Papier de conférence
Rack, M., Wane, S., Bajon, D., Raskin, J.-P., & Lederer, D. (2025). Low Power K- and Ka- Wideband LNA Design in 22 nm FD-SOI Using Transformer-Tuned Input. 2025 IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 8-11. https://doi.org/10.1109/SiRF63957.2025.11076816 (Original work published 2025)
Colla, M.-S., & Pardoen, T. (2025). Hydrogen effect on the strain rate sensitivity of nanocrystalline Pd thin films. 12th European Solid Mechanics Conference (ESMC 2025), Lyon, France.
Yadav, S., Rassekh, A., Cardinael, P., Banerjee, S., Esfeh, B. K., Peralagu, U., Dehan, M., Raskin, J.-P., & Parvais, B. (2025). High Linearity and Low RF Loss GaN-on-Si Substrates Achieved Through Interface Engineering. IEEE Compound Semiconductor Integrated Circuit Symposium. Technical Digest, N.A.(N.A.), N. https://doi.org/10.1109/bcicts63111.2025.11211364 (Original work published 2025)
Delait, L., Craeye, C., Raskin, J.-P., & Lederer, D. (2025). Analytical Expressions for Antenna On-Chip Efficiency at mm-Wave and Sub-THz Frequencies. 2025 55th European Microwave Conference (EuMC), p. 930-933. https://doi.org/10.23919/EuMC65286.2025.11235230
Lahaye, L., Raskin, J.-P., & Flandre, D. (2025). Fabrication of Vanadium Dioxide Resistors on Fully-released Polyimide Thin Films for High Strain Studies. Micro and Nano Engineering. Published. Micro and Nano Engineering 2025, Southampton, Angleterre. (Original work published 2025)
Delait, L., Tian, Z., Rack, M., Ma, S., Courte, Q., Rennings, A., Craeye, C., Raskin, J.-P., & Lederer, D. (2025). Silicon Resistivity Impact on Surface Waves for Antenna on-Chip Applications. 2024 IEEE Asia-Pacific Microwave Conference (APMC), pp. 635-637. (Original work published 2024)
Masrouri, A., Courte, Q., Raskin, J.-P., & Lederer, D. (2025). Influence of RF Probe Tip Geometry on Surface Wave Generation in Millimeter-Wave on-Wafer Characterization. 2025 55th European Microwave Conference (EuMC), p. 584-587. https://doi.org/10.23919/EuMC65286.2025.11235136
Lebrun, J., Toussaint, S., Raskin, J.-P., & et al. (2025). Assessing sustainability hotspots in the production of FR4 PCBs. imec Partner Week, Leuven.
Article de journal
Long Chen, Zheyi Lu, Yu Song, Runtong Guo, Hongfu Li, Raskin, J.-P., Flandre, D., Yuan Liu, Lei Liao, & Li, G. (2025). Quantum capacitance impact on low-frequency noise in MoS2 transistors. Physical Review Applied, 23(5), 54012. https://doi.org/10.1103/PhysRevApplied.23.054012 (Original work published 2025)
Lahaye, L., Roisin, N., André, N., Flandre, D., & Raskin, J.-P. (2025). Design, Fabrication, Modeling and Characterization of a Polyimide-Based Membrane for High Strain Studies in Microfabricated Devices. IEEE Transactions on Semiconductor Manufacturing, 3, 26-33. https://doi.org/10.1109/TMAT.2025.3557763 (Original work published 2025)
Long Chen, Liting Liu, Hongfu Li, Xingqiang Liu, Yuan Liu, Raskin, J.-P., Flandre, D., & Li, G. (2025). Mechanisms of forward current transport in vertical nanoscale devices: insights and applications. Nano Express, 6(1). https://doi.org/10.1088/2632-959X/ad9853 (Original work published 2025)
Zeidi, N., Gabbouj, R., Raskin, J.-P., Tounsi, F., & Flandre, D. (2025). High-Resistivity Trap-Rich Silicon Substrate Advantages for Large Integrated MIM Capacitors. IEEE Transactions on Electron Devices, 1-7. https://doi.org/10.1109/TED.2025.3622098 (Original work published 2025)
Roisin, N., Lahaye, L., Raskin, J.-P., & Flandre, D. (2025). Electron mobility in silicon under high uniaxial strain. Solid-State Electronics, 227. https://doi.org/10.1016/j.sse.2025.109118 (Original work published 2025)
Khiara, N., Coulombier, M., Raskin, J.-P., Bréchet, Y., Pardoen, T., & Onimus, F. (2025). Helium nano-bubbles in copper thin films slows down creep under ion irradiation. Acta Materialia, 288, 120854. https://doi.org/10.1016/j.actamat.2025.120854 (Original work published 2025)
Halder, A., Vanbrabant, M., Lederer, D., Raskin, J.-P., & Kilchytska, V. (2025). Impact of Device Layout on Self-Heating Extraction in MOSFETs. Solid-State Electronics, 229(109175). https://doi.org/10.1016/j.sse.2025.109175 (Original work published 2025)
Rack, M., Nabet, M., Bendou, Y., Vanbrabant, M., M.Moulin, Courte, Q., S. Cremer, A.Cathelin, Lederer, D., & Raskin, J.-P. (2025). Low-loss silicon substrates with PN passivation in 28 nm FD-SOI. Solid-State Electronics, 229(109174). https://doi.org/10.1016/j.sse.2025.109174 (Original work published 2025)
Yan, Y., & et al. (2025). Traps characterization in RF SOI substrates including a buried SiGe layer. Solid-State Electronics, 226(16), 109103. https://doi.org/10.1016/j.sse.2025.109103 (Original work published 2025)
Zeidi, N., Tounsi, F., Raskin, J.-P., & Flandre, D. (2025). Vialess non-spiral on-chip stacked transformer on high-resistivity silicon for improved RF power transfer efficiency. Microelectronic Engineering, 302, 112424. https://doi.org/10.1016/j.mee.2025.112424 (Original work published 2026)
Rack, M., Lederer, D., & Raskin, J.-P. (2025). High-Resistivity Substrates in 22-nm FD-SOI—Part I: Wideband Modeling and Impact on RF Losses. IEEE Transactions on Electron Devices, 72(9), 5229-5235. https://doi.org/10.1109/TED.2025.3594268 (Original work published 2025)
Lahaye, L., Roisin, N., André, N., Flandre, D., & Raskin, J.-P. (2025). Design, Fabrication, Modelling and Characterization of a Polyimide-Based Membrane for High Strain Studies in Microfabricated Devices. IEEE Transactions on Materials for Electron Devices, 2, 26-33. https://doi.org/10.1109/TMAT.2025.3557763 (Original work published 2025)
Ma, S., André, N., Tuyaerts, R., Francis, L., Raskin, J.-P., & Lederer, D. (2025). Porous Silicon Waveguides for Integrated Sub-THz Systems. IEEE Microwave and Wireless Technology letters. Published. https://doi.org/10.1109/LMWT.2025.3643128 (Original work published 2025)
Flandre, D., Raskin, J.-P., Hong, R., & et al. (2025). Symmetrical Ambipolar Transport in SnO Thin-Film Transistors Enabled by Dopant-Induced Preferential Crystal Orientation toward Complementary Logic. Nano Letters, 25(43), 15698-15704. https://doi.org/10.1021/acs.nanolett.5c04300 (Original work published 2025)
Rack, M., Lederer, D., & Raskin, J.-P. (2025). High-Resistivity Substrates in 22-nm FD-SOI—Part II: Impact on mm-Wave SPDT Performance. International Journal of Microwave and Wireless Technologies, 72(9), 5236-5242. https://doi.org/10.1017/S1759078725101876 (Original work published 2025)
Orekhov, A., Gauquelin, N., Kermouche, G., Gomez-Perez, A., Baral, P., Dohmen, R., Coulombier, M., Verbeeck, J., Raskin, J.-P., Pardoen, T., Schryvers, D., Lin, J., Cordier, P., & Idrissi, H. (2025). Room temperature electron beam sensitive viscoplastic response of ultra-ductile amorphous olivine films. Acta Materialia, 282, 120479. https://doi.org/10.1016/j.actamat.2024.120479 (Original work published 2025)
Baral, P., Jaddi, S., Wang, H., Orekhov, A., Gauquelin, N., Bagherpour, A., Van Loock, F., Coulombier, M., Favache, A., Rusinowicz, M., Verbeeck, J., Lucas, S., Raskin, J.-P., Idrissi, H., & Pardoen, T. (2025). Al2O3/Al hybrid nanolaminates with superior toughness, strength and ductility. Nature Communications, 16(1), 1355. https://doi.org/10.1038/s41467-025-56512-7 (Original work published 2025)
Zeidi, N., Tounsi, F., Raskin, J.-P., & Flandre, D. (2025). Trap-rich high-resistivity silicon for improved on-chip monolithic transformers characteristics. Solid-State Electronics, 230. https://doi.org/10.1016/j.sse.2025.109261 (Original work published 2025)
Nyssens, L., Nabet, M., Rack, M., Bendou, Y., Wane, S., Sombrin, J. B., Raskin, J.-P., & Lederer, D. (2025). Analysis of Back-Gate Bias Control on EVM Measurements of a Dual-Band Power Amplifier in 22 nm FD-SOI for 5G 28 and 39 GHz Applications. IEEE Transactions on Circuits and Systems I, 72(2), 753-762. https://doi.org/10.1109/TCSI.2024.3487636 (Original work published 2025)
Bendou, Y., Lederer, D., Cathelin, A., & Raskin, J.-P. (2025). High-resistivity silicon to reduce substrate noise coupling in 28 nm FD-SOI VCOs. International Journal of Microwave and Wireless Technologies. Submitted. https://doi.org/10.1017/S1759078725101876 (Original work published 2025)
Papier de conférence
Colla, M.-S., Roisin, N., Flandre, D., Raskin, J.-P., Pardoen, T., & et al. (2024). Strain engineering of thin semiconductor films investigated using the residual-stress-actuated on-chip testing method. 19th European Mechanics of Materials Conference - EMMC19, Madrid.
Parlak, M., Rack, M., Lucas Nyssens, Denis, T., Raskin, J.-P., & Lederer, D. (2024). Millimeter-Wave Low Noise Amplifiers in SOI for 5G/6G Joint Communication and Sensing. 2024 International Radar Symposium (IRS), Wroclaw, Poland.
Rack, M., Nyssens, L., Wane, S., Bajon, D., Raskin, J.-P., & Lederer, D. (2024). A Low-Power 42 to 67 GHz Variable-Gain LNA in 22FDX. 2024 19th European Microwave Integrated Circuits Conference (EuMIC), p. 367-370. https://doi.org/10.23919/EuMIC61603.2024.10732188
Colla, M.-S., Naceri, S. E., Roisin, N., Baral, P., Coulombier, M., Idrissi, H., Flandre, D., Raskin, J.-P., & Pardoen, T. (2024). New developments of the residual stress actuated on-chip testing method. 2nd MecaNano General Meeting, Vienna.
Vanhouche, B., Cardinael, P., Boakes, L., Ragnarsson, L.-Å., Rolin, C., Raskin, J.-P., & Parvais, B. (2024). Environmental Analysis of RF Substrates. 2024 Electronics Goes Green 2024+ (EGG), 1-8. https://doi.org/10.23919/egg62010.2024.10631181 (Original work published 2024)
Bendou, Y., Rack, M., Lederer, D., cathelin, A., & Raskin, J.-P. (2024). Substrate noise mitigation using high resistivity base silicon wafer for a 14 GHz VCO on 28 nm FD-SOI. 2024 19th European Microwave Integrated Circuits Conference (EuMIC), 355-358. https://doi.org/10.23919/EuMIC61603.2024.10732151
Baral, P., Kashiwar, A., Coulombier, M., Delannay, L., Hoummada, K., Raskin, J.-P., Idrissi, H., & Pardoen, T. (2024). Combining nano-DIC and ACOM TEM to study the ductility enhancement of aluminium films by grain boundary sliding. 19th European Mechanics of Materials Conference (EMMC19), Madrid, Spain.
Pardoen, T., Jaddi, S., Wasil, M., Wang, B., Coulombier, M., & Raskin, J.-P. (2024). Last progress about on chip test methods On-chip fracture mechanics to explore fracture toughness of freestanding films from brittle to ductile, down to 2D materials. ERC Timeman international meeting, Antwerpen.
Nabet, M., Rack, M., Crémer, S., Paillardet, F., Cathelin, A., Raskin, J.-P., & Lederer, D. (2024). Sub-6 GHz RF SPDT Switches Designed in an Advanced 28 nm Fully-Depleted Silicon-on-Insulator Technology with a High Resistivity Substrate. 2024 19th European Microwave Integrated Circuits Conference (EuMIC). Published. 2024 19th European Microwave Integrated Circuits Conference (EuMIC), Paris, France. https://doi.org/10.23919/EuMIC61603.2024.10732828
Ma, S., Nabet, M., Hanus, R., Raskin, J.-P., Francis, L., & Lederer, D. (2024). Towards Porous SI THz Planar Waveguides in Ultra-Low-Resistivity Substrates. 15th Globol Symposium on Millimeter-Waves & Terahertz (GSMM), Hong Kong.
Hahn, H., Mauder, C., Marx, M., Gao, Z., Lauffer, P., Schön, O., John, P. T., Yadav, S., Banerjee, S., Cardinael, P., Raskin, J.-P., Parvais, B., & Fahle, D. (2024). Depleted AlN/Si interfaces for minimizing RF loss in GaN-on-Si HEMTs. CS Mantech 2024 Digest, 1-4. (Original work published 2024)
Coulombier, M., Raskin, J.-P., Pardoen, T., Cordier, P., Idrissi, H., & et al. (2024). Towards HTOC in situ TEM. ERC Timeman international meeting, Antwerpen.
Vanbrabant, M., Rack, M., Lederer, D., Kilchytska, V., & Raskin, J.-P. (2024). Various RF Substrate Solutions for 22 nm FD-SOI Technology Targeting Cryogenic Applications. 2024 IEEE/MTT-S International Microwave Symposium - IMS 2024, pp. 784-787. https://doi.org/10.1109/IMS40175.2024.10600309
Perrosé, M., Acosta Alba, P., Reboh, S., Lugo, J., Plantier, C., Cardinael, P., Rack, M., Allibert, F., Milesi, F., Garros, X., & Raskin, J.-P. (2024). Local Interface RF Passivation Layer Based on Helium Ion-Implantation in High-Resistivity Silicon Substrates. Proceedings of the 2024 IEEE/MTT-S International Microwave Symposium (IMS)., 944-947. https://doi.org/10.1109/IMS40175.2024.10600220 (Original work published 2024)
Kashiwar, A., Orekhov, A., UI Haq, I., Coulombier, M., Raskin, J.-P., Schryvers, D., Pardoen, T., & Idrissi, H. (2024). Room temperature electron beam sensitive viscoplastic response of ultra-ductile Al/a-Al2O3 model system. EMMC19 - 19th European Mechanics of Materials Conference, Madrid, Spain.
Kashiwar, A., Baral, P., Coulombier, M., Delannay, L., Raskin, J.-P., Pardoen, T., & Idrissi, H. (2024). A Novel combination of lab-on-chip testing, nanoscale DIC, and ACOM-TEM for unraveling plasticity mechanisms in UFG freestanding metal thin films. Nanobrücken 2024, Nanomechanical Testing Conference, Ecully, France.
Lahaye, L., Roisin, N., Raskin, J.-P., & Flandre, D. (2024). Accurate estimation of Young’s modulus of VO2 thin film integrated on polyimide for high strain studies. Measuring By Light 2025, Delft, Pays-Bas.
Delait, L., Z. Tian, Rack, M., Courte, Q., A. Rennings, Craeye, C., Raskin, J.-P., Lederer, D., & Ma, S. (2024). Planar Leaky-Wave Antenna Design on Thick Substrate by Radiating Surface Waves Using Strip Rings. 2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Perth, Australia.
Cordier, P., Orekhov, A., Gauquelin, N., Kermouche, G., Baral, P., Dohmen, R., Coulombier, M., Verbeeck, J., Raskin, J.-P., Pardoen, T., Schryvers, D., & Idrissi, H. (2024). Room temperature electron beam sensitive viscoplastic response of ultra-ductile amorphous olivine films. EMMC19 - 19th European Mechanics of Materials Conference, Madrid, Spain.
Bidoul Noemie, Pauline Raux, Van Aerschot, T., Alex Pip, Renaux, C., Faniel, S., Flandre, D., & Raskin, J.-P. (2024). Process-Based Life Cycle Assessment of a Vanadium Dioxide Spiking Neuron. 2024 Electronics Goes Green 2024+ (EGG). Published. 2024 Electronics Goes Green 2024+ (EGG), Berlin, Germany. https://doi.org/10.23919/EGG62010.2024.10631188
Article de journal
Cardinael, P., Yadav, S., Hahn, H., Zhao, M., Banerjee, S., Kazemi Esfeh, B., Mauder, C., O’Sullivan, B., Peralagu, U., Vohra, A., Langer, R., Collaert, N., Parvais, B., & Raskin, J.-P. (2024). AlN/Si interface engineering to mitigate RF losses in MOCVD-grown GaN-on-Si substrates. Applied Physics Letters, 125(7), 2103. https://doi.org/10.1063/5.0212145 (Original work published 2024)
Le Brun, G., Nuytten, M., Leprince, A., Glinel, K., Gillis, A., Mahillon, J., & Raskin, J.-P. (2024). Rapid and Specific Detection of Bacillus cereus Using Phage Protein-Based Lateral Flow Assays. ACS Applied Bio Materials, 7(11), 7292-7305. https://doi.org/10.1021/acsabm.4c00965 (Original work published 2024)
Huang, Y., Yan, Y., Nabet, M., Liu, F., Li, B., Li, B., Han, Z., Cristoloveanu, S., & Raskin, J.-P. (2024). Analysis of anomalous C-V behavior for extracting the traps density in the undoped polysilicon with a double-BOX structure. Solid-State Electronics, 217(n/), 108946. (Original work published 2024)
Cardinael, P., Yadav, S., Rack, M., Peralagu, U., Alian, A., Parvais, B., Collaert, N., & Raskin, J.-P. (2024). Contribution of Substrate Harmonic Distortion to GaN-on-Si RF Switches Linearity. IEEE Microwave and Wireless Technology Letters, 34(3), 298-301. https://doi.org/10.1109/lmwt.2024.3355148 (Original work published 2024)
Roisin, N., Brunin, G., Rignanese, G.-M., Flandre, D., Raskin, J.-P., & Poncé, S. (2024). Phonon-limited mobility for electrons and holes in highly-strained silicon. npj Computational Materials, 10(1), 242. https://doi.org/10.1038/s41524-024-01425-0 (Original work published 2024)
Daudin, R., Idrissi, H., Coulombier, M., Lhuissier, P., Béché, A., Verbeeck, J., Schryvers, D., Ghidelli, M., Raskin, J.-P., Blandin, J.-J., Schülli, T. U., & Pardoen, T. (2024). Strain-and temperature-induced dilatancy in ZrNi thin film metallic glasses with nanoscale structural heterogeneities. Journal of Materials Research, Online. https://doi.org/10.1557/s43578-024-01479-2 (Original work published 2024)
Coulombier, M., Baral, P., Orekhov, A., Dohmen, R., Raskin, J.-P., Pardoen, T., Cordier, P., & Idrissi, H. (2024). On-chip very low strain rate rheology of amorphous olivine films. Acta Materialia, 266, 119693. https://doi.org/10.1016/j.actamat.2024.119693 (Original work published 2024)
Huang, Y., Liu, F., Cristoloveanu, S., Ma, S., Nabet, M., Yan, Y., Li, B., Li, B., Nguyen, B.-Y., Han, Z., & Raskin, J.-P. (2024). C-V characterization of the trap-rich layer in a novel Double-BOX structure. Solid-State Electronics, 218, 108951. (Original work published 2024)
Le Brun, G., Hauwaert, M., Moumneh, R., Yunus, S., & Raskin, J.-P. (2024). Studying ion transport dynamics in electrochemical measurements of lateral flow assays. Journal of Electroanalytical Chemistry, 966, 118399. https://doi.org/10.1016/j.jelechem.2024.118399 (Original work published 2024)
Jaddi, S., Malik, M. W., Wang, B., Pugno, N. M., Zeng, Y., Coulombier, M., Raskin, J.-P., & Pardoen, T. (2024). Definitive engineering strength and fracture toughness of graphene through on-chip nanomechanics. Nature Communications, 15(1), 5863. https://doi.org/10.1038/s41467-024-49426-3 (Original work published 2024)
Cardinael, P., Yadav, G., Parvais, B., & Raskin, J.-P. (2024). Effect of Buffer Charge Redistribution on RF Losses and Harmonic Distortion in GaN-on-Si Substrates. IEEE Journal of the Electron Devices Society, 12, 322-330. https://doi.org/10.1109/JEDS.2024.3386170 (Original work published 2024)
Chapitre de livre
Pirson, T., Le Brun, G., Ernesto Quisbert-Trujillo, Thomas Ernst, Raskin, J.-P., & Bol, D. (2024). Towards Life Cycle Thinking and Judicious Ecodesign for the Internet of Things (IoT) Current Practices and Perspectives. In Jenny Stanford Publishing (ed.), Outlooking beyond Nanoelectronics and Nanosystems (Ultra Scaling, Pervasiveness, Sustainable Integration, and Biotic Cross-Inspiration (1st Edition), p. p. 75-136). Simon Deleonibus. https://doi.org/10.1201/9781003509905
Article de journal
Pirson, T., Delhaye, T. P., Pip, A., Le Brun, G., Raskin, J.-P., & Bol, D. (2023). The Environmental Footprint of IC Production: Review, Analysis and Lessons from Historical Trends. IEEE Transactions on Semiconductor Manufacturing, 36, 56-67. https://doi.org/10.1109/tsm.2022.3228311 (Original work published 2023)
Halder, A., Nyssens, L., Lederer, D., Kilchytska, V., & Raskin, J.-P. (2023). Comparison of Heat Sinks in Back-End of Line to reduce Self-Heating in 22FDX® MOSFETs. Solid-State Electronics, 207, 108706. https://doi.org/10.1016/j.sse.2023.108706 (Original work published 2023)
Huang, Y., Yan, Y., Nabet, M., Liu, F., Li, B., Li, B., Han, Z., Nguyen, B.-Y., Cristoloveanu, S., & Raskin, J.-P. (2023). C-V measurement and modeling of double-BOX Trap-Rich SOI substrate. Solid-State Electronics, 209, 108763. https://doi.org/10.1016/j.sse.2023.108763 (Original work published 2023)
Roisin, N., Colla, M.-S., Raskin, J.-P., & Flandre, D. (2023). Raman Strain-Shift Measurements and Prediction from First-Principles in Highly-Strained Silicon. Journal of Materials Science: Materials in Electronics, 34, 373. https://doi.org/10.1007/s10854-022-09769-3 (Original work published 2023)
Nabet, M., Rack, M., Yan, Y., Nguyen, B.-Y., & Raskin, J.-P. (2023). Double Buried Oxide Trap-Rich Substrates for High Frequency Applications. IEEE Electron Device Letters, 1. https://doi.org/10.1109/LED.2023.3243693 (Original work published 2023)
L. Nyssens, Ma, S., Rack, M., Lederer, D., & Raskin, J.-P. (2023). Probe-Dependent Residual Error Analysis for Accurate On-Wafer MOSFET Measurements up to 110 GHz. I E E E Journal of the Electron Devices Society, 11(11), 650-657. https://doi.org/10.1109/JEDS.2023.3284291 (Original work published 2023)
Vanbrabant, M., Raskin, J.-P., Flandre, D., & Kilchytska, V. (2023). Impact of thermal coupling effects on the digital and analog figures of merit of UTBB SOI MOSFET pairs. Solid-State Electronics, 2023, 108623. https://doi.org/10.1016/j.sse.2023.108623 (Original work published 2023)
Nyssens, L., Rack, M., Nabet, M., Schwan, C., Zhao, Z., Lhemann, S., Lederer, D., Raskin, J.-P., & et al. (2023). High-resistivity with PN interface passivation in 22 nm FD-SOI technology for low-loss passives at RF and millimeter-wave frequencies. Solid-State Electronics, 205. https://doi.org/10.1016/j.sse.2023.108656 (Original work published 2023)
Yan, Y., Kilchytska, V., Flandre, D., & Raskin, J.-P. (2023). Analysis of trap distribution and NBTI degradation in Al2O3/SiO2 dielectric stack. Solid-State Electronics, 207(207). https://doi.org/10.1016/j.sse.2023.108675 (Original work published 2023)
Roisin, N., Colla, M.-S., Scaffidi, R., Pardoen, T., Flandre, D., & Raskin, J.-P. (2023). Band gap reduction in highly-strained silicon beams predicted by first-principles theory and validated using photoluminescence spectroscopy. Optical Materials, 144(114347), 1-10. https://doi.org/10.1016/j.optmat.2023.114347 (Original work published 2023)
Halder, A., Nyssens, L., Vanbrabant, M., Rack, M., Lederer, D., Kilchytska, V., & Raskin, J.-P. (2023). Impact of High Temperature Up to 175 ∘ C on the DC and RF Performances of 22-nm FD-SOI MOSFETs. IEEE Transactions on Electron Devices, 1-6. https://doi.org/10.1109/TED.2023.3303150 (Original work published 2023)
Bahrami, F., Malik, M. W., Van Loock, F., Raskin, J.-P., Pardoen, T., & Nysten, B. (2023). Accurate determination of stiffness and strength of graphene via AFM-based membrane deflection. Measurement Science and Technology, 34(12), 125027. https://doi.org/10.1088/1361-6501/acf4b1 (Original work published 2023)
Papier de conférence
Perrosé, M., Acosta Alba, P., Moulin, M., Augendre, E., Lugo, J., Raskin, J.-P., & Reboh, S. (2023). RF figures of merit of polysilicon trap-rich layers formed locally by ion amorphization and nanosecond laser annealing. IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF 2023, Las Vegas, Nevada, USA.
Huang, Y., Yan, Y., Nabet, M., Liu, F., Li, B., Li, B., Han, Z., Nguyen, B.-Y., Cristoloveanu, S., & Raskin, J.-P. (2023). C-V Measurement and Modeling of Double-BOX Trap-Rich SOI Substrate. 9th Joint Intl EuroSOI Workshop and International Conf On Ultimate Integration on Silicon 2023. Published. 9th Joint Intl EuroSOI Workshop and International Conf On Ultimate Integration on Silicon 2023, Tarragona, Spain.
Al Khalifeh, K., Vanbrabant, M., Rack, M., Tihon, D., Craeye, C., Raskin, J.-P., Lederer, D., & et al. (2023). Combined Thermo-Reflectance and Thin-Film Coating in Near-Field Imaging of Chip-Package-PCB-Antenna Modules for Industrial-Testing and Failure Analysis. Texas Symposium on Wireless and Microwave Circuits and Systems (WMCS). Published. Texas Symposium on Wireless and Microwave Circuits and Systems (WMCS), Texas, USA.
Rack, M., L. Nyssens, Q.H. Le, D.K. Huynh, T. Kämpfe, Raskin, J.-P., & Lederer, D. (2023). A Compact 120 GHz LNA in 22 nm FD-SOI with Back-Gate Controllable Variable-Gain. 18th European Microwave Integrated Circuits Conference (EuMIC). Published. 18th European Microwave Integrated Circuits Conference (EuMIC), Berlin, Germany.
MYRIAM BANAÏ, Contino, F., Ducarme, D., Malcourant, E., & Raskin, J.-P. (2023). Collaborations entreprises – universités : un levier vers un changement systémique ? Questions de pédagogie dans l’enseignement supérieur, Lausanne.
Scheen, G., Tuyaerts, R., Cardinael, P., Ekoga, E., Aouadi, K., Pavageau, C., Rassekh, A., Nabet, M., Yadav, S., Raskin, J.-P., Parvais, B., & Emam, M. (2023). GaN-on-Porous Silicon for RF Applications. 2023 53rd European Microwave Conference (EuMC), 842-845. https://doi.org/10.23919/EuMC58039.2023.10290465 (Original work published 2023)
L. Nyssens, Rack, M., Tuyaerts, R., Lederer, D., & Raskin, J.-P. (2023). Verification of Reference Impedance from Common On-Wafer Calibrations on Commercial Calibration Substrates. 101st ARFTG Microwave Measurement Conference (ARFTG), San Diego, USA.
Ma, S., L. Nyssens, Raskin, J.-P., & Lederer, D. (2023). Sub-mmWave Transmission Lines on Silicon-Based Technologies. 53rd European Microwave Conference. Published. 53rd European Microwave Conference, Berlin, Germany.
Scheen, G., Tuyaerts, R., Van Overmeere, Q., Whyte Ferreira, C., Rasson, J., & Raskin, J.-P. (2023). Post-fab porosification : challenges and advances. SCOPe 2023, Louvain-la-Neuve, Belgium.
Tian, Z., Zhang, M., Ma, S., Sievert, B., Yuan, H., Lederer, D., Raskin, J.-P., Roskos, H., Erni, D., & Rennings, A. (2023). The Concept of a Large-scale Subharmonic Coherent Detector Array at 600 GHz. Proceedings of 2023 Asian Pacific Microwave Conference. Published. 2023 Asian Pacific Microwave Conference, Taiwan. (Original work published 2023)
Roisin, N., Colla, M.-S., Scaffidi, R., Pardoen, T., Flandre, D., & Raskin, J.-P. (2023). Band gap narrowing in highly-strained silicon beams observed using photoluminescence spectroscopy. BePOM 2023, Bruxelles.
Nabet, M., Rack, M., Huet, B., Tuyaerts, R., Scheen, G., Raskin, J.-P., & et al. (2023). High Resistivity Trap-Rich Substrate for RF MEMS Switches. 2023 Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP). Published. 2023 Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP), Valetta, Malta. https://doi.org/10.1109/DTIP58682.2023.10267954
Fache, T., Moulin, M., Charlet, I., Chalupa, Z., Raskin, J.-P., Allibert, F., Plantier, C., Gaillard, F., & Hutin, L. (2023). Buried PN junctions impact on the performances of an inductor at RF frequencies. IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF 2023, Las Vegas, Nevada, USA.
Courte, Q., Rack, M., Lederer, D., & Raskin, J.-P. (2023). SPST and SPDT 60 GHz Travelling-Wave Switches in 22 nm FD-SOI. 18th European Microwave Integrated Circuits Conference (EuMIC). Published. 18th European Microwave Integrated Circuits Conference (EuMIC), Berlin, Germany.
Roisin, N., Raskin, J.-P., & Flandre, D. (2023). Near-IR response of highly-strained Si photodetector linking first principles and TCAD. ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC), 1(1), 1-9. https://doi.org/10.1109/ESSDERC59256.2023.10268568 (Original work published 2023)
Zeidi, N., Rack, M., André, N., Tounsi, F., Raskin, J.-P., & Flandre, D. (2023). Effect of Silicon Substrate Resistivity on Large- Area High-Voltage Spiral Inductor Performance. 2023 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS. Published. 2023 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, Valetta, Malta. https://doi.org/10.1109/DTIP58682.2023.10267935
Coulombier, M., Baral, P., Orekhov, A., Ralf Dohmen, Raskin, J.-P., Cordier, P., Pardoen, T., & Idrissi, H. (2023). Rheology of amorphous olivine thin films characterized by the tensile-on-chip technique. Annual meeting ERC Timeman, Lille.
Bidoul, N., Huet, B., Ureña Begara, F., Raskin, J.-P., & Flandre, D. (2023). Tuning the stochasticity of VO2 neurons firing-threshold through grain size engineering. Proceedings of Neuromorphic Materials, Devices, Circuits and Systems, p. 050. https://doi.org/10.29363/nanoge.neumatdecas.2023.050
Francis, L., Roisin, N., Colla, M.-S., Flandre, D., & Raskin, J.-P. (2023). Improving the determination of strain in the deformed Silicon measured by Raman spectroscopy. International Meeting on Optical Measurement Techniques and Industrial Applications. Published. International Meeting on Optical Measurement Techniques and Industrial Applications, Delft (Netherlands).
Chapitre de livre
Rack, M., Nyssens, L., Nabet, M., Lederer, D., & Raskin, J.-P. (2023). Impact of a High-resistivity Substrate on RF and mm-wave Performance of 22 nm FD-SOI Devices and Circuits. In Björn Debaillie, François Brunier, Dominique Morche, Erkan Nevzat Isa, Jan Craninckx (ed.), Technologies Enabling Future Mobile Connectivity & Sensing (1st ed.). Rive Publishers. https://doi.org/10.1201/9781032633039
Papier de conférence
Halder, A., Nyssens, L., Rack, M., Lederer, D., Kilchytska, V., & Raskin, J.-P. (2022). 22 nm FD-SOI MOSFET Figures of Merit at high temperatures upto 175 °C. SiRF 2022 Proceedings, p. 27-30. https://doi.org/10.1109/sirf53094.2022.9720052
Wane, S., Tran, Q. H., Dinh, T. V., Eddine, J. A., Duffourg, F., Ndagijimana, F., Bajon, D., Terki, F., Rioult, J., Darroman, J.-L., Bonnaire, L., Montfort, O., Huard, V., Raskin, J.-P., Lederer, D., & Bousseksou, A. (2022). Spintronics Technology Solutions for Interferometric Thermal-Electromagnetic Sensing. Proceedings of the 2022 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems. Published. 2022 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems, Texas, USA.
Raskin, J.-P. (2022). Comments pertaining to holistic approaches to solve technical problems in a sustainable way. The societal responsibility of engineers and the role of Engineering Schools. Euro-CASE conference, “Technical Innovation for the Common Good of Humanity”, Académie Royale, Brussels, Belgium.
Yadav, S., Cardinael, P., Zhao, M., Vondkar, K., Peralagu, U., Alian, A., Rodriguez, R., Khaled, A., Makovejev, S., Ekoga, E., Lederer, D., Raskin, J.-P., Parvais, B., & Collaert, N. (2022). Substrate effects in GaN-on-Si HEMT technology for RF FEM applications. The 242nd ElectroChemical Society Meeting – ECS 2022, p. Poster P3.42. https://doi.org/10.1149/MA2022-02321208mtgabs
Pardoen, T., Jaddi, S., Malik, M. W., Wang, B., Coulombier, M., & Raskin, J.-P. (2022). A crack-on-chip fracture mechanics method for freestanding ultra-thin films from brittle to ductile down to 2D materials. 18th European Mechanics of Materials Conference - EMMC18. Published. 18th European Mechanics of Materials Conference - EMMC18, Oxford, UK.
Raskin, J.-P., & Merle, S. (2022). IngénieuxSud – When Northern-Southern students act together for a sustainable and fair world. The 2022 ACEEU Stakeholders Forum, Florence, Italy.
Nyssens, L., Rack, M., Nabet, M., Schwan, C., Zhao, Z., Lehmann, S., Raskin, J.-P., Lederer, D., & et al. (2022). PN Junctions Interface Passivation in 22 nm FD- SOI for Low-Loss Passives. 24th International Microwave and Radar Conference (MIKON). Published. 24th International Microwave and Radar Conference (MIKON), Gdansk, Poland. https://doi.org/10.23919/MIKON54314.2022.9924803
Pirson, T., Delhaye, T., Pip, A., Le Brun, G., Raskin, J.-P., & Bol, D. (2022). The Environmental Footprint of IC Production: Meta-Analysis and Historical Trends. ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC), pp. 352-355. https://doi.org/10.1109/essderc55479.2022.9947198
Roisin, N., Colla, M.-S., Flandre, D., Raskin, J.-P., & et al. (2022). Raman Shift Prediction from First Principles in Highly-Strained Silicon. ICOOPMA 2022, Gent.
Raskin, J.-P. (2022). SOI technologies for RF and millimeter-wave integrated circuits. International Conference on Recent Advances in Electrical, Electronics, Ubiquitous Communication & Computational Intelligence –, Chennai, Tamilnadu, India (online/virtual mode).
Cardinael, P., Rack, M., Zhao, M., Rack, M., Lederer, D., Collaert, N., Parvais, B., & Raskin, J.-P. (2022). Time Dependence of RF Losses in GaN-on-Si Substrates. International Microwave Symposium 2022, Denver, CO, United States of America.
Rack, M., Nyssens, L., Courte, Q., Lederer, D., & Raskin, J.-P. (2022). A DC-120 GHz SPDT Switch Based on 22 nm FD-SOI SLVT NFETs with Substrate Isolation Rings Towards Increased Shunt Impedance. 2022 IEEE RFIC Symposium. Published. 2022 IEEE RFIC Symposium, Denver, Colorado, USA. https://doi.org/10.1109/RFIC54546.2022.9863217
Raskin, J.-P. (2022). Internet-of-Things (IoT) for the best and the worst. Electronics for Sustainable Societies – ESS 2022, Liverpool, UK.
Banaï, M., Contino, F., Ducarme, D., Malcourant, E., & Raskin, J.-P. (2022). Collaborations entreprises – universités : un levier vers un changement systémique ? Questions de Pédagogie dans l’Enseignement Supérieur, La Rochelle, France.
Merle, S., & Raskin, J.-P. (2022). The stakeholder’s objectives divergence in a service learning course as source of tension and learning for students. 5th European Conference on Service-Learning in Higher Education - ECSLHE 2022, On-line conference.
Merle, S., & Raskin, J.-P. (2022). IngénieuxSud - Study, design and installation of street lighting and a nursery in Dwale, Democratic Republic of Congo. 3rd Uniservitate Global Symposium, Rome, Italy.
Vanbrabant, M., Nyssens, L., Kilchytska, V., & Raskin, J.-P. (2022). Back-gate lumped resistance effect on AC characteristics of FD-SOI MOSFET. International Microwave Symposium - IMS 2022, Denver, Colorado, USA.
Vanbrabant, M., Raskin, J.-P., Flandre, D., & Kilchytska, V. (2022). Experimental study of thermal coupling effects in FD-SOI MOSFET. The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS′2022. Published. The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS′2022, Udine, Italy.
Moulin, M., Rack, M., Fache, T., Nabet, M., Chalupa, Z., Plantier, C., Allibert, F., Lugo, J., Hutin, L., & Raskin, J.-P. (2022). Nox and buried PN junctions effect on RF performance of High-Resistivity Silicon substrates. 2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF). Published. The 22nd IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF’22, Las Vegas, USA. https://doi.org/10.1109/SiRF53094.2022.9720037
Nabet, M., Rack, M., Nyssens, L., Raskin, J.-P., & Lederer, D. (2022). 28 GHz Down-Conversion Mixer with RF Back-Gate Excitation Topology in 22-nm FD-SOI. Proceedings of the 17th European Microwave Integrated Circuits Conference. Published. 17th European Microwave Integrated Circuits Conference, Milan, Italy.
