polymer Thin Films under keV Ion Bombardment. In: SIMS X proceedings, p. 731-734 (1997). http://hdl.handle.net/2078.1/83794

  • Laschewsky, A. ; Wischerhoff, Erik ; Denzinger, S ; Ringsdorf, H ; Delcorte, Arnaud ; Bertrand, Patrick. Molecular recognition by hydrogen bonding in polyelectrolyte multilayers. In: Chemistry: A European Journal, Vol. 3, no. 1, p. 34-38 (1997). doi:10.1002/chem.19970030107. http://hdl.handle.net/2078.1/46311

  • Hendlinger, P. ; Laschewsky, A. ; Bertrand, Patrick ; Delcorte, Arnaud ; Legras, Roger ; Nysten, Bernard ; Mobius, D. Partially fluorinated maleimide copolymers for Langmuir films of improved stability .2. Spreading behavior and multilayer formation. In: Langmuir : the A C S journal of surfaces and colloids, Vol. 13, no. 2, p. 310-319 (1997). doi:10.1021/la960639+. http://hdl.handle.net/2078.1/46538

  • Laschewsky, A. ; Wischerhoff, Erik ; Bertrand, Patrick ; Delcorte, Arnaud. Polyelectrolyte multilayers containing photoreactive groups. In: Macromolecular Chemistry and Physics, Vol. 198, no. 10, p. 3239-3253 (1997). doi:10.1002/macp.1997.021981021. http://hdl.handle.net/2078.1/45898

  • Delcorte, Arnaud ; Segda, BG ; Bertrand, Patrick. ToF-SIMS analyses of polystyrene and dibenzanthracene: Evidence for fragmentation and metastable decay processes in molecular secondary ion emission. In: Surface Science, Vol. 381, no. 1, p. 18-32 (1997). doi:10.1016/S0039-6028(97)00070-8. http://hdl.handle.net/2078.1/46186

  • Delcorte, Arnaud ; Segda, BG ; Bertrand, Patrick. ToF-SIMS analyses of polystyrene and dibenzanthracene: Evidence of the fragmentation and metastable decay processes in the molecular secondary ion emission (vol 381, pg 18, 1997). In: Surface Science, Vol. 389, no. 1-3, p. 393-394 (1997). doi:10.1016/S0039-6028(97)00468-8. http://hdl.handle.net/2078.1/45866

  • Communication à un colloque (Conference Paper)
  • Bertrand, Patrick ; Delcorte, Arnaud. Secondary molecular ion emission in static SIMS of organic materials. 11th International Conference on Secondary Ion Mass Spectrometry (Orlando (U.S.A.), 09/1997). http://hdl.handle.net/2078.1/130240

  • 1996
    Article de périodique (Journal article)
  • Laschewsky, A. ; Mayer, B. ; Wischerhoff, Erik ; Arys, X ; Bertrand, Patrick ; Delcorte, Arnaud ; Jonas, Alain. A new route to thin polymeric, non-centrosymmetric coatings. In: Thin Solid Films, Vol. 284-285, p. 334-337 (1996). doi:10.1016/S0040-6090(95)08336-7. http://hdl.handle.net/2078.1/62829

  • Delcorte, Arnaud ; Bertrand, Patrick. Energy distributions of hydrocarbon secondary ions from thin organic films under keV ion bombardment: Correlation between kinetic and formation energy of ions sputtered from tricosenoic acid. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 117, no. 3, p. 235-242 (1996). doi:10.1016/0168-583X(96)00306-0. http://hdl.handle.net/2078.1/46933

  • Delcorte, Arnaud ; Bertrand, Patrick. Kinetic energy distributions of secondary molecular ions from thin organic films under ion bombardment. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 115, no. 1-4, p. 246-250 (1996). http://hdl.handle.net/2078.1/62875

  • Delcorte, Arnaud ; Bertrand, Patrick ; Arys, X ; Jonas, Alain ; Wischerhoff, Erik ; Mayer, B. ; Laschewsky, A.. ToF-SIMS study of alternate polyelectrolyte thin films: Chemical surface characterization and molecular secondary ions sampling depth. In: Surface Science, Vol. 366, no. 1, p. 149-165 (1996). doi:10.1016/0039-6028(96)00779-0. http://hdl.handle.net/2078.1/46897

  • 1995
    Article de périodique (Journal article)
  • Delcorte, Arnaud ; Weng, L.T. ; Bertrand, Patrick. Secondary Molecular Ion Emission From Aliphatic Polymers Bombarded With Low-energy Ions - Effects of the Molecular-structure and the Ion-beam-induced Surface Degradation. In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol. 100, no. 2-3, p. 213-216 (1995). http://hdl.handle.net/2078.1/63105


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