SUCH - SUrface CHaracterisation

This technology platform has been created to gather the techniques used for characterising the surface of materials and bio-materials.

          XPS-ESCA and ToF-SIMS+AES constitute the nucleus of this platform.
          - X-ray photoelectron spectroscopy (XPS-ESCA)
          - Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS + AES)

Research teams developing an expertise in these surface characterisation spectroscopies:

         • Bio and Soft Matter – Surfaces (BSMA – SURF)
          which focuses on the tailoring and characterisation of organic and biological
          surfaces

         • Molecules, Solids and Reactivity (MOST)
            - Catalysis and Chemistry of divided materials (CATA)
            which focuses on preparation, characterisation and optimization of inorganic solids
            as heterogeneous catalysts
            - Chemistry of inorganic and organic materials (CMAT)
            which focuses on coordination and organometallic chemistry applied to
            heterogeneous catalysis and materials science

Some other surface characterisation techniques are also accessible at IMCN:

Contact:

- Scanning Probe Microscopy (SPM's)

. Atomic Force Microscopy (AFM) Prof Yves Dufrêne

. Several SPM's

Prof Bernard Nysten

- QCM-D Prof Christine Dupont

- Measurement of static and dynamic contact angles
Yasmine Adriaensen and Sylvie Derclaye

- Ellipsometry and X-ray reflectivity (XRR)
Prof Alain Jonas

- Field emission Scanning Electron Microscope LEO 982 GEMINI
Dr Etienne Ferain