Yan, Y., Reckinger, N., Kilchytska, V., Flandre, D., Tang, X., Malik, M. W., Hackens, B., & Raskin, J.-P. (2022). Hexagonal Boron Nitride Memristor based on a nanogap self-formed by silicidation. Mini Colloquia (MQ) on “Memristive Devices”, The 6th Symposium on Schottky Barrier MOS Devices (SSBMOS), Giessen, Germany.
Raskin, J.-P. (2022). SOI CMOS technologies for RF and millimeter-wave communication systems. 2022 International Conference on IC Design and Technology – ICICDT 2022, Hanoi, Vietnam.
Nyssens, L., Rack, M., Lederer, D., & Raskin, J.-P. (2022). Effect of probe coupling on MOSFET series resistance extraction up to 110 GHz. 2022 IEEE Latin America Electron Devices Conference (LAEDC). Published. 2022 IEEE Latin America Electron Devices Conference (LAEDC), Puebla, Mexico.
Jaddi, S., Coulombier, M., Idrissi, H., Raskin, J.-P., & Pardoen, T. (2022). Fracture properties and environmentally assisted subcritical crack growth of thin freestanding Al2O3, SiO2 and SiN films using residual stress-induced crack-on-a-chip testing technique. European Conference on Fracture 2022 - ECF23, Funchal, Madeira, Portugal.
Yan, Y., Kilchytska, V., Faniel, S., Flandre, D., & Raskin, J.-P. (2022). Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks. The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS′2022. Published. The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS′2022, Udine, Italy.
Wane, S., Ferrero, F., Sombrin, J., Tombakdjian, L., Bajon, D., Ratajczak, P., Molina, F., Rack, M., Nyssens, L., Raskin, J.-P., Lederer, D., Craeye, C., & et al. (2022). Energy-Efficient RF-Optics Multi-Beam Systems Using Correlation Technologies: Toward Hybrid GaN-FDSOI Front-End-Modules. Proceedings of the 2022 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems. Published. 2022 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems, Texas, USA.
Nyssens, L., Rack, M., Schwan, C., Zhao, Z., Lehmann, S., Hermann, T., Allibert, F., Aulnette, C., Lederer, D., & Raskin, J.-P. (2022). Impact of substrate resistivity on spiral inductors at mm-wave frequencies. The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS′2022. Published. The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS′2022, Udine, Italy.
Roisin, N. (2022). Optical performances prediction of highly strained silicon photodetector. 7th edition of the silicon photonics Summer School, C2N Paris-Saclay, France.
Rack, M., Nyssens, L., Nabet, M., Lederer, D., & Raskin, J.-P. (2022). High-Resistivity substrates with PN interface passivation in 22 nm FD-SOI. The 2022 International Symposium on VLSI Technology Systems and Applications (VLSI-TSA). Published. The 2022 International Symposium on VLSI Technology Systems and Applications (VLSI-TSA), Hsincu, Taiwan. https://doi.org/10.1109/VLSI-TSA54299.2022.9771028
Nyssens, L., Rack, M., Wane, S., Schwan, C., Lehmann, S., Zhao, Z., Lucci, L., Lugo-Alvarez, J., Gaillard, F., Raskin, J.-P., & Lederer, D. (2022). A 2.5-2.6 dB Noise Figure LNA for 39 GHz band in 22 nm FD-SOI with Back-Gate Bias Tunability. Proceedings of the 17th European Microwave Integrated Circuits Conference. Published. 17th European Microwave Integrated Circuits Conference, Milan, Italy.
Francis, L., Moumneh, R., Hanus, R., Le Brun, G., & Raskin, J.-P. (2022). Harvesting the blue energy using paper-based microfluidics. Euro-Mediterranean Conference on Materials, Devices and Systems - EMCM-DS 2022. Published. Euro-Mediterranean Conference on Materials, Devices and Systems - EMCM-DS 2022, Fez, Morocco.
Article de journal
Cardinael, P., Yadav, S., Zhao, M., Rack, M., Lederer, D., Collaert, N., Parvais, B., & Raskin, J.-P. (2022). Time Dependence of RF Losses in GaN-on-Si Substrates. IEEE Microwave and Wireless Components Letters, 32(6), 688-691. https://doi.org/10.1109/lmwc.2022.3162028 (Original work published 2022)
Yan, Y., Kilchytska, V., Flandre, D., & Raskin, J.-P. (2022). Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks using conductance method. Solid-State Electronics, 194, 4. https://doi.org/10.1016/j.sse.2022.108347 (Original work published 2022)
Vanbrabant, M., Raskin, J.-P., Flandre, D., & Kilchytska, V. (2022). Experimental study of thermal coupling effects in FD-SOI MOSFET. Solid-State Electronics, 194(108362), 4. https://doi.org/10.1016/j.sse.2022.108362 (Original work published 2022)
Roisin, N., Delhaye, T., André, N., Raskin, J.-P., & Flandre, D. (2022). Low-Power Silicon Strain Sensor Based on CMOS Current Reference Topology. Sensors and Actuators A: Physical : an international journal devoted to research and development of physical and chemical transducers, 339(113491), 1-11. https://doi.org/10.1016/j.sna.2022.113491 (Original work published 2022)
Yan, Y., Kilchytska, V., Bin, W., Faniel, S., Zeng, Y., Raskin, J.-P., & Flandre, D. (2022). Characterization of thin Al2O3/SiO2 dielectric stack for CMOS transistors. Microelectronic Engineering, 254(111708), 7. https://doi.org/10.1016/j.mee.2022.111708 (Original work published 2022)
Khiara, N., Onimus, F., Crocombette, J.-P., Dupuy, L., Pardoen, T., Raskin, J.-P., & Bréchet, Y. (2022). A molecular dynamics study of a cascade induced irradiation creep mechanism in pure copper. Journal of Nuclear Materials, 560, 153518. https://doi.org/10.1016/j.jnucmat.2022.153518 (Original work published 2022)
Vanbrabant, M., Nyssens, L., Kilchytska, V., & Raskin, J.-P. (2022). Back-Gate Lumped Resistance Effect on AC Characteristics of FD-SOI MOSFET. IEEE Microwave and Wireless Components Letters, 32(6), 704-707. https://doi.org/10.1109/lmwc.2022.3162497 (Original work published 2022)
Tang, X., Raskin, J.-P., Reckinger, N., Yan, Y., André, N., Lahem, D., & Debliquy, M. (2022). Enhanced Gas Detection by Altering Gate Voltage Polarity of Polypyrrole/Graphene Field-Effect Transistor Sensor. Chemosensors, 10(11), 467. https://doi.org/10.3390/chemosensors10110467 (Original work published 2022)
Shaik, R. R., Chandrasekar, L., Raskin, J.-P., & Pradhan, K. P. (2022). Back-gate bias effect on the linearity of pocket doped FDSOI MOSFET. Microelectronics, 121, 105365. https://doi.org/10.1016/j.mejo.2022.105365 (Original work published 2022)
Courte, Q., Rack, M., Nabet, M., Cardinael, P., & Raskin, J.-P. (2022). High-Temperature Characterization of Multiple Silicon-Based Substrate for RF-IC Applications. I E E E Journal of the Electron Devices Society, 10(1), 620-626. https://doi.org/10.1109/jeds.2022.3188893 (Original work published 2022)
Tounsi, F., Hadj Said, M., Hauwaert, M., Kaziz, S., Francis, L., Raskin, J.-P., & Flandre, D. (2022). Variation Range of Different Inductor Topologies with Shields for RF and Inductive Sensing Applications. Sensors, 22(9), 15. https://doi.org/10.3390/s22093514 (Original work published 2022)
Bertrand, I., Flatresse, P., Besnard, G., Bethoux, J.-M., Chalupa, Z., Plantier, C., Rack, M., Nabet, M., Raskin, J.-P., & Allibert, F. (2022). Development Of High Resistivity FD-SOI Substrates for mmWave Applications. ECS Transactions, 108(5), 31-45. https://doi.org/10.1149/10805.0031ecst (Original work published 2022)
Nyssens, L., Rack, M., Schwan, C., Zhao, Z., Lehmann, S., Hermann, T., Allibert, F., Aulnette, C., Lederer, D., & Raskin, J.-P. (2022). Impact of substrate resistivity on spiral inductors at mm-wave frequencies. Solid-State Electronics, 194. https://doi.org/10.1016/j.sse.2022.108377 (Original work published 2022)
Raskin, J.-P. (2022). Fully Depleted SOI Technology for Millimeter-Wave Integrated Circuits. IEEE Journal of the Electron Devices Society, 10, 424-434. https://doi.org/10.1109/jeds.2022.3165877 (Original work published 2022)
Velosa-Moncada, L. A., Raskin, J.-P., Aguilera-Cortés, L. A., López-Huerta, F., & Herrera-May, A. L. (2022). Estimation of the Young’s Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers. Nanomaterials, 12(2), 265. https://doi.org/10.3390/nano12020265 (Original work published 2022)
Moulin, M., Rack, M., Fache, T., Chalupa, Z., Plantier, C., Morand, Y., Lacord, J., Allibert, F., Gaillard, F., Lugo, J., Hutin, L., & Raskin, J.-P. (2022). High-resistivity silicon-based substrate using buried PN junctions towards RFSOI applications. Solid-State Electronics, 194, 108301. https://doi.org/10.1016/j.sse.2022.108301 (Original work published 2022)
Chapitre de livre
Merle, S., & Raskin, J.-P. (2022). Les techniques pédagogiques critiques de l’éducation à la citoyenneté mondiale. In Cécile Giraud, Gautier Pirotte, Daniel Faulx (ed.), Manuel d’éducation à la citoyenneté mondiale Une perspective belge (Presses universitaires de Louvain, p. p. 262). Presses universitaires de Louvain.
Article de journal
Bahrami, F., Hammad, M., Fivel, M., Huet, B., D’Haese, C., Ding, L., Nysten, B., Idrissi, H., Raskin, J.-P., & Pardoen, T. (2021). Single layer graphene controlled surface and bulk indentation plasticity in copper. International Journal of Plasticity, 138(March 2021), 102936. https://doi.org/10.1016/j.ijplas.2021.102936 (Original work published 2021)
Halder, A., Nyssens, L., Rack, M., Lederer, D., Raskin, J.-P., & Kilchytska, V. (2021). Heat sink implementation in back-end of line for self-heating reduction in 22 nm FDSOI MOSFETs. Solid-State Electronics, 184, 108088. https://doi.org/10.1016/j.sse.2021.108088 (Original work published 2021)
Khiara, N., Onimus, F., Jublot-Leclerc, S., Jourdan, T., Pardoen, T., Raskin, J.-P., & Bréchet, Y. (2021). In-situ TEM irradiation creep experiment revealing radiation induced dislocation glide in pure copper. Acta Materialia, 216, 117096. https://doi.org/10.1016/j.actamat.2021.117096 (Original work published 2021)
Le Brun, G., Hauwaert, M., Leprince, A., Glinel, K., Mahillon, J., & Raskin, J.-P. (2021). Electrical Characterization of Cellulose-Based Membranes towards Pathogen Detection in Water. Biosensors, 11(2), 57. https://doi.org/10.3390/bios11020057 (Original work published 2021)
Ghidelli, M., Orekhov, A., Bassi, A. L., Terraneo, G., Djemia, P., Abadias, G., Nord, M., Béché, A., Gauquelin, N., Verbeeck, J., Raskin, J.-P., Schryvers, D., Pardoen, T., & Idrissi, H. (2021). Novel class of nanostructured metallic glass films with superior and tunable mechanical properties. Acta Materialia, 213, 116955. https://doi.org/10.1016/j.actamat.2021.116955 (Original work published 2021)
Rack, M., Frédéric Allibert, & Raskin, J.-P. (2021). Modeling of Semiconductor Substrates for RF Applications: Part I—Static and Dynamic Physics of Carriers and Traps. IEEE Transactions on Electron Devices, 68(9), 4598-4605. https://doi.org/10.1109/ted.2021.3096777 (Original work published 2021)
Ernst, T., & Raskin, J.-P. (2021). Towards circular ICT: from materials to components. HiPEAC Vision 2021, 122-129. https://doi.org/10.5281/zenodo.4719642 (Original work published 2021)
Wang, B., Malik, M. W., Yan, Y., Kilchytska, V., Zeng, Y., Flandre, D., & Raskin, J.-P. (2021). A Physical Model of Contact Resistance in Ti-Contacted Graphene-Based Field Effect Transistors. IEEE Transactions on Electron Devices, 68(2), 892-898. https://doi.org/10.1109/TED.2020.3046166 (Original work published 2021)
Nyssens, L., Rack, M., Halder, A., Raskin, J.-P., & Kilchytska, V. (2021). On the Separate Extraction of Self-Heating and Substrate Effects in FD-SOI MOSFET. IEEE Electron Device Letters, 42(5), 665-668. https://doi.org/10.1109/led.2021.3071272 (Original work published 2021)
Tang, X., Debliquy, M., Lahem, D., Yan, Y., & Raskin, J.-P. (2021). A Review on Functionalized Graphene Sensors for Detection of Ammonia. Sensors, 2021(21 (4)), 1443. https://doi.org/10.3390/s21041443 (Original work published 2021)
Vandermolen, E., Ferrandis, P., Allibert, F., Nabet, M., Rack, M., Raskin, J.-P., & Cassé, M. (2021). Characterization and role of deep traps on the radio frequency performances of high resistivity substrates. Journal of Applied Physics, 129(21), 215701. https://doi.org/10.1063/5.0045306 (Original work published 2021)
Vercauteren, R., Scheen, G., Raskin, J.-P., & Francis, L. (2021). Porous silicon membranes and their applications: Recent advances. Sensors and Actuators A: Physical : an international journal devoted to research and development of physical and chemical transducers, 318(112486), 20. https://doi.org/10.1016/j.sna.2020.112486 (Original work published 2021)
Jaddi, S., Raskin, J.-P., & Pardoen, T. (2021). On‑chip environmentally assisted cracking in thin freestanding SiO2 films. Journal of Materials Research, 36(12), 2479-2494. https://doi.org/10.1557/s43578-021-00189-3 (Original work published 2021)
Rack, M., Frédéric Allibert, & Raskin, J.-P. (2021). Modeling of Semiconductor Substrates for RF Applications: Part II—Parameter Impact on Harmonic Distortion. IEEE Transactions on Electron Devices, 68(9), 4606-4613. https://doi.org/10.1109/ted.2021.3096781 (Original work published 2021)
Moreau, N., Pirson, T., Le Brun, G., Delhaye, T., Sandu, G., Paris, A., Bol, D., & Raskin, J.-P. (2021). Could Unsustainable Electronics Support Sustainability. Sustainability, 13(6541), 7. https://doi.org/10.3390/su13126541 (Original work published 2021)
Roisin, N., Brunin, G., Rignanese, G.-M., Flandre, D., & Raskin, J.-P. (2021). Indirect light absorption model for highly strained silicon infrared sensors. Journal of Applied Physics, 30(5), 30. https://doi.org/10.1063/5.0057350 (Original work published 2021)
Kilchytska, V., Makovejev, S., Esfeh, B. K., Nyssens, L., Halder, A., Raskin, J.-P., & Flandre, D. (2021). Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications. I E E E Journal of the Electron Devices Society, 9, 500-510. https://doi.org/10.1109/JEDS.2021.3057798 (Original work published 2021)
Baral, P., Orekhov, A., Dohmen, R., Coulombier, M., Raskin, J.-P., Cordier, P., Idrissi, H., & Pardoen, T. (2021). Rheology of amorphous olivine thin films characterized by nanoindentation. Acta Materialia, 219, 117257. https://doi.org/10.1016/j.actamat.2021.117257 (Original work published 2021)
Morelle, A., Vandermolen, E., Kilchytska, V., Raskin, J.-P., & Flandre, D. (2021). Improved Split CV Mobility Extraction in 28 nm Fully Depleted Silicon on Insulator Transistors. IEEE Electron Device Letters, 42(5), 661-664. https://doi.org/10.1109/LED.2021.3065002 (Original work published 2021)
Rajkumar Jaiswar, Mederos Henry, F., Hermans, S., Raskin, J.-P., & Huynen, I. (2021). Nonlinear electrical transport in Fe3O4-decorated graphene nanoplatelets. Journal of Physics D: Applied Physics, 54(6), 65304. https://doi.org/10.1088/1361-6463/abc2f2 (Original work published 2021)
Papier de conférence
Colla, M.-S., Lumbeeck, G., Raskin, J.-P., Idrissi, H., & Pardoen, T. (2021). Effect of ageing on the mechanical behavior of nanocrystalline metallic thin films. European Congress and Exhibition on Advanced Materials and Process - EUROMAT 2021, Graz, Austria.
Rack, M., Nyssens, L., Nabet, M., Lederer, D., & Raskin, J.-P. (2021). Field-Effect Passivation of Lossy Interfaces in High-Resistivity RF Silicon Substrates. EuroSOI-ULIS 2021 Proceedings, p. 130-133. https://doi.org/10.1109/eurosoi-ulis53016.2021.9560697
Baral, P., Orekhov, A., Dohmen, R., Coulombier, M., Raskin, J.-P., Cordier, P., Idrissi, H., & Pardoen, T. (2021). Rheology of amorphous olivine thin films characterized by nanoindentation at ambient temperature. The 2021 Spring Meeting of the European Materials Research Society (E-MRS), Virtual conference.
Rack, M., Nyssens, L., Courte, Q., Lederer, D., & Raskin, J.-P. (2021). Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI. ESSDERC 2021 Proceedings, p. 195-198. https://doi.org/10.1109/ESSDERC53440.2021.9631835
Jaddi, S., Wang, B., Malik, M. W., Zeng, Y., Raskin, J.-P., & Pardoen, T. (2021). Fracture toughness and fracture strain of single-layer freestanding graphene extracted by on-chip testing. 2021 MRS Spring Meeting & Exhibit, Seattle, WA, USA.
Merle, S., & Raskin, J.-P. (2021). How to avoid pitfalls of pedagogical methodologies in a global citizenship project? ANGEL (Academic Network on Global Education & Learning) conference, London, UK.
Rack, M., Allibert, F., & Raskin, J.-P. (2021). Substrate RF non-linear characterization and modeling. 5th Sino MOS-AK Workshop Xi’an (MOS-AK: Modeling of Systems and Parameter Extraction Working Group), Xi’an, China.
Nyssens, L., Rack, M., Halder, A., Vanbrabant, M., Kilchytska, V., & Raskin, J.-P. (2021). Back-Gate Network Extraction Free from Dynamic Self-Heating in FD SOI. IEEE International Symposium on V L S I Technology. Proceedings of Technical Papers, 1-2. https://doi.org/10.1109/vlsi-tsa51926.2021.9440125 (Original work published 2021)
Jaddi, S., Malik, M. W., Wang, B., Coulombier, M., Raskin, J.-P., & Pardoen, T. (2021). A crack-on-chip testing method applied to freestanding ultra-thin films from brittle to ductile down to 2D materials. European Congress and Exhibition on Advanced Materials and Process - EUROMAT 2021, Graz, Austria.
Baral, P., Wang, H., Jaddi, S., Houssiau, C., Orekhov, A., Bagherpour, A., Coulombier, M., Favache, A., Raskin, J.-P., Lucas, S., Idrissi, H., & Pardoen, T. (2021). Size and structure dependent ductility, strength and toughness of thin hybrid Al/Al2O3 nanolaminated films. European Congress and Exhibition on Advanced Materials and Process - EUROMAT 2021, Graz, Austria.
Malik, M. W., Wang, B., Jaddi, S., Yan, Y., Reis, V., Zeng, Y., Pardoen, T., Hackens, B., & Raskin, J.-P. (2021). Impact of oxygen on CVD grown boron nitride layers. 2021 MRS Spring Meeting & Exhibit, Seattle, WA, USA.
Jaddi, S., Coulombier, M., Raskin, J.-P., & Pardoen, T. (2021). Static fracture toughness and environmentally assisted cracking in thin freestanding SiO2 and SiN films using crack-on-chip testing. The 2021 Spring Meeting of the European Materials Research Society (E-MRS), Virtual conference.
Malik, M. W., Jaddi, S., Wang, B., & Raskin, J.-P. (2021). Nucleation seeds control for the growth of sub-centimeter size crystals of single-layer graphene on polycrystalline copper foil. European Congress and Exhibition on Advanced Materials and Process - EUROMAT 2021, Graz, Austria.
Coulombier, M., Baral, P., Pip, A., Dohmen, R., Raskin, J.-P., Pardoen, T., Cordier, P., & Idrissi, H. (2021). Time dependent response of amorphous olivine thin films determined by on-chip nanomechanical testing. The 2021 Spring Meeting of the European Materials Research Society (E-MRS), Virtual conference.
Vandermolen, E., Ferrandis, P., Allibert, F., Augendre, E., Nabet, M., Rack, M., Raskin, J.-P., & Cassé, M. (2021). Characterization of LPCVD polycrystalline silicon trap-rich based substrates for RF applications. The 31st International Conference on Defects in Semiconductors - ICDS-31, Oslo, Norway.
Hauwaert, M., Le Brun, G., Vandeputte, J., Mahy, J., Hermans, S., & Raskin, J.-P. (2021). Nanoparticles for impedimetric biodetection on paper-based substrates. Micro and Nano Engineering Conference – MNE 2021, Torino, Italy.
Moulin, M., Rack, M., Fache, T., Chalupa, Z., Plantier, C., Morand, Y., Lacord, J., Allibert, F., Gaillard, F., Lugo, J., Hutin, L., & Raskin, J.-P. (2021). High performance silicon-based substrate using buried PN junctions towards RF applications. Proceedings, p. 1-4. https://doi.org/10.1109/eurosoi-ulis53016.2021.9560171
Bahramia, F., D’Hease, C., Nysten, B., Hammad, M., Idrissi, H., Raskin, J.-P., & Pardoen, T. (2021). On the extraction of accurate stiffness and strength properties of 2D materials using atomic force microscopy induced membrane deflection. The 2021 Spring Meeting of the European Materials Research Society (E-MRS), Virtual conference.
Kilchytska, V., Makovejev, S., Esfeh, B. K., Nyssens, L., Halder, A., Raskin, J.-P., & Flandre, D. (2021). Advanced MOSFETs Electrical Characterization for Further Analog and RF applications. SBMicro, virtual conference.
Raskin, J.-P. (2021). When defects become beauty ... from RF SOI CMOS to the exploration of material properties at nanometre scale. Webinar on Research Opportunities on Semiconductor Materials and Devices (IIITDM), Virtual conference.
Le Brun, G., Hauwaert, M., Adant, I., & Raskin, J.-P. (2021). Conception responsable de capteurs de qualité de l’eau. Conception responsable de capteurs de qualité de l’eau. Published. Conference on interdisciplinary and transdisciplinary research for sustainable development, Louvain-la-Neuve, Belgium.
Delhaye, T. P., Le Brun, G., Flandre, D., & Raskin, J.-P. (2021). Bottom-Up Life-Cycle Assessment of MEMS Piezoresistive Pressure Sensors. Proceedings, p. 1-6. https://doi.org/10.1109/dtip54218.2021.9568683
Yadav, S., Cardinael, P., Zhao, M., Peralagu, U., Alian, A., Khaled, A., Makovejev, S., Ekoga, E., Lederer, D., Raskin, J.-P., Parvais, B., & Collaert, N. (2021). CMOS compatible GaN-on-Si HEMT technology for RF applications: analysis of substrate losses and non-linearities. International Conference on IC Design and Technology 2021, Dresden, Germany.
Pirson, T., Bol, D., Le Brun, G., & Raskin, J.-P. (2021). Can we cope with the upcoming massive deployment of IoT within environmental limits? Educational workshop of IEEE ESSDERC, Grenoble (France).
Cardinael, P., Yadav, S., Zhao, M., Rack, M., Lederer, D., Collaert, N., Parvais, B., & Raskin, J.-P. (2021). Impact of III-N buffer layers on RF losses and harmonic distortion of GaN-on-Si Substrates. ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC). Published. European Solid-State Device Research Conference (ESSDERC 2021), Grenoble, France. https://doi.org/10.1109/ESSDERC53440.2021.9631822 (Original work published 2021)
Delhaye, T., Le Brun, G., Flandre, D., & Raskin, J.-P. (2021). Bottom-Up Life-Cycle Assessment of MEMS Piezoresistive Pressure Sensors. Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Virtual event.
Yan, Y., Flandre, D., Kilchytska, V., Faniel, S., Tang, X., & Raskin, J.-P. (2021). Determination of Carrier Lifetime in Silicon Using an Ultra-thin Al2O3/SiO2 Dielectric Stack. Proceedings of the 2021 IEEE Latin America Electron Devices Conference (LAEDC). 2021 IEEE Latin America Electron Devices Conference (LAEDC), Virtual conference.
Ghidelli, M., Idrissi, H., Orekhov, A., Raskin, J.-P., Park, J.-U., Li Bassi, A., & Pardoen, T. (2021). Toward novel stretchable electronics with nanostructured metallic glass films. The International Conference on Metallurgical Coatings and Thin Films – ICMCTF 2020, San Diego, California, USA.
Raskin, J.-P. (2021). TCAD at the heart of innovation in RF SOI technology. Silvaco SURGE 2021, Virtual conference.
Ghidelli, M., Idrissi, H., Orekhov, A., Raskin, J.-P., Park, J.-U., Li Bassi, A., & Pardoen, T. (2021). Novel nanostructured thin film metallic glasses for stretchable electronics. The 2021 Spring Meeting of the European Materials Research Society (E-MRS), Virtual conference.
Pardoen, T., Orekhov, A., Wang, H., Baral, P., Coulombier, M., Raskin, J.-P., & Idrissi, H. (2021). Interface controlled high strength, ductile and tough hybrid Al/amorphous Al2O3 nanolaminates. The 2021 Spring Meeting of the European Materials Research Society (E-MRS), Virtual conference.
Khiara, N., Coulombier, M., Onimus, F., Raskin, J.-P., Pardoen, T., & Bréchet, Y. (2021). Creep behavior of helium implanted submicron films under irradiation. 2021 TMS Annual Meeting & Exhibition, Orlando, FL, USA.
Vandermolen, E., Ferrandis, P., Allibert, F., Nabet, M., Rack, M., Raskin, J.-P., De Groot, C. H. (., & Cassé, M. (2021). Characterization of traps in high resistivity silicon substrates and link with Radio Frequency performances. The 2021 Spring Meeting of the European Materials Research Society (E-MRS), Virtual conference.
Merle, S., Mbuyi Katshiatshia, H., & Raskin, J.-P. (2021). De la coopération à la collaboration universitaire : des étudiants congolais et belges engagés auprès des acteurs sociaux et économiques de la RD Congo. La Coopération universitaire au développement à l’épreuve de l’après Covid-19. Published. La Coopération universitaire au développement à l’épreuve de l’après Covid-19, RDC, Kinshasa.
Tang, X., Debliquy, M., Lahem, D., Yan, Y., & Raskin, J.-P. (2021). Graphene sensors. Encyclopedia.
Rack, M., Nyssens, L., Wane, S., Bajon, D., Lederer, D., & Raskin, J.-P. (2021). FD-SOI mm-Wave Differential Single-Pole Switches with Ultra-High Isolation. 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), Hsinchu, Taiwan.
Raskin, J.-P. (2021). SOI technologies for RF and millimeter-wave integrated circuits. IEEE Latin America Electron Devices Conference. Published. 2021 IEEE Latin America Electron Devices Conference (LAEDC), Mexico, Mexico. https://doi.org/10.1109/laedc51812.2021.9437979 (Original work published 2021)
Khiara, N., Onimus, F., Dupuy, L., Crocombette, J.-P., Jublot-Leclerc, S., Jourdan, T., Pardoen, T., Raskin, J.-P., & Bréchet, Y. (2021). A novel displacement cascade driven irradiation creep mechanism in pure copper. 2021 TMS Annual Meeting & Exhibition, Orlando, FL, USA.
Courte, Q., Rack, M., Nabet, M., Cardinael, P., & Raskin, J.-P. (2021). High-Temperature Characterization of Novel Silicon-Based Substrate Solutions for RF-IC Applications. European Solid-State Device Research Conference (ESSDERC 2021), Grenoble, France.
Rack, M., & Raskin, J.-P. (2021). Next generation of FD SOI platform to fulfill the requirements of millimeter-wave wireless systems. The 51st European Solid-State Device Conference – ESSDERC 2021, Grenoble, France.
Idrissi, H., Daudin, R., Coulombier, M., Lhuissier, P., Raskin, J.-P., Blandin, J.-J., Schülli, T. U., & Pardoen, T. (2021). Plasticity mechanisms in ZrNi metallic glass thin films with high strength/ductility balance. European Congress and Exhibition on Advanced Materials and Process - EUROMAT 2021, Graz, Austria.
Vanbrabant, M., Nyssens, L., Kilchytska, V., & Raskin, J.-P. (2021). Assessment of RF compact modelling of FD SOI transistors. IEEE Latin America Electron Devices Conference. Published. 2021 IEEE Latin America Electron Devices Conference (LAEDC), Mexico, Mexico. https://doi.org/10.1109/laedc51812.2021.9437955 (Original work published 2021)
Hauwaert, M., Eloy, M.-C., Magnin, D., Glinel, K., Mahillon, J., Raskin, J.-P., Le Brun, G., Leprince, A., & et al. (2021). Phage-protein biointerfaces for electrochemical paper-based bacteria sensors. The 21st edition of Trends in Nanotechnology International Conference – TNT 2021, Tirana, Albania.
Papier de conférence
Baral, P., Houssiau, C., Bagherpour, A., Muller, J., Orekhov, A., Favache, A., Colla, M.-S., Van Loock, F., Coulombier, M., Raskin, J.-P., Lucas, S., Idrissi, H., & Pardoen, T. (2020). Size and structure dependent ductility, strength and toughness of thin hybrid nanolaminated films. Materials Science and Engineering Congress (MSE), Darmstadt, Germany.
Wane, S., Huard, V., Rack, M., Nyssens, L., Kieniewicz, B., Bajon, D., & Raskin, J.-P. (2020). Broadband smart mm-wave Front-End-Modules in advanced FD-SOI with adaptive-biasing and tuning of distributed antenna-arrays. 2020 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems, Texas (USA).
Rack, M., Nyssens, L., Wane, S., Bajon, D., & Raskin, J.-P. (2020). DC-40 GHz SPDTs in 22 nm FD-SOI and back-gate impact study. The 2020 IEEE Radio Frequency Integrated Circuits Symposium – RFIC 2020, Los Angeles (USA).
Le Brun, G., & Raskin, J.-P. (2020). Life cycle approach for electronics eco-design: case study on paper-based water quality sensors. The 27th CIRP Conference on Life Cycle Engineering – LCE 2020, Grenoble (France).
Raskin, J.-P. (2020). No Digital Society without Sustainable Communication Technologies. ESSDERC 2020, Grenoble (France).
Khiara, N., Onimus, F., Dupuy, L., Crocombette, J.-P., Pardoen, T., Raskin, J.-P., & Brechet, Y. (2020). Un nouveau mécanisme de fluage d’irradiation induit par les cascades de déplacements générées par l’irradiation. Plasticité 2020, Toulouse (France).
Yadav, S., Cardinael, P., Zhao, M., Vondkar, K., Khaled, A., Rodriguez, R., Vermeersch, B., Makovejev, S., Ekoga, E., Pottrain, A., Waldron, N., Raskin, J.-P., Parvais, B., & Collaert, N. (2020). Substrate RF Losses and Non-linearities in GaN-on-Si HEMT Technology. International Electron Devices Meeting. I E D M Technical Digest. Published. 2020 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA. https://doi.org/10.1109/iedm13553.2020.9371893 (Original work published 2020)
Kilchytska, V., Makovejev, S., Kazemi Esfeh, B., Nyssens, L., Halder, A., Raskin, J.-P., & Flandre, D. (2020). Electrical characterization of advanced MOSFETs towards analog and RF applications. Proceedings of the 2020 IEEE Latin America Electron Devices Conference (LAEDC), 4. https://doi.org/10.1109/LAEDC49063.2020.9073536
Le Brun, G., Leprince, A., Crahay, O., Glinel, K., Mahillon, J., & Raskin, J.-P. (2020). Phage endolysin biointerface for electrochemical paper-based bacteria sensors. Biosensors 2020, Busan, Korea.
Halder, A., Nyssens, L., Rack, M., Raskin, J.-P., & Kilchytska, V. (2020). Effect of heat sink Back-End of Line on self-heating in 22 nm FD SOI MOSFETs. Sixth Joint International EUROSOI-ULIS, Caen (France).
Halder, A., Nyssens, L., Rack, M., Raskin, J.-P., & Kilchytska, V. (2020). Effect of Heat Sink in Back-End of Line on Self-Heating in 22 nm FDSOI MOSFETs. Proceedings, p. 1-4. https://doi.org/10.1109/eurosoi-ulis49407.2020.9365293
Khiara, N., Onimus, F., Dupuy, L., Crocombette, J.-P., Jublot-Leclerc S., Jourdan, T., Pardoen, T., Raskin, J.-P., & Bréchet, Y. (2020). A novel displacement cascade driven irradiation creep mechanism in α-zirconium and copper. The Nuclear Materials Conference - NUMAT 2020, Ghent, Belgium.
Jaddi, S., Coulombier, M., Idrissi, H., Raskin, J.-P., & Pardoen, T. (2020). Fracture toughness and environmentally assisted subcritical cracking of thin freestanding Al2O3 and SiO2 films. 17th European Mechanics of Materials Conference (EMMC17), Madrid (Spain).
Le Brun, G., Hauwaert, M., Leprince, A., Glinel, K., Mahillon, J., & Raskin, J.-P. (2020). Electrochemical paper-based biosensors for bacteria detection in water. The 1st International Electronic Conference on Biosensors (IECB), On-line conference.
Rack, M., & Raskin, J.-P. (2020). SOI devices and substrates towards RF and millimeter-wave ICs. IEEE Electron Devices Technology & Manufacturing Conference (EDTM). Published. The 4th IEEE Electron Devices Technology and Manufacturing Conference 2020 – EDTM 2020, Penang (Malaysia). https://doi.org/10.1109/EDTM47692.2020.9117977
HUET, B., Bachu, S., Choudhury, T. H., Chubarov, M., Zhang, X., & Raskin, J.-P. (2020). Mass production of CVD graphene, reliable transfer, and co- integration with TMDs. The 3rd edition of the Graphene & 2D Materials International Conference and Exhibition - GrapheneforUS, New-York (USA).
Vandermolen, E., Ferrandis, P., Allibert, F., Nabet, M., (Kees) de Groot, CH., Raskin, J.-P., & Cassé, M. (2020). Characterization of deep levels in high resistivity substrates by Photo-Induced Current Transient Spectroscopy. Workshop on Defects 2020, Leuven (Belgium).
Rack, M., Nyssens, L., Wane, S., Bajon, D., & Raskin, J.-P. (2020). DC-40 GHz SPDTs in 22 nm FD-SOI and Back-Gate Impact Study. 2020 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), Los Angeles, CA, USA.
Raskin, J.-P. (2020). SOI technologies from digital to RF and beyond. Intelligent Semiconductor for Technology Convergence, nano-KISS Short Course, pp 28-64.
Pardoen, T., Dépinoy, S., Strepenne, F., Bertholet, Y., Raskin, J.-P., Massart, T. J., & Godet, S. (2020). Interface toughening in multilayered systems through extrinsic plastically deforming or compliant dissipative interlayers. 17th European Mechanics of Materials Conference (EMMC17), Madrid (Spain).
Raskin, J.-P. (2020). New generation of SOI substrate solutions for RF and millimeter-wave applications. The 27th Korean Conference on Semiconductors – KCS 2020 – Intelligent Semiconductor for Technology Convergence, Sabuk Gohan (Korea).
Article de journal
Ding, L., Raskin, J.-P., Lumbeeck, G., Schryvers, D., & Idrissi, H. (2020). TEM investigation of the role of the polycrystalline-silicon film/substrate interface in high quality radio frequency silicon substrates. Materials Characterization, 161, 110174. https://doi.org/10.1016/j.matchar.2020.110174 (Original work published 2020)
Le Brun, G., & Raskin, J.-P. (2020). Life cycle approach for electronics eco - design: case study on paper - based water quality sensors. Procedia CIRP, 90, 344-349. https://doi.org/10.1016/j.procir.2020.02.041 (Original work published 2020)
Shan, Z., Zhang, X., Dang, J., Chen, Y., Lu, B., Zhang, M., Song, J., Raskin, J.-P., & Tang, X. (2020). Research of correspondence between human beings and universe based on intelligent pulse diagnosis instrument. Journal of Traditional Chinese Medicine, 60(24). https://doi.org/10.13288/j.11-2166/r.2019.24.013. (Original work published 2019)
Nyssens, L., Rack, M., & Raskin, J.-P. (2020). Effective resistivity extraction of low-loss silicon substrate at millimeter-wave frequencies. International Journal of Microwave and Wireless Technologies, 12(7), 615-628. https://doi.org/10.1017/S175907872000077X (Original work published 2020)
Allibert, F., Andia, L., Morandini, Y., Veytizou, C., Rack, M., Nyssens, L., Raskin, J.-P., & Augendre, E. (2020). Engineering SOI substrates for RF to mm-wave front-ends. Microwave Journal, 72-82. (Original work published 2020)
Nyssens, L., Halder, A., Esfeh, B. K., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., & Kilchytska, V. (2020). Self-Heating in FDSOI UTBB MOSFETs at Cryogenic Temperatures and Its Effect on Analog Figures of Merit. I E E E Journal of the Electron Devices Society, 8, 789-796. https://doi.org/10.1109/JEDS.2020.2999632 (Original work published 2020)
Belaroussi, Y., Scheen, G., Saadi, A. A., Taibi, A., Maafri, D., Nysten, B., Gabouze, N., & Raskin, J.-P. (2020). Structural and nanomechanical properties of porous silicon: Cheap substrate for CMOS process industry. Surface and Interface Analysis, 52(12), 1055-1060. https://doi.org/10.1002/sia.6885 (Original work published 2020)
Jaiswar Rajkumar, Dupont Védi, Mederos Henry, F., Hermans, S., Raskin, J.-P., Huynen, I., & et al. (2020). Inkjet-printed frequency-selective surfaces based on carbon nanotubes for ultra-wideband thin microwave absorbers. Journal of Materials Science: Materials in Electronics, 1(12), 2. https://doi.org/10.1007/s10854-019-02751-6 (Original work published 2019)
Pampin, R., Raskin, J.-P., Huynen, I., & Flandre, D. (2020). Electrodes-oxide-semiconductor device for biosensing: Renewed conformal analysis and multilayer algorithm. Journal of Electroanalytical Chemistry, 856, 113651. https://doi.org/10.1016/j.jelechem.2019.113651 (Original work published 2020)
Scheen, G., Tuyaerts, R., Rack, M., Nyssens, L., Rasson, J., Nabet, M., & Raskin, J.-P. (2020). Post-process porous silicon for 5G applications. Solid-State Electronics, 168, 107719. https://doi.org/10.1016/j.sse.2019.107719 (Original work published 2020)
Le Brun, G., Hauwaert, M., Leprince, A., Glinel, K., Mahillon, J., & Raskin, J.-P. (2020). Electrochemical Characterization of Nitrocellulose Membranes towards Bacterial Detection in Water. Proceedings, 60(1), 61. https://doi.org/10.3390/iecb2020-07080 (Original work published 2020)
Khiara, N., Onimus, F., Dupuy, L., Kassem, W., Crocombette, J.-P., Pardoen, T., Raskin, J.-P., & Bréchet, Y. (2020). A novel displacement cascade driven irradiation creep mechanism in α-zirconium: A molecular dynamics study. Journal of Nuclear Materials, 541, 152336. https://doi.org/10.1016/j.jnucmat.2020.152336 (Original work published 2020)
Tang, X., Raskin, J.-P., Kryvutsa, N., Hermans, S., Slobodian, O., Nazarov, A. N., & Debliquy, M. (2020). An ammonia sensor composed of polypyrrole synthesized on reduced graphene oxide by electropolymerization. Sensors and Actuators B: Chemical : international journal devoted to research and development of physical and chemical transducers, 305(127423), 127423. https://doi.org/10.1016/j.snb.2019.127423 (Original work published 2020)
Han, Q., Liu, M., Kazemi Esfeh, B., Raskin, J.-P., & Zhao, Q.-T. (2020). Impact of gate to source/drain alignment on the static and RF performance of junctionless Si nanowire n-MOSFETs. Solid-State Electronics, 169, 107817. https://doi.org/10.1016/j.sse.2020.107817. (Original work published 2020)
Tuyaerts, R., Raskin, J.-P., & Proost, J. (2020). Opto-electrical properties and internal stress in Al:ZnO thin films deposited by direct current reactive sputtering. Thin Solid Films, 695(137760), 8 pages. https://doi.org/10.1016/j.tsf.2019.137760 (Original work published 2020)
Nabet, M., Rack, M., Hashim, N. Z., de Groot, C. H. K., & Raskin, J.-P. (2020). Behavior of gold-doped silicon substrate under small- and large-RF signal. Solid-State Electronics, 168, 107718. https://doi.org/10.1016/j.sse.2019.107718 (Original work published 2020)
HUET, B., Raskin, J.-P., Redwing, J. M., & Snyder, D. W. (2020). Fundamental limitations for the transfer of graphene grown on Cu substrates. Carbon, 163, 95-104. https://doi.org/10.1016/j.carbon.2020.02.074. (Original work published 2020)
Nyssens, L., Halder, A., Kazemi Esfeh, B., Planes, N., Flandre, D., Kilchytska, V., & Raskin, J.-P. (2020). 28-nm FD-SOI CMOS RF Figures of Merit Down to 4.2 K. I E E E Journal of the Electron Devices Society, B, 646-654. https://doi.org/10.1109/JEDS.2020.3002201 (Original work published 2020)
Article de journal
Jaddi, S., Coulombier, M., Raskin, J.-P., & Pardoen, T. (2019). Crack on a chip test method for thin freestanding films. Journal of the Mechanics and Physics of Solids, 123, 267-291. https://doi.org/10.1016/j.jmps.2018.10.005 (Original work published 2019)
Chabou, N., Birouk, B., Aida, M. S., & Raskin, J.-P. (2019). Deposition time and annealing effects on morphological and optical properties of ZnS thin films prepared by Chemical Bath Deposition. Materials Science-Poland, 37(3), 404-416. (Original work published 2019)
Kazemi Esfeh, B., Kilchytska, V., Planes, N., Haond, M., Flandre, D., & Raskin, J.-P. (2019). 28 nm FDSOI nMOSFET RF Figures of Merits and Parasitic Elements extraction at Cryogenic Temperature down to 77 K. I E E E Journal of the Electron Devices Society, 7, 810816. https://doi.org/10.1109/JEDS.2019.2906724 (Original work published 2019)
Kazemi Esfeh, B., Planes N., Haond M., Raskin, J.-P., Flandre, D., & Kilchytska, V. (2019). 28 nm FDSOI analog and RF figures of merit at N2 cryogenic temperatures. Solid-State Electronics, 159(September 2019), 77-82. https://doi.org/10.1016/j.sse.2019.03.039 (Original work published 2019)
Raskin, J.-P. (2019). Analogue and RF performances of Fully Depleted SOI MOSFET (invited paper). Nanoelectronic Devices, 2(April 2019), 18 pages. https://doi.org/10.21494/ISTE.OP.2019.0358 (Original work published 2019)
HUET, B., Zhang, X., Redwing, J. M., Snyder, D. W., & Raskin, J.-P. (2019). Multi-wafer batch synthesis of graphene on Cu films by quasi-static flow chemical vapor deposition. 2D Materials, 6(4), 45032. https://doi.org/10.1088/2053-1583/ab33ae (Original work published 2019)
Slobodian, O. S., Milovanov, Y. S., Skryshevsky, V. A., Vasin, A. V., Tang, X., Raskin, J.-P., & et al. (2019). Reduced graphene oxide obtained by spray pyrolis technique for gas sensing. Fizika Napivprovidnikiv Kvantova ta Optoelektronika, 22(1), 98-103. https://doi.org/10.15407/spqeo22.01.98 (Original work published 2019)
Tang, X., Haddad, P.-A., Mager, N., Geng, X., Reckinger, N., Hermans, S., Debliquy, M., & Raskin, J.-P. (2019). Chemically deposited palladium nanoparticles on graphene for hydrogen sensor applications. Scientific Reports, 9(1), 3653. https://doi.org/10.1038/s41598-019-40257-7 (Original work published 2019)
André, N., Rack, M., Nyssens, L., Oueslati, D., Ben Ali, K., Gilet, S., Craeye, C., Raskin, J.-P., & Flandre, D. (2019). Ultra Low-Loss Si Substrate for On-Chip UWB GHz Antennas. I E E E Journal of the Electron Devices Society, 7, 393397. https://doi.org/10.1109/JEDS.2019.2902636 (Original work published 2019)
Li, G., André, N., Huet, B., Delhaye, T., Reckinger, N., Francis, L., Lioa, L., Raskin, J.-P., Zeng, Y., & Flandre, D. (2019). Enhanced ultraviolet photoresponse in a graphene-gated ultra-thin Sibased photodiode. Journal of Physics D: Applied Physics, 52(24), 7. https://doi.org/10.1088/1361-6463/ab12b8 (Original work published 2019)
Rack, M., Nyssens, L., & Raskin, J.-P. (2019). Low loss Si-substrates enhanced using buried PN junctions for RF applications. IEEE Electron Device Letters, 40(5), 690-693. (Original work published 2019)
Idrissi, H., Ghidelli, M., Béché, A., Turner, S., Gravier, S., Blandin, J.-J., Raskin, J.-P., Schryvers, D., & Pardoen, T. (2019). Atomic-scale viscoplasticity mechanisms revealed in high ductility metallic glass films. Scientific Reports, 9(1), 13426. https://doi.org/10.1038/s41598-019-49910-7 (Original work published 2019)
Caicedo, N., Leturcq, R., Raskin, J.-P., Flandre, D., & Lenoble, D. (2019). Detection mechanism in highly sensitive ZnO nanowires network gas sensors. Materials science, preprint, 27. (Original work published 2019)
Fates, R., & Raskin, J.-P. (2019). Probing carrier concentration in gated single layer, bilayer and trilayer CVD graphene using Raman Spectroscopy. Carbon, 149, 390-399. https://doi.org/10.1016/j.carbon.2019.04.078 (Original work published 2019)
Jaiswar, R. R., Mederos Henry, F., Dupont, V., Hermans, S., Raskin, J.-P., & Huynen, I. (2019). A ultra-wideband thin microwave absorber using inkjet-printed Frequency Selective Surfaces combining carbon nanotubes and magnetic nanoparticles. Applied Physics A: Solids and Surfaces, 125(473). https://doi.org/10.1007/s00339-019-2764-9 (Original work published 2019)
Jaiswar, R., Bailly, C., Hermans, S., Raskin, J.-P., & Huynen, I. (2019). Wideband microwave absorption in thin nanocomposite films induced by a concentration gradient of mixed carbonaceous nanostructures. Journal of Materials Science: Materials in Electronics, 30(21), 19147-19153. https://doi.org/10.1007/s10854-019-02271-3 (Original work published 2019)
Papier de conférence
Milovanov, Y. S., Skryshevsky, V. A., Slobodian, O. M., Pustovyi, D. O., Tang, X., Raskin, J.-P., & Nazarov, A. N. (2019). Influence of gas adsorption on the impedance of graphene oxide. Proceedings of the 2019 IEEE 39th International Conference on Electronics and Nanotechnology - IEEE ELNANO-2019, p. 155-158.
Le Brun, G., & Raskin, J.-P. (2019). Paper-based printed electronic sensor for water quality monitoring. The 2019 European Materials Research Society (E-MRS) Fall Meeting, Warsaw (Poland).
Scheen, G., Tuyaerts, R., Rack, M., Nyssens, L., Rasson, J., & Raskin, J.-P. (2019). Post-process porous silicon for 5G applications. Proceedings of the Fifth Joint International EUROSOI-ULIS Conference on SOI and Ultimate Integration on Silicon - EuroSOI-ULIS 2, p. 110-111.
Flandre, D., Kazemi Esfeh, B., Nyssens, L., Halder, A., Kilchytska, V., & Raskin, J.-P. (2019). Figures of merit of nanoscale transistors at cryogenic temperature: 28nm UTBB FD SOI nMOSFET case study. 3rd Symposium on Schottky barrier MOS devices, Gif-sur Yvette (France).
Kermouche, G., Baral, P., Guillonneau, G., Loubet, J.-L., Ghidelli, M., Raskin, J.-P., Pardoen, T., & Idrissi, H. (2019). Measurement of the creep behavior of thin ZrNi metallic glass films – a comparison between nanoindentation relaxation, nanoindentation creep and lab-on-chips experiments. ECI conference, Nanomechanical Testing in Materials Research and Development VII, Malaga, Spain.
Kermouche, G., Baral, P., Loubet, J. L., Ghidelli, M., Idrissi, H., Raskin, J.-P., & Pardoen, T. (2019). A new long-term nanoindentation relaxation method to characterize the time-dependent behavior of thin ZrNi metallic glass films. 17th International conference on liquid and amorphous metals, Lyon, France.
Nyssens, L., Halder, A., Planes, N., Flandre, D., Kilchytska, V., & Raskin, J.-P. (2019). 28 FDSOI RF Figures of Merit down to 4.2 K. IEEE S3S Conference, San Jose (USA).
Scheen, G., Tuyaerts, R., Rack, M., Nyssens, L., Rasson, J., & Raskin, J.-P. (2019). Post-process local porous silicon integration method for RF application. Proceedings of the IEEE International Microwave Symposium – IMS’19, p. 1291-1294.
Velosa-Moncada, L. A., Raskin, J.-P., Aguilera-Cortés, L. A., & Herrera-May, A. L. (2019). Thermal mismatch stress analysis of high-temperature deposited polysilicon cantilever-beam. ANSYS Convergence, Mexico (Mexico).
Nyssens, L., Rack, M., & Raskin, J.-P. (2019). Effective Resistivity Extraction of Low-Loss Silicon Substrate at Millimeter-Wave Frequencies. European Microwave Integrated Circuit Conference (EuMIC), Paris (France). https://doi.org/10.23919/EuMIC.2019.8909575
HUET, B., Raskin, J.-P., Redwing, J. M., & Snyder, D. W. (2019). Epitaxial Cu films: an ideal platform for the graphene growth, transfer and device fabrication. 19th International Conference on Crystal Growth and Epitaxy (ICCGE-19), Keystone, Colorado (USA).
Khiara, N., Onimus, F., Dupuy, L., Crocombette, J. P., Pardoen, T., Raskin, J.-P., & Brechet, Y. (2019). A molecular dynamics study of irradiation creep deformation mechanisms in α-zirconium. 1st Colloquium on Theoretical and Experimental Micro-Mechanics, Metz (France).
Nabet, M., Rack, M., De Groot, C. H. K., & Raskin, J.-P. (2019). Behavior of gold-doped silicon under small- and large-RF signal. Proceedings of the Fifth Joint International EUROSOI-ULIS Conference on SOI and Ultimate Integration on Silicon - EuroSOI-ULIS 2, p. 103-104.
Nyssens, L., Rack, M., & Raskin, J.-P. (2019). Evaluation of silicon substrate losses at millimeter-wave frequencies. On-Wafer Users’ Forum 2019 at IEEE International Microwave Symposium – IMS’19, Boston, MA (USA).
Bahrami, F., Fivel, M., Wasil Malik, M., Huet, B., Hammad, M., Idrissi, H., Raskin, J.-P., & Pardoen, T. (2019). Graphene effect on mechanical response of metal substrate. Abstract Book - EUROMAT 2019, p. 1370.
Wang, H., Coulombier, M., Idrissi, H., Raskin, J.-P., & Pardoen, T. (2019). Interface Controlled Ductile Hybrid Crystal/Amorphous Nanolaminates. 1st Colloquium on Theoretical and Experimental Micro-Mechanics, Metz, France.
Jaddi, S., Coulombier, M., Raskin, J.-P., & Pardoen, T. (2019). Subcritical crack growth in freestanding silicon nitride and silicon dioxide thin films using residual stress-induced crack on-chip testing technique. Nanomechanical Testing in Materials Research and Development VII. Published. ECI - The Nanomechanical Testing in Materials Research and Development VII, Malaga (Spain).
Nyssens, L., Halder, A., Kazemi Esfeh, B., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., & Kilchytska, V. (2019). Self-Heating in 28 FDSOI UTBB MOSFETs at Cryogenic Temperatures. 49th European Solid-State Device Research Conference (ESSDERC 2019), Cracow (Poland).
Khiara, N., Onimus, F., Dupuy, L., Crocombette, J. P., Pardoen, T., Raskin, J.-P., & Brechet, Y. (2019). A molecular dynamics study of irradiation creep deformation mechanisms in α-zirconium. Materials in Nuclear Energy Systems - MiNES, Baltimore (USA).
Flandre, D., André, N., Delhaye, T., Francis, L., & Raskin, J.-P. (2019). Capteurs CMOS physiques & physiologiques flexibles et basse consommation. Ecole d’hiver Francophone sur les Technologies de Conception des Systèmes embarqués Hétérogènes (FETCH 2019), Louvain-la-Neuve (Belgium).
Merle, S., & Raskin, J.-P. (2019). Three aspects of reflection to decolonize Service Learning in its practice. The 2nd European Conference on Service-Learning in Higher Education - ECSL 2019, Antwerpen (Belgium).
Raskin, J.-P. (2019). ENCOS – No digital society without sustainable information technology. Proceedings of Sustainable IoT Workshop, p. 11 pages.
Orekhov, A., Ghidelli, M., Béché, A., Nord, M., Verbeeck, J., Raskin, J.-P., Schryvers, D., Pardoen, T., & Idrissi, H. (2019). Investigation of the nanoscale plasticity mechanisms in nanostructured thin metallic glass films using advanced in‐situ TEM nanomechanical testing. Book of abstracts, p. 4.
Khiara, N., Dupuy, L., Onimus, F., Crocombette, J.-P., Pardoen, T., Raskin, J.-P., & Brechet, Y. (2019). Simulation de dynamique moléculaire des mécanismes de fluage d’irradiation du zirconium. Colloque Plasticité 2019. Published. Colloque Plasticité 2019, Villeneuve d’Ascq (France).
HUET, B., Raskin, J.-P., J. M. Redwing, & D. W. Snyder. (2019). Multi-wafer batch synthesis of graphene on Cu films by quasi-static flow chemical vapor deposition. 19th International Conference on Crystal Growth and Epitaxy (ICCGE-19), Keystone (Colorado - USA).
Wasil Malik, M., Huet, B., & Raskin, J.-P. (2019). CVD Synthesis of Large Area Twisted Multilayer Graphene. Graphene 2019, Rome (Italy).
Rack, M., Nyssens, L., & Raskin, J.-P. (2019). Silicon-substrate enhancement technique enabling high quality integrated RF passives. Proceedings of the IEEE International Microwave Symposium – IMS’19, p. 1295-1298.
Huet, B., Zhang, X., Raskin, J.-P., J. Redwing, D. W. Snyder, & et al. (2019). Chemical vapor synthesis of ultra flat crack-free highly-crystalline single-layer graphene on Cu substrates. Proceedings of Graphene for US - Graphene & 2D Materials International Conference and Exhibition, p. 1 page.
Rack, M., & Raskin, J.-P. (2019). SOI technologies for RF and millimeterwave applications. The 236th Meeting of the Electrochemical Society - The Semiconductor Process Integration 11 Symposium, Atlanta (USA).
Wasil Malik, M., Huet, B., & Raskin, J.-P. (2019). Domain shape engineering of CVD grown hexagonal Boron Nitride. 2019 Materials Research Society Spring Meeting – MRS Spring’19, paper # QN01.13.05.
Wane, S., Emam, M., & Raskin, J.-P. (2019). Chip Package PCB Antenna Co Design for Smart 5G Solutions: Requirement for Unified Modeling & Instrumentation Platforms. Tutorial, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference – S3S’19, San Francisco (USA).
Khiara, N., Dupuy, L., Onimus, F., Crocombette, J.-P., Pardoen, T., & Raskin, J.-P. (2019). Expériences de traction in situ sous irradiation : application aux alliages de zirconium et de cuivre. 63ièmes journées du GUMP (Groupe des Utilisateurs de Microscopie électronique Philips-FEI), CSNSM/JANNuS-Orsay, Orsay (France).
Nyssens, L., Rack, M., & Raskin, J.-P. (2019). New method for accurate transmission line characterization on low-loss silicon substrate at millimiter-wave frequencies. The Microwave Technology and Techniques Workshop 2019, ESA-ESTEC in Noordwijk (The Netherlands).
Raskin, J.-P. (2019). Fully Depleted SOI technologies from digital to RF and beyond. Fifth Joint International EUROSOI-ULIS Conference on SOI and Ultimate Integration on Silicon - EuroSOI-ULIS 2019, Grenoble (France).
Jaddi, S., Coulombier, M., Raskin, J.-P., & Pardoen, T. (2019). Subcritical crack growth in freestanding silicon nitride and silicon dioxide thin films. Abstract book - EUROMAT 2019, p. 1361.
Ghidelli, M., Idrissi, H., Orekhov, A., Raskin, J.-P., Li Bassi, A., & Pardoen, T. (2019). Novel nanostructured thin film metallic glasses with superior mechanical properties. 26th International Symposium on Metastable, Amorphous and Nanostructured Materials, Chennai, India.
Papier de conférence
Ghidelli, M., Coulombier, M., Pardoen, T., Idrissi, H., Schülli, T., Gravier, S., Blandin, J. J., Daudin, R., & Raskin, J.-P. (2018). On the processing, mechanical and structural characterization of ZrNi amorphous thin films. Proceedings of the 25th ISMANAM 2018, p. ID #274.
Raskin, J.-P. (2018). RF characterization and modelling of SOI MOSFETs. SINANO Multi-Scale Modelling Summer School, Universitat Rovira i Virgili, Tarragona (Spain).
Kazemi Esfeh, B., Masselus, M., Planes, N., Haond, M., Raskin, J.-P., Flandre, D., & Kilchytska, V. (2018). 28 FDSOI Analog and RF Figures of merit at Cryogenic Temperatures. 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon EUROSOI-ULIS 2018, Granada (Spain).
Rack, M., Lederer, D., Nyssens, L., Paganini, A., Beganovic, A., & Raskin, J.-P. (2018). Layout device dimension impact on effective substrate resistivity. Proceeddings of the IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference – S3S’18, p. paper 7.2.
Pardoen, T., Raskin, J.-P., Coulombier, M., Jaddi, S., Ghidelli, M., Vayrette, R., & Idrissi, H. (2018). On a chip MEMS based mechanical testing. Workshop on stress in microelectronics, Leuven, Belgium.
Raskin, J.-P. (2018). Current status and trends in RF SOI material and device. Proceedings of SEMICON Korea 2018, p. 3 pages.
Lumbeeck, G., Idrissi, H., Samaeeaghmiyoni, V., Béché, A., Haque, A., Raskin, J.-P., Pardoen, T., & Schryvers, D. (2018). Grain size dependent deformation mechanisms in nanocrystalline thin films: insights from new dedicated sample preparation method. Proceedings of the European Materials Research Society (EMRS 2018). Published. European Materials Research Society (EMRS 2018), Strasbourg, France.
Idrissi, H., Ghidelli, M., Gravier, S., Blandin, J. J., Coulombier, M., Raskin, J.-P., Schryvers, D., & Pardoen, T. (2018). Atomistic plasticity mechanisms in metallic glass thin films : new insights from advanced transmission electron microscopy. 2018 DPG Spring meeting, Berlin, Germnay.
Pardoen, T., Jaddi, S., Coulombier, M., Idrissi, H., & Raskin, J.-P. (2018). Fracture mechanics on a chip. Proceedings of Proceedings of EMRS Spring Meeting. Published. European Materials Research Society (EMRS 2018), Strasbourg, France.
Raskin, J.-P. (2018). Current status and trends in RF silicon-on-insulator material and device. ECS Transactions, 85(8), 47-57. https://doi.org/10.1149/08508.0047ecst (Original work published 2018)
Jaddi, S., Coulombier, M., Raskin, J.-P., Pardoen, T., & et al. (2018). On a chip fracture mechanics test method. Proceedings of the 16th European Mechanics of Materials Conference EMMC16. Published. 16th European Mechanics of Materials Conference EMMC16, Nantes.
Delcorte, A., Hermans, S., Raskin, J.-P., Jaiswar, R. R., Bailly, C., Huynen, I., & et al. (2018). Multilayered absorber over K-and Ka-band based on graded concentration of carbon nanofillers: Modeling, Fabrication, and Experimental validation. Proceedings of the URSI AP-RASC 2019, New Delhi, India, 09 - 15 March 2019. Published. URSI AP-RASC 2019, New Delhi, India, 09 - 15 March 2019. (Original work published 2018)
Raskin, J.-P. (2018). No digital society without sustainable information technology. Symposium HERA – Transmettre un monde habitable pour les générations futures : l’apport de la recherche, University of Mons (Belgium).
Raskin, J.-P. (2018). Current status and trends in RF Silicon-on-Insulator material and device. Proceedings of the 233rd Electrochemical Society (ECS) Meeting, p. paper HO2-1479.
Raskin, J.-P., & Merle, S. (2018). IngénieuxSud: Educate Engineers for Acting in a Complex and Intercultural Environment. 2018 International Conference UNESCO Chair in Technologies for Development – Voices of the Global South, EPFL, Lausanne (Switzerland).
Vangrunderbeeck, P., Malcourant, E., Lecoq, J., Ducarme, D., & Raskin, J.-P. (2018). Un escape game pour préparer des étudiants de master au stage en entreprise. Colloque AUPTIC.education 2018 - Les technologies au service du pédagogique, Bienne (Suisse).
Huet, B., & Raskin, J.-P. (2018). Controlling the size, number of layers and planarity of CVD graphene single-crystals. Proceedings of The 12th international New Diamond and Nano Carbons Conference - NDNC 2018, p. 1 page.
Kazemi Esfeh, B., Kilchytska, V., Planes, N., Haond, M., Flandre, D., & Raskin, J.-P. (2018). 28 FDSOI RF Figures of Merits and Parasitic Elements at Cryogenic Temperature. Proceedings of the IEEE S3S Conference, 2.
Raskin, J.-P. (2018). FD SOI technologies from digital to RF and beyond. Proceedings of the IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, p. paper 7.1. https://doi.org/10.1109/S3S.2018.8640138
Lapouge, P., Onimus, F., Coulombier, M., Raskin, J.-P., Pardoen, T., & Bréchet, Y. (2018). On chip study of the irradiation creep behavior of copper films. Proceedings of the 16th European Mechanics of Materials Conference. Published. 16th European Mechanics of Materials Conference, Nantes, France.
Article de journal
Debliquy, M., Lahem, D., Bueno-Martinez, A., Caucheteur, C., Bouvet, M., Recloux, I., Raskin, J.-P., & Olivier, M.-G. (2018). Optical fibre NO2 sensor based on lutetium bisphthalocyanine in a mesoporous silica matrix. Sensors, 18(3), 740. https://doi.org/10.3390/s18030740 (Original work published 2018)
Rack, M., Belaroussi, Y., Ben Ali, K., Scheen, G., Kazemi Esfeh, B., & Raskin, J.-P. (2018). Small- and Large-Signal Performance Up To 175 °C of Low-Cost Porous Silicon Substrate for RF Applications. IEEE Transactions on Electron Devices, 65(5), 1887-1895. https://doi.org/10.1109/ted.2018.2818466 (Original work published 2018)
Kemiha A., Birouk B, & Raskin, J.-P. (2018). Ellipsometry-based electrical characterization of phosphorus doped LPCVD polysilicon. Journal of Materials : Materials in Electronics, 29(14), 11627-11636. https://doi.org/10.1007/s10854-018-9260-4 (Original work published 2018)
Fates, R., & Raskin, J.-P. (2018). Linear and non-linear electrical behavior in graphene ribbon based devices. Journal of Science: Advanced Materials and Devices, 3(3), 366-370. (Original work published 2018)
Huet Benjamin, & Raskin, J.-P. (2018). Role of Cu in-situ annealing in controlling the chemical vapor deposition of millimeter-size graphene domains. Carbon, 129(4), 270-280. https://doi.org/10.1016/j.carbon.2017.12.043 (Original work published 2018)
Huet, B., & Raskin, J.-P. (2018). Role of the Cu substrate in the growth of ultra-flat crack-free highly-crystalline single-layer graphene. Nanoscale, 10(46), 21898-21909. https://doi.org/10.1039/c8nr06817h (Original work published 2018)
Kazemi Esfeh, B., Rack, M., Ben Ali, K., Allibert, F., & Raskin, J.-P. (2018). RF Small- and Large-Signal Characteristics of CPW and TFMS Lines on Trap-Rich HR-SOI Substrates. IEEE Transactions on Electron Devices, 65(8), 3120-3126. https://doi.org/10.1109/ted.2018.2845679 (Original work published 2018)
Peña-García, N. N., Aguilera-Cortés, L. A., González-Palacios, M. A., Raskin, J.-P., & Herrera-May, A. L. (2018). Design and modeling of a MEMS dual-backplate capacitive microphone with spring-supported diaphragm for mobile device applications. Sensors, 18(10), 3545. https://doi.org/10.3390/s18103545 (Original work published 2018)
Tang, X., Lahem, D., Raskin, J.-P., Gérard, P., Geng, X., André, N., & Debliquy, M. (2018). A Fast and Room-Temperature Operation Ammonia Sensor Based on Compound of Graphene With Polypyrrole. IEEE Sensors Journal, 18(22), 9088-9096. https://doi.org/10.1109/JSEN.2018.2869203 (Original work published 2018)
Ureña Begara, F., Vayrette, R., Bhaskar, U. K., & Raskin, J.-P. (2018). Raman analysis of strain in p-type doped silicon nanostructures. Journal of Applied Physics, 124(9), 95102. https://doi.org/10.1063/1.5045736 (Original work published 2018)
Haddad, P.-A., Flandre, D., & Raskin, J.-P. (2018). Intrinsic rectification in common-gated graphene field-effect transistors. Nano Energy, 43, 37-46. https://doi.org/10.1016/j.nanoen.2017.10.049 (Original work published 2018)
Velosa-Moncada, L., Aguilera-Cortés, L., González-Palacios, M., Raskin, J.-P., & Herrera-May, A. (2018). Design of a novel MEMS microgripper with rotatory electrostatic comb-drive actuators for biomedical applications. Sensors, 18(5), 1664. https://doi.org/10.3390/s18051664 (Original work published 2018)
Martinez-Lopez, A. G., Tinoco, J. C., Lezama, G., Conde, J. E., Kazemi Esfeh, B., & Raskin, J.-P. (2018). Extrinsic gate capacitance compact model for UTBB MOSFETs. Semiconductor Science and Technology, 33(1), 15001. https://doi.org/10.1088/1361-6641/aa98e7 (Original work published 2018)
Kazemi Esfeh, B., Rack, M., Makovejev, S., Allibert, F., & Raskin, J.-P. (2018). A SPDT RF Switch Small- and Large-Signal Characteristics on TR-HR SOI Substrates. IEEE Journal of the Electron Devices Society, 6, 543-550. https://doi.org/10.1109/jeds.2018.2805780 (Original work published 2018)
Maafri Djabar, Kazemi Esfeh, B., Saadi Abdelhalim, Yagoub Mustapha C.E., & Raskin, J.-P. (2018). Prediction of RF performances of advanced MOS transistor from dc and low frequency measurements. Microwave & Optical Technology Letters, 60(9), 2256-2262. https://doi.org/10.1002/mop.31334 (Original work published 2018)
Martinez-Lopez A.G., Tinoco J.C., Lezama G., Conde J.E., Kazemi Esfeh, B., & Raskin, J.-P. (2018). Extrinsic gate capacitance model for UTBB MOSFETs. Semiconductor Science and Technology, 33(1), 9 pages. (Original work published 2018)
Poncelet, O., Rasson, J., Tuyaerts, R., Coulombier, M., Kotipalli, R. R. V., Raskin, J.-P., & Francis, L. (2018). Hemispherical cavities on silicon substrates: an overview of micro fabrication techniques. Materials Research Express, 5(4), 45702. https://doi.org/10.1088/2053-1591/aab907 (Original work published 2018)
Papier de conférence
Debliquy, M., Lahem, D., Tang, X., Bilteryst, L., & Raskin, J.-P. (2017). Formaldehyde detection for indoor air quality. Proc of the Towards Reality in Nanoscale Materials IX (TRNM) - Nanoscale Materials for Warfare Agent Detection: Nanoscience, p. 20-21.
Kazemi Esfeh, B., Makovejev S., Allibert F., & Raskin, J.-P. (2017). A SPDT RF switch small- and large-signal characteristics on TR-HR SOI substrates. Proceedings of the IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, p. paper #11.2.
Kilchytska, V., Kazemi Esfeh, B., Gimeno Gasca, C., Parvais, B., Planes, N., Hahond, M., Raskin, J.-P., & Flandre, D. (2017). Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs. Proceedings of 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon – ULIS, p. session 10, paper # 1. https://doi.org/10.1109/ULIS.2017.7962581
Raskin, J.-P. (2017). RF SOI, from material to devices. Short Course SMC, IEEE International Microwave Symposium – IMS’17, Honolulu, Hawaii (USA).
Tang, X., & Raskin, J.-P. (2017). Characterization of high-efficiency multi-crystalline silicon in industrial production. 2017 International Conference on New Energy and Future Energy System - NEFES 2017, Kumming, Southwest China (China).
Rack, M., & Raskin, J.-P. (2017). Small- and large-signal RF modeling of silicon-based substrates. ESSDERC/ESSCIRC 2017, Leuven, Belgium.
Van Brandt, L., Kilchytska, V., Raskin, J.-P., Parvais, B., & Flandre, D. (2017). Optimal measurement parameters for accurate time-domain and spectral analyses of RTN. 47th IEEE European Solid-State Device Research Conference (ESSDERC), Leuven, Belgium.
Haddad, P.-A., Flandre, D., & Raskin, J.-P. (2017). Intrinsic rectification in gated CVD graphene ribbons. Proceedings of Graphene Barcelona 2017, p. paper #19.
Tang, X., Lahem, D., Raskin, J.-P., & Debliquy, M. (2017). A hybrid gas sensor based on compound of graphene with polypyrrole. 31st International Conference on Surface Modification Technologies, Mons (Belgium).
Jaiswar, R. R., Mederos Henry, F., Dupont, V., Hermans, S., Delcorte, A., Bailly, C., Delmotte, C., Lardot, V., Raskin, J.-P., & Huynen, I. (2017). A Thin Ultra-wideband Microwave Absorbing Structure Printed On Flexible substrate With Resistive-Ink Made Of Multiwall Carbon-Nanotube. Proceedings of Metamaterials 2017 Conference, p. 686-688.
André, N., Delhaye, T., Al Kadi Jazairli, M., Olbrechts, B., Gérard, P., Francis, L., Raskin, J.-P., & Flandre, D. (2017). Ultra-low-power SOI CMOS pressure sensor based on orthogonal PMOS gauges. 22nd IMEKO TC4 International Symposum & 20th International Workshop on ADC Modelling and Testing, Iasi (Romania).
Kazemi Esfeh, B., Kilchytska, V., Parvais, B., Planes, N., Haond, M., Flandre, D., & Raskin, J.-P. (2017). Back-gate bias effect on 3-port UTBB-FDSOI non-linearity performance. proceedings of ESSDERC 2017. Published. 2017 47th European Solid-State Device Research Conference (ESSDERC 2017), Leuven (Belgium). https://doi.org/10.1109/ESSDERC.2017.8066613 (Original work published 2017)
Daudin, R., Coulombier, M., Schülli, T., Zhou, T., Idrissi, H., Raskin, J.-P., & Pardoen, T. (2017). Etude de la déformation locale de films minces de verres métalliques par nano-diffraction de rayons X synchrotron. Book of abstracts - Journées annuelles de la SF2M 2017, JA0035.
Raskin, J.-P. (2017). Small and large-signal wideband characterization of RF SOI technology. Proceedings of The 30th International Conference on Microelectronic Test Structures – ICMTS 2017, p. invited paper#1.
Liu, L., Han, Q., Makovejev, S., Trellenkamp, S., Raskin, J.-P., Manti, S., & Zhao, Q.-T. (2017). Analog and RF analysis of gate-all-around silicon nanowire MOSFET. Proceedings of 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon – ULIS, p. Poster # 8. https://doi.org/10.1109/ULIS.2017.7962575
Kazemi Esfeh, B., Kilchytska, V., Parvais, B., Planes, N., Haond, M., Flandre, D., & Raskin, J.-P. (2017). Back-gate bias effect on FDSOI MOSFET RF Figures of Merits and Parasitic Elements. Proceedings of EUROSOI-ULIS 2017. Published. 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2017), Athens (Greece). https://doi.org/10.1109/ULIS.2017.7962569 (Original work published 2017)
Haddad, P.-A., Raskin, J.-P., & Flandre, D. (2017). Efficient passive energy harvesters at 950 MHz and 2.45 GHz for 100 μW applications in 65 nm CMOS. Proceedings of the 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS), 508-511. https://doi.org/10.1109/ICECS.2016.7841250
Rack, M., & Raskin, J.-P. (2017). RF harmonic distortion modeling in CPW lines on silicon-based substrates including non-equilibrium carrier dynamics. 2017 IEEE MTT-S International Microwave Symposium (IMS). Published. 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017, Honololu, HI, USA. https://doi.org/10.1109/mwsym.2017.8058737
Raskin, J.-P. (2017). Current status and trends in RF SOI material and device. Proceedings of the SEMICON Europa 2017, p. 3 pages.
Flandre, D., André, N., Al Kadi Jazairli, M., Olbrechts, B., Gilet, S., Haddad, P.-A., Gimeno Gasca, C., & Raskin, J.-P. (2017). vers des capteurs implantés de quelques mm³ à consommation ultra faible, avec transmissions de puissance en RF et de données en UWB. Ecole d’hiver francophone sur les Technologies de Conception des Systèmes Embarqués Hétérogènes (FETCH 2017), Québec (Canada).
Flandre, D., Kilchytska, V., Gimeno Gasca, C., Bol, D., Kazemi Esfeh, B., & Raskin, J.-P. (2017). Measurement and modelling of specific behaviors in 28nm FD SOI UTBB MOSFETs of importance for analog / RF amplifiers. MOS-AK Workshop, Leuven (Belgium).
Raskin, J.-P., & Merle, S. (2017). IngénieuxSud – a collaborative initiative between Northern and Southern organizations for helping scientists to raise questions about the impact of the technologies on the society. Sustainable energy for Africa, Palace of the Academies, Brussels (Belgium).
Huet, B., & Raskin, J.-P. (2017). Pressure-controlled chemical vapor deposition of single-layer graphene with millimeter-size domains on thin Cu film. Proceedings of Graphene Barcelona 2017, p. paper #315.
Debliquy, M., Lahem, D., Krumpmann, A., Gonzalez Vila, A., Raskin, J.-P., Zhang, C., & Caucheteur, C. (2017). Molecularly Imprinted Polymers for VOC Sensing: chemoresistive and optical Sensors. FiMPART Conference, Bordeaux (France).
Haddad, P.-A., Stas, F., Raskin, J.-P., Bol, D., & Flandre, D. (2017). Automated Layout-integrated Sizing of a 2.45 GHz Differential-Drive Rectifier in 28 nm FDSOI CMOS. Proceedings of the 2017 IEEE Wireless Power Transfer Conference (WPTC 2017). Published. 2017 IEEE Wireless Power Transfer Conference (WPTC 2017), Taipei (Taiwan). https://doi.org/10.1109/WPT.2017.7953845
Tuyaerts, R., Raskin, J.-P., & Proost, J. (2017). Electromechanical testing of ZnO thin films under high uniaxial strain. Proceedings of the 30th International Conference on Microelectronic Test Structures – ICMTS 2017, p. paper # 2.3. https://doi.org/10.1109/ICMTS.2017.7954261
Tang, X., Debliquy, M., Lahem, D., Flandre, D., André, N., Walewyns, T., Francis, L., & Raskin, J.-P. (2017). A hybrid graphene-metal oxide sensor for formaldehyde detection at room temperature. 2016 13th International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2016), Beijing (China).
Article de journal
Tuyaerts, R., Poncelet, O., Raskin, J.-P., & Proost, J. (2017). Internal stress and opto-electronic properties of ZnO thin films deposited by reactive sputtering in various oxygen partial pressures. Journal of Applied Physics, 122(15), 155306. https://doi.org/10.1063/1.4996453 (Original work published 2017)
Ghidelli, M., Idrissi, H., Gravier, S., Blandin, J.-J., Raskin, J.-P., Schryvers, D., & Pardoen, T. (2017). Homogeneous flow and size dependent mechanical behavior in highly ductile Zr65Ni35 metallic glass films. Acta Materialia, 131, 246-259. https://doi.org/10.1016/j.actamat.2017.03.072 (Original work published 2017)
Lapouge, P., Onimus, F., Coulombier, M., Raskin, J.-P., & Pardoen, T. (2017). Creep behavior of submicron copper films under irradiation. Acta Materialia, 131, 77-87. https://doi.org/10.1016/j.actamat.2017.03.056 (Original work published 2017)
Belaroussi, Y., Rack, M., Saadi, A. A., Scheen, G., Belaroussi, M. T., Trabelsi, M., & Raskin, J.-P. (2017). High quality silicon-based substrates for microwave and millimeter wave passive circuits. Solid-State Electronics, 135, 78-84. https://doi.org/10.1016/j.sse.2017.06.028 (Original work published 2017)
Kazemi Esfeh, B., Ben Ali, K., & Raskin, J.-P. (2017). Compact On-Wafer Test Structures for Device RF Characterization. IEEE Transactions on Electron Devices, 64(8), 3101-3107. https://doi.org/10.1109/TED.2017.2717196 (Original work published 2017)
Ureña Begara, F., Crunteanu, A., & Raskin, J.-P. (2017). Raman and XPS characterization of vanadium oxide thin films with temperature. Applied Surface Science, 403(1 May 2017), 717-727. https://doi.org/10.1016/j.apsusc.2017.01.160 (Original work published 2017)
Jaiswar, R. R., Danlée, Y., Mesfin, H. M., Delcorte, A., Hermans, S., Bailly, C., Raskin, J.-P., & Huynen, I. (2017). Absorption modulation of FSS-polymer nanocomposites through incorporation of conductive nanofillers. Applied Physics A, 123-164. https://doi.org/10.1007/s00339-017-0805-9 (Original work published 2017)
Hammad, M., Adjizian, J. J., Sacré, C.-H., Huet, B., Charlier, J.-C., Raskin, J.-P., & Pardoen, T. (2017). Adhesionless and near-ideal contact behavior of graphene on Cu thin film. Carbon, 122, 446-450. https://doi.org/10.1016/j.carbon.2017.06.037 (Original work published 2017)
van der Rest, A., Idrissi, H., Henry, F., Favache, A., Schryvers, D., Proost, J., Raskin, J.-P., Van Overmeere, Q., & Pardoen, T. (2017). Mechanical behavior of ultrathin sputter deposited porous amorphous Al2O3 films. Acta Materialia, 125, 27-37. https://doi.org/10.1016/j.actamat.2016.11.037 (Original work published 2017)
Belaroussi, Y., Rack, M., Saadi, A. A., Scheen, G., Belaroussi, M. T., Trabelsi, M. T., & Raskin, J.-P. (2017). High-quality silicon-based substrates for microwave millimeterwave passive circuits integration. Solid-State Electronics, 135, 78-84. (Original work published 2017)
Tang, X., Mager, N., Vanhorenbeke, B., Hermans, S., & Raskin, J.-P. (2017). Defect-free functionalized graphene sensor for formaldehyde detection. Nanotechnology, 28(5), number 055501. https://doi.org/10.1088/1361-6528/28/5/055501 (Original work published 2017)
Tang, X., Raskin, J.-P., Lahem, D., Krumpmann, A., Decroly, A., & Debliquy, M. (2017). A formaldehyde sensor based on molecularly imprinted polymer on TiO2 nanotubes. Sensors, 17(4), 675. https://doi.org/10.3390/s17040675 (Original work published 2017)
Kazemi Esfeh, B., Makovejev, S., Basso, D., Desbonnets, E., Kilchytska, V., Flandre, D., & Raskin, J.-P. (2017). RF SOI CMOS technology on 1st and 2nd generation trap-rich high resistivity SOI wafers. Solid-State Electronics, 128(February 2017), 121-128. https://doi.org/10.1016/j.sse.2016.10.035 (Original work published 2017)
Huet, B., & Raskin, J.-P. (2017). Pressure-controlled chemical vapor deposition of single-layer graphene with millimeter-size domains on thin Cu film. Chemistry of Materials, 29(8), 3431-3440. https://doi.org/10.1021/acs.chemmater.6b04928 (Original work published 2017)
Haddad, P.-A., Flandre, D., & Raskin, J.-P. (2017). A Quasi-Static Model of Silicon Substrate Effects in Graphene Field Effect Transistors. IEEE Electron Device Letters, 38(7), 987-990. https://doi.org/10.1109/LED.2017.2706362 (Original work published 2017)
Passi Vikram, & Raskin, J.-P. (2017). Review on analog RF performance of advanced MOSFET. Semiconductor Science and Technology, 32(12), 123004. https://doi.org/10.1088/1361-6641/aa9145 (Original work published 2017)
Chapitre de livre
Rack, M., Rack, M., Van der Plas, G., Raskin, J.-P., & Beyne, E. (2017). Modeling and Characterization of TSV-Induced Noise Coupling. In Thomas Noulis (ed.), Noise Coupling in System-on-Chip (p. p. 195-232). CRC Press, Taylor & Francis Group.
Article de journal
Raskin, J.-P. (2016). La technologie RF SOI dans 100% de nos smartphones. Revue de l’Electricite et de l’Electronique, 1, 13-16. (Original work published 2016)
Lapouge, P., Onimus, F., Vayrette, R., Raskin, J.-P., Pardoen, T., & Bréchet, Y. (2016). A novel on chip test method to characterize the creep behavior of metallic layers under heavy ion irradiation. Journal of Nuclear Materials, 476, 20-29. https://doi.org/10.1016/j.jnucmat.2016.04.014 (Original work published 2016)
Pham, T. T., Santos, C. N., Joucken, F., Hackens, B., Raskin, J.-P., & Sporken, R. (2016). The role of SiC as a diffusion barrier in the formation of graphene on Si(111). Diamond and Related Materials, 66(0925-9635), 141-148. https://doi.org/10.1016/j.diamond.2016.04.011 (Original work published 2016)
Debliquy, M., Dony, N., Lahem, D., Tang, X., Zhang, C., Raskin, J.-P., & Olivier, M.-G. (2016). Acetaldehyde chemical sensor based on molecularly imprinted polymer polypyrrole. Procedia Engineering, 168(Available online 4 January 2017), 569-573. https://doi.org/10.1016/j.proeng.2016.11.527 (Original work published 2016)
Solis Avila, E., Tinoco, J. C., Martinez-Lopez, A., Reyes-Barranca, M. A., Cerdeira, A., & Raskin, J.-P. (2016). Parasitic gate resistance impact on Triple Gate FinFET CMOS inverter. IEEE Transactions on Electron Devices, 63(7), 2635-2642. https://doi.org/10.1109/TED.2016.2558580 (Original work published 2016)
Bui, T. N., Raskin, J.-P., & Hackens, B. (2016). Semiconductor- to metallic-like behavior in Bi thin films on KCl substrate. Journal of Applied Physics, 119(13), 135304. https://doi.org/10.1063/1.4945036 (Original work published 2016)
Favache, A., Ryelandt, S., Melchior, M., Zeb, G., Carbonnelle, P., Raskin, J.-P., & Pardoen, T. (2016). A generic “micro-Stoney” method for the measurement of internal stress and elastic modulus of ultrathin films. Review of Scientific Instruments, 87(1), 15002. https://doi.org/10.1063/1.4939912 (Original work published 2016)
Dutu, C. A., Vlad, A., Roda Neve, C., Avram, I., Sandu, G., Raskin, J.-P., & Melinte, S. (2016). Surveying colloid sedimentation by coplanar waveguides. Nanotechnology, 27, 225502. https://doi.org/10.1088/0957-4484/27/22/225502 (Original work published 2016)
Haddad, P.-A., Gosset, G., Raskin, J.-P., & Flandre, D. (2016). Automated Design of a 13.56 MHz 19µW Passive Rectifier With 72% Efficiency Under 10µA load. IEEE Journal of Solid State Circuits, 51(5), 12. https://doi.org/10.1109/JSSC.2016.2527714 (Original work published 2015)
Pardoen, T., Colla, M.-S., Idrissi, H., Amin-Ahmadi, B., Wang, B., Schryvers, D., Bhaskar, U. K., & Raskin, J.-P. (2016). A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects. Comptes rendus. Physique, 17(3-4), 485-495. https://doi.org/10.1016/j.crhy.2015.11.005 (Original work published 2016)
Trabelsi, M., Taibi, A., Slimane, A., Saadi, A. A., Belaroussi, M. T., & Raskin, J.-P. (2016). Compact UWB bandpass filter with notch band using the impedance matching method. Microwave & Optical Technology Letters, 58(9), 2176-2178. https://doi.org/10.1002/mop.30004 (Original work published 2016)
Raskin, J.-P. (2016). FinFET and UTBB for RF SOI communication systems. Solid-State Electronics, 125, 73-81. (Original work published 2016)
Vayrette, R., Galceran, M., Coulombier, M., Godet, S., Raskin, J.-P., & Pardoen, T. (2016). Fracture mechanisms in freestanding polycrystalline silicon films with nanoscale thickness. Engineering Fracture Mechanics, 68(Part A), 190-203. https://doi.org/10.1016/j.engfracmech.2016.10.003 (Original work published 2016)
Nascimento Santos, C., Joucken, F., De Sousa Meneses, D., Echegut, P., Campos-Delgado, J., Louette, P., Raskin, J.-P., & Hackens, B. (2016). Terahertz and mid-infrared reflectance of epitaxial graphene. Scientific Reports, 6(6), 24301. https://doi.org/10.1038/srep24301 (Original work published 2016)
Papier de conférence
Birouk, B., & Raskin, J.-P. (2016). Electrical conductivity extracted from optical characterization of polysilicon films. Proceedings of the 2nd International Conference on Electrical Engineering and Electronics - EEE′16, poster # EEE 132.
Fates, R., Haddad, P.-A., Huet, B., Bouridah, H., & Raskin, J.-P. (2016). Experimental and theoretical investigation of the graphene ribbons nonlinear electrical behavior. International Conference on Diamond and Carbon Materials, poster # P13.64.
Emam, M., & Raskin, J.-P. (2016). Engineered Si-based substrates for the state-of-the-art RF devices and IoT applications. RF Technology Day, Leuven (Belgium).
Ben Ali, K., & Raskin, J.-P. (2016). Nonlinear characteristics and RF losses of CPW and TFMS lines over a wide temperature range. 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF’16, 24-26. https://doi.org/10.1109/SIRF.2016.7445458
Raskin, J.-P. (2016). SOI technology pushes the limits of CMOS for RF applications. Microelectronics Technology, Circuits, and Systems for Space Applications Workshop, 20.
Idrissi, H., Ghidelli, M., Gravier, S., Blandin, J.-J., Raskin, J.-P., Pardoen, T., & Schryvers, D. (2016). Advanced TEM Study of Homogeneous Flow and Size Dependent Mechanical Behaviour in Highly Ductile Zr65Ni35 Metallic Glass Films. European Microscopy Congress 2016: Proceedings. Published. MRS Fall Meeting 2016, Boston, MA, USA. https://doi.org/10.1002/9783527808465.EMC2016.5990
Idrissi, H., Ghidelli, M., Gravier, S., Blandin, J. J., Raskin, J.-P., Pardoen, T., & Schryvers, D. (2016). Recent investigation of small-scale plasticity mechanisms in 3D and small-sized systems using advanced in-situ TEM nanomechanical testing. European Microscopy Congress 2016: Proceedings. Published. European Microscopy Conference (EMC2016), Lyon, France. https://doi.org/10.1002/9783527808465.EMC2016.8312
Belaroussi, Y., Saadi, A., Slimane, A., Belaroussi, M.-T., Trabelsi, M., Scheen, G., & Raskin, J.-P. (2016). Porous silicon substrate for millimeter-waves applications. Porous Semiconductors - Science and Technology – PSST, Tarragona (Spain).
Tang, X., Recckinger, N., Mager, N., Vanhorenbeke, B., Hermans, S., & Raskin, J.-P. (2016). Graphene for gas sensor applications. Graphene Week 2016 conference, Warsaw (Poland).
Haddad, P.-A., Raskin, J.-P., & Flandre, D. (2016). Automated design of a 13.56 MHz Corner-robust Efficient Differential Drive Rectifier for 10 μA load. 2016 IEEE International Symposium on Circuits and Systems (ISCAS), Montréal (Canada).
Kazemi Esfeh, B., Kilchytska, V., Flandre, D., & Raskin, J.-P. (2016). RF SOI CMOS Technology on 1st and 2nd Generation Trap-Rich High Resistivity SOI Wafers. Proceedings de la conférence EUROSOI-ULIS 2016, 159-161. https://doi.org/10.1109/ULIS.2016.7440077
Rack, M., Ben Ali, K., Raskin, J.-P., Sun, X., Roda Neve, C., Van der Plas, G., & Stucchi, M. (2016). Investigation of TSV noise coupling in 3D-ICs using an experimental validated 3D TSV circuit model including Si substrate effects and anomalous TSV capacitance behavior after wafer thinning. International Microwave Symposium – IMS 2016. Published. International Microwave Symposium – IMS 2016, San Francisco, CA (USA). https://doi.org/10.1109/MWSYM.2016.7540397.
Coulombier, M., Favache, A., Idrissi, H., Lemoine, G., Tuyaerts, R., van der Rest, A., Hammad, M., Ureña Begara, F., Pardoen, T., & Raskin, J.-P. (2016). Lab on-chip for testing thin film materials: extraction of mechanical properties at the nanometer scale. Belgian Physical Society Meeting, paper #62.
Rack, M., Raskin, J.-P., Sun, X., Van der Plas, G., Absil, P., & Beyne, E. (2016). Fast and Accurate Modelling of Large TSV Arrays in 3D-ICs Using a 3D Circuit Model Validated Against Full-Wave FEM Simulations and RF Measurements. 2016 IEEE 66th Electronic Components and Technology Conference (ECTC). Published. 2016 IEEE 66th Electronic Components and Technology Conference (ECTC), Las Vegas, NV, USA. https://doi.org/10.1109/ectc.2016.227
Scheen, G., Rasson, J., Belaroussi, Y., Poncelet, O., Majoul, N., Raskin, J.-P., & Francis, L. (2016). Porous Silicon: when void enables new Si application fields. Third Winfab Scientific Day, UCL, Louvain-la-Neuve (Belgium).
Tang, X., Debliquy, M., Lahem, D., Flandre, D., André, N., Walewyns, T., Francis, L., & Raskin, J.-P. (2016). A hybrid graphene-metal oxide sensor for formaldehyde detection at room temperature. 2016 13th International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2016), Beijing (China).
Rack, M., Ben Ali, K., Raskin, J.-P., Sun, X., Roda Neve, C., Van der Plas, G., & Stucchi, M. (2016). Fast and accurate modelling of large TSV arrays in 3D-ICs using a 3D circuit model validated against full-wave FEM simulations and RF measurements. The 66th IEEE Electronic Components and Technology Conference – ECTC’16, Las Vegas, Nevada (USA).
Coulombier, M., Raskin, J.-P., & Pardoen, T. (2016). Lab-on-chip for testing thin film materials: extraction of mechanical and electrical properties under large deformation at the nanometer scale. Third Winfab Scientific Day, UCL, Louvain-la-Neuve (Belgium).
Idrissi, H., Ghidelli, M., Gravier, S., Blandin, J.-J., Raskin, J.-P., Schryvers, D., & Pardoen, T. (2016). Size dependent mechanical behavior and nanoscale plasticity mechanisms in highly ductile zr65ni35 metallic glass films. EMMC15, 15th European Mechanics of Materials Conference, Brussels, Belgium.
Debliquy, M., Lahem, D., Bueno, A., Caucheteur, C., Raskin, J.-P., & Bouvet, M. (2016). Phthalocyanine based optical fiber sensors. International Conference on Porphyrins and Phthalocyanines (ICPP-9), 65.
Sun, X., Rack, M., Van der Plas, G., Stucchi, M., De Vos, J., Absil, P., Raskin, J.-P., & Beyne, E. (2016). Investigation of TSV noise coupling in 3D-ICs using an experimental validated 3D TSV circuit model including Si substrate effects and TSV capacitance inversion behavior after wafer thinning. 2016 IEEE MTT-S International Microwave Symposium (IMS). Published. 2016 IEEE/MTT-S International Microwave Symposium (IMS), San Francisco, CA. https://doi.org/10.1109/mwsym.2016.7540397
Raskin, J.-P. (2016). SOI technology pushes the limits of CMOS for RF applications. 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF’16, 17-20. https://doi.org/10.1109/SIRF.2016.7445456
Dutu, C. A., Vlad, A., Roda Neve, C., Avram, I., Sandu, G., Raskin, J.-P., & Melinte, S. (2016). Coplanar waveguide devices: Surveying nanocolloid dynamics. Proceedings of the 2016 E-MRS Spring Meeting, 1.
Papier de conférence
Ghidelli, M., Gravier, S., Blandin, J.-J., Djemia, P., Coulombier, M., Vayrette, R., Raskin, J.-P., & Pardoen, T. (2015). Viscoplastic and fracture behavior of ZrNi freestanding metallic glass films. Book of abstracts. Published. ESMC2015, 9th European Solid Mechanics Conference, Madrid, Spain.
Maafri, D., Yagoub, M. C. E., Touhami, R., Belaroussi, M. T., Slimane, A., & Raskin, J.-P. (2015). Efficient small-signal extraction technique for Ultra-Thin Body and Ultra-Thin BOX FD-SOI transistor. NEMO 2015, Ottawa (Canada).
Raskin, J.-P., & Desbonnets, E. (2015). High Resistivity SOI wafer for mainstream RF System-on-Chip. 15th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF’15, 33-36.
Huet, B., Raskin, J.-P., & et al. (2015). Graphene growth, transfer and devices fabrication. NATO Advanced Research Workshop: “Functional Nanomaterials and Devices for Electronics, Sensors, Energy Harvesting”, Lviv, Ukraine.
Haddad, P.-A., & Raskin, J.-P. (2015). Towards suspended geometric diodes for TeraHertz rectenna solar cells using wafer-scale CVD graphene on Cu thin films. The 19th International Conference on Electron Dynamics in Semiconductors, Optoelectronic - Edison′19, Universidad de Salamanca (Spain).
Martinez-Lopez, A., Tinoco, J. C., Martynyuk, A., & Raskin, J.-P. (2015). Triple-Gate FinFETs for very high frequency applications. 4th International Symposium on Energy Challenges and Mechanics - working on small scales (ECM4), session 09E, paper # 6-266.
Raskin, J.-P. (2015). SOI Technologies from Microelectronics to Microsystems - Meeting the More than Moore Roadmap Requirements. 9th Workshop on Frontiers in Electronics (WOFE-2015), Joint with Workshop on Multifunctional Nanomaterials, San)Juan, Puerto Rico (USA).
Raskin, J.-P. (2015). FinFET versus UTBB SOI - a RF perspective. 45th European Solid-State Device Conference – ESSDERC 2015, 84-88. https://doi.org/10.1109/ESSDERC.2015.7324719.
Idrissi, H., Colla, M.-S., Amin-Ahmadi, B., Delmelle, R., Malet, L., Proost, J., Godet, S., Raskin, J.-P., Schryvers, D., & Pardoen, T. (2015). Nanoscale plasticity mechanisms in as-deposited and hydride nanocrystalline Pd thin films revealed by advanced in-situ TEM nanomechanical testing. Book of abstracts. Published. ESMC2015, 9th European Solid Mechanics Conference, Madrid, Spain.
Amin-Ahmadi, B., Colla, M.-S., Idrissi, H., Malet, L., Godet, S., Raskin, J.-P., Pardoen, T., & Schryvers, D. (2015). Dislocation mediated hardening and relaxation in nanocrystalline palladium films revealed by on-chip HRTEM time-resolved nano mechanical testing. Proceedings of the MMC 2015. Published. MMC 2015, Manchester Central, UK.
Kazemi Esfeh, B., Kilchytska, V., Barral, V., Planes, N., Haond, M., Flandre, D., & Raskin, J.-P. (2015). Comparative study of effect of parasitic elements on RF FoM in 28 nm FD SOI and Bulk technologies. IEEE International SOI-3D-Subthreshold Microelectronics Technology Unified Conference – S3S’15, paper 7.a.3. https://doi.org/10.1109/S3S.2015.7333532
Abadi, A. R. N., Rack, M., & Raskin, J.-P. (2015). Through silicon via to FinFET noise coupling in 3-D integrated circuits. 2015 International conference on IC Design & Technology, Leuven, Belgium.
Lapouge, P., Onimus, F., Bréchet, Y., Pardoen, T., Raskin, J.-P., & Vayrette, R. (2015). Study of the irradiation creep based on nanomechanical lab-on-chip testing. Book of abstracts. Published. ICM12 - 12th International Conference on the Mechanical Behavior of Materials, Karlsruhe, Allemagne.
Tang, X., Reckinger, N., Mager, N., Vanhorenbeke, B., Hermans, S., Delamare, R., Colomer, J.-F., & Raskin, J.-P. (2015). Graphene sensor for formaldehyde detection. 2015 International Graphene Innovation Conference, Qingdao (China).
Rack, M., Raskin, J.-P., & et al. (2015). Modeling the effect of charges in the back side passivation layer on through silicon via (TSV) capacitance after wafer thinning. 2015 IEEE MTT-S International Microwave Symposium, Phoenix, Arizona, USA.
Belaroussi, Y., Slimane, A., Belaroussi, M. T., Scheen, G., Rack, M., Trabelsi, M., & Raskin, J.-P. (2015). Caractérisation physique et dynamique du Silicium poreux pour les applications RF. 2ème journée SemiConducteurs et Oxyde Poreux, Montpellier, France.
Flandre, D., Kilchytska, V., Bol, D., Francis, L., André, N., & Raskin, J.-P. (2015). Analog/RF, sensors and MEMS in SOI: demos and performance assessment. SOI Workshop, Dresden (Germany).
Fivel, M., Hammad, M., Idrissi, H., Raskin, J.-P., & Pardoen, T. (2015). 3D Dislocation Dynamics simulations of naonindentation: application to Cu/graphene bilayer system. Proceedings of the MRS Fall Meeting & Exhibit. Published. MRS Fall Meeting & Exhibit, Boston, USA.
Makovejev, S., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., & Kilchytska, V. (2015). Self-Heating in 28 nm Bulk and FDSOI. Proceedings of EUROSOI-ULIS 2015, 41-44. https://doi.org/10.1109/ULIS.2015.7063768
Le Meil, J.-M., Aspar, B., Desbonnets, E., & Raskin, J.-P. (2015). Engineered substrates: The foundation to meet current and future RF requirements. Proceedings of the VLSI-TSA & VLSI-DAT, paper JS14, pp. 71-74.
Lapouge, P., Vayrette, R., Onimus, F., Pardoen, T., Raskin, J.-P., & Bréchet, Y. (2015). On-Chip Irradiation Creep Testing of Copper Films. Proceedings of the 2015 MRS Fall Meeting & Exhibit. Published. 2015 MRS Fall Meeting & Exhibit, Boston, USA.
Idrissi, H., Amin-Ahmadi, B., Colla, M.-S., Bollinger, C., Boioli, F., Raskin, J.-P., Cordier, P., Pardoen, T., & Schryvers, D. (2015). Small-scale plasticity mechanisms in crystalline and amorphous materials revealed by in-situ TEM nanomechanical testing. European-MRS Fall Meeting, Warsaw, Poland.
Makovejev, S., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., & Kilchytska, V. (2015). Self-heating in 28 nm Bulk and FD SOI. 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS 2015, 41-44.
Sun, X., Rack, M., Raskin, J.-P., & et al. (2015). Noise coupling between TSVs and active devices: Planar nMOSFETs vs. nFinFETs. 2015 IEEE 65th Electronic Components and Technology Conference, San Diego, CA, USA.
Huet, B., & Raskin, J.-P. (2015). Growth of spatially-arranged millimeter-size sigle-crystal graphene on thin Cu film. 2015 Materials Research Society (MRS) Fall Meeting, Boston, MA (USA).
Raskin, J.-P. (2015). High resistivity SOI substrates boost CMOS RF performance. General Assembly and Meet the Fellows, Antwerpen (Belgium).
Ghidelli, M., Gravier, S., Djemia, P., Coulombier, M., Vayrette, R., Raskin, J.-P., & Pardoen, T. (2015). Giant ductility of ZrNi thin freestanding metallic glass films. 9th European Solid Mechanics Conference – ESMC’15, Madrid (Spain).
Hammad, M., Raskin, J.-P., & Pardoen, T. (2015). On-Chip Graphene Tensile Testing. Proceedings fo the 2015 MRS Fall Meeting & Exhibit. Published. MRS Fall Meeting & Exhibit, Boston, USA.
Lemoine, G., Colla, M.-S., Amin-Ahmadi, B., Idrissi, H., Schryvers, D., Raskin, J.-P., Pardoen, T., & Delannay, L. (2015). Study of creep/relaxation in nanocrystalline FCC thin films through internal-stress-actuated microtensile testing method. 13th International Conference on Creep and Fracture of Engineering Materials and Structures - CREEP2015, Toulouse.
Raskin, J.-P. (2015). SOI – a key substrate for RF CMOS. 5th Korean International Summer School on Nanoelectronics – nano-KISS, More Moore or More than Moore Nano-Devices?, ETRI-DAEJEON (Korea).
Tinoco, J. C., Solis, E., Reyes-Barranca, A., Cerdeira, A., & Raskin, J.-P. (2015). CMOS inverter based on Triple-Gate FinFETs for low power electronics. 4th International Symposium on Energy Challenges and Mechanics - working on small scales (ECM4), session 09F, paper # 5-264.
Article de journal
Vais, A., Lin, H.-C., Dou, C., Martens, K., Ivanov, T., Xie, Q., Tang, F., Given, M., Maes, J., Collaert, N., Raskin, J.-P., & et al. (2015). On the temperature dependence of frequency dispersion in C-V measurements of III-V MOS devices and its application in spatial profiling of border traps. Applied Physics Letters, 107(5), 053504-1 - 053504-5. https://doi.org/10.1063/1.4928332 (Original work published 2015)
Ghidelli, M., Gravier, S., Blandin, J.-J., Djemia, P., Mompiou, F., Abadias, G., Raskin, J.-P., & Pardoen, T. (2015). Extrinsic mechanical size effects in thin ZrNi metallic glass films. Acta Materialia, 90, 232-241. https://doi.org/10.1016/j.actamat.2015.02.038 (Original work published 2015)
Herrera-May, A. L., Lara-Castro, M., Lopez-Huerta, F., Gkotsis, P., Raskin, J.-P., & Figueras, E. (2015). A MEMS-based magnetic field sensor with simple resonant structure and linear electrical response. Microelectronic Engineering, 142, 12-21. https://doi.org/10.1016/j.mee.2015.06.009 (Original work published 2015)
Mulay, S. S., Becker, G., Vayrette, R., Raskin, J.-P., Pardoen, T., Galceran, M., Godet, S., & Noels, L. (2015). Multiscale modelling framework for the fracture of thin brittle polycrystalline films: application to polysilicon. Computational Mechanics : solids, fluids, engineered materials, aging, infrastructure, molecular dynamics, heat transfer, manufacturing processes, optimization, fracture and integrity, 55(1), 73-91. https://doi.org/10.1007/s00466-014-1083-4 (Original work published 2015)
Kilchytska, V., Makovejev, S., Barraud, S., Poiroux, T., Raskin, J.-P., & Flandre, D. (2015). Trigate nanowire MOSFETs analog figures of merit. Solid-State Electronics, 112, 78-84. https://doi.org/10.1016/j.sse.2015.02.003 (Original work published 2015)
Colla, M.-S., Amin-Ahmadi, B., Idrissi, H., Malet, L., Godet, S., Raskin, J.-P., Schryvers, D., & Pardoen, T. (2015). Dislocation-mediated relaxation in nanograined columnar palladium films revealed by on-chip time-resolved HRTEM testing. Nature Communications, 6, 5922. https://doi.org/10.1038/ncomms6922 (Original work published 2015)
Mulay, S. S., Becker, G., Vayrette, R., Raskin, J.-P., Pardoen, T., Galceran, M., Godet, S., & Noels, L. (2015). Multiscale fracture studies of polycrystalline silicon-based MEMS. Computational Mechanics, 55(1), 73-91. (Original work published 2015)
Kazemi Esfeh, B., Kilchytska, V., Barral, V., Planes, N., Haond, M., Flandre, D., & Raskin, J.-P. (2015). Assessment of 28nm UTBB FD-SOI technology platform for RF applications: Figures of merit and effect of parasitic elements. Solid-State Electronics, 117, 130-137. https://doi.org/10.1016/j.sse.2015.11.020 (Original work published 2015)
Changizi, A., Stiharu, I., Olbrechts, B., & Raskin, J.-P. (2015). Extraction method for the residual stress in multilayer micro-plates under large deflection based on static deflection analysis. IEEE Journal of Microelectromechanical Systems, 24(4), 1150-1163. https://doi.org/10.1109/JMEMS.2015.2388532 (Original work published 2015)
Navarro, E., Bréchet, Y., Barthelemy, A., Radu, I., Pardoen, T., & Raskin, J.-P. (2015). Adhesion and separation models for direct hydrophilic bonding. Journal of Applied Physics, 117, 085305-1 - 085305-6. https://doi.org/10.1063/1.4913481 (Original work published 2015)
Martinez-Lopez, A. G., Cerdeira, A., Tinoco, J. C., Alvarado, J., Padron, W. Y., Mendoza, C., & Raskin, J.-P. (2015). RF modeling of 40-nm triple-gate SOI FinFET. International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, 28, 465-478. https://doi.org/10.1002/jnm.2028 (Original work published 2015)
Gkotsis, P., Castro, L., Lopez-Huerta, F., Herrera-May, A. L., & Raskin, J.-P. (2015). Mechanical characterization and modelling of Lorentz force based MEMS magnetic field sensors. Solid-State Electronics, 112(Special Issue EuroSOI’14), 68-77. https://doi.org/10.1016/j.sse.2015.02.004 (Original work published 2015)
Taibi, A., Trabelsi, M., Sliman, A., Belaroussi, M. T., & Raskin, J.-P. (2015). A novel design method for compact UWB bandpass filters. IEEE Microwave and Wireless Components Letters, 25(1), 4-6. https://doi.org/10.1109/LMWC.2014.2363016 (Original work published 2015)
Makovejev, S., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., & Kilchytska, V. (2015). Comparison of self-heating and its effect on analogue performance in 28 nm bulk and FDSOI. Solid-State Electronics, 115, 219-224. https://doi.org/10.1016/j.sse.2015.08.022 (Original work published 2015)
Favache, A., Sacre, C.-H., Coulombier, M., Libralesso, L., Guaino, P., Raskin, J.-P., Bailly, C., Nysten, B., & Pardoen, T. (2015). Fracture mechanics based analysis of the scratch resistance of thin brittle coatings on a soft interlayer. Wear, 330-331, 461-468. https://doi.org/10.1016/j.wear.2015.01.081 (Original work published 2015)
Vayrette, R., Raskin, J.-P., & Pardoen, T. (2015). On-chip fracture testing of freestanding nanoscale materials. Engineering Fracture Mechanics, 150, 222-238. https://doi.org/10.1016/j.engfracmech.2015.07.006 (Original work published 2015)
Makovejev, S., Kazemi Esfeh, B., Barral, V., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., & Kilchytska, V. (2015). Wide frequency band assessment of 28 nm FDSOI technology platform for analogue and RF applications. Solid-State Electronics, 6. https://doi.org/10.1016/j.sse.2014.12.007 (Original work published 2015)
Tang, X., Reckinger, N., Poncelet, O., Louette, P., Ureña Begara, F., Idrissi, H., Turner, S., Cabosart, D., Colomer, J.-F., Raskin, J.-P., Hackens, B., & Francis, L. (2015). Damage evaluation in graphene underlying atomic layer deposition dielectrics. Scientific Reports, 5(13523), 12. https://doi.org/10.1038/srep13523 (Original work published 2015)
Article de journal
Raskin, J.-P. (2014). Silicon-on-insulator MOSFETs models in analog/RF domain. International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, 27(5-6), 707-735. https://doi.org/10.1002/jnm.1950 (Original work published 2014)
Vayrette, R., Coulombier, M., Pardoen, T., & Raskin, J.-P. (2014). On-chip MEMS-based internal stress actuated structures for the mechanical testing of freestanding thin film materials. Advanced Materials Research, 996, 833-840. https://doi.org/10.4028/www.scientific.net/AMR.996.833 (Original work published 2014)
Favache, A., Libralesso, L., Jacques, P., Raskin, J.-P., Bailly, C., Nysten, B., & Pardoen, T. (2014). Fracture toughness measurement of ultra-thin hard films deposited on a polymer. Thin Solid Films, 550(1), 464-471. https://doi.org/10.1016/j.tsf.2013.10.052 (Original work published 2014)
Md Arshad, M. K., Kilchytska, V., Emam, M., Andrieu, F., Flandre, D., & Raskin, J.-P. (2014). Effect of parasitic elements on UTBB FD SOI MOSFETs RF figures of merit. Solid-State Electronics, 97, 38-44. https://doi.org/10.1016/j.sse.2014.04.027 (Original work published 2014)
Ghidelli, M., Gravier, S., Blandin, J.-J., Raskin, J.-P., Lani, F., & Pardoen, T. (2014). Size-dependent failure mechanisms in ZrNi thin metallic glass films. Scripta Materialia, 89, 9-12. https://doi.org/10.1016/j.scriptamat.2014.06.011 (Original work published 2014)
Rudenko, T., Md Arshad, Raskin, J.-P., Nazarov, A., Flandre, D., & Kilchytska, V. (2014). On the gm/ID-based approaches for threshold voltage extraction in advanced MOSFETs and their application to ultra-thin body SOI MOSFETs. Solid-State Electronics, 97, 52-58. https://doi.org/10.1016/j.sse.2014.04.029 (Original work published 2014)
Idrissi, H., Kobler, A., Amin-Ahmadi, B., Coulombier, M., Galceran, M., Raskin, J.-P., Godet, S., Kübel, C., Pardoen, T., & Schryvers, D. (2014). Plasticity mechanisms in ultrafine grained freestanding aluminum thin films revealed by in-situ transmission electron microscopy nanomechanical testing. Applied Physics Letters, 104(10), 101903. https://doi.org/10.1063/1.4868124 (Original work published 2014)
Smets, Q., Verhulst, A. S., Martens, K., Lin, D. H.-C., El Kazzi, S., Verreck, D., Simoen, E., Collaert, N., Thean, A., Raskin, J.-P., & Heyns, M. M. (2014). Delayed onset of band-to-band tunneling in tunneling field effects transistors due to field induced quantum confinement: experimental verification. Applied Physics Letters, 105, 203507. https://doi.org/10.1063/1.4902117 (Original work published 2015)
Dutu, C. A., Vlad, A., Reckinger, N., Flandre, D., Raskin, J.-P., & Melinte, S. (2014). Tuning the surface conditioning of trapezoidally shaped silicon nanowires by (3-aminopropyl)triethoxysilane. Applied Physics Letters, 104(2), 023502 (4). https://doi.org/10.1063/1.4861598 (Original work published 2014)
Oueriemi, I., Raskin, J.-P., Roda Neve, C., Choubani, F., Dupont, V., Lardot, V., & Huynen, I. (2014). Analysis of slow-wave propagation in coplanar transmission lines with inkjet printed multiwalled carbon nanotubes network. Microwave & Optical Technology Letters, 56(5), 1118-1124. https://doi.org/10.1002/mop.28280 (Original work published 2014)
Tang, X., Francis, L., Dutu, C. A., Reckinger, N., & Raskin, J.-P. (2014). Self-formation of sub-10 nm nanogaps based on silicidation. Nanotechnology, 25(115201), 115201-115201. https://doi.org/10.1088/0957-4484/25/11/115201 (Original work published 2014)
Makovejev, S., Kazemi Esfeh, B., Andrieu, F., Raskin, J.-P., Flandre, D., & Kilchytska, V. (2014). Assessment of Global Variability in UTBB MOSFETs in Subthreshold Regime. Journal of Low Power Electronics and Applications, 4(3), 201-213. https://doi.org/10.3390/jlpea4030201 (Original work published 2014)
Kazemi Esfeh, B., Raskin, J.-P., & Van Moer, W. (2014). Low-cost wideband double-layer microstrip coupled-line directional coupler with high directivity. Microwave & Optical Technology Letters, 56(7), 1570-1575. https://doi.org/10.1002/mop.28391 (Original work published 2014)
Roda Neve, C., Ben Ali, K., Sarafis, P., Hourdakis, E., Nassiopoulou, A. G., & Raskin, J.-P. (2014). Effect of temperature on advanced Si-based substrates performance for RF passive integration. Microelectronic Engineering, 120, 205-209. https://doi.org/10.1016/j.mee.2013.08.004 (Original work published 2014)
Navarro, E., Bréchet, Y., Barthelemy, A., Radu, I., Pardoen, T., & Raskin, J.-P. (2014). Influence of the bonding front propagation on the wafer stack curvature. Applied Physics Letters, 105(6), 61908. https://doi.org/10.1063/1.4893462 (Original work published 2014)
Ureña, F., Raskin, J.-P., Minamisawa, R. A., Escobedo-Cousin, E., & Olsen, S. H. (2014). Roughness analysis in strained silicon-on-insulator wires and films. Journal of Applied Physics, 116(12). https://doi.org/10.1063/1.4896301 (Original work published 2014)
Ali, K. B., Neve, C. R., Gharsallah, A., & Raskin, J.-P. (2014). RF performance of SOI CMOS technology on commercial 200-mm enhanced signal integrity high resistivity SOI substrate. IEEE Transactions on Electron Devices, 61(3), 722-728. https://doi.org/10.1109/TED.2014.2302685 (Original work published 2014)
Ghidelli, M., Gravier, S., Blandin, J.-J., Pardoen, T., Raskin, J.-P., & Mompiou, F. (2014). Compositional-induced structural change in ZrxNi100−x thin film metallic glasses. Journal of Alloys and Compounds, 615(supplément 1), S348-S351. https://doi.org/10.1016/j.jallcom.2013.12.054 (Original work published 2014)
Ghidelli, M., Volland, A., Blandin, J.-J., Pardoen, T., Raskin, J.-P., Mompiou, F., Djemia, P., & Gravier, S. (2014). Exploring the mechanical size effects in Zr65Ni35 thin film metallic glasses. Journal of Alloys and Compounds, 615(supplément 1), S90-S92. https://doi.org/10.1016/j.jallcom.2013.11.154 (Original work published 2014)
Thanh Trung, P., Campos Delgado, J., Joucken, F., Colomer, J.-F., Hackens, B., Raskin, J.-P., Nascimento Santos, C., & Sporken, R. (2014). Direct growth of graphene on Si(111). Journal of Applied Physics, 115(223704), 223704. https://doi.org/10.1063/1.4882181 (Original work published 2014)
André, N., Rue, B., Scheen, G., Flandre, D., Francis, L., & Raskin, J.-P. (2014). Out-of-plane MEMS-based mechanical airflow sensor co-integrated in SOI CMOS technology. Sensors and Actuators A: Physical : an international journal devoted to research and development of physical and chemical transducers, 206, 67-74. https://doi.org/10.1016/j.sna.2013.11.017 (Original work published 2013)
Papier de conférence
Tuyaerts, R., Henry, F., Raskin, J.-P., & Proost, J. (2014). Strain-engineered piezoelectric ZnO thin films. Proceedings of the 8th International Workshop on Zinc Oxide and Related Materials, Symposium on Piezoelectric, Acousto-Optic, Gas, Chemical and Biosensor Device Applications, p.
Vayrette, R., Coulombier, M., Pardoen, T., & Raskin, J.-P. (2014). On-chip MEMS-based internal stress actuated structures for the mechanical testing of freestanding thin film materials. Proceedings of the 9th European Conference on Residual Stress. Published. 9th European Conference on Residual Stress, Troyes, France.
Hammad, M., Raskin, J.-P., & Pardoen, T. (2014). Nano-Indentation of Cu/Graphene Bilayer System. Book of abstracts. Published. 14th European Mechanics of Materials Conference – EMMC14, Gothenburg, Sweden.
Lemoine, G., Colla, M.-S., Raskin, J.-P., Pardoen, T., & Delannay, L. (2014). Crystal plasticity based modelling of strain hardening and creep in nanocrystalline FCC thin films. 4th International Symposium on Computational Mechanics of Polycrystals, Max-Planck-Institut für Eisenforschung, Düsseldorf, Germany.
Makovejev, S., Kazemi Esfeh, B., Barral, V., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., & Kilchytska, V. (2014). Wide Frequency Band Assessment of 28 nm FDSOI Technology Platform for Analogue and RF Applications. Proceedings of the 15th International Conference on ULTIMATE INTEGRATION ON SILICON (ULIS 2014), p. 2.
Haddad, P.-A., Gosset, G., Raskin, J.-P., & Flandre, D. (2014). Efficient ultra low power rectification at 13.56 MHz for a 10 µA load current. 2014 SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S). Published. SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE, Millbrae, CA, USA. https://doi.org/10.1109/S3S.2014.7028220
Tang, X., Reckinger, N., Mager, N., Vanhorenbeke, B., Dutu, C. A., Hermans, S., Colomer, J.-F., & Raskin, J.-P. (2014). Investigation of selective formaldehyde detection by graphene sensors. 1st International Conference Functional Integrated nano Systems (NANOFIS 2014), Graz (Austria).
Kilchytska, V., Makovejev, S., Barraud, S., Poiroux, T., Raskin, J.-P., & Flandre, D. (2014). Trigate NanoWire MOSFETs Analog Figures of Merit. Proceedings of the 10th Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits (EUROSOI 2014), p. 2.
Lemoine, G., Colla, M.-S., Idrissi, H., Raskin, J.-P., Pardoen, T., & Delannay, L. (2014). Crystal plasticity based modelling of strain hardening and creep in nanocrystalline freestanding Pd films. 14th European Mechanics of Materials Conference - EMMC14, Gothenburg,Sweden.
Makovejev, S., Barraud, S., Poiroux, T., Rozeau, O., Raskin, J.-P., Flandre, D., & Kilchytska, V. (2014). Impact of Self-Heating on UTB MOSFET Parameters. Proceedings of the 10th Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits (EUROSOI 2014). Published. 10th Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits (EUROSOI 2014), Tarragona (Spain).
Olbrechts, B., & Rue, B. (2014). PMOSFET-based Pressure Sensors in FD SOI.
Ghidelli, M., Blandin, J.-J., Pardoen, T., Lani, F., Raskin, J.-P., Mompiou, F., Djemia, P., & Gravier, S. (2014). Size-Dependent Mechanical Behavior of Sputter-Deposited Zr65Ni35 Thin Film Metallic Glasses. 21st International Symposium on Metastable, Amorphous and Nanostructured Materials (ISMANAM 2014), Cancun (Mexique).
Idrissi, H., Amin-Ahmadi, B., Colla, M.-S., Kobler, A., Coulombier, M., Raskin, J.-P., Kübel, C., Pardoen, T., & Schryvers, D. (2014). Study of nanoscale deformation mechanisms in nanocrystalline materials using advanced micro/nanomechanical TEM testing. IUTAM Symposium on Micromechanics of Defects in Solids, Seville, Spain.
Idrissi, H., Colla, M.-S., Ahmin-Ahmadi, B., Kobler, A., Coulombier, M., Raskin, J.-P., Kübel, C., Godet, S., Schryvers, D., & Pardoen, T. (2014). Unravelling plasticity mechanisms in nanocrystalline metallic thin films using advanced in-situ TEM micro/nanomechanical testing. Book of abstracts. Published. 16th International Conference on Experimental Mechanics, Cambridge, UK.
Pardoen, T., Coulombier, M., Colla, M.-S., Lemoine, G., Vayrette, R., Ghidelli, M., Blandin, J.-J., Gravier, S., Delannay, L., & Raskin, J.-P. (2014). Size dependent plastic localization in thin nanocrystalline or amorphous metallic films. MRS fall meeting, Boston, USA.
Kilchytska, V., Makovejev, S., Raskin, J.-P., & Flandre, D. (2014). Advantages and Challenges of Advanced MOSFETs for Analog and RF Applications. Abstratcs - CMOS Emerging Technologies Research Symposium, p. 33.
Pardoen, T., Colla, M.-S., Coulombier, M., Wang, B., Idrissi, H., Schryvers, D., & Raskin, J.-P. (2014). Failure in thin metallic films: on chip testing and size effects. 20th European Conference on Fracture, Trondheim, Norvège.
Hammad, M., Fivel, M., Sacre, C.-H., Idrissi, H., D’Haese, C., Schryvers, D., Nysten, B., Raskin, J.-P., & Pardoen, T. (2014). Nanoindentation of Cu/Graphene Bilayer System. Book of abstracts. Published. 2014 Materials Research Society Fall Meeting & Exhibit, Boston, Massachussetts, USA.
Kazemi Esfeh, B., Kilchytska, V., Barral, V., Planes, N., Haond, M., Flandre, D., & Raskin, J.-P. (2014). 28 nm FD SOI Technology Platform RF FoM. Proceedings of the 2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference. Published. 2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S 2014), Millbrae (USA). https://doi.org/10.1109/S3S.2014.7028208
Olbrechts, B., & Rue, B. (2014). MOSFETs-based Pressure Sensors in Thin Film SOI Technology.
Makovejev, S., Kazemi Esfeh, B., Raskin, J.-P., Kilchytska, V., Flandre, D., Barral, V., Planes, N., & Haond, M. (2014). Variability of UTBB MOSFET Analog Figures of Merit in Wide Frequency Range. Proceedings of the 2014 4th European Solid State Device research Conference (ESSDERC 2014), 222-225. https://doi.org/10.1109/ESSDERC.2014.6948800
Chapitre de livre
Kilchytska, V., Makovejev, S., Md Arshad, M. K., Raskin, J.-P., & Flandre, D. (2014). Perspectives of UTBB FD SOI MOSFETs for Analog and RF Applications. In Alexei Nazarov, Francis Balestra, Valeriya Kilchytska, Denis Flandre (ed.), Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting (p. p. 27-46). Springer International Publishing. https://doi.org/10.1007/978-3-319-08804-4_2
Nassiopoulou, A., Sarafis, P., Raskin, J.-P., Issa, H., & Ferrari, P. (2014). Substrate Technologies for Silicon-Integrated RF and mm-Wave Passive Devices. In Francis Balestra (ed.), Beyond-CMOS Nanodevices 1 (p. p. 373-411). John Wiley & Sons, Ltd. https://doi.org/10.1002/9781118984772.ch13
Papier de conférence
Vayrette, R., Galceran, M., Godet, S., Raskin, J.-P., & Pardoen, T. (2013). On-chip testing and characterization of polysilicon thin films fracture mechanisms. MRS Fall Meeting and Exhibit, Boston, USA.
Vayrette, R., Coulombier, M., Mompiou, F., Raskin, J.-P., & Pardoen, T. (2013). Lab-on-chip for in- and ex-situ characterization of the mechanical response of nano-objects. GDRI CNRS Mecano General Meeting on the Mechanics of Nano-objects, Duesseldorf, Deutschland.
Bhaskar, U. K., Pardoen, T., Passi, V., Houri, S., & Raskin, J.-P. (2013). Surface effects on the electrical, mechanical and electro-mechanical properties of silicon nano wires. Book of abstracts. Published. 2013 MRS Spring Meeting & Exhibit, San Francisco, California, USA.
Santos, C. N., Hackens, B., Joucken, F., Sporken, R., Campos-Delgado, J., Raskin, J.-P., de Sousa Meneses, D., & Echegut, P. (2013). THz and mid-IR Reflectance of epitaxial graphene. American Physical Society March Meeting 2013 – APS 2013, Baltimore, Maryland (USA).
Pardoen, T., Coulombier, M., Idrissi, H., Schryvers, D., Mompiou, F., Legros, M., & Raskin, J.-P. (2013). Size and rate dependent plastic localization in thin metallic films. 142nd Annual Meeting & Exhibition, TMS 2013 - Symposium: Fatigue and Fracture of Thin Films and Nanomaterials, San Antonio, Texas (USA).
Kilchytska, V., Makovejev, S., Md Arshad, M. K., Raskin, J.-P., Flandre, D., Andrieu, F., Poiroux, T., & Faynot, O. (2013). Perspectives of UTBB FD SOI MOSFETs for analog and RF applications. Proceedings of the 2nd Ukrainian-French Seminar “Semiconductor on Insulator Materials, Devices and Circuits: Physics, Technology and Diagnostics, and 7th International Workshop “Functional Nanomaterials and Devices”. Published. 2nd Ukrainian-French Seminar : Semiconductor on Insulator Materials, Devices and Circuits: Physics, Technology and Diagnostics, and 7th International Workshop : Functional Nanomaterials and Devices, Kyiv (Ukraine).
Navarro, E., Bréchet, Y., Moreau, R., Pardoen, T., Raskin, J.-P., Barthelemy, A., & Radu, I. (2013). Direct silicon bonding dynamics: a coupled fluid/structure analysis. Proceedings of WaferBond′13. Published. WaferBond′13, Stockhom, Suède.
Martinez-Lopez, A. G., Padron-Hernandez, W. Y., Salas, S., Alvarado, J., Tinoco, J. C., Raskin, J.-P., & Cerdeira, A. (2013). Triple-Gate FinFETs for Very High Frequency Applications. Proceedings of the Workshop on Advanced Materials and Devices - WAMD’13. Published. Workshop on Advanced Materials and Devices - WAMD’13, University of Havana (Cuba).
Makovejev, S., Kazemi Esfeh, B., Andrieu, F., Raskin, J.-P., Flandre, D., & Kilchytska, V. (2013). Threshold Voltage Extraction Techniques and Temperature Effect in Context of Global Variability in UTBB MOSFETs. Proceedings of the 43rd European Solid-State Device Research Conference (ESSDERC 2013), 4. https://doi.org/10.1109/ESSDERC.2013.6818852
Idrissi, H., Amin-Ahmadi, B., Kobler, A., Coulombier, M., Kübel, C., Raskin, J.-P., Pardoen, T., & Schryvers, D. (2013). Study of small-scale plasticity and fracture mechanisms in ultrafine-grained Al wires using in situ BF-TEM and in situ ACOM-TEM nanomechanical testing. Nanobrücken, Dresden, Germany.
Idrissi, H., Amin-Ahmadi, B., Kobler, A., Coulombier, M., Kübel, C., Raskin, J.-P., Schryvers, D., & Pardoen, T. (2013). Etude des mécanismes élémentaires de plasticité et de fracture dans des films minces d’Aluminium nanocristallin par des tests nanomécaniques in-situ en ACOM-TEM. Book of abstracts. Published. Colloque Plasticité 2013, Paris, France.
Idrissi, H., Kobler, A., Amin-Ahmadi, B., Coulombier, M., Raskin, J.-P., Kubel, C., Pardoen, T., & Schryvers, D. (2013). In-situ ACOM-TEM nanomechanical testing of <111> textured ultrafine grained Al thin films: plasticity and fracture mechanisms. Book of abstracts. Published. TMS 2013, San Antonio, California, USA.
Roda Neve, C., Ben Ali, K., Malaquin, C., Allibert, F., Desbonnets, E., Bertrand, I., Van Den Daele, W., & Raskin, J.-P. (2013). RF and linear performance of commercial 200 mm trap-rich HRSOI wafers for SoC applications. SiRF 2013 Techn. Digest, pp. 15-17.
Francis, L., Gkotsis, P., Kilchytska, V., Tang, X., Druart, S., Raskin, J.-P., & Flandre, D. (2013). Impact of radiations on the electromechanical properties of materials and on the piezoresistive and capacitive transduction mechanisms used in microsystems. Proceedings of SPIE 8614. Published. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII (SPIE 2013), San Francisco (USA). https://doi.org/10.1117/12.2008531
Alvarado, J., Tinoco, J. C., Salas, S., Martinez-Lopez, A. G., Soto-Cruz, B. S., Cerdeira, A., & Raskin, J.-P. (2013). SOI FinFET compact model for RF circuits simulation. Proceedings o the 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF’13, TU1C-4, pp. 90-92.
Huet, B., Raskin, J.-P., & et al. (2013). Role of confinement in chemical vapor deposition of graphene on copper thin films. Material Research Society, Boston.
Ghidelli, M., Volland, A., Blandin, J.-J., Pardoen, T., Raskin, J.-P., Mompiou, F., Djemia, P., & Gravier, S. (2013). Exploring size effect phenomena in Zr65Ni35 thin film metallic glasses. 20th International Symposium on Metastable, Amorphous and Nanostructured Materials, Torino (Italy).
Roda Neve, C., Ben Ali, K., Sarafis, P., Hourdakis, E., Nassiopoulou, A. G., & Raskin, J.-P. (2013). Effect of temperature on advanced Si-based substrates performance for RF passive integration. Proceedings of the Materials for Advanced Metallization – MAM 2013, 151-152.
Raskin, J.-P., Bhaskar, U. K., & Pardoen, T. (2013). On-Chip tensile testing of the mechanical and electro-mechanical properties of nano-scale silicon free-standing beams up to fracture. Book of abstracts. Published. PiezoNEMS 2013 - PHELMA-Polygone, Grenoble, France.
Md Arshad, M. K., Kilchytska, V., Emam, M., Andrieu, F., Flandre, D., & Raskin, J.-P. (2013). Effect of parasitic elements on UTBB FD SOI MOSFET RF figures of merit. Proceedings of the Ninth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits (EUROSOI 2012), p. 2.
Ben Ali, K., Roda Neve, C., Gharsallah, A., & Raskin, J.-P. (2013). Digital substrate noise coupling into trap-rich HR-SOI substrate. Proceedings of the Ninth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’13, paper # 16.
Ghidelli, M., Gravier, S., Blandin, J.-J., Pardoen, T., Raskin, J.-P., Mompiou, F., & Djemia, P. (2013). Compositional-induced structural change of ZrNi thin film metallic glasses deposited by magnetron sputtering. 20th International Symposium on Metastable, Amorphous and Nanostructured Materials, Torino (Italy).
Salas, S., Tinoco, J. C., Martinez-Lopez, A. G., Alvarado, J., & Raskin, J.-P. (2013). Fringing gate capacitance model for Triple-Gate FinFET. Proceedings of the 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF’13, TU1C-4, pp. 90-92.
Navarro, E., Bréchet, Y., Moreau, R., Pardoen, T., Raskin, J.-P., Barthelemy, A., & Radu, I. (2013). Direct wafer bonding front propagation dynamics. Book of abstracts. Published. WaferBond’13, Stockhom, Suède.
Colla, M.-S., Amin-Ahmadi, B., Pardoen, T., Idrissi, H., Malet, L., Schryvers, D., Godet, S., & Raskin, J.-P. (2013). In-situ characterization of the time dependent mechanical properties of nanocrystalline Pd thin films. MECANO, Dusseldorf, Germany.
Idrissi, H., Amin-Ahmadi, B., Galceran, M., Delmelle, R., Colla, M.-S., Raskin, J.-P., Godet, S., Proost, J., Pardoen, T., & Schryvers, D. (2013). TEM Observation of FCC 9R Phase Transformation in Nanocrystalline Pd Thin Films during Hydriding/Dehydriding Cycles. Proceedings of the 142nd Annual Meeting of the Metallurgical Society (TMS), p.
Rudenko, T., Md Arshad, M. K., Raskin, J.-P., Nazarov, A., Flandre, D., & Kilchytska, V. (2013). On the gm/ID-based Threshold Voltage Extractions in Advanced SOI MOSFETs. Proceedings of the Ninth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits (EUROSOI 2013), p. 2.
Nassiopoulou, A. G., Hourdakis, E., Sarafis, P., Ferrari, Ph., Issa, H., Raskin, J.-P., Roda Neve, C., & Ben-Ali, K. (2013). Porous Si as a substrate material for RF passive integration. Proceedings ot the 14th International Conference on Ultimate Integration on Silicon – ULIS’13, 89-93.
Makovejev, S., Kazemi Esfeh, B., Andrieu, F., Raskin, J.-P., Flandre, D., & Kilchytska, V. (2013). Global Variability of UTBB MOSFET in Subthreshold. Proceedings of the IEEE S3S Conference 2013, 2. https://doi.org/10.1109/S3S.2013.6716585
Pardoen, T., Coulombier, M., Colla, M.-S., Raskin, J.-P., Idrissi, H., Wang, B., Schryvers, D., Mompiou, F., & Legros, M. (2013). Size and rate dependent ductility of thin metallic films. Plasticity′13 - Symosium in honor of Prof. P. Van Houtte, Nassau, Bahamas.
Tang, X., Francis, L., Dutu, C. A., Reckinger, N., & Raskin, J.-P. (2013). Sub-10-nm Nanogap Fabrication by Silicidation. Proceedings of the 13th IEEE International Conference on Nanotechnology 2013, p. 570-573. https://doi.org/10.1109/NANO.2013.6720811
Article de journal
Mompiou, F., Legros, M., Boé, A., Coulombier, M., Raskin, J.-P., & Pardoen, T. (2013). Inter- and intragranular plasticity mechanisms in ultrafine-grained Al thin films: An in situ TEM study. Acta Materialia, 61(1), 205-216. https://doi.org/10.1016/j.actamat.2012.09.051 (Original work published 2013)
Md Arshad, M. K., Makovejev, S., Olsen, S. H., Andrieu, F., Raskin, J.-P., Flandre, D., & Kilchytska, V. (2013). UTBB SOI MOSFETs analog figures of merit: Effects of ground plane and asymmetic double-gate regime. Solid-State Electronics, 90, 56-64. (Original work published 2013)
Rodriguez, S. S., Tinoco, J. C., Martinez-Lopez, A. G., Alvarado, J., & Raskin, J.-P. (2013). Parasitic gate capacitance model for triple-gate finfets. IEEE Transactions on Electron Devices, 60(11), 3710-3717. https://doi.org/10.1109/TED.2013.2282629 (Original work published 2013)
Campos Delgado, J., Cançado, L. G., Achete, C. A., Jorio, A., & Raskin, J.-P. (2013). Raman scattering study of the phonon dispersion in twisted bilayer graphene. Nano Research, 6(4), 269-274. https://doi.org/10.1007/s12274-013-0304-z (Original work published 2013)
Pham Thanh Trung, Joucken, F., Campos Delgado, J., Raskin, J.-P., Hackens, B., & et al. (2013). Direct growth of graphitic carbon on Si(111). Applied Physics Letters, 102, 013118 1-5. https://doi.org/10.1063/1.4773989 (Original work published 2013)
Raskin, J.-P., & Desbonnets, E. (2013). SOITEC and UCL boost the RF performance of SOI substrates. Advanced Substrate News. Published. (Original work published 2013)
Emam, M., & Raskin, J.-P. (2013). Partially Depleted SOI Versus Deep N-Well Protected Bulk-Si MOSFETs: A High-Temperature RF Study for Low-Voltage Low-Power Applications. IEEE Transactions on Microwave Theory and Techniques, 61(4), 1496-1504. https://doi.org/10.1109/TMTT.2013.2250513 (Original work published 2013)
Tinoco, J., Rodriguez, S. S., Martinez-Lopez, A. G., Alvarado, J., & Raskin, J.-P. (2013). Impact of extrinsic capacitances on FinFETs RF performance. IEEE Transactions on Microwave Theory and Techniques, 16(2), 833-840. https://doi.org/10.1109/TMTT.2012.2231697 (Original work published 2013)
Bhaskar, U. K., Pardoen, T., Passi, V., & Raskin, J.-P. (2013). Surface states and conductivity of silicon nano-wires. Journal of Applied Physics, 113(13), 134502. https://doi.org/10.1063/1.4798611 (Original work published 2013)
Houri, S., Bhaskar, U. K., Gallacher, B., Francis, L., Pardoen, T., & Raskin, J.-P. (2013). Dynamic analysis of multi-beam MEMS structures for the extraction of the stress-strain response of thin films. Experimental Mechanics : an international journal of the Society for Experimental Mechanics, 53(3), 441-453. https://doi.org/10.1007/s11340-012-9654-9 (Original work published 2013)
Walewyns, T., Reckinger, N., Ryelandt, S., Pardoen, T., Raskin, J.-P., & Francis, L. (2013). Polyimide as a versatile enabling material for microsystems fabrication: surface micromachining and electrodeposited nanowires integration. Journal of Micromechanics and Microengineering : structures, devices & systems, 23(9), 12. https://doi.org/10.1088/0960-1317/23/9/095021 (Original work published 2013)
Shim, T., Raskin, J.-P., Neve, C. R., & Rais-Zadeh, M. (2013). RF MEMS passives on high-resistivity silicon substrates. IEEE Microwave and Wireless Components Letters, 23(12), 632-634. https://doi.org/10.1109/LMWC.2013.2283857 (Original work published 2013)
Navarro, E., Bréchet, Y., Moreau, R., Pardoen, T., Raskin, J.-P., Barthelemy, A., & Radu, I. (2013). Direct silicon bonding dynamics: A coupled fluid/structure analysis. Applied Physics Letters, 103(3), 34104. https://doi.org/10.1063/1.4813312 (Original work published 2013)
Guisbiers, G., Colla, M.-S., Coulombier, M., Raskin, J.-P., & Pardoen, T. (2013). Study of creep/relaxation mechanisms in thin freestanding nanocrystalline palladium films through the lab-on-chip technology. Journal of Applied Physics, 113(024513), 024513-1 - 024513-6. https://doi.org/10.1063/1.4775398 (Original work published 2013)
Campos Delgado, J., Botello Mendez, A. R., Algara-Siller, G., Hackens, B., Pardoen, T., Kaiser, U., Dresselhaus, M. S., Charlier, J.-C., & Raskin, J.-P. (2013). CVD synthesis of mono- and few-layer graphene using alcohols at low hydrogen concentration and atmospheric pressure. Chemical Physics Letters, 584, 142-146. https://doi.org/10.1016/j.cplett.2013.08.031 (Original work published 2013)
Amin-Ahmadi, B., Idrissi, H., Galceran, M., Colla, M.-S., Raskin, J.-P., Pardoen, T., Godet, S., & Schryvers, D. (2013). Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline Pd thin films. Thin Solid Films, 539, 145-150. https://doi.org/10.1016/j.tsf.2013.05.083 (Original work published 2013)
Bhaskar, U. K., Pardoen, T., Passi, V., & Raskin, J.-P. (2013). Piezoresistance of nano-scale silicon up to 2GPa in tension. Applied Physics Letters, 102(3), 31911. https://doi.org/10.1063/1.4788919 (Original work published 2013)
Sarafis, P., Hourdakis, E., Nassiopoulou, A. G., Roda Neve, C., Ben Ali, K., & Raskin, J.-P. (2013). Advanced Si-based substrates for RF passive integration: Comparison between local porous Si layer technology and trap-rich high resistivity Si. Solid-State Electronics, 87, 27-33. https://doi.org/10.1016/j.sse.2013.04.026 (Original work published 2013)
Crupi, G., Schreurs, D., Raskin, J.-P., & Caddemi, A. (2013). A comprehensive review on microwave FinFET modeling for progressing beyond the state of art. Solid-State Electronics, 80, 81-95. (Original work published 2013)
Makovejev, S., Olsen, S. H., Kilchytska, V., & Raskin, J.-P. (2013). Time and Frequency Domain Characterization of Transistor Self-Heating. IEEE Transactions on Electron Devices, 60(6), 1844-1851. https://doi.org/10.1109/TED.2013.2259174 (Original work published 2013)
Ben Ali, K., Neve, C. R., Gharsallah, A., & Raskin, J.-P. (2013). Photo-induced coplanar waveguide rf switch and optical crosstalk on high-resistivity silicon trap-rich passivated substrate. IEEE Transactions on Electron Devices, 60(10), 3478-3484. https://doi.org/10.1109/TED.2013.2279686 (Original work published 2013)
Houri, S., Bhaskar, U. K., Pardoen, T., & Raskin, J.-P. (2013). Note: Size effects on the tensile response of top-down fabricated Si nanobeams. Review of Scientific Instruments, 84(3), 36102. https://doi.org/10.1063/1.4794438 (Original work published 2013)
Passi, V., Dubois, E., Lecestre, A., Linde, A. S., Du Bois, B., & Raskin, J.-P. (2013). Design guidelines for releasing silicon nanowire arrays by liquid and vapor phase hydrofluoric acid. Microelectronic Engineering, 103, 57-65. https://doi.org/10.1016/j.mee.2012.09.002 (Original work published 2013)
Urena, F., Olsen, S. H., & Raskin, J.-P. (2013). Raman measurements of uniaxial strain in silicon nanostructures. Journal of Applied Physics, 114(14). https://doi.org/10.1063/1.4824291 (Original work published 2013)
Md Arshad, Makovejev, S., Olsen, S., Andrieu, F., Raskin, J.-P., Flandre, D., & Kilchytska, V. (2013). UTBB SOI MOSFETs analog figures of merit: Effects of ground plane and asymmetric double-gate regime. Solid-State Electronics. Published. https://doi.org/10.1016/j.sse.2013.02.051 (Original work published 2013)
Oueriemi, I., Raskin, J.-P., Choubani, F., & Huynen, I. (2013). Wideband non-linear characteristics of random multi-walled carbon nanotube networks. Microwave & Optical Technology Letters, 55(11), 2648-2652. https://doi.org/10.1002/mop.27842 (Original work published 2013)
Tang, X., Francis, L., Gong, L., Wang, F., Raskin, J.-P., Flandre, D., Zhang, S., You, D., Wu, L., & Dai, B. (2013). Characterization of high-efficiency multi-crystalline silicon in industrial production. Solar Energy Materials & Solar Cells, 117, 225-230. https://doi.org/10.1016/j.solmat.20313.06.013 (Original work published 2013)
Tang, X., Raskin, J.-P., Reckinger, N., Dai, B., & Francis, L. (2013). A new fabrication method for elevated source/drain junctionless transistors. Journal of Physics D: Applied Physics, 46(165101), 7. https://doi.org/10.1088/0022-3727/46/16/165101 (Original work published 2013)
Chapitre de livre
Kilchytska, V., Raskin, J.-P., & Flandre, D. (2013). Specific Features of MuGFETs at High Temperatures over a Wide Frequency Range. In Nadine Collaert (ed.), CMOS Nanoelectronics: Innovative Devices, Architectures, and Applications (pp. 233-259). Pan Stanford Publishing Pte Ltd. https://doi.org/10.1201/b13063-9
Papier de conférence
Minnebo, H., André, S., Duflot, M., Pardoen, T., & Raskin, J.-P. (2012). X-FEM based modelling of complex mixed mode fatigue crack propagation. Book of abstracts. Published. VIth European Congress on Computational Methods in Applied Sciences and Engineering-ECCOMAS 2012, Vienna, Austria.
Alvarado, J., Tinoco, J. C., Kilchytska, V., Flandre, D., Raskin, J.-P., Cerdeira, A., & Contreras, E. (2012). Compact small-signal model for RF FinFETs. Proceedings of the 8th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS 2012), 1-4. https://doi.org/10.1109/ICCDCS.2012.6188936
Md Arshad, M. K., Kilchytska, V., Makovejev, S., Olsen, S. H., Andrieu, F., Raskin, J.-P., & Flandre, D. (2012). UTBB SOI MOSFETs analog figures of merit: effect of ground plane and asymmetric double-gate regime. Proceedings of the Eighth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’12, 111-112.
Vayrette, R., Coulombier, M., Bhaskar, U. K., Raskin, J.-P., & Pardoen, T. (2012). On-chip tensile testing for the investigation of thin films, nanoribbons and nanowires mechanical properties. Proceedings des Journées de la Matière Condensée - JMC13, p. 479.
Md Arshad, M. K., Emam, M., Kilchytska, V., Andrieu, F., Flandre, D., & Raskin, J.-P. (2012). RF behavior of undoped channel ultra-thin body with ultra-thin BOX MOSFETs. Proceedings of the 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Digest of papers (SiRF 2012), 105-108. https://doi.org/10.1109/SiRF.2012.6160155
Raskin, J.-P. (2012). SOI technologies from microelectronics to microsystems - meeting the More than Moore roadmap requirements. Proceedings of the 27th Symposium on Microelectronics Technology and Devices – SBMicro’12, p. Paper invited V.
Tinoco, J. C., Alvarado, J., Martinez-Lopez, A. G., & Raskin, J.-P. (2012). Impact of extrinsic capacitances on FinFETs RF performance. Proceedings of the IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - SiRF 2012, pp. 73-76. https://doi.org/10.1109/SiRF.2012.6160141
Bhaskar, U. K., Passi, V., Pardoen, T., & Raskin, J.-P. (2012). Surface and strain effects on the conductivity of silicon nanowires. 2012 Materials Research Society Fall Meeting – MRS Fall’12, paper # FF9.28.
Roda Neve, C., Raskin, J.-P., & Desbonnets, E. (2012). Engineering substrate paths for RF Front End module integration - Focus on Trap Rich High Resistivity Silicon-on-Insulator. Proceedings of the 42nd European Solid-State Device Research Conference – ESSDERC 2012, SINANO-NanoFunction Workshop - Novel materials, devices and technologies for high performance on-chip RF applications. Published. 42nd European Solid-State Device Research Conference – ESSDERC 2012, SINANO-NanoFunction Workshop - Novel materials, devices and technologies for high performance on-chip RF applications, Bordeaux, France.
Kilchytska, V., Md Arshad, M. K., Makovejev, S., Olsen, S., Andrieu, F., Poiroux, T., Faynot, O., & Raskin, J.-P. (2012). Ultra-thin body and thin-BOX SOI CMOS technology analog figures of merit. Solid-State Electronics, 70, 50-58. https://doi.org/10.1016/j.sse.2011.11.020 (Original work published 2012)
Makovejev, S., Olsen, S. H., Md Arshad, K., Flandre, D., Raskin, J.-P., & Kilchytska, V. (2012). Improvement of high-frequency FinFET performance by fin width engineering. Proceedings of the IEEE 2012 International SOI Conference (SOI’12), 58-59. https://doi.org/10.1109/SOI.2012.6404381
Campos Delgado, J., Botello Mendez, A. R., Hackens, B., Pardoen, T., Charlier, J. C., & Raskin, J.-P. (2012). Graphene from alcohols. Proceedings of the Graphene 2012 International Conference, pp. 52-53.
Colla, M.-S., Wang, B., Idrissi, H., Guisbiers, G., Schryvers, D., Raskin, J.-P., & Pardoen, T. (2012). Time dependent mechanical properties of palladium thin films: influence of microstructure and of the presence of a surface barrier. Nanobrücken II – Hybrid Nanomechanical Testing Techniques, Saarbrücken, Germany.
Campos Delgado, J., Botello Mendez, A. R., Hackens, B., Charlier, J.-C., Pardoen, T., & Raskin, J.-P. (2012). Graphene growth by CVD using liquid precursors. Proceedings of the American Physical Society – APS, March meeting 2012 - Graphene: Growth, Mechanical Exfoliation, and Properties, p. Paper # X12.00010.
Kilchytska, V., Raskin, J.-P., & Flandre, D. (2012). UTBB FDSOI and SOI FinFET device assessment for future analog/RF applications. 2012 IEEE International SOI Conference, Napa (USA).
Emam, M., & Raskin, J.-P. (2012). Nonlinear high temperature behavior for Low Voltage Low Power applications. Proceedings of the 2012 IEEE Subthreshold Microelectronics Conference (SubVT), p. Session 1 - Power Management, paper # 3.
Oueriemi, I., Raskin, J.-P., Choubani, F., & Huynen, I. (2012). Analytical validation of experimental nonlinear electrical behavior of Multiwalled Carbon Nanotubes (MWCNTs) Network. Nanotec2012, Brighton, UK.
Francis, L., Druart, S., André, N., Gkotsis, P., Flandre, D., & Raskin, J.-P. (2012). Magnetic sensors enabled by MEMS and SOI technologies. Proceedings of the CMOS Emerging Technologies Conference. Published. CMOS Emerging Technologies Conference, Vancouver (Canada).
Wang, X., Becker, G., Ling, W., Pardoen, T., Raskin, J.-P., & Noels, L. (2012). The fracture of polycrystalline silicon based MEMS. Proceedings of the 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - EuroSimE 2012. Published. 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - EuroSimE 2012, Lisbon, Portugal.
Raskin, J.-P. (2012). SOI substrates for More than Moore roadmap. Proceedings of the 8th International Caribbean Conference on Devices, Circuits and Systems - ICCDCS 2012, p. 4 pages - Paper INV9. https://doi.org/10.1109/ICCDCS.2012.6188886
Raskin, J.-P. (2012). SOI technologies from microelectronics to microsystems - meeting the More than Moore roadmap requirements. Proceedings of the IEEE International Conference on Solid-State and Integrated Circuit Technology – ICSICT’12, p. Paper S08-02.
Emam, M., & Raskin, J.-P. (2012). Wideband characterization for optimized performance in Low Voltage Low Power Applications. Proceedings of the 59th International Symposium & Exhibition – AVS’12, p. 200.
Pardoen, T., Coulombier, M., Colla, M.-S., Bhaskar, U. K., Passi, V., Houri, S., Raskin, J.-P., Idrissi, H., & et al. (2012). On chip testing of (freestanding) thin films. Proceedings of the GDRi CNRS MECANO, Session I, Mechanical Testing, p. Paper 2.
Ben Ali, K., Roda Neve, C., Gharsallah, A., & Raskin, J.-P. (2012). RF SOI CMOS technology on commercial trap-rich high resistivity SOI wafer. Proceedings of the SOI Conference (SOI), 2012 IEEE International, p. 2. https://doi.org/10.1109/SOI.2012.6404404
Pardoen, T., Coulombier, M., Colla, M.-S., Bhaskar, U. K., Passi, V., Houri, S., Raskin, J.-P., Idrissi, H., & et al. (2012). On-chip testing of (freestanding) thin films. Proceedings of the Indentation 2012, p. Paper 1.
Makovejev, S., Olsen, S., Andrieu, F., Poiroux, T., Faynot, O., Flandre, D., Raskin, J.-P., & Kilchytska, V. (2012). On extraction of self-heating features in UTBB SOI MOSFETs. Proceedings of the 13th International Conference on Ultimate Integration on Silicon (ULIS 2012), 109-112. https://doi.org/10.1109/ULIS.2012.6193369
Urena, F., Raskin, J.-P., & Olsen, S. H. (2012). Surface roughness characterisation of strained silicon structures using AFM. Proceedings of the The 14th edition of the Annual Research Conference – ARC’12, p. 23.
Nayak, P., Olbrechts, B., Vanden Bulcke, M., & Raskin, J.-P. (2012). Conventional Fully-Depleted SOI devices going flexible. Proceedings of the Innovative Printed Smart Objects – IPSO 2012. Published. Innovative Printed Smart Objects – IPSO 2012, Aix-en-Provence, France.
Raskin, J.-P. (2012). Sensing and MEMS devices in thin film SOI MOS technology. Proceedings of the 2nd Annual Congress of Nano-S&T – Nano S&T-2012, p. 64.
Nascimento Santos, C., Joucken, F., Domingos de Sousa, M., Echegut, P., Campos Delgado, J., Raskin, J.-P., Sporken, R., & Hackens, B. (2012). Reflectance of pristine and n-doped epitaxial graphene from THz to mid-IR. Proceedings of the Graphene 2012 International Conference, p. 210.
Flandre, D., Kilchytska, V., Alvarado, J. J., Boufouss, E. H., Rue, B., Roda Neve, C., Raskin, J.-P., & Francis, L. (2012). Harsh-environment behaviours and performances of advanced Silicon-on-Insulator CMOS sensors, transistors and circuits. VII Workshop on Semiconductor and Micro & Nano Technology, SEMINATEC 2012, Sao Bernardo do Campo (Brazil).
Walewyns, T., Reckinger, N., Ryelandt, S., Pardoen, T., Raskin, J.-P., & Francis, L. (2012). Polyimide as versatile enabling material for microsystems fabrication: electrodeposited nanowires integration and surface micromachining. Proceedings du 5ème Colloque du Laboratoire International Associé “Nanotechnologies & Nanosystèmes, p. 103 - Paper GE21.
Article de journal
Passi, V., Bhaskar, U. K., Pardoen, T., Sodervall, U., Nilsson, B., Petersson, G., Hagberg, M., & Raskin, J.-P. (2012). High-Throughput On-Chip Large Deformation of Silicon Nanoribbons and Nanowires. IEEE Journal of Microelectromechanical Systems, 21(4), 822-829. https://doi.org/10.1109/JMEMS.2012.2190711 (Original work published 2012)
Wang, B., Idrissi, H., Galceran, M., Colla, M.-S., Turner, S., Hui, S., Raskin, J.-P., Pardoen, T., Godet, S., & Schryvers, D. (2012). Advanced TEM investigation of the plasticity mechanisms in nanocrystalline freestanding palladium films with nanoscale twins. International Journal of Plasticity, 37, 140-156. https://doi.org/10.1016/j.ijplas.2012.04.003 (Original work published 2012)
Roda Neve, C., & Raskin, J.-P. (2012). RF Harmonic Distortion of CPW Lines on HR-Si and Trap-Rich HR-Si Substrates. IEEE Transactions on Electron Devices, pp(Issue 99), 1-9. https://doi.org/10.1109/TED.2012.2183598 (Original work published 2012)
Colla, M.-S., Wang, B., Idrissi, H., Schryvers, D., Raskin, J.-P., & Pardoen, T. (2012). High strength-ductility of thin nanocrystalline palladium films with nanoscale twins : On-chip testing and grain aggregate model. Acta Materialia, 60(4), 1795-1806. https://doi.org/10.1016/j.actamat.2011.11.054 (Original work published 2012)
Raskin, J.-P. (2012). SOI technologies from microelectronics to microsystems - meeting the More than Moore roadmap requirements. Electrochemical Society. Transactions, 49(1), 15-23. https://doi.org/10.1149/04901.0015ecst (Original work published 2012)
Wang, B., Idrissi, H., Shi, H., Colla, M.-S., Michotte, S., Raskin, J.-P., Pardoen, T., & Schryvers, D. (2012). Texture dependent twin formation in nanocrystalline thin Pd films. Scripta Materialia, 66(11), 866-871. https://doi.org/10.1016/j.scriptamat.2012.01.038 (Original work published 2012)
Arshad, M. K. M., Raskin, J.-P., Kilchytska, V., Andrieu, F., Scheiblin, P., Faynot, O., & Flandre, D. (2012). Extended MASTAR modeling of DIBL in UTB and UTBB SOI MOSFETs. IEEE Transactions on Electron Devices, 59(1 (article n°6085605)), 247-251. https://doi.org/10.1109/TED.2011.2172993 (Original work published 2012)
Reckinger, N., Dutu, C. A., Tang, X., Dubois, E., Yarekha, D. A., Godey, S., Nougaret, L., Lacszcz, J., Ratajczak, J., & Raskin, J.-P. (2012). Comparative study of erbium disilicide thin films grown in situ under ultrahigh vacuum or ex situ with a capping layer. Thin Solid Films, 520(13), 4501-4505 (April). https://doi.org/10.1016/j.tsf.2012.02.076 (Original work published 2012)
Makovejev, S., Raskin, J.-P., Md Arshad, M. K., Flandre, D., Olsen, S., Andrieu, F., & Kilchytska, V. (2012). Impact of self-heating and substrate effects on small-signal output conductance in UTBB SOI MOSFETs. Solid-State Electronics, 71, 93-100. https://doi.org/10.1016/j.sse.2011.10.027 (Original work published 2012)
André, N., Druart, S., Dupuis, P., Rue, B., Gérard, P., Flandre, D., Raskin, J.-P., & Francis, L. (2012). Dew-based wireless mini module for respiratory rate monitoring. IEEE Sensors Journal, 12(3), 699-706. https://doi.org/10.1109/JSEN.2011.2161668 (Original work published 2012)
Gkotsis, P., Kilchytska, V., Fragkiadakis, C., Kirby, P. B., Raskin, J.-P., & Francis, L. (2012). Effects of Fast Neutrons on the Electromechanical Properties of Materials Used in Microsystems. IEEE Journal of Microelectromechanical Systems, 21(6), 1471-1483. https://doi.org/10.1109/JMEMS.2012.2211578 (Original work published 2012)
Kilchytska, V., Md Arshad, M. K., Makovejev, S., Olsen, S., Andrieu, F., Poiroux, T., Faynot, O., Raskin, J.-P., & Flandre, D. (2012). Ultra-thin body and thin-BOX SOI CMOS technology analog figures of merit. Solid-State Electronics, 70, 50-58. (Original work published 2012)
Urena, F., Olsen, S. H., Šiller, L., Bhaskar, U. K., Pardoen, T., & Raskin, J.-P. (2012). Strain in silicon nanowire beams. Journal of Applied Physics, 112(11), 114506. https://doi.org/10.1063/1.4765025 (Original work published 2012)
Coulombier, M., Guisbiers, G., Colla, M.-S., Raskin, J.-P., & Pardoen, T. (2012). On-chip stress relaxation testing method for freestanding thin film materials. Review of Scientific Instruments, 83(10), 105004. https://doi.org/10.1063/1.4758288 (Original work published 2012)
Mouthuy, P.-O., Coulombier, M., Pardoen, T., Raskin, J.-P., & Jonas, A. (2012). Overcurvatuve describes the buckling and folding of rings from curved origami to foldable tents. Nature Communications, 3, 1290. https://doi.org/10.1038/ncomms2311 (Original work published 2012)
Bhaskar, U. K., Passi, V., Houri, S., Escobedo-Cousin, E., Olsen, S. H., Pardoen, T., & Raskin, J.-P. (2012). On-chip tensile testing of nanoscale silicon free-standing beams. Journal of Materials Research, 27(3), 571-579. https://doi.org/10.1557/jmr.2011.340 (Original work published 2012)
Passi, V., Sodervall, U., Nilsson, B., Petersson, G., Hagberg, M., Krezminski, C., Dubois, E., Du Bois, B., & Raskin, J.-P. (2012). Anisotropic Vapor HF etching of silicon dioxide for Si microstructure release. Microelectronic Engineering, 95, 83-89. https://doi.org/10.1016/j.mee.2012.01.005 (Original work published 2012)
Tang, X., Francis, L., Simonis, P., Haslinger, M., Delamare, R., Deschaume, O., Flandre, D., Defrance, P., Jonas, A., Vigneron, J.-P., & Raskin, J.-P. (2012). Room temperature atomic layer deposition of Al2O3 and replication of butterfly wings for photovoltaic application. Journal of Vacuum Science and Technology. Part A. Vacuum, Surfaces and Films, 30(1), 01A146. https://doi.org/10.1116/1.3669521 (Original work published 2012)
Chapitre de livre
Dupuis, P., Van Overstraeten, N., Raskin, J.-P., Francis, L., & Flandre, D. (2012). Some mitigations for unequal data variance in linear regression. In Advanced Mathematical and Computational Tools in Metrology and Testing IX (p. pp. 118-125). World Scientific Publishing Vompany. https://doi.org/10.1142/9789814397957_0015
Papier de conférence
Colla, M.-S., Wang, B., Idrissi, H., Guisbiers, G., Schryvers, D., Raskin, J.-P., & Pardoen, T. (2011). Mechanical Properties of Palladium Thin Films: High Strength/Ductility Balance Through Growth Nanotwins. Proceedings of ASME 2011. Published. ASME 2011 Applied Mechanics and Materials Conference - Session 6-7 Micromechanics of Materials VII, Chicago, US.
Emam, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2011). RF antenna switch using Dynamic Threshold SOI MOSFET. Proceedings of the 11th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - SiRF′11. Published. 11th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - SiRF′11, Phoenix, Arizona, USA. https://doi.org/10.1109/SIRF.2011.5719333
Makovejev, S., Kilchytska, V., Md Arshad, M. K., Flandre, D., Andrieu, F., Faynot, O., Olsen, S., & Raskin, J.-P. (2011). Self-heating and substrate effects in ultra-thin body ultra-thin BOX devices. Proceedings of the 12th International Conference on Ultimate Integration on Silicon – ULIS 2011, 130-133. https://doi.org/10.1109/ULIS.2011.5758009
Pardoen, T., Coulombier, M., Colla, M.-S., Idrissi, H., Wang, B., Schrijvers, D., & Raskin, J.-P. (2011). Imperfection, rate and size dependent plastic localization in thin nanocrystalline metallic films. DYMAT, 20th Technical meeting: mechanical behaviour of nanomaterials, metallic glasses and architecturally designed materials, Maison de la chimie, Paris, France.
Emam, M., & Raskin, J.-P. (2011). Sub-threshold RF characteristics of Partially-Depleted SOI MOSFETs. Proceedings of the 2011 IEEE Subthreshold Microelectronics Conference, p. Session 2 RF and Analog Circuits, paper # 3.
Makovejev, S., Olsen, S., & Raskin, J.-P. (2011). RF extraction of self-heating effects in FinFETs of various geometries. Proceedings of the Postgraduate Conference at Newcastle University – PGC 2011. Published. Postgraduate Conference at Newcastle University – PGC 2011, Newcastle Upon Tyne, UK.
Roda Neve, C., & Raskin, J.-P. (2011). Nonlinear Properties of Si-based substrates for wireless systems and SoC integration. Proceedings of the 219th Electrochemical Society Meeting – ECS 2011, p. paper 1438.
Bouterfa, M., Aouadi, K., Bertrand, D., Olbrechts, B., Delamare, R., Raskin, J.-P., Kilchytska, V., Cortina Gil, E., & Flandre, D. (2011). Towards a New Generation of Ultra-Thin P-Type Silicon Strip Detectors for Hadrontherapy Beam Monitoring. Proceedings of ANIMMA. Published. ANIMMA, Ghent (Belgium).
Urena, F., Raskin, J.-P., & Olsen, S. (2011). Local characterisation of silicon nanowires. Proceedings of the Postgraduate Conference at Newcastle University – PGC 2011. Published. Postgraduate Conference at Newcastle University – PGC 2011, Newcastle Upon Tyne, UK.
Schryvers, D., Idrissi, H., Wang, B., Colla, M.-S., Raskin, J.-P., & Pardoen, T. (2011). Study of Twins in nanoscale Pd films with high strain hardening capacity. Proceedings of TMS Annual Meeting & Exhibition. Published. TMS Annual Meeting & Exhibition, San Diego, USA.
Favache, A., Teillet, A., Poirier, C., Pardoen, T., Jacques, P., Carbonnelle, P., Raskin, J.-P., Bailly, C., & Nysten, B. (2011). Fracture mechanics based analysis of the scratch resistance of thin Cr based coatings. European Symposium on Friction, Wear and Wear Protection, Karlsruhe (Germany).
Bhaskar, U. K., Houri, S., Passi, V., Pardoen, T., & Raskin, J.-P. (2011). Nano-mechanical testing of free-standing mono-crystalline silicon beams. Proceedings of the 219th Electrochemical Society Meeting – ECS 2011, p. paper 1446.
Bouterfa, M., Aouadi, K., Bertrand, D., Olbrechts, B., Raskin, J.-P., Delamare, R., Cortina Gil, E., & Flandre, D. (2011). Hadrontherapy beam monitoring: towards a new generation of ultra-thin p-type silicon strip detectors. Proceedings of the The Second International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications – ANIMMA’11, paper INV30.
Kilchytska, V., Md Arshad, M. K., Makojev, S., Olsen, S., Andrieu, F., Faynot, O., Raskin, J.-P., & Flandre, D. (2011). Ultra-thin body and BOX SOI Analog Figures of Merit. Proceedings of the Sixth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’11, 143-144.
Coulombier, M., Guisbiers, G., Colla, M.-S., Raskin, J.-P., & Pardoen, T. (2011). Experimental evidences of competing stress relaxation mechanisms in thin Al/Si and Pd films tested on chip. MRS Fall meeting, Boston, USA.
Emam, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2011). Zero Temperature Coefficient of Current Gain Cutoff Frequency and Maximum Oscillation Frequency for Various SOI and Si bulk MOSFETs. Proceedings of the 219th Electrochemical Society Meeting – ECS 2011, p. paper 1446.
Schryvers, D., Idrissi, H., Wang, B., Colla, M.-S., & Raskin, J.-P. (2011). TEM study of nanoscale Pd films with high strain hardening capacity. ISDMM11 fifth international symposium on defects and material mechanics, Sevilla, Spain.
Makovejev, S., Raskin, J.-P., Flandre, D., Olsen, S., Andrieu, F., Poiroux, T., & Kilchytska, V. (2011). Comparison of Small-Signal Output Conductance Frequency Dependence in UTBB SOI MOSFETs with and without Ground Plane. Proceedings of the IEEE International SOI Conference. Published. IEEE International SOI Conference, Tempe (USA). https://doi.org/10.1109/SOI.2011.6081717
Raskin, J.-P. (2011). Sensing and MEMS Devices in Thin-Film SOI MOS Technology. IEEE International SOI Conference – SOI 2011, Phoenix, Arizona, USA.
Oueriemi, I., Choubani, F., Huynen, I., & Raskin, J.-P. (2011). Nonlinear Electrical behavior of Multiwalled Carbon Nanotubes network. Proceeding of Nanotech 2011 Conference. Published. Nanotec2011, Nantes.
Dupuis, P., Van Overstraeten, N., Raskin, J.-P., Francis, L., & Flandre, D. (2011). Some mitigations for unequal data variance in linear regression. Proceedings of the AMCTM conference. Published. AMCTM conference, Göteborg (Sweden).
André, N., Francis, L., Raskin, J.-P., Nachtergaele, P., Cases, S., Paquay, S., De Batselier, E., & Flandre, D. (2011). The integrated design of a MEMS-based flow-sensor system. Proceedings of the The 9th International Nanotech Symposium & Exhibition in Korea - NANO KOREA 2011. Published. The 9th International Nanotech Symposium & Exhibition in Korea - NANO KOREA 2011, Kintex (Korea).
Gkotsis, P., Kilchytska, V., Militaru, O., Tang, X., Raskin, J.-P., Flandre, D., & Francis, L. (2011). Neutron and gamma radiation effects on MEMS structures. International conference EuroSensors XXV, paper #1345.
Tang, X., Francis, L., Haslinger, M., Delamare, R., Flandre, D., Simonis, P., Vigneron, J.-P., Deschaume, O., Jonas, A., & Raskin, J.-P. (2011). Replication of butterfly wings by ALD and nanoimprint for production of Si solar cells with high light absorption surface. Proceedings of the 11th International Conference on Atomic Layer Deposition – ALD 2011. Published. 11th International Conference on Atomic Layer Deposition – ALD 2011, Cambridge, Massachusetts (USA).
André, N., Francis, L., Rue, B., Druart, S., Dupuis, P., Flandre, D., & Raskin, J.-P. (2011). Ultra low power SOI transducer for flow and dew-based humidity sensing. Proceedings of the 2011 CMOS Emerging Technologies Workshop, session 1-D, paper 6.
André, N., Rue, B., Scheen, G., Francis, L., Flandre, D., & Raskin, J.-P. (2011). Ultra Low Power 3-D flow meter in monolithic SOI technology. Proceedings of the 219th Electrochemical Society Meeting – ECS 2011, paper 1459.
Flandre, D., Kilchytska, V., Alvarado Pulido, J. J., Boufouss, E. H., Assaad, M., Rue, B., Roda Neve, C., Raskin, J.-P., & Francis, L. (2011). Extreme-environment behaviors and performances of advanced Silicon-on-Insulator CMOS sensors, transistors and circuits. 2nd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications (ANIMMA 2011), Ghent (Belgium).
Coulombier, M., Ryelandt, L., Idrissi, H., Wang, B., Schrijvers, D., Raskin, J.-P., & Pardoen, T. (2011). Deformation mechanisms in aluminium and aluminium-silicon freestanding thin films uncovered through on-chip testing. Proceedings of the European Congress on Advanced Materials and Processes – EuroMAT 2011, p. Session In-situ Testing 2, paper # 5.
Pardoen, T., Idrissi, H., WANGA MVEMBA, B., Colla, M.-S., Raskin, J.-P., & Schryvers, D. (2011). Ultra High strain hardening in nanocrystalline Pd thin films with nanotwins. Plasticity′11. Published. Plasticity′11, Puerto Vallarta, Mexico.
Rudenko, C., Kilchytska, V., Md Arshad, M. K., Raskin, J.-P., Nazarov, A., & Flandre, D. (2011). Impact of mobility variation on threshold voltage extraction by transconductance change and gm/Id methods and its demonstration on advanced SOI MOSFETs. Proceedings of the Sixth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’11, 25-26.
Kranti, A., Raskin, J.-P., & Armstrong, G. A. (2011). Source/Drain Engineered Ultra Low Power Analog/RF UTBB MOSFETs. Proceedings of the 12th International Conference on Ultimate Integration on Silicon – ULIS 2011, p. 114-117. https://doi.org/10.1109/ULIS.2011.5757997
Campos Delgado, J., Botello Mendez, A. R., Hackens, B., Charlier, J.-C., Pardoen, T., & Raskin, J.-P. (2011). Graphene growth by CVD using liquid precursors. Proceeding of the Lavoisier Discussions - Graphene on metals: CVD growth and exploitation, pp. 11-14.
Olbrechts, B., Rue, B., Flandre, D., & Raskin, J.-P. (2011). Innovative Frequency Output Pressure Sensor with Single SOI NMOSFET Suspended Transducer. Proceedings of the IEEE International SOI Conference(SOI 2011), 1-2. https://doi.org/10.1109/SOI.2011.6081790
Rudenko, T., Kilchytska, V., Md Arshad, M. K., Raskin, J.-P., Nazarov, A., & Flandre, D. (2011). Influence of drain voltage on MOSFET threshold voltage determination by transconductance change and gm/Id methods. Proceedings of the 12th International Conference on Ultimate Integration on Silicon – ULIS 2011, 150-153.
Rue, B., Olbrechts, B., Raskin, J.-P., & Flandre, D. (2011). A SOI CMOS smart strain sensor. Proceedings of the IEEE International SOI Conference (SOI 2011), 1-2. https://doi.org/10.1109/SOI.2011.6081791
Raskin, J.-P. (2011). SOI substrates for analog/RF MOS devices and microsystems. Proceedings of the 8th IEEE International Caribbean Conference on Devices, Circuits and Systems – ICCDCS’11. Published. 8th IEEE International Caribbean Conference on Devices, Circuits and Systems – ICCDCS’11, Playa del Carmen, Mexico.
Silvestri, L., Reggiani, S., Passi, V., Ravaux, F., Dubois, E., Raskin, J.-P., & et al. (2011). TCAD study of the detection mechanisms in Si-Nanoribbon gas sensors. Proceedings of the 41st European Solid-State Device Research Conference – ESSDERC 2011, pp. 131-134. https://doi.org/10.1109/ESSDERC.2011.6044217
Makovejev, S., Olsen, S., & Raskin, J.-P. (2011). RF extraction of self-heating effects in FinFETs of various geometries. Proceedings of the 11th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - SiRF′11. Published. 11th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - SiRF′11, Phoenix, Arizona, USA.
Passi, V., Dubois, E., Celle, C., Clavaguera, S., Simonato, J.-P., & Raskin, J.-P. (2011). Functionalization of Silicon Nanowires for Specific Sensing. Proceedings of the 219th Electrochemical Society Meeting – ECS 2011, p. Paper #1458.
Urena, F., Olsen, S., Escobedo-Cousin, E., Siller, S., Bhaskar, U. K., & Raskin, J.-P. (2011). Local strain characterization of MEMS-based silicon beams by Raman spectroscopy. Proceedings of the Electronic Materials Conference - EMC 2011. Published. Electronic Materials Conference - EMC 2011, Santa Barbara, CA, USA.
Pardoen, T., Jacques, P. J., Schryvers, D., Idrissi, H., Wang B., Colla M.-S., Renard K., & Raskin, J.-P. (2011). Advanced TEM analysis of deformation and growth twins in coarse and nano-grained materials. The XIVth International Conference on Electron Microscopy, Wisla, Poland.
Favache, A., Teillet, A., Poirier, C., Carbonnelle, P., Raskin, J.-P., Jacques, P., Nysten, B., Bailly, C., & Pardoen, T. (2011). Approche du comportement tribologique de couches minces de chrome par la mécanique de la rupture. Journées internationales francophones de tribologie 2011, Obernai (France).
Olbrechts, B., Rue, B., Pardoen, T., Flandre, D., & Raskin, J.-P. (2011). A novel approach for active pressure sensors in thin film SOI technology. Proceedings of the International conference Eurosensors XXV. Published. International conference Eurosensors XXV, Athènes (Grèce).
Colla, M.-S., Wang, B., Idrissi, H., Guisbiers, G., Schryvers, D., Raskin, J.-P., & Pardoen, T. (2011). Ultra high strain hardening in nanocrystalline palladium thin films with nanotwins: an experimental study coupled to a phenomenological analytical mode. Proceedings of the ECI Conference on Nanomechanical Testing in Materials Research and Development, p. Paper 7.
Emam, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2011). Effect of gate oxide scaling on RF performance of SOI MOSFETs. Proceedings of the 11th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - SiRF′11. Published. 11th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - SiRF′11, Phoenix, Arizona, USA. https://doi.org/10.1109/SIRF.2011.5719322
Bhaskar, U. K., Houri, S., Passi, V., Pardoen, T., & Raskin, J.-P. (2011). Nanomechanical testing of free-standing monocrystalline silicon beams. Proceedings of the 219th ECS Meeting, p. paper #1446.
Passi, V., Ravaux, F., Dubois, E., Clavaguera, S., Celle, C., Simonato, J.-P., Silvestri, L., Reggiani, S., Vuillaume, D., & Raskin, J.-P. (2011). Gas detection using Si Nanowires. The 41st European Solid-State Device Research Conference – ESSDERC 2011, SINANO-NanoFunction Workshop, paper #9.
André, N., Francis, L., Raskin, J.-P., Nachergaele, P., Vaassen, J.-M., Civello, J., Cases, S., Paquay, S., & De Baetselier, E. (2011). The integrated design of a MEMS-based flow-sensor system. Proceedings of the Smart System Integration 2011. Published. Smart System Integration 2011, European Conference & Exhibition on Integration Issues of Miniaturized Systems – MEMS, MOEMS ICs and Electronic Components, Dresden (Germany).
Article de journal
Passi, V., Dubois, E., Celle, C., Clavaguera, S., Simonato, J.-P., & Raskin, J.-P. (2011). Functionalization of Silicon Nanowires for Specific Sensing. Electrochemical Society. Transactions, 35(5), 313-318. https://doi.org/10.1149/1.3570811 (Original work published 2011)
Tinoco, J. C., Martinez-Lopez, A. G., & Raskin, J.-P. (2011). Mobility degradation and transistor asymmetry impact on field effect transistor access resistances extraction. Solid-State Electronics, 56(1), 214-218. https://doi.org/10.1016/j.sse.2010.10.020 (Original work published 2011)
Olbrechts, B., Rue, B., Pardoen, T., Flandre, D., & Raskin, J.-P. (2011). A novel Approach for Active Pressure Sensors in Thin Film SOI Technology. Procedia Engineering, 25, 43-46. https://doi.org/10.1016/j.proeng.2011.12.011 (Original work published 2011)
Roda Neve, C., Kilchytska, V., Alvarado, J. J., Lederer, D., Militaru, O., Flandre, D., & Raskin, J.-P. (2011). Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer. Microelectronics Reliability, 51(2), 326-331. https://doi.org/10.1016/j.microel.2010.07.153 (Original work published 2011)
Escobedo-Cousin, E., Olsen, S. H., Pardoen, T., Bhaskar, U. K., & Raskin, J.-P. (2011). Characterizing the effect of uniaxial strain on the surface roughness of Si nanowire MEMS-based microstructures. MRS Proceedings, Micromechanical Systems - Materials and Devices, 1299, article 25. https://doi.org/10.1557/opl.2011.251 (Original work published 2011)
Rudenko, T., Kilchytska, V., Arshad, M. K., Raskin, J.-P., Nazarov, A., & Flandre, D. (2011). On the MOSFET Threshold Voltage Extraction by Transconductance and Transconductance-to-Current Ratio Change Methods: Part II—Effect of Drain Voltage. IEEE Transactions on Electron Devices, 99, 1-9. https://doi.org/10.1109/TED.2011.2168227 (Original work published 2011)
Passi, V., Ravaux, F., Dubois, E., Clavaguera, S., Celle, C., Simonato, J. P., Silvestri, L., Reggiani, S., Vuillaume, D., & Raskin, J.-P. (2011). High gain and fast detection of warfare agent using back-gated silicon nanowires MOSFETs. IEEE Electron Device Letters, 32(7), 976-978. https://doi.org/10.1109/LED.2011.2146750 (Original work published 2011)
Reckinger, N., Poleunis, C., Dubois, E., Dutu, C. A., Tang, X., Delcorte, A., & Raskin, J.-P. (2011). Very low effective Schottky barrier height for erbium disilicide contacts on n-Si through arsenic segregation. Applied Physics Letters, 99(1), 012110 (1-3). https://doi.org/10.1063/1.3608159 (Original work published 2011)
Escobedo-Cousin, E., Olsen, S. H., Pardoen, T., Bhaskar, U. K., & Raskin, J.-P. (2011). Experimental observations of surface roughness in uniaxially loaded strained Si microelectromechanical systems-based structures. Applied Physics Letters, 99, 241906. https://doi.org/10.1063/1.3669413 (Original work published 2011)
Emam, M., Pavanello, M. A., Danneville, F., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2011). High Temperature effect on Harmonic Distortions in submicron Graded-Channel MOSFETs. Advanced Materials Research, 276, 67-75. https://doi.org/10.4028/www.scientific.net/AMR.276.67 (Original work published 2011)
Reckinger, N., Tang, X., Dubois, E., Larrieu, G., Flandre, D., Raskin, J.-P., & Afzalian, A. (2011). Low temperature tunneling current enhancement in silicide/Si Schottky contacts with nanoscale barrier width. Applied Physics Letters, 98(11), 112102. https://doi.org/10.1063/1.3567546 (Original work published 2011)
Bhaskar, U. K., Passi, V., Zulfiqar, A., Sodervall, U., Nilsson, B., Peterson, G., Hagberg, M., Pardoen, T., & Raskin, J.-P. (2011). On-chip tensile testing of the mechanical and electro-mechanical properties of nano-scale silicon free-standing beams. Advanced Materials Research, 276, 117-126. https://doi.org/10.4028/www.scientific.net/AMR.276.117 (Original work published 2011)
Ben Ali, K., Roda Neve, C., Gharsallah, A., & Raskin, J.-P. (2011). Ultrawide Frequency Range Crosstalk Into Standard and Trap-Rich High Resistivity Silicon Substrates. IEEE Transactions on Electron Devices, 58(Issue 12), 4258-4264. https://doi.org/10.1109/TED.2011.2170074 (Original work published 2011)
Idrissi, H., Wang, B., Colla, M.-S., Raskin, J.-P., Schryvers, D., & Pardoen, T. (2011). Ultrahigh Strain Hardening in Thin Palladium Films with Nanoscale Twins. Advanced Materials, 23(18), 2119-2122. https://doi.org/10.1002/adma.201004160 (Original work published 2011)
Passi, V., Bhaskar, U. K., Pardoen, T., Sodervall, U., Nilsson, B., Petersson, G., Hagberg, M., & Raskin, J.-P. (2011). Note: Fast and reliable fracture strain extraction technique applied to silicon at nanometer scale. Review of Scientific Instruments, 82, 116106. https://doi.org/10.1063/1.3655464 (Original work published 2011)
Reckinger, N., Tang, X., Godey, S., Dubois, E., Laszcz, A., Ratajczak, J., Vlad, A., Dutu, C. A., & Raskin, J.-P. (2011). Erbium Silicide Growth in the Presence of Residual Oxygen. Journal of the Electrochemical Society, 158(7), H715-H723. https://doi.org/10.1149/1.3585777 (Original work published 2011)
André, N., Rue, B., Scheen, G., Francis, L., Flandre, D., & Raskin, J.-P. (2011). Ultra Low Power 3-D Flow Meter in Monolithic SOI Technology. Journal of the Electrochemical Society, 35(5), 319-324. https://doi.org/10.1149/1.3570812 (Original work published 2011)
Tang, X., Flandre, D., Raskin, J.-P., Nizet, Y., Moreno-Hagelsieb, L., Pampin, R., & Francis, L. (2011). Rapid and selective detection of Staphylococcus aureus using insulated substrate impedance transducers. Sensors and Actuators, B(156), 578-587. (Original work published 2011)
Tang, X., Krzeminski, C., Lecavalier des Etangs-Levallois, A., Chen, Z., Dubois, E., Kasper, E., Karmous, A., Reckinger, N., Flandre, D., Francis, L., Colinge, J.-P., & Raskin, J.-P. (2011). Energy-Band Engineering for Improved Charge Retention in Fully Self-Aligned Double Floating-Gate Single-Electron Memories. Nano Letters : a journal dedicated to nanoscience and nanotechnology, 11(11), 4520-4526. https://doi.org/10.1021/nl202434k (Original work published 2011)
Tang, X., Flandre, D., Raskin, J.-P., Nizet, Y., Moreno Hagelsieb, L., Pampin, R., & Francis, L. (2011). A new interdigitated array microelectrode-oxide-silicon sensor with label-free, high sensitivity and specificity for fast bacteria detection. Sensors and Actuators B: Chemical : international journal devoted to research and development of physical and chemical transducers, 156(2), 578-587. https://doi.org/10.1016/j.snb.2011.02.002 (Original work published 2011)
Bhaskar, U. K., Houri, S., Passi, V., Pardoen, T., & Raskin, J.-P. (2011). Nanomechanical testing of free-standing monocrystalline silicon beams. ECS Transactions, 35(5), 221-226. https://doi.org/10.1149/1.3570799 (Original work published 2011)
Idrissi, H., Tumer, S., Mitsuhara, M., Wang, B., Hata, S., Coulombier, M., Raskin, J.-P., Pardoen, T., Van Tendeloo, G., & Schryvers, D. (2011). Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study. Microscopy and Microanalysis, 17(6), 983-990. https://doi.org/10.1017/S143192761101213X (Original work published 2011)
Roda Neve, C., & Raskin, J.-P. (2011). Nonlinear properties of Si-based substrates for wireless systems and SoC integration. Electrochemical Society. Transactions, 35(5), 169-176. https://doi.org/10.1149/1.3570793 (Original work published 2011)
Olbrechts, B., Rue, B., Pardoen, T., Flandre, D., & Raskin, J.-P. (2011). Routes towards novel active pressure sensors in SOI technology. Advanced Materials Research, 276, 145-155. https://doi.org/10.4028/www.scientific.net/AMR.276.145 (Original work published 2011)
Emam, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2011). Zero Temperature Coefficient of current gain cutoff frequency and maximum oscillation frequency for various SOI and Si bulk MOSFETs. Electrochemical Society. Transactions, 35(5), 129-134. https://doi.org/10.1149/1.3570787 (Original work published 2011)
Farhi, G., Morris, D., Charlebois, S. A., & Raskin, J.-P. (2011). The impact of etched trenches geometry and dielectric material on the electrical behaviour of SOI self-switching diodes. Nanotechnology, 22(43), 435203. https://doi.org/10.1088/0957-4484/22/43/435203 (Original work published 2011)
Makovejev, S., Olsen, S. H., & Raskin, J.-P. (2011). RF extraction of self-heating effects in FinFETs of various geometries. IEEE Transactions on Electron Devices, 58(10), 3335-3341. https://doi.org/10.1109/SIRF.2011.5719331 (Original work published 2011)
Rudenko, T., Kilchytska, V., Arshad, M. K. M., Raskin, J.-P., Nazarov, A., & Flandre, D. (2011). On the MOSFET Threshold Voltage Extraction by Transconductance and Transconductance-to-Current Ratio Change Methods: Part I—Effect of Gate-Voltage-Dependent Mobility. IEEE Transactions on Electron Devices, 99, 1-8. https://doi.org/10.1109/TED.2011.2168226 (Original work published 2011)
Gkotsis, P., Kilchytska, V., Bhaskar, U. K., Militaru, O., Tang, X., Fragkiadakis, C., Kirby, P. B., Raskin, J.-P., Flandre, D., & Francis, L. (2011). Neutron and gamma radiation effects on MEMS structures. Procedia Engineering, 25, 172-175. https://doi.org/10.1016/j.proeng.2011.12.043 (Original work published 2011)
Chapitre de livre
André, N., Francis, L., Rue, B., Renaux, C., Flandre, D., & Raskin, J.-P. (2011). Artificial microbeams for sensing air flow, temperature and humidity by combining MEMS and CMOS technologies. In Kris Iniewski (ed.), Optical, Acoustic, Magnetic, and Mechanical Sensor Technologies. CRC Press.
Rudenko, T., Kilchytska, V., Raskin, J.-P., Nazarov, A., & Flandre, D. (2011). Special features of the back-gate effects in ultra-thin body SOI MOSFETs. In Nazarov, A., Colinge, J.-P., Balestra, F., Raskin, J.-P., Gamiz, F., Lysenko, V.S. (Eds.) (ed.), Semiconductor-On-Insulator Materials for NanoElectronics Applications (p. p. 323-343). Springer-Verlag.
Kilchytska, V., Raskin, J.-P., & Flandre, D. (2011). Specific features of MuGFETs behavior at high temperatures in a wide frequency range. In N. Collaert (ed.), CMOS Nanoelectronics: Innovative Devices, Architectures and Applications. Pan Stanford Publishers.
Raskin, J.-P., Francis, L., & Flandre, D. (2011). Sensing and MEMS Devices in Thin-Film SOI MOS Technology. In A. Nazarov et al. (eds.) (ed.), Semiconductor-On-Insulator Materials for Nanoelectronics Applications, Engineering Materials (p. p. 355-392). Springer-Verlag. https://doi.org/10.1007/978-3-642-15868-1_20
Papier de conférence
Colinge, J.-P., Raskin, J.-P., Ferain, I., & Kranti, A. (2010). Analysis of the Junctionless Transistor Architecture. Proceedings 2010 International Conference on Solid State Devices and Materials - SSDM 2010, p. paper C-9-4.
Passi, V., Ravaux, F., Dubois, E., & Raskin, J.-P. (2010). Backgate bias and stress level impact on giant piezoresistance effect in thin silicon films and nanowires. 23rd IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2010), p. 464-467. https://doi.org/10.1109/MEMSYS.2010.5442464
Kranti, A., Rashmi, Burignat, S., Raskin, J.-P., & Armstrong, G. A. (2010). Analog/RF performance of sub-100 nm SOI MOSFETs with non-classical gate-source/drain underlap channel design. 2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2010), p. 45-48. https://doi.org/10.1109/SMIC.2010.5422943
Tinoco, J. C., Urban, C., Emam, M., Mantl, S., Zhao, Q. T., & Raskin, J.-P. (2010). Non-Linear analysis of n-type Schottky-Barrier MOSFETs. Proceedings of the 2010 IEEE International SOI Conference, pp. 76-77.
Makovejev, S., Olsen, S., & Raskin, J.-P. (2010). Self-Heating effect in Omega-Gate n-MOSFETs. Proceedings of the Postgraduate Conference at Newcastle University – PGC 2010, p. 38.
de Souza, M., Emam, M., Vanhoenacker-Janvier, D., Raskin, J.-P., Flandre, D., & Pavanello, M. A. (2010). Comparison between the behavior of submicron Graded-Channel SOI nMOSFETs with Fully- and Partially-Depleted operations in a wide temperature range. Proceedings of the 2010 IEEE International SOI Conference, 82-83.
Cerdeira, A., Tinoco, J. C., Estrada, M., & Raskin, J.-P. (2010). RF Compact Small-Signal Model for SOI DG-MOSFETs. 2010 27th International Conference on Microelectronics (MIEL 2010), p. 391-394. https://doi.org/10.1109/MIEL.2010.5490458
Raskin, J.-P. (2010). SOI technology : an opportunity for RF designers? Proceedings of the 40th European Solid-State Device Research Conference – ESSDERC’10. Published. 40th European Solid-State Device Research Conference – ESSDERC’10 - ESSDERC Tutorial on Silicon-on-Insulator: from materials to circuit design, Seville, Spain.
Schrijvers, D., Idrissi, H., Wang, B., Colla, M.-S., Coulombier, M., Boe, A., Proost, J., Raskin, J.-P., & Pardoen, T. (2010). TEM characterization of freestanding Pd and Al films for lab-on-chip nanomechanical tensile testing. Proceedings of the MICROSCIENCE 2010, p. paper M3.2 - 0062.
Colla, M.-S., Coulombier, M., Boé, A., Idrissi, H., Wang, B., Schrijvers, D., Proost, J., Raskin, J.-P., & Pardoen, T. (2010). Mechanical properties characterization of freestanding palladium films by on-chip internal stress controlled nanomechanical tensile testing. Proceedings of the Nanomechanical Testing Workshop and Hysitron User Meeting, 29-30.
Urena, F., Olsen, S., & Raskin, J.-P. (2010). Surface characterization of silicon nanostructures. Proceedings of the Postgraduate Conference at Newcastle University – PGC 20101, p. 49.
Rudenko, T., Flandre, D., Kilchytska, V., Burignat, S., Raskin, J.-P., Andrieu, F., Faynot, O., Le Tiec, Y., Landry, K., Nazarov, A., & Lysenko, V. S. (2010). Experimental study of transconductance and mobility behaviors in ultra-thin SOI MOSFETs with standard and thin buried oxides. Solid-State Electronics, 54(2), 164-170. https://doi.org/10.1016/j.sse.2009.12.014 (Original work published 2010)
Farhi, G., Morris, D., Charlebois, S. A., & Raskin, J.-P. (2010). Nonlinear transport regime in lateral field effect devices based on SOI. Proceedings du 3ème Colloque du Laboratoire International Associé « Nanotechnologies & Nanosystèmes, p. P. 56.
Strepenne, F., Raskin, J.-P., Poirier, C., Boe, A., & Pardoen, T. (2010). New adhesion testing methods for thin coatings towards separating the different energy contributions to the total work of fracture. Proceedings of the European Conference on Nano Film - ECNF′10, p. 132.
Burignat, S., Flandre, D., Arshad, M. K., Kilchytska, V., Andrieu, F., Faynot, O., & Raskin, J.-P. (2010). Substrate impact on threshold voltage and subthreshold slope of sub-32 nm ultra thin SOI MOSFETs with thin buried oxide and undoped channel. Solid-State Electronics, 54(2), 213-219. https://doi.org/10.1016/j.sse.2009.12.021 (Original work published 2010)
Pardoen, T., Coulombier, M., Boé, A., Brugger, C., Colla, M.-S., Delannay, L., Dancette, S., Idrissi, H., Wang, B., Schryvers, D., Massart, T. J., & Raskin, J.-P. (2010). Imperfection and size dependent fracture of thin metallic films. Conference proceedings, p. 243.
Rudenko, T., Kilchytska, V., Raskin, J.-P., Andrieu, F., Faynot, O., Le Tiec, Y., Landry, K., Nazarov, A., & Flandre, D. (2010). Special Features of the Back-Gate Effects in UTB SOI MOSFETs. Proceedings of the 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics”, 18-19.
Vasin, A. V., Rusavsky, A. V., Kysenko, V. S., Nazarov, A. N., Ishikawa, Y., Muto, Sh., Kimura, T., André, N., & Raskin, J.-P. (2010). Amorphous silicon-carbon alloy films as a functional material for MEMS technologies. Proceedings of the 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics”, p. 20.
Ben Ali, K., Roda Neve, C., André, N., Gharsallah, A., & Raskin, J.-P. (2010). Design and fabrication of RF-MEMS devices on high resistivity silicon substrate. Proceedings of the 11th International Symposium on RF MEMS and RF Microsystems – MEMSWAVE 2010, p. paper P10.
Wilson, C. J., Oila, A., Sanderson, L., Bull, S. J., & Raskin, J.-P. (2010). Simulation of the effect of microstructure on the elastic properties of copper interconnects. Proceedings of the 11th International Workshop on Stress-Induced Phenomena in Metallization – Stress Workshop 2010, p. paper P6.
Elhawil, A., Huynen, I., Raskin, J.-P., Roda Neve, C., Stiens, J., & Vounckx, R. (2010). Quasi-optical technique for sensing bond quality of silicon wafer. SPIE Photonics Europe (Micro Optics), Brussels, Belgium.
Oueriemi, I., Choubani, F., Huynen, I., & Raskin, J.-P. (2010). Performance of low-pass filter based on non-uniform capacitor sections. 2010 5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2010), 5 pp. https://doi.org/10.1109/DTIS.2010.5487587
Francis, L., André, N., Rue, B., Dupuis, P., Gérard, P., Bouterfa, M., Moreno Hagelsieb, L., Flandre, D., & Raskin, J.-P. (2010). Wireless humidity sensing: CMOS fabrication, interfaces, packaging and various applications from weather to re-education. Proceedings of the Ecole d’hiver Francophone sur les Technologies de Conception des Systèmes embarqués Hétérogènes – FETCH’10, Tutorial 1.
Houri, S., Raskin, J.-P., & Francis, L. (2010). MEMS filters based on traveling flexural waves. proceedings of the 2010 IEEE International Frequency Control Symposium (FCS 2010), 151-154. https://doi.org/10.1109/FREQ.2010.5556353
Tang, X., Francis, L., Raskin, J.-P., & Flandre, D. (2010). Rapid and Selective Detection of Staphylococcus Aureus Using Insulated Substrate Impedance Transducers. Proceedings of the BIT’s 3rd World Congress of Industrial Biotechnology 2010 (ibio-2010), Track 4.2, p. 292.
Moreno Hagelsieb, L., Nizet, Y., Tang, X., Bulteel, O., Van Overstaeten-Schlögel, N., André, N., Dupuis, P., Raskin, J.-P., Fontayne, P. A., Gala, J.-L., Francis, L., & Flandre, D. (2010). Miniaturized and low cost innovative detection systems for medical and environmental applications. Proceedings of the IEEE 2nd Circuits and Systems for Medical and Environmental Applications Workshop - CASME 2010, Article n°5706682. https://doi.org/10.1109/CASME.2010.5706682
Moreno Hagelsieb, L., Tang, X., Bulteel, O., Nizzet, Y., André, N., Gérard, P., Dupuis, P., Francis, L., Raskin, J.-P., & Flandre, D. (2010). Low-power/high-temperature sensors and MEMS in SOI technology. Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010, 165-168.
Pardoen, T., Coulombier, M., Idrissi, H., Wang, B., Enmili, A., Brugger, C., & Raskin, J.-P. (2010). Ultra large local ductility in thin freestanding Al films. Proceedings of the 2010 Materials Research Society Fall Meeting, p. paper # P11.3.
Carbonnelle, P., Ryelandt, S., Boe, A., Coulombier, M., Zulfiqar, A., Bhaskar, U. K., Raskin, J.-P., & Pardoen, T. (2010). Lab-on-chips based testing methods to investigate the mechanical behavior of nanofilms. Proceedings of the European Conference on Nano Film - ECNF′10, p. 37.
Wang, B., Idrissi, H., Colla, M.-S., Coulombier, M., Boé, A., Proost, J., Raskin, J.-P., Pardoen, T., & Schryvers, D. (2010). Nanomechanical tensile testing of metallic thin films. Proceedings of MICROSCIENCE 2010, p. Paper M3.2-0142.
Ben Ali, K., Roda Neve, C., Gharsallah, A., & Raskin, J.-P. (2010). Performances RF de structures coplanaires sur substrat silicium haute résistivité passivé avec une couche de polysilicium. Proceedings of the Journées Nationales du Réseau Doctoral en Microélectronique – JNRDM 2010, pp. 53-56.
Ben Ali, K., Roda Neve, C., Gharsallah, A., & Raskin, J.-P. (2010). Efficient polysilicon passivation layer for crosstalk reduction in high-resistivity SOI substrates. 2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2010), p. 212-215. https://doi.org/10.1109/SMIC.2010.5422973
Raskin, J.-P. (2010). High Resistivity SOI wafer: the substrate for RF SoC applications? Proceedings of the 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics”, pp. 51-52.
Emam, M., Pavanello, M. A., Danneville, F., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2010). High Temperature effect on Harmonic Distortions in submicron Graded-Channel MOSFETs. Proceedings of the 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics”, pp. 119-120.
Tinoco, J., & Raskin, J.-P. (2010). MuGFETs for microwave and millimeter wave applications. Proceedings of the International Conference on Solid-State and Integrated Circuit Technology – ICSICT 2010, pp. 615-618. https://doi.org/10.1109/ICSICT.2010.5667308
Md Arshad, M. K., Raskin, J.-P., Kilchytska, V., Flandre, D., Faynot, O., Scheiblin, P., & Andrieux, F. (2010). Improved DIBL in Ultra Thin Body SOI MOSFETs with Ultra Thin Buried Oxide and inverted substrate. Proceedings of the ULtimate Integration on Silicon - ULIS’10, 113-116.
Wang, B., Idrissi, H., Colla, M.-S., Coulombier, M., Raskin, J.-P., Pardoen, T., & Schrijvers, D. (2010). TEM characterization of freestanding metallic thin films deformed by controlled on chip internal stress. Proceedings of the 17th International Microscopy Congress - IMC17, p. paper M12505.
Tinoco, J. C., Martinez-Lopez, A. G., Emam, M., & Raskin, J.-P. (2010). New RF Intrinsic Parameters Extraction Procedure for Advanced MOS Transistors. 2010 23rd IEEE ICMTS International Conference on Microelectronic Test Structures (ICMTS 2010), p. 86-89. https://doi.org/10.1109/ICMTS.2010.5466853
Idrissi, H., Wang, B., Colla, M.-S., Raskin, J.-P., Schrijvers, D., & Pardoen, T. (2010). TEM characterization of twinned nanocrystalline palladium thin films. Proceedings of the 2010 Materials Research Society Fall Meeting, p. paper # P1.3.
Emam, M., Danneville, F., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2010). Graded Channel MOS transistors for Low Power Low Voltage applications. Proceedings of the Sixth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’10, pp. 113-114.
Pardoen, T., Brugger, C., Coulombier, M., Boé, A., Raskin, J.-P., & Massart, T. J. (2010). Strain hardening in fine grained metallic alloys : from bulk to thin film systems. Proceedings of the 16th International Symposium on Plasticity and its Current Applications - PLASTICITY 2010, Finite plasticity and viscoplasticity of conventional and emerging materials. Published. The International Symposium on Plasticity 2010, St Kitts.
Carbonnelle, P., Ryelandt, S., Boe, A., Coulombier, M., Zulfiqar, A., Bhaskar, U. K., Raskin, J.-P., & Pardoen, T. (2010). Lab-on-chips based testing methods to investigate the mechanical behaviour of thin films. Proceedings of the 2nd International Conference on Functional Nanocoatings, p. Paper # 25. https://doi.org/10.1051/epjconf/20100626001
Raskin, J.-P., Colinge, J.-P., Ferain, I., Kranti, A., Lee, C. W., Dehdashti, N., Yan, R., Razavi, P., & Yu, R. (2010). Mobility improvement in nanowire junctionless transistors by uniaxial strain. Proceedings of the 2010 IEEE International SOI Conference, pp. 78-79.
Passi, V., Bhaskar, U. K., Pardoen, T., & Raskin, J.-P. (2010). Fabrication process for applying high mechanical stress on monocrystalline silicon film. Proceedings of the 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics”, pp. 125-126.
Emam, M., Sakalas, P., Kumar, A., Ida, J., Vanhoenacker-Janvier, D., Raskin, J.-P., & Danneville, F. (2010). Graded Channel concept used to improve RF noise of an industrial 0.15 µm SOI CMOS technology. Proceedings of the 5th European Microwave Integrated Circuits Conference - EuMIC’10. Published. The 5th European Microwave Integrated Circuits Conference - EuMIC’10, Paris, France.
Passi, V., Bhaskar, U. K., Pardoen, T., & Raskin, J.-P. (2010). Application of process induced stress to study the mechanical properties of monocrystalline and amorphous silicon thin films. Proceedings of the Nanomechanical Testing Workshop and Hysitron User Meeting, p. 39-40.
Emam, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2010). High temperature RF behavior of SOI MOSFET transistors for Low Power Low Voltage applications. Proceedings of the 2010 IEEE International SOI Conference, pp. 147-148.
Raskin, J.-P., Passi, V., Bhaskar, U. K., Zulfiqar, A., & Pardoen, T. (2010). Mechanical and electromechanical on-chip testing of mono- and poly-crystalline silicon nanobeams. Proceedings of the 2010 Materials Research Society Fall Meeting - MRS Fall′10. Published. 2010 Materials Research Society Fall Meeting - MRS Fall′10, Boston, MA, USA.
Escobedo-Cousin, E., Raskin, J.-P., Bhaskar, U. K., Pardoen, T., & Olsen, S. (2010). Characterising the effect of uniaxial strain on the surface roughness of Si nanowire MEMS-based microstructures. Proceedings of the 2010 Materials Research Society Fall Meeting, p. Paper # S3.4.
Brugger, C., Coulombier, M., Boé, A., Colla, M.-S., Raskin, J.-P., & Pardoen, T. (2010). Size dependent ductility and fracture behaviour of thin freestanding metallic films. European Conference on Fracture ECF18, Dresden, Germany.
Olbrechts, B., Rue, B., Pardoen, T., Flandre, D., & Raskin, J.-P. (2010). Routes towards novel active pressure sensors in SOI technology. Proceedings of the 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics”, p. paper 36.
Ryelandt, S., Carbonnelle, P., Boe, A., Coulombier, M., Bhaskar, U. K., Zulfiqar, A., Colla, M.-S., Dille, J., Poirier, C., Proost, J., Godet, S., Raskin, J.-P., & Pardoen, T. (2010). Nanomechanical testing of thin metallic films application to aluminium, palladium and chromium films. Proceedings of the European Conference on Nano Film - ECNF′10, p. 70.
Makovejev, S., Olsen, S., Dehan, M., & Raskin, J.-P. (2010). Self-Heating Effect characterisation in SOI FinFETs. Proceedings of the ULtimate Integration on Silicon - ULIS’10, pp. 9-12.
Elhawil, A., Huynen, I., Raskin, J.-P., Roda Neve, C., Olbrechts, B., Stiens, J., & Vounckx, R. (2010). Quasi-optical technique for sensing bond quality of silicon wafers. Micro-Optics 2010, Vol. 7716, 77161R (7 pp.). https://doi.org/10.1117/12.853667
André, N., Raskin, J.-P., & Francis, L. (2010). 3-D SOI MEMS for sensing applications. Proceedings du 3ème Colloque du Laboratoire International Associé « Nanotechnologies & Nanosystèmes, p. 88.
André, N., Francis, L., Druart, S., Dupuis, P., Flandre, D., & Raskin, J.-P. (2010). Portable wireless microsensing system for human breath monitoring. Proceedings of the 2010 CMOS Emerging Technologies Workshop, Session 2E: Wireless, paper 7.
Chapitre de livre
Kilchytska, V., Flandre, D., & Raskin, J.-P. (2010). Wide Frequency Band Characterization. In Francis Balestra (eds) (ed.), Nanoscale CMOS: Innovative Materials, Modeling and Characterization (p. 672 pages). Wiley-ISTE. https://doi.org/10.1002/9781118621523.ch17
Article de journal
Moldovan, O., Chaves, F. A., Jime nez, D., Raskin, J.-P., & Iniguez, B. (2010). Accurate prediction of the volume inversion impact on undoped Double Gate MOSFET capacitances. International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, 23(6), 447-457. https://doi.org/10.1002/jnm.745 (Original work published 2010)
Brugger, C., Coulombier, M., Massart, T. J., Raskin, J.-P., & Pardoen, T. (2010). Strain gradient plasticity analysis of the strength and ductility of thin metallic films using an enriched interface model. Acta Materialia, 58(15), 4940-4949. https://doi.org/10.1016/j.actamat.2010.05.021 (Original work published 2010)
Rinaldi, G., Stiharu, I., Packirisamy, M., Nerguizian, V., Landry, R. J., & Raskin, J.-P. (2010). Dynamic pressure as a measure of gas turbine engine (GTE) performance. Measurement Science and Technology, 21(4). https://doi.org/10.1088/0957-0233/21/4/045201 (Original work published 2010)
Urban, C., Emam, M., Sandow, C., Knoch, J., Zhao, Q.-T., Raskin, J.-P., & Mantl, S. (2010). Radio-Frequency Study of Dopant-Segregated n-Type SB-MOSFETs on Thin-Body SOI. IEEE Electron Device Letters, 31(6), 537-539. https://doi.org/10.1109/LED.2010.2045220 (Original work published 2010)
Ben Ali, K., Roda Neve, C., Gharsallah, A., & Raskin, J.-P. (2010). Impact of crosstalk into high resistivity silicon substrate on the RF performance of SOI MOSFET. Journal of Telecommunications and Information Technology, 4, 93-100. (Original work published 2010)
André, N., Druart, S., Gérard, P., Pampin, R., Moreno Hagelsieb, L., Kezai, T., Francis, L., Flandre, D., & Raskin, J.-P. (2010). Miniaturized wireless sensing system for real-time breath activity recording. IEEE Sensors Journal, 10(1), 178-184. https://doi.org/10.1109/JSEN.2009.2035666 (Original work published 2010)
Olbrechts, B., & Raskin, J.-P. (2010). PECVD oxide as intermediate film for wafer bonding : impact of residual stress. Microelectronic Engineering, 87(11), 2178-2186. https://doi.org/10.1016/j.mee.2010.01.022 (Original work published 2010)
Urban, C., Emam, M., Sandow, C., Zhao, Q. T., Fox, A., Mantl, S., & Raskin, J.-P. (2010). Small-signal analysis of high-performance of p- and n-type SOI SB-MOSFETs with dopant segregation. Solid-State Electronics, 54(9), 877-882. https://doi.org/10.1016/j.sse.2010.04.013 (Original work published 2010)
Pardoen, T., Coulombier, M., Boe, A., Safi, A., Brugger, C., Ryelandt, S., Carbonnelle, P., Gravier, S., & Raskin, J.-P. (2010). Ductility of thin metallic films. Materials Science Forum, 633-634, 615-635. (Original work published 2010)
Tinoco, J. C., & Raskin, J.-P. (2010). New RF series extrinsic resistances extraction procedure for deep-submicron MOS transistors. International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, 23(2), 107-126. https://doi.org/10.1002/jnm.726 (Original work published 2010)
Coulombier, M., Boe, A., Brugger, C., Raskin, J.-P., & Pardoen, T. (2010). Imperfection-sensitive ductility of aluminium thin films. Scripta Materialia, 62(10), 742-745. https://doi.org/10.1016/j.scriptamat.2010.01.048 (Original work published 2010)
Raskin, J.-P., Colinge, J.-P., Ferain, I., Kranti, A., Lee, C.-W., Akhavan, N. D., Yan, R., Razavi, P., & Yu, R. (2010). Mobility improvement in nanowire junctionless transistors by uniaxial strain. Applied Physics Letters, 97(4). https://doi.org/10.1063/1.3474608 (Original work published 2010)
Roda Neve, C., Farci, A., Gallitre, M., Blampey, B., Meuris, P., Arnaud, L., & Raskin, J.-P. (2010). Behaviour of CPW and TFMS lines at high temperature for RF applications in sub-45 nm nodes. Microelectronic Engineering, 87(3), 324-328. https://doi.org/10.1016/j.mee.2009.06.021 (Original work published 2010)
Emam, M., Pavanello, M. A., Danneville, F., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2010). High temperature effects on harmonic distortions in submicron graded-channel MOSFETs. Advanced Materials Research, 5 pages. (Original work published 2010)
Passi, V., Lecestre, A., Krzeminski, C., Larrieu, G., Dubois, E., & Raskin, J.-P. (2010). A single layer hydrogen silsesquioxane based lift-off process for germanium and platinum. Microelectronic Engineering, 87(10), 1872-1878. https://doi.org/10.1016/j.mee.2009.11.022 (Original work published 2010)
Emam, M., Sakalas, P., Vanhoenacker-Janvier, D., Raskin, J.-P., Lim, T. C., & Danneville, F. (2010). Thermal Noise in MOSFETs: A Two- or a Three-Parameter Noise Model? IEEE Transactions on Electron Devices, 57(5), 1188-1191. https://doi.org/10.1109/TED.2010.2044286 (Original work published 2010)
Elhawil, A., Roda Neve, C., Olbrechts, B., Huynen, I., Raskin, J.-P., Poesen, G., Zhang, L., Stiens, J., & Vounckx, R. (2010). Contactless monitoring of Si substrate permittivity and resistivity from microwave to millimeter-wave frequencies. Microwave & Optical Technology Letters, 52(11), 2500-2505. https://doi.org/10.1002/mop.25524 (Original work published 2010)
Dupuis, P., André, N., Gérard, P., Flandre, D., Raskin, J.-P., & Francis, L. (2010). A fast and robust algorithm to assess respiratory frequency in real-time. Procedia Engineering, 5, 576-579. https://doi.org/10.1016/j.proeng.2010.09.175 (Original work published 2010)
André, N., Rue, B., Van Vynckt, D., Francis, L., Flandre, D., & Raskin, J.-P. (2010). Ultra Low Power flow-to-frequency SOI MEMS transducer. Procedia Engineering, 5, 540-543. https://doi.org/10.1016/j.proeng.2010.09.166 (Original work published 2010)
Papier de conférence
Roda Neve, C., Farcy, A., Gallitre, M., Blampey, B., Meuris, P., Arnaud, L., & Raskin, J.-P. (2009). Behaviour of CPW and TFMS lines versus high temperature for RF applications in sub-45 nm nodes. Proceedings of the eighteenth European Workshop on Materials for Advanced Metallization - MAM 2009, pp. 165-166.
Brugger, C., Coulombier, M., Boé, A., Raskin, J.-P., Massart, T. J., & Pardoen, T. (2009). Strain gradient plasticity based modeling of the necking in thin metallic films: influence of grain size and imperfections. Proceedings of the Materials Science & Technology Conference & Exhibition 2009, p.
Farhi, G., Morris, D., Charlebois, S. A., & Raskin, J.-P. (2009). Nonlinear transport regime in lateral field effect devices based on SOI. Proceedings of the 14th Canadian Semiconductor Technology Conference – CSTC’09, p. Session IX, paper # 9.
Emam, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2009). High temperature DC and RF behavior of partially depleted SOI versus deep n-well protected bulk MOSFETs. In Chappell, W.J.; (ed.), 2009 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF09) (p. 4 pp.). IEEE. https://doi.org/10.1109/SMIC.2009.4770530
Boé, A., Coulombier, M., Ryelandt, S., Pardoen, T., & Raskin, J.-P. (2009). MEMS based microstructures for nanomechanical characterization of thin films. GDR MECANO - 2ème atelier général Ecole des Mines de Paris, Paris.
Strepenne, F., Poirier, C., Raskin, J.-P., & Pardoen, T. (2009). Wedge opening test for measuring the adhesion of thin films : applications and separation by multiscale modeling of the different energy contributions. Proceedings of the 12th International Congress on Fracture, p. Paper # T44.009.
Pardoen, T., Brugger, C., Coulombier, M., Boe, A., Colla, M.-S., Proost, J., Massart, T. J., & Raskin, J.-P. (2009). Imperfection and size dependent ductility of thin freestanding metallic films. 2009 Materials Research Society (MRS) Fall Meeting, Boston, USA.
Coulombier, M., Boe, A., Safi, A., Gravier, S., Raskin, J.-P., & Pardoen, T. (2009). Fracture of thin freestanding ductile metallic films characterized using a nanomechanical lab-on-chip technique. Proceedings of the 12th International Congress on Fracture, p. Paper # T44.002.
Boé, A., Coulombier, M., Colla, M.-S., Bhaskar, U. K., Zulfiqar, A., Pardoen, T., & Raskin, J.-P. (2009). Internal stress relaxation based method to extract the Young’s modulus of brittle and ductile thin layers. Proceedings of the Innovations in Thin Film Processing ans Characterization, Paper O 3.3, p 12.
Burignat, S., Flandre, D., Kilchytska, V., Andrieu, F., Faynot, O., & Raskin, J.-P. (2009). Substrate Effects in sub-32 nm ultra thin SOI MOSFETs with thin buried oxide. Proceedings of the EUROSOI Conference. Published. EUROSOI Conference 2009, Göteborg (Sweden).
Roda Neve, C., Lederer, D., & Raskin, J.-P. (2009). Substrate crosstalk reduction using a passivation barrier on oxidized high-resistivity Si substrates. Proceedings of the Fifth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’09, pp. 119-120.
Emam, M., Roda Neve, C., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2009). Electronic Semiconductor Characterization Tool (ESC): From measured DC and RF parameters to a wideband electrical equivalent circuit. Proceedings of the MOS-AK/ESSDERC/ESSCIRC Workshop - MOS Modeling and Parameter Extraction Working Group, p. Paper C.
Kranti, A., Burignat, S., Raskin, J.-P., & Armstrong, G. A. (2009). Underlap channel UTBB MOSFETs for low-power analog/RF applications. 2009 10th International Conference on Ultimate Integration on Silicon, p. 173-176. https://doi.org/10.1109/ULIS.2009.4897564
Danneville, F., Lim, T. C., Emam, M., Sakalas, P., Dambrine, G., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2009). Noise properties of Low-Power Si MOSFETs through different channel engineering. Proceedings of the International Microwave Symposium 2009, Workshop WSL (IMS/RFIC) - State-of-the-Art of Low-Noise III-V Narrow-Bandgap and Silicon FET Technologies for Low-Power Applications, p. Paper 5.
Dubois, E., Larrieu, G., Breil, N., Valentin, R., Danneville, F., Yarekha, D., Reckinger, N., Tang, X., Halimaoui, A., Rengel, R., Pascual, E., Pouydebasque, A., Wallart, X., Godey, S., Ratajczak, J., Laszcz, A., Katcki, J., Raskin, J.-P., Dambrine, G., et al. (2009). Metallic Source/Drain Architecture for Advanced MOS Technology: an overview of METAMOS results. Proceedings of the 8th Diagnostics & Yield Symposium. Published. 8th Diagnostics & Yield Symposium, Warszaw (Poland).
Raskin, J.-P. (2009). SOI technology: an opportunity for RF designers? Proceedings of the Fifth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’09, p. Paper 3.
Rue, B., André, N., Olbrechts, B., Gosset, G., Raskin, J.-P., & Flandre, D. (2009). High Temperature SOI CMOS Low Power circuits and micro systems for MEMS co-integrated interfaces, temperature sensing and power management applications. Proceedings of the International Collaborative Aerospace Development Micro Natnotechnologies: From concepts to systems – CANEUS 2009, p. Panel Session P10: Low TRL Devices (Sensors and Instrumentation).
Emam, M., Kumar, A., Ida, J., Danneville, F., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2009). DC and RF temperature behavior of deep submicron graded channel MOSFETs. 2009 IEEE International SOI Conference, 2 pp. https://doi.org/10.1109/SOI.2009.5318757
Roda Neve, C., & Raskin, J.-P. (2009). Is SOI technology an opportunity for RF designers? Proceedings of The 12th International Symposium on Microwave and Optical Technology – ISMOT 2009, p. paper INV 81 - ISMOT/09/I/611.
Roda Neve, C., Kilchytska, V., Alvarado, J., Lederer, D., Militaru, O., Flandre, D., & Raskin, J.-P. (2009). Impact of neutron irradiation on oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer. Proceedings of the 10th edition the European Conference on Radiation and its Effects on Components and Systems - RADECS 2009, Paper A-6.
Spiegel, J., Renaux, C., Darques, M., De La Torre, J., Piraux, L., Simon, P., Raskin, J.-P., & Huynen, I. (2009). Ferromagnetic inductors on commercial nanoporous anodic alumina. 2009 European Microwave Conference (EuMC), p. 582-585. https://doi.org/10.1109/EUMC.2009.5296230
Roda Neve, C., Spiegel, J., Molenberg, I., Huynen, I., Elhawil, A., Poesen, G., Zhang, L., Stiens, J., Vounckx, R., & Raskin, J.-P. (2009). On-wafer and free space characterization of materials and devices for mm-wave imaging. Workshp on Millimeter Wave Imaging and Technologies for Security Applications, KUL, Leuven, Belgium.
Dutu, C. A., Vlad, A., Raskin, J.-P., & Melinte, S. (2009). Silicon nanostructures for biosensors. Proceedings of the 10th International Balkan Workshop on Applied Physics – IBWAP’09, Section S4, no.1.
André, N., Gérard, P., Drochmans, P., Kezai, T., Druart, S., Moreno Hagelsieb, L., Francis, L., Flandre, D., & Raskin, J.-P. (2009). Wireless microsensors system for monitoring breathing activity. In Vander Sloten J., Nyssen M., Verdonck P., Haueisen, J. (Eds.) (ed.), Proceedings of the 4th European Conference of the International Federation for Medical and Biological Engineering (ECIFMBE 2008) (pp. 875-879). Springer verlag. https://doi.org/10.1007/978-3-540-89208-3_209
Tang, X., Raskin, J.-P., Jonas, A., Nysten, B., Demoustier, S., Bayot, V., Francis, L., Pampin, R., Moreno Hagelsieb, L., & Flandre, D. (2009). Fabrication of SOI-based nano-biosensors. Proceedings of the 35th International Conference on Micro & Nano Engineering (MNE). Published. 35th International Conference on Micro & Nano Engineering (MNE), Ghent (Belgium).
Moreno Hagelsieb, L., André, N., Gérard, P., Kezai, T., Nizet, Y., Tang, X., Bulteel, O., Francis, L., Raskin, J.-P., & Flandre, D. (2009). Aluminium Oxide Based Sensors for Medical Applications. Proceedings of the 14th Biodetection Technologies Conference. Published. 14th Biodetection Technologies Conference, Baltimore (MD/USA).
Emam, M., Pavanello, M. A., Danneville, F., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2009). Analog, RF and nonlinear behaviors of submicron graded channel partially depleted SOI MOSFETs. In Tsoukalas, D.; Dimoulas, A.; (ed.), 39th European Solid-State Device Research Conference. ESSDERC 2009 (p. p. 125-128). IEEE. https://doi.org/10.1109/ESSDERC.2009.5331397
Tang, X., Ravau, F., Dubois, E., Kasper, E., Karmous, A., Reckinger, N., & Raskin, J.-P. (2009). Self-aligned single-electron memory fabrication based on Si/SiGe/Si heterostructures. Proceedings of the Workshop on Templated Self-Organization: processing, characterization and modeling. Published. Workshop on Templated Self-Organization: processing, characterization and modeling, Stuttgart (Germany).
Brugger, C., Massart, T. J., Raskin, J.-P., & Pardoen, T. (2009). Strain gradient plasticity based modeling of the size dependent strength and ductility of thin polycrystalline metallic films. Proceedings of the Innovations in Thin Film Processing and Characterization. Published. Innovations in Thin Film Processing and Characterization - ITFPC′09, Nancy, France.
Boé, A., Coulombier, M., Safi, A., Pardoen, T., & Raskin, J.-P. (2009). On-chip testing laboratory for nanomechanical characterization of thin films. Proceedings of the 2009 SEM Annual Conference and Exposition on Experimental and Applied Mechanics, p. -.
Brugger, C., Coulombier, M., Boé, A., Raskin, J.-P., Massart, T. J., & Pardoen, T. (2009). Strain gradient plasticity based modeling of the ductility of thin freestanding metallic films (oral pres. By C. Brugger). IICSMA 15 - 15th International Conference on the Strength of Materials, Dresden.
Boe, A., Coulombier, M., Colla, M.-S., Brugger, C., DILLE, J., Proost, J., GODET, S., Legros, M., Mompiou, F., Sharon, J. A., Hemker, K. J., Pardoen, T., & Raskin, J.-P. (2009). Lab-on-chip tensile stages for nanomechanical testing and TEM analysis. Proceedings of the 35 th International Conference on Micro & Nano Engineering, p. paper # O-MEMS-02.
Raskin, J.-P. (2009). SOI technology: an opportunity for RF designers? Proceedings of the 8th Diagnostics & Yield Symposium, p. Paper 7.
Rue, B., Olbrechts, B., André, N., Raskin, J.-P., & Flandre, D. (2009). High temperature SOI CMOS low power circuits for MEMS co-integrated interfaces. Proceedings of hte International Conference and Exhibition on High Temperature Electronics Network – HiTEN 2009, Session 4, paper 2.
Urban, C., Emam, M., Sandow, C., Zhao, Q.-T., Fox, A., Raskin, J.-P., & Mantl, S. (2009). High-frequency performance of dopant-segregated NiSi S/D SOI SB-MOSFETs. In Tsoukalas, D.; Dimoulas, A.; (ed.), 39th European Solid-State Device Research Conference. ESSDERC 2009 (p. p. 149-152). IEEE. https://doi.org/10.1109/ESSDERC.2009.5331620
Burignat, S., Arshad, M. K. M., Raskin, J.-P., Kilchytska, V., Flandre, D., Faynot, O., Scheiblin, P., & Andrieu, F. (2009). Drain/substrate coupling impact on DIBL of ultra thin body and BOX SOI MOSFETs with undoped channel. In Tsoukalas, D.; Dimoulas, A.; (ed.), Proceedings of the 39th European Solid-State Device Research Conference. ESSDERC 2009 (pp. 141-144). IEEE. https://doi.org/10.1109/ESSDERC.2009.5331323
Coulombier, M., Boé, A., Bhaskar, U. K., Ryelandt, S., Brugger, C., Raskin, J.-P., & Pardoen, T. (2009). New testing method for ductility of thin Al films (oral pres. by M. Coulombier). ECI 2009, Nanomechanical Testing in Materials Research and Development, Barga (Tuscany), Italy.
Rue, B., Olbrechts, B., André, N., Raskin, J.-P., & Flandre, D. (2009). High temperature SOI CMOS ultra low power circuits for MEMS co-integrated interfaces. Proceedings of the International Conference and Exhibition on HPigh Temperature Electronics Network - HiTEN 2009. Published. International Conference and Exhibition on High Temperature Electronics Network (HiTEN 2009), Oxford (United Kingdom).
Rudenko, T., Kilchytska, V., Burignat, S., Raskin, J.-P., Andrieu, F., Faynot, O., Le Tiec, Y., Landry, K., Nazarov, A., Lysenko, V. S., & Flandre, D. (2009). Transconductance and mobility behaviors in UTB SOI MOSFETs with standard and thin BOX. Proceedings of the EUROSOI Conference 2009. Published. EUROSOI Conference 2009, Göteborg (Sweden).
Moreno Hagelsieb, L., André, N., Scheen, G., Gérard, P., Nizet, Y., Tang, X., Bulteel, O., Dupuis, P., Francis, L., Raskin, J.-P., & Flandre, D. (2009). Integration of aluminum oxide based sensors for medical and health monitoring applications. Proceedings of the 14th Annual Conference on Commercializing Micro- and Nanotechnology – COMS 2009. Published. The 14th Annual Conference on Commercializing Micro- and Nanotechnology – COMS 2009, Copenhagen (Denmark).
Houri, S., Raskin, J.-P., & Francis, L. (2009). Electromagnetic transduction of Traveling Anti-Symmetric Lamb Waves in suspended beams. Proceedings of the 20th Workshop on Micromachining, Micromechanics and Microsystems – MME’09, p. Paper C11.
Moreno Hagelsieb, L., Nizet, Y., Tang, X., Raskin, J.-P., Flandre, D., & Francis, L. (2009). CMOS compatible anodic Al2O3 based sensors for bacteria detection. Procedia Chemistry, 1(1), 1283-1286. https://doi.org/10.1016/j.proche.2009.07.320 (Original work published 2009)
Moreno Hagelsieb, L., André, N., Scheen, G., Gérard, P., Nizet, Y., Tang, X., Bulteel, O., Dupuis, P., Francis, L., Flandre, D., & Raskin, J.-P. (2009). Aluminium Oxide Based Sensors Integration for Medical and Health Monitoring Applications. Proceedings of COMS′09, 14th Annual Conference on Commercializing Micro- and Nanotechnology. Published. 14th Annual Conference on Commercializing Micro- and Nanotechnology (COMS 2009), Copenhagen (Denmark).
Chapitre de livre
Raskin, J.-P., Lederer, D., & Kilchytska, V. (2009). Wideband Characterization of SOI Materials and Devices. In Sergo B.Kobadze (ed.), Solid State Electronics Research (p. p. 391). Nova Publishers.
Article de journal
Boe, A., Safi, A., Coulombier, M., Pardoen, T., & Raskin, J.-P. (2009). Internal stress relaxation based method for elastic stiffness characterization of very thin films. Thin Solid Films, 518(1), 260-264. https://doi.org/10.1016/j.tsf.2009.06.062 (Original work published 2009)
Emam, M., Sakalas, P., Vanhoenacker-Janvier, D., Raskin, J.-P., Lim, T., & Danneville, F. (2009). Experimental evidence of MOSFET high frequency noise reduction by channel engineering. IEEE Transactions on Electron Devices, 56(7), 1516-1522. (Original work published 2009)
Moreno Hagelsieb, L., Flandre, D., & Raskin, J.-P. (2009). Mechanical properties of anodic aluminum oxide for MEMS applications. Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures, 27(1), 542-546. https://doi.org/10.1116/1.3025906 (Original work published 2009)
Valentin, R., Dubois, E., Larrieu, G., Raskin, J.-P., Dambrine, G., Breil, N., & Danneville, F. (2009). Optimization of RF Performance of Metallic Source/Drain SOI MOSFETs Using Dopant Segregation at the Schottky Interface. IEEE Electron Device Letters, 30(11), 1197-1199. https://doi.org/10.1109/LED.2009.2031254 (Original work published 2009)
Mendez, C., Paquay, S., Klapka, I., & Raskin, J.-P. (2009). Effect of geometrical nonlinearity on MEMS thermoelastic damping. Nonlinear Analysis: Real World Applications, 10(3), 1579-1588. https://doi.org/10.1016/j.nonrwa.2008.02.002 (Original work published 2009)
Emam, M., Houri, S., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2009). The impact of externally applied mechanical stress on analog and RF performances of SOI MOSFETs. Journal of Telecommunications and Information Technology, 4, 18-24. (Original work published 2009)
Moreno-Hagelsieb, L., Nizet, Y., Tang, X., Raskin, J.-P., Flandre, D., & Francis, L. (2009). CMOS compatible anodic Al2O3 based sensors for bacteria detection. Procedia Chemistry, 1, 1283-1286. (Original work published 2009)
Raskin, J.-P. (2009). Bulk and surface micromachined MEMS in thin film SOI technology. Advanced Substrate News, ASN 12(Spring 2009), 5 pages. (Original work published 2009)
Emam, M., Sakalas, P., Vanhoenacker-Janvier, D., Raskin, J.-P., Lim, T. C., & Danneville, F. (2009). Experimental Investigation of RF Noise Performance Improvement in Graded-Channel MOSFETs. IEEE Transactions on Electron Devices, 56(7), 1516-1522. https://doi.org/10.1109/TED.2009.2021361 (Original work published 2009)
Raskin, J.-P. (2009). SOI technology: an opportunity for RF designers? (invited paper). Journal of Telecommunications and Information Technology, 4, 3-17. (Original work published 2009)
Tang, X., Jonas, A., Nysten, B., Demoustier, S., Blondeau, F., Prévot, P.-P., Pampin, R., Godfroid, E., Iñiguez, B., Colinge, J.-P., Raskin, J.-P., Flandre, D., & Bayot, V. (2009). Direct protein detection with a nano-interdigitated array gate MOSFET. Biosensors and Bioelectronics, 24(12), 3531-3537. https://doi.org/10.1016/j.bios.2009.05.012 (Original work published 2009)
Tang, X., Bayot, V., Reckinger, N., Flandre, D., Raskin, J.-P., Dubois, E., & Nysten, B. (2009). A Simple Method for Measuring Si-Fin Sidewall Roughness by AFM. IEEE Transactions on Nanotechnology, 8(5), 611-616. https://doi.org/10.1109/TNANO.2009.2021064 (Original work published 2009)
Boe, A., Safi, A., Coulombier, M., Fabregue, D., Pardoen, T., & Raskin, J.-P. (2009). MEMS-based microstructures for nanomechanical characterization of thin films. Smart Materials and Structures, 18(11). https://doi.org/10.1088/0964-1726/18/11/115018 (Original work published 2009)
Reckinger, N., Tang, X., Bayot, V., Yarekha, D. A., Dubois, E., Godey, S., Wallart, X., Larrieu, G., Laszcz, A., Ratajczak, J., Jacques, P., & Raskin, J.-P. (2009). Schottky barrier lowering with the formation of crystalline Er silicide on n-Si upon thermal annealing. Applied Physics Letters, 94(19). https://doi.org/10.1063/1.3136849 (Original work published 2009)
Tang, X., Flandre, D., Reckinger, N., Bayot, V., Dubois, E., Yarekha, D. A., Larrieu, G., Lecestre, A., Ratajczak, J., Breil, N., Passi, V., & Raskin, J.-P. (2009). An electrical evaluation method for the silicidation of silicon nanowires. Applied Physics Letters, 95(2). https://doi.org/10.1063/1.3171929 (Original work published 2009)
Gravier, S., Coulombier, M., Safi, A., André, N., Boe, A., Raskin, J.-P., & Pardoen, T. (2009). New On-Chip Nanomechanical Testing Laboratory - Applications to Aluminum and Polysilicon Thin Films. IEEE Journal of Microelectromechanical Systems, 18(3), 555-569. https://doi.org/10.1109/JMEMS.2009.2020380 (Original work published 2009)
André, N., Sobieski, S., Francis, L., & Raskin, J.-P. (2009). Messung der 3D-Topographie von Sensoren in Mikrosystemtechnik. MessTec, 01-02, 22. (Original work published 2009)
Sobieski, S., André, N., Raskin, J.-P., & Francis, L. (2009). Temperature Effect on Lorentz Based Magnetometer. Sensor Letters, 7(3), 456-459. https://doi.org/10.1166/sl.2009.1068 (Original work published 2009)
Papier de conférence
Emam, M., Vanhoenacker-Janvier, D., Anil, K., Ida, J., & Raskin, J.-P. (2008). High Temperature RF Behavior of SOI MOSFETs for Low-Power Low-Voltage Applications. Proceedings of the IEEE International SOI Conference - SOI′2008, p. 139.
Moldovan, O., Lederer, D., Iniguez, B., & Raskin, J.-P. (2008). Finite element simulations of parasitic capacitances related to multiple-gate field-effect transistors architectures. Proceedings of the IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - SiRF 2008, pp. 183-186. https://doi.org/10.1109/SMIC.2008.52
Raskin, J.-P. (2008). Silicon-on-Insulator MEMS sensors. Proceedings of the NATO-RTO meeting - AVT 160 Symposium on Data Gathering, Sensors and Integration of Sensors, p. Paper 2.
Lederer, D., Roda Neve, C., & Raskin, J.-P. (2008). Fabrication and characterization of High Resistivity SOI wafers for RF applications. Proceedings of the 214th Meeting of The Electrochemical Society (ECS) - 10th International Symposium on Semiconductor Wafer Bonding: Science, Technology and Applications, p. Paper 2173.
Safi, A., Houri, S., Coulombier, M., Gravier, S., André, N., Pardoen, T., & Raskin, J.-P. (2008). A new on chip nanomechanical testing concept applied to ductile and brittle thin film materials. “Surface Modification of Materials” Scientific Research Community of the F.W.O. - Mechanical Behavior of Materials in Small Volumes, Heverlee, Belgique.
Roda Neve, C., Bol, D., Ambroise, R., Flandre, D., & Raskin, J.-P. (2008). Comparison of Digital Substrate Noise in SOI and Bulk Si CMOS Technologies. 7th Workshop on Low-Voltage Low Power Design, Louvain-la-Neuve (Belgium).
André, N., Sobieski, S., Renaux, C., Flandre, D., & Raskin, J.-P. (2008). 3-D CMOS compatible MEMS sensors and actuators. proceedings of the Workshop on MEMS and Nanotechnology through Science and Applications. Published. Workshop on MEMS and Nanotechnology through Science and Applications, UCL/Louvain-la-Neuve (Belgium).
Doria, R. T., Cerdeira, A., Raskin, J.-P., Flandre, D., & Pavanello, M. A. (2008). Linearity Analysis in Double Gate Graded-Channel SOI Devices Applied to 2-MOS MOSFET-C Balanced Structures. Proceedings of SBMICRO 2008, the 23rd Symposium on Microelectronics Technology and Devices, 273-282.
Kezai, T., André, N., Gérard, P., Drochmans, P., Druart, S., Moreno Hagelsieb, L., Flandre, D., & Raskin, J.-P. (2008). Wireless Sensor Network For Breathing Activity Monitoring. Proceedings of the SR05 Satellite Conference - Topics in Electrical Circuits and Systems. Published. SR05 Satellite Conference - Topics in Electrical Circuits and Systems, Fez (Marocco).
Dutu, C. A., Vlad, A., Gence, L., Raskin, J.-P., & Melinte, S. (2008). Silicon Nanowires for Biosensors. 9th International Balkan Workshop on Applied Physics – IBWAP’08, Constanta (Romania).
El Kaamouchi, M., Emam, M., Roda Neve, C., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2008). CMOS technologies for RF applications in harsh environment. Proceedings of the Microwave Technology and Techniques Workshop 2008 - Innovation and Challenges (ESA/ESTEC), p. 8 pages.
Roda Neve, C., Bol, D., Ambroise, R., Flandre, D., & Raskin, J.-P. (2008). Digital substrate noise reduction by low-power circuit operation and SOI technology. Proceedings des 7e journées d’étude Faible Tension Faible Consommation, FTFC 2008, 23-28.
Safi, A., Houri, S., Coulombier, M., Gravier, S., André, N., Pardoen, T., & Raskin, J.-P. (2008). A new on chip nanomechanical testing concept applied to ductile and brittle thin film materials. EuroSimE 2008 International Conference on Thermal, Mechanical and Multi-Physics; Simulation and Experiments in Microelectronics and Micro-Systems, p. 46.
Tinoco, J. C., & Raskin, J.-P. (2008). Revised RF extraction methods for deep submicron MOSFETs. 2008 European Microwave Integrated Circuit Conference (EuMIC), p. 127-130. https://doi.org/10.1109/EMICC.2008.4772245
Moreno Hagelsieb, L., Flandre, D., & Raskin, J.-P. (2008). Anodic Aluminium Oxide Properties and its Interest for MEMS and DNA Sensors. Proceedings of the Regional Electrochemistry Meeting of South-east Asia. Published. Regional Electrochemistry Meeting of South-east Asia, Singapore.
Roda Neve, C., Poesen, G., Schreurs, D., Raskin, J.-P., Stiens, J., & Vounckx, R. (2008). Microwave characterization of optically modulated photo-induced switches with a passivation layer using an LSNA. 2008 72nd ARFTG Microwave Measurement Symposium, p. 58-63. https://doi.org/10.1109/ARFTG.2008.4804288
Moreno Hagelsieb, L., Flandre, D., & Raskin, J.-P. (2008). Mechanical properties of anodic aluminum oxide for microelectromechanical system applications. Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures, 27(1), 542-546. https://doi.org/10.1116/1.3025906 (Original work published 2009)
Pardoen, T., Raskin, J.-P., & Carbonnelle, P. (2008). A new on chip nanomechanical testing concept applied to ductile and brittle thin film materials. Proceedings of the First International Conference on Functional Nanocoatings, p. 62.
Emam, M., Tinoco, J., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2008). High-temperature DC and RF behaviors of partially-depleted SOI MOSFET transistors. Solid-State Electronics, 52(12), 1924-1932. https://doi.org/10.1016/j.sse.2008.06.058 (Original work published 2008)
Pardoen, T., Safi, A., Coulombier, M., Carbonnelle, P., Raskin, J.-P., & Gravier, S. (2008). A new on chip nanomechanical testing concept applied to brittle and ductile thin films materials. 2nd International Conference on Integration and Commercialization of Micro and Nanosystems 2008, p. 259-267.
Pardoen, T., Safi, A., Houri, S., Coulombier, M., Gravier, S., André, N., Carbonnelle, P., & Raskin, J.-P. (2008). A new on chip nanomechanical testing method. Proceedings of the Observatory for Micro & NanoTechnologies - Nanomechanics for NEMS: scientific and technological issues. Published. Observatory for Micro & NanoTechnologies - Nanomechanics for NEMS: scientific and technological issues, Grenoble, France.
Tinoco, J., Parvais, B., Mercha, A., Decoutere, S., & Raskin, J.-P. (2008). DC and RF characteristics of a 60 nm FinFET for a wide temperature range. Proceedings of the Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’08, pp. 57-58.
Olbrechts, B., Rue, B., Flandre, D., & Raskin, J.-P. (2008). Cross-sensitivities of ring oscillators on thin dielectric membrane for pressure sensing applications. Proceedings of the EUROSOI - 2008, Fourth Workshop of the Thematic Network on Sil. Published. Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2008), Tyndall National Institute, Cork, Ireland.
Ackaert, J., Charavel, R., Dhondt, K., Vlachakis, B., De Schepper, L., Millecam, M., Vandevelde, E., Bogaert, P., Iline, A., De Backer, E., Vlad, A., & Raskin, J.-P. (2008). MIMC reliability and electrical behavior defined by a physical layer property of the dielectric. Microelectronics Reliability, 48(8-9), 1553-1556. https://doi.org/10.1016/j.microrel.2008.06.043 (Original work published 2008)
Houri, S., Francis, L., & Raskin, J.-P. (2008). Wide frequency tuning range of MEMS resonators through on-wafer uniaxial stress. Proceedings of the 34th International Conference on Micro- and Nano-Engineering - MNE 2008, p. 366 - Paper MEMS3-P15.
Houri, S., Francis, L., & Raskin, J.-P. (2008). On-wafer stress tuning of MEMS resonators. Proceedings of the 19th MicroMechanics Europe Workshop - MME’08, pp. 287-290.
Sobieski, S., André, N., Francis, L., & Raskin, J.-P. (2008). Temperature effect on Lorentz based magnetometer. Proceedings of the European Magnetic Sensors & Actuators Conference - EMSA 2008, p. 138.
Passi, V., Lecestre, A., Dubois, E., & Raskin, J.-P. (2008). Selective etching of implanted silicon-dioxide in hydrofluoric acid. Proceedings of the 34th International Conference on Micro- and Nano-Engineering - MNE 2008, p. 455 - Paper FAB-P32.
Moreno Hagelsieb, L., André, N., Kezai, T., Bulteel, O., Druart, S., Pampin, R., Rue, B., Olbrechts, B., Raskin, J.-P., & Flandre, D. (2008). SOI Sensors Advantages for Consumer and Health Monitoring Applications. Proceedings of the Commercialization of Micro and Nano Systems Conference. Published. Commercialization of Micro and Nano Systems Conference, Mexico.
Houri, S., Emam, M., & Raskin, J.-P. (2008). RF behavior of strained Fully Depleted SOI MOSFETs. Proceedings of the Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’08, pp. 55-56.
André, N., Rue, B., Renaux, C., Flandre, D., & Raskin, J.-P. (2008). 3-D capacitive MEMS sensors co-integrated with SOI CMOS circuits. Proceedings of the EUROSOI - 2008, Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits, 75-76.
Wang, B., Safi, A., Pardoen, T., Boé, A., Raskin, J.-P., Wang, X., Vlassak, J., & Schryvers, D. (2008). TEM study of the NiTi shape memory thin film. Proceedings of the 14th European Microscoyp Congress EMC′08, p. paper # P659.
Kranti, A., Raskin, J.-P., & Armstrong, G. A. (2008). Optimizing FinFET Geometry and Parasitics for RF Applications. Proceedings of the IEEE International SOI Conference, SOI’2008, pp. 123-124.
Tinoco, J. C., & Raskin, J.-P. (2008). RF extraction techniques for series resistances of MOSFETs. Proceedings of the MOS-AK Workshop – MOS modeling and parameter extraction working group, p. Paper 9.
Ivanov, P., Gracia, I., Blanco, F., Raskin, J.-P., Cumeras, R., Sabate, N., Vilanova, X., Correig, X., Fonseca, L., Figueras, E., Santander, J., & Cane, C. (2008). Preconcentrator-based sensor mu -system for low-level benzene detection. Smart Structures, Devices, and Systems IV, Vol. 7268, 72680S (8 pp.). https://doi.org/10.1117/12.807433
El Kaamouchi, M., Dambrine, G., Si Moussa, M., Emam, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2008). Body-biasing control on zero-temperature-coefficient in partially depleted SOI MOSFET. 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, p. 114-117.
El Kaamouchi, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2008). Design d’un LNA avec protection ESD en technologie CMOS SOI 130 nm. Proceedings of the FTFC 08 Conference, pp. 61-64.
Olbrechts, B., Rue, B., Flandre, D., & Raskin, J.-P. (2008). Cross-Sensitivities of Ring Oscillators on Thin Dielectric Membrane for Pressure Sensing Applications. Proceedings of the EUROSOI Conference, 73-74.
Raskin, J.-P. (2008). Si Nanowires: challenges and prospects. Proceedings of the 11th Session Nanoscale CMOS and Si-based Beyond CMOS Nanodevices - MIGAS’08, p. Paper 14.
André, N., Gérard, P., Drochmans, P., Kezai, T., Druart, S., Moreno-Hagelsieb, L., Flandre, D., & Raskin, J.-P. (2008). Wireless microsensors system for monitoring breathing activity. European Medical and Biological Engineering Congress – Engineering for Health – EMBEC’08, Antwerp (Belgium).
Emam, M., Vanhoenacker-Janvier, D., Anil, K., Ida, J., & Raskin, J.-P. (2008). High temperature RF behavior of SOI MOSFETs for low-power low-voltage applications. 2008 IEEE International SOI Conference, p. 139-140. https://doi.org/10.1109/SOI.2008.4656333
Balestra, F., Parker, E., Mantl, S., Dubois, E., Engstrom, O., Clerc, R., Cristoloveanu, S., Kurz, H., Raskin, J.-P., & et al. (2008). Silicon-based nanostructures and nanodevices for long-term nanoelectronics applications. Proceedings of the European Materials Research Society – E-MRS 2008 Spring Meeting, p. Paper 14.
Boé, A., Safi, A., Coulombier, M., Pardoen, T., & Raskin, J.-P. (2008). MEMS microstructures for the nanomechanical characterization of thin films. Proceedings of the International Conference on Multifunctional Materials and Structures, p. paper # MF382.
Moreno Hagelsieb, L., Pampin, R., Bulteel, O., Olbrechts, B., André, N., Rue, B., Raskin, J.-P., & Flandre, D. (2008). Development of Micro- and Nano- Bio- and Environmental SOI-Sensors. Proceedings of the Workshop on MEMS and Nanotechnology through Science and Applications. Published. Workshop on MEMS and Nanotechnology through Science and Applications, UCL/Louvain-la-Neuve (Belgium).
Kerr, D. C., Gering, J. M., McKay, T., Carroll, S., Roda Neve, C., & Raskin, J.-P. (2008). The effect of a SiO2 interface on RF harmonic distortion in CPW lines on silicon or passivated silicon. The 8th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF’08, Orlando, FL (USA).
Roda Neve, C., Lederer, D., Pailloncy, G., Kerr, D. C., Gering, J. M., McKay, T. G., Carroll, M. S., & Raskin, J.-P. (2008). Impact of Si substrate resistivity on the non-linear behaviour of RF CPW transmission lines. 2008 European Microwave Integrated Circuit Conference (EuMIC), p. 36-39. https://doi.org/10.1109/EMICC.2008.4772222
Tinoco, J. C., & Raskin, J.-P. (2008). RF-extraction methods for MOSFET series resistances: a fair comparison. ICCDCS ’08. 7th 2008 International Caribbean Conference on Devices, Circuits and Systems, 6 pp.
Roda Neve, C., Lederer, D., & Raskin, J.-P. (2008). Temperature and Bias Dependent Performance of Coplanar Waveguide on High Resistivity Silicon Substrate with Passivation Layer. Proceedings of the Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’08, pp. 121-122.
André, N., Rue, B., Renaux, C., Raskin, J.-P., & Flandre, D. (2008). Artificial microbeams to sense air flow, temperature or humidity combining MEMS and CMOS technologies. Sensors and Sensing in Biology and Engineering Conference, October 12 – 16, 2008, Cetraro (Italy).
Pardoen, T., Coulombier, M., Safi, A., Boé, A., & Raskin, J.-P. (2008). A new nanomechanical testing concept for thin films. Gordon Conference on thin films, Colby College, Maine USA.
André, N., Rue, B., Raskin, J.-P., & Flandre, D. (2008). Artificial microbeams to sense air flow and temperature combining MEMS and CMOS technologies. Proceedings of the ), Sensors and Sensing in Biology and Engineering, p. 50.
Coulombier, M., Safi, A., Boé, A., Carbonnelle, P., Raskin, J.-P., & Pardoen, T. (2008). A new on chip micro and nanolaboratory measuring the mechanical properties of ductile and brittle thin film materials. The 9th symposium on nano-mechanical Testing - Nanomech 9, Hückelhoven, Germany,.
Stiens, J., Zhang, L., Elhawil, A., Poesen, G., Jaeger, I., Van Kempen, L., Salhi, H., Nauwelaers, B., Schreurs, D., Olyslager, F., Franchois, A., De Zutter, D., De Raedt, W., Carchon, G., Huynen, I., Raskin, J.-P., & Vounckx, R. (2008). Intelligent hyper-spectral mm-wave illumination techniques for feature extraction of hidden objects in indoor security applications: a fusion of photonics, electronics and electromagnetism. Proceedings of the 2008 International Topical Meeting on Microwave Photonics /Asia-Pacific Microwave Photonics Conference - MWP/APMP 2008. Published. 2008 International Topical Meeting on Microwave Photonics /Asia-Pacific Microwave Photonics Conference - MWP/APMP 2008, Gold Coast, Australia.
Article de journal
Reckinger, N., Tang, X., Dubois, E., Godey, S., Wallart, X., Raskin, J.-P., & et al. (2008). Low Schottky barrier height for ErSi2−x/n-Si contacts formed with a Ti cap. Journal of Applied Physics, 104(10), 103523. (Original work published 2008)
Emam, M., Tinoco, C., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2008). High-Temperature DC and RF behaviors of Partially-Depleted SOI MOSFET transistors. Solid-State Electronics, 52(12), 1924-1932. (Original work published 2008)
Doria, R. T., Cerdeira, A., Raskin, J.-P., Flandre, D., & Pavanello, M. A. (2008). Harmonic distortion analysis of double gate graded-channel MOSFETs operating in saturation. Microelectronics, 39(12), 1663-1670. https://doi.org/10.1016/j.mejo.2008.02.006 (Original work published 2008)
Raskin, J.-P., Pearman, D. J., Pailloncy, G., Larson, J. M., Snyder, J., Leadley, D. L., & Whall, T. E. (2008). High-frequency performance of Schottky Barrier p-MOSFET devices. IEEE Electronic Device Letters, 29(4), 396-398. (Original work published 2008)
Valentin, R., Dubois, E., Raskin, J.-P., Larrieu, G., Dambrine, G., Lim, T. C., Breil, N., & Danneville, F. (2008). RF small-signal analysis of Schottky-barrier p-MOSFET. IEEE Transactions on Electron Devices, 55(5), 1192-1202. https://doi.org/10.1109/TED.2008.919382 (Original work published 2008)
Tang, X., Reckinger, N., Larrieu, G., Dubois, E., Flandre, D., Raskin, J.-P., Nysten, B., Jonas, A., & Bayot, V. (2008). Characterization of ultrathin SOI film and application to short channel MOSFETs. Nanotechnology, 19(16), 165703. https://doi.org/10.1088/0957-4484/19/16/165703 (Original work published 2008)
Lederer, D., & Raskin, J.-P. (2008). RF performance of a commercial SOI technology transferred onto a passivated HR silicon substrate. IEEE Transactions on Electron Devices, 55(7), 1664-1671. https://doi.org/10.1109/TED.2008.923564 (Original work published 2008)
Lederer, D., Roda Neve, C., Olbrechts, B., & Raskin, J.-P. (2008). Fabrication and Characterization of High Resistivity SOI Wafers for RF Applications. ECS Transactions, 16(8), 165-174. https://doi.org/10.1149/1.2982866 (Original work published 2008)
Roda Neve, C., Lederer, D., & Raskin, J.-P. (2008). Reduction of Photo-Induced excess carriers in optically controlled microwave circuits on HR-Si. Proceedings of the European Microwave Association, 4, 199-205. (Original work published 2008)
André, N., Sobieski, S., Francis, L., & Raskin, J.-P. (2008). Out-of-plane topography of 3-D surface micromachined micro-sensors. Materials Science in Semiconductor Processing, 2, 22-23. (Original work published 2008)
Reckinger, N., Tang, X., Bayot, V., Yarekha, D. A., Dubois, E., Godey, S., Wallart, X., Larrieu, G., Laszcz, A., Ratajczak, J., & Raskin, J.-P. (2008). Low Schottky barrier height for ErSi2−x/n-Si contacts formed with a Ti cap. Journal of Applied Physics, 104(10), 103523. https://doi.org/10.1063/1.3010305 (Original work published 2008)
Raskin, J.-P., Pailloncy, G., Lederer, D., Danneville, F., Dambrine, G., Decoutere, S., Mercha, A., & Parvais, B. (2008). High-Frequency Noise Performance of 60-nm Gate-Length FinFETs. IEEE Transactions on Electron Devices, 55(10), 2718-2727. https://doi.org/10.1109/TED.2008.2003097 (Original work published 2008)
Kilchytska, V., Flandre, D., & Raskin, J.-P. (2008). Silicon-on-Nothing MOSFETs: An efficient solution for parasitic substrate coupling suppression in SOI devices. Applied Surface Science, 254(19), 6168-6173. https://doi.org/10.1016/j.apsusc.2008.02.171 (Original work published 2008)
Doria, R. T., Cerdeira, A., Raskin, J.-P., Flandre, D., & Pavanello, M. A. (2008). Linearity analysis in Double Gate Graded-Channel SOI devices applied to 2-MOS MOSFET-C balanced structures. ECS Transactions, 14, 273-282. https://doi.org/10.1149/1.2956041 (Original work published 2008)
Balestra, F., Parker, E., Leadley, D. L., Mantl, S., Dubois, E., Engstrom, o., Clerc, R., Cristoloveanu, S., Kurz, H., Raskin, J.-P., Lemme, M., Ionescu, A., Kasper, E., Karmous, A., Baus, M., Spangenberg, B., Ostling, M., Sangiorgi, E., Ghibaudo, G., & Flandre, D. (2008). NANOSIL network of excellence-silicon-based nanostructures and nanodevices for long-term nanoelectronics applications. Materials Science in Semiconductor Processing, 11(5-6), 148-159. https://doi.org/10.1016/j.mssp.2008.09.017 (Original work published 2008)
Pavageau, C., Moussa, M. S., Raskin, J.-P., Vanhoenacker-Janvier, D., Fel, N., Russat, J., Picheta, L., & Danneville, F. (2008). A 7-dB 43-GHz CMOS distributed amplifier on high-resistivity SOI substrates. IEEE Transactions on Microwave Theory and Techniques, 56(3), 587-598. https://doi.org/10.1109/TMTT.2008.916930 (Original work published 2008)
El Kaamouchi, M., Delatte, P., Moussa, M. S., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2008). Temperature behavior of spiral inductors on high resistivity substrate in SOI CMOS technology. Solid-State Electronics, 52(12), 1915-1923. https://doi.org/10.1016/j.sse.2008.06.060 (Original work published 2008)
Charavel, R., Ackaert, J., Dhondt, K., Vlachakis, B., De Schepper, L., Millecam, M., Vandevelde, E., Bogaerts, P., De Backer, E., Ilin, A., Vlad, A., & Raskin, J.-P. (2008). MIMC Reliability and Electrical Behavior Defined by a Physical Layer Property of the Dielectric. ECS Transactions, 13(2), 83-90. (Original work published 2008)
Brevet
Pardoen, T., Raskin, J.-P., Carbonnelle, P., & Gravier, S. (2008). Imposing and determining stress in sub-micron samples (Patent No. PCT/EP2008/051810).
Article de journal
Bertholet, Y., Olbrechts, B., Lejeune, B., Raskin, J.-P., & Pardoen, T. (2007). Molecular bonding aided by dissipative inter-layers. Acta Materialia, 55(2), 473-479. https://doi.org/10.1016/j.actamat.2006.08.036 (Original work published 2007)
Gluszko, G., Lukasiak, L., Kilchytska, V., Chung, T. M., Olbrechts, B., Flandre, D., & Raskin, J.-P. (2007). Charge-pumping characterization of SOI devices fabricated by means of wafer bonding over pre-patterned cavities. Journal of Telecommunications and Information Technology, 3, 61-66. (Original work published 2007)
Pearman, D. J., Pailloncy, G., Raskin, J.-P., Larson, J. M., Snyder, J. P., Parker, E. H. C., & Whall, T. E. (2007). Static and high-frequency behavior and performance of Schottky-barrier, p-MOSFET devices. IEEE Transactions on Electron Devices, 54(10), 2796-2802. https://doi.org/10.1109/TED.2007.904985 (Original work published 2007)
Raskin, J.-P., IKER, F., André, N., Fabrègue, D., Coulombier, M., & Pardoen, T. (2007). From Nanoelectronics towards Nanoelectromechanical Systems. Revue E tijdschrift, 1(mars/avril 2007), 26-33. (Original work published 2007)
Raskin, J.-P., Flandre, D., Iker, F., André, N., Olbrechts, B., & Pardoen, T. (2007). Bulk and surface micromachined MEMS in thin film SOI technology. Electrochimica Acta, 52(8), 2850-2861. https://doi.org/10.1016/j.electacta.2006.09.021 (Original work published 2007)
Lederer, D., & Raskin, J.-P. (2007). On-wafer wideband electrical characterization : a powerful tool for improving the IC technologies. Journal of Telecommunications and Information Technology, 2, 69-77. (Original work published 2007)
Raskin, J.-P. (2007). Wideband characterization of SOI materials and devices. Solid-State Electronics, 51, 1161-1171. (Original work published 2007)
Kilchytska, V., Pailloncy, G., Lederer, D., Raskin, J.-P., Collaert, N., Jurczak, M., & Flandre, D. (2007). On the substrate-related variation of the small-signal output conductance in advanced MOSFETs. IEEE Electron Device Letters, 419-421. (Original work published 2007)
Doria, R. T., Pavanello, M. A., Cerdeira, A., Raskin, J.-P., & Flandre, D. (2007). Application of Double Gate Graded-Channel SOI in MOSFET-C Balanced Structures. Journal of the Electrochemical Society, 6(4), 217-222. (Original work published 2007)
André, N., Coulombier, M., De Longueville, V., Fabregue, D., Gets, T., Gravier, S., Pardoen, T., & Raskin, J.-P. (2007). Microfabrication-based nanomechanical laboratory for testing the ductility of submicron aluminium films. Microelectronic Engineering, 84(11), 2714-2718. https://doi.org/10.1016/j.mee.2007.05.039 (Original work published 2007)
Kilchytska, V., Pailloncy, G., Lederer, D., Raskin, J.-P., Collaert, N., Jurczak, M., & Flandre, D. (2007). Frequency variation of the small-signal output conductance of decananometer MOSFETs due to substrate crosstalk. IEEE Electron Device Letters, 28(5), 419-421. https://doi.org/10.1109/LED.2007.895374 (Original work published 2007)
Farhi, G., Saracco, E., Beerens, J., Morris, D., Charlebois, S. A., & Raskin, J.-P. (2007). Electrical Characteristics and Simulation of Self-Switching-Diodes in SOI. Solid-State Electronics, 51, 1245-1249. (Original work published 2007)
Simoen, E., Claeys, C., Chung, T. M., Flandre, D., & Raskin, J.-P. (2007). The Length-Dependence of the 1/f Noise of Graded-Channel SOI nMOSFETs. ECS Transactions, 9(1), 373-381 (September). https://doi.org/10.1149/1.2766908 (Original work published 2007)
Lederer, D., & Raskin, J.-P. (2007). Characterization of the body node in PD SOI MOSFETs using multiport VNA measurements. IEEE Transactions on Electron Devices, 54(11), 3030-3039. https://doi.org/10.1109/TED.2007.907188 (Original work published 2007)
Kilchytska, V., Chung, T. M., Vovk, Y., Raskin, J.-P., & Flandre, D. (2007). True Silicon-on-Nothing MOSFETs fabricated by Si layer transfer over a pre-etched cavity. Solid-State Electronics, 51, 1238-1244. (Original work published 2007)
Chung, T. M., Olbrechts, B., Flandre, D., Södervall, U., Bengtsson, S., & Raskin, J.-P. (2007). Planar Double-Gate SOI MOS devices by wafer bonding over pre-patterned cavities. Solid-State Electronics, 51(2), 231-238. https://doi.org/10.1016/j.sse.2007.01.017 (Original work published 2007)
Moldovan, O., Cerdeira, A., Jimenez, D., Raskin, J.-P., Kilchytska, V., Flandre, D., Collaert, N., & Iniguez, B. (2007). Compact model for highly-doped double-gate SOI MOSFETs targeting baseband analog applications. Solid-State Electronics, 51(5), 655-661. https://doi.org/10.1016/j.sse.2007.02.039 (Original work published 2007)
Simoen, E., Flandre, D., Claeys, C., Chung, T. M., & Raskin, J.-P. (2007). On the origin of the excess low-frequency noise in graded-channel silicon-on-insulator nMOSFETs. IEEE Electron Device Letters, 28(10), 919-921. https://doi.org/10.1109/LED.2007.905958 (Original work published 2007)
Moreno Hagelsieb, L., Laurent, G., Pampin, R., Foultier, B., Remacle, J.-F., Raskin, J.-P., & Flandre, D. (2007). Electrical detection of DNA hybridization : three extraction techniques based on interdigitated Al/Al2O3 capacitors. Biosensors and Bioelectronics, 22(9-10), 2199-2207. (Original work published 2007)
Fabregue, D., André, N., Coulombier, M., Raskin, J.-P., & Pardoen, T. (2007). Multipurpose nanomechanical testing machines revealing the size-dependent strength and high ductility of pure aluminium submicron films. Micro & Nano Letters, 2(1), 13-16. https://doi.org/10.1049/mnl:20065068 (Original work published 2007)
Olbrechts, B., Rue, B., Suski, J., Flandre, D., & Raskin, J.-P. (2007). Characterization of FD SOI devices and VCO’s on ONO membranes under pressure. Solid-State Electronics, 51(9), 1229-1237. https://doi.org/10.1016/j.sse.2007.07.026 (Original work published 2007)
Simoen, E., Claeys, C., Chung, T. M., Flandre, D., Raskin, J.-P., Pavanello, M. A., & Martino, J. A. (2007). Low-frequency noise behavior of graded-channel SOI n-MOSFETs. Solid-State Electronics, 51(2), 260-267. (Original work published 2007)
El Kaamouchi, M., Si Moussa, M., Delatte, P., Wybo, G., Bens, A., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2007). A 2.4-GHz Fully Integrated ESD-Protected Low-Noise Amplifier in 130-nm PD SOI CMOS Technology. IEEE Transactions on Microwave Theory and Techniques, 55(12), 2822-2831. https://doi.org/10.1109/TMTT.2007.909148 (Original work published 2007)
Papier de conférence
Simoen, E., Flandre, D., Claeys, C., Chung, T. M., Pavanello, M. A., Martino, J. A., & Raskin, J.-P. (2007). The low-frequency noise behaviour of graded-channel SOI nMOSFETs. Solid-State Electronics, 51(2), 260-267. https://doi.org/10.1016/j.sse.2007.01.003 (Original work published 2007)
André, N., Iker, F., & Raskin, J.-P. (2007). CMOS compatible 3-D MEMS in SOI technology. Proceedings of the Third Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’07, pp. 69-70.
Coulombier, M., Gravier, S., Pardoen, T., Fabrègue, D., André, N., Houri, S., & Raskin, J.-P. (2007). New concept of multipurpose on-chip nanomechanical laboratory. Proceedings of the 1st International Congress and Exhibition on Microreliability and Nanoreliability in Key Technology Applications - MicroNanoReliability 2007. Published. 1st International Congress and Exhibition on Microreliability and Nanoreliability in Key Technology Applications - MicroNanoReliability 2007, Berlin, Germany.
Olbrechts, B., Rue, B., Rinaldi, G., Stiharu, I., Flandre, D., & Raskin, J.-P. (2007). SOI devices and ring oscillators on thin dielectric membranes for pressure sensing applications. Proccedings 2007 IEEE International SOI Conference, 109-110.
Strepenne, F., Bertholet, Y., Olbrechts, B., Raskin, J.-P., & Pardoen, T. (2007). A new variant of the wedge opening test method with inverse identification of interface toughness. Proceedings, p. 131-134.
Farhi, G., Saracco, E., Beerens, J., Morris, D., Charlebois, S. A., & Raskin, J.-P. (2007). Electrical characteristics and simulations of self-switching-diodes in SOI technology. Solid-State Electronics, 51(9), 1245-1249. https://doi.org/10.1016/j.sse.2007.07.013 (Original work published 2007)
Gluszko, G., Lukasiak, L., Szostak, S., Raskin, J.-P., Olbrechts, B., Gottlob, H., Lemme, M. C., Gili, E., Ashburn, P., Korwin-Pawlowski, M. L., & Jakubowski, A. (2007). Charge-pumping characterization of SOI and vertical MOS structures. 13th Canadian Semiconductor Technology Conference – CSTC’07, Montreal (Canada).
Kilchytska, V., Lederer, D., Flandre, D., & Raskin, J.-P. (2007). Substrate Parasitic Coupling in SOI Devices: Engineering Solutions. Proceedings of the 3rd International Workshop on New Group IV Semiconductor Nanoelectronics. Published. 3rd International Workshop on New Group IV Semiconductor Nanoelectronics, Tohoku University, Sendai (Japan).
Kuylenstierna, D., Norling, M., Vorobiev, A., Reimann, K., Lederer, D., Raskin, J.-P., & Gevorgian, S. (2007). Performance of Coplanar waveguides on surface passivated highly resistive silicon covered by ferroelectric film. Proceedings of the ”, IEEE MTT-S International Microwave Symposium – IMS’07, pp. 2055-2058.
El Ghorba, M., André, N., Sobieski, S., & Raskin, J.-P. (2007). CMOS Compatible Out-of-Plane & In-Plane Integrated Magnetometer. Proceedings of the Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS - DTIP 2007, pp. 221-224.
Coulombier, M., André, N., Sobieski, S., Houri, S., Gravier, S., Carbonnelle, P., Raskin, J.-P., & Pardoen, T. (2007). Microlaboratoire « on chip » pour la mesure des propriétés mécaniques de films minces. Proceedings de la journée de Rencontre Entreprises-Laboratoires. Published. Pôle de compétitivité MECATECH - Journée de Rencontre Entreprises-Laboratoires, Louvain-la-Neuve, Belgium.
André, N., Coulombier, M., De Longueville, V., Fabrègue, D., Gets, T., Gravier, S., Houri, S., Safi, A., Raskin, J.-P., & Pardoen, T. (2007). Multipurpose on-chip nanomechanical laboratory for testing the size-dependent strength and ductility of submicron metallic films. Proceedings of the International Union of Theoretical and Applied Mechanics (IUTAM) Symposium on Multi-Scale Plasticity of Crystalline Materials Organization, p. 16-17.
Roda Neve, C., & Raskin, J.-P. (2007). Optical crosstalk reduction in optically controlled microwave circuits on HR-Si using a trap-rich passivation layer. Proceedings of the 12th Annual Symposium of the IEEE/LEOS Benelux chapter, pp. 251-254.
Cornet, A., Raskin, J.-P., & Antoine, P. (2007). High precision interferometric measurements with broad spectral sources : application for MEMS profilometry. 3rd Workshop on Optical Measurements Techniques OPTIMESS, Leuven.
Cornet, A., Antoine, P., & Raskin, J.-P. (2007). High precision interferometric measurements with broad spectral sources : applications for MEMS pofilometry. 3rd Workshop on Optical Measurements Techniques OPTIMESS, Leuven.
Dubois, E., Larrieu, G., Breil, N., Valentin, R., Danneville, E., Ostling, M., Hellström, P. E., Reckinger, N., Tang, X., Raskin, J.-P., & et al. (2007). Metallic Source/Drain architecture: status and prospects. Proceedings of the 37th European Solid-State Device Research Conference – ESSDERC 2007, SINANO Workshop entitled : Nanoscale CMOS and Beyond-CMOS Nanodevices, p. Paper 2.
Kilchytska, V., Chung, T. M., Olbrechts, B., Vovk, Ya. N., Flandre, D., & Raskin, J.-P. (2007). On true Silicon-on-Insulator MOSFETs: fabrication by Si layer transfer over the pre-defined cavity and electrical characterization. Proceedings of the 5th International Symposium on Control of Semiconductor Interfaces for Next Generation ULSI Process Integrations - ISCSI-V. Published. 5th International Symposium on Control of Semiconductor Interfaces for Next Generation ULSI Process Integrations - ISCSI-V, Tokyo (Japan).
Bertholet, Y., Olbrechts, B., Lejeune, B., Raskin, J.-P., & Pardoen, T. (2007). Molecular Bonding Aided by Dissipative Interlayers. Proceedings of the 1st International Congress and Exhibition on Microreliability and Nanoreliability in Key Technology Applications - MicroNanoReliability 2007, p. paper #3.
Olbrechts, B., André, N., Rue, B., Flandre, D., & Raskin, J.-P. (2007). SOI co-integrated microsensors. Proceedings of the 7th MEMUNITY - The MEMS Test Community - Workshop, Paper 10.
Kilchytska, V., Pailloncy, G., Raskin, J.-P., Collaert, N., Jurczak, M., & Flandre, D. (2007). Substrate-related output conductance frequency response of FD SOI MOSFETs: influence of channel length and substrate temperature. Proceedings of ULIS 2007, the 8th International Conference on Ultimate Integration on Silicon. Published. 8th International Conference on Ultimate Integration on Silicon (ULIS 2007), Leuven/Belgium.
Si Moussa, M., Pavageau, C., Picheta, L., Danneville, F., Russat, J., Fel, N., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2007). Design of a 23 GHz Low Noise Amplifier in 130 nm SOI CMOS Technology. Proceedings of the Third Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’07, pp. 72-73.
Coulombier, M., Gravier, S., Pardoen, T., Fabrègue, D., André, N., Houri, S., & Raskin, J.-P. (2007). Multipurpose on-chip nanomechanical laboratory revealing the size-dependent strenght and high ductility of pure aluminium submicron films. Proceedings of the European Congress and Exhibition on Advanced Materials and Processes, p. paper # D21-553.
Pardoen, T., Raskin, J.-P., Coulombier, M., Gravier, S., André, N., Safi, A., Gets, T., De Longueville, V., Sobieski, S., & Houri, S. (2007). Multipurpose on-chip nanomechanical laboratory for testing thin films. Proceedings of the 2007 Materials Research Society (MRS) Fall Meeting, p. paper # DD1.3.
Moreno Hagelsieb, L., Flandre, D., Foultier, B., Laurent, G., Pampin, R., Remacle, J.-F., & Raskin, J.-P. (2007). Electrical detection of DNA hybridization: Three extraction techniques based on interdigitated Al/Al2O3 capacitors. Biosensors and Bioelectronics, 22(9-10), 2199-2207. https://doi.org/10.1016/j.bios.2006.10.024 (Original work published 2007)
Pardoen, T., Fabrègue, D., André, N., Coulombier, M., & Raskin, J.-P. (2007). Nanomechanical testing machines revealing size-dependent mechanical properties of thin metallic films. Proceedings, p. Session 5, paper #2.
Larrieu, G., Dubois, E., Valentin, R., Breil, N., Danneville, F., Dambrinne, G., Raskin, J.-P., & Pesant, J.-C. (2007). Low Temperature Implementation of Dopant-Segregated Band-edge Metallic S/D junctions in Thin-Body SOI p-MOSFETs. Proceedings of the IEEE International Electron Devices Meeting - IEDM 2007, pp. 147-150. https://doi.org/10.1109/IEDM.2007.4418886
Kilchytska, V., Flandre, D., Chung, T. M., Olbrechts, B., Vovk, Ya., & Raskin, J.-P. (2007). Electrical characterization of true Silicon-On-Nothing MOSFETs fabricated by Si layer transfer over a pre-etched cavity. Solid-State Electronics, 51(9), 1238-1244. https://doi.org/10.1016/j.sse.2007.07.021 (Original work published 2007)
Raskin, J.-P., Lemme, M., Dubois, E., Ionescu, A., Baron, T., Gentile, P., & Colinge, J.-P. (2007). Si nanowires: challenges and prospects. Proceedings of the 37th European Solid-State Device Research Conference – ESSDERC 2007, SINANO Workshop entitled : Nanoscale CMOS and Beyond-CMOS Nanodevices, p. Paper 9.
Norling, M., Kuylenstierna, D., Vorobiev, A., Reimann, K., Lederer, D., Raskin, J.-P., & Gevorgian, S. (2007). Comparison of High-Resistivity Silicon Surface Passivation Methods. Proceedings of the European Microwave Integrated Circuit Conference - EuMIC 2007, pp. 215-218. https://doi.org/10.1109/EMICC.2007.4412687
Farhi, G., Saracco, E., Beerens, J., Morris, D., Charlebois, S. A., & Raskin, J.-P. (2007). Effect of surface states on the electrical properties of Self-Switching Diodes Based on SOI. 13th Canadian Semiconductor Technology Conference – CSTC’07, Montreal (Canada).
Raskin, J.-P., Fabregue, D., André, N., Coulombier, M., & Pardoen, T. (2007). Low complexity testing micromachines revealing size-dependent mechanical properties of thin Al films. TRANSDUCERS ’07 & Eurosensors XXI. 2007 14th International Conference on Solid-State Sensors, Actuators and Microsystems, p. 619-622.
Emam, M., El Kaamouchi, M., Si Moussa, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2007). RF Antenna Switches Based on 130 nm Floating and Body-Tied SOI CMOS Technology. Proceedings of the Third Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’07, pp. 78-79.
El Ghorba, M., André, N., Sobieski, S., & Raskin, J.-P. (2007). CMOS compatible out-of-plane & in-plane magnetometers. TRANSDUCERS ’07 & Eurosensors XXI. 2007 14th International Conferenceon Solid-State Sensors, Actuators and Microsystems, p. 2373-2376.
Simoen, E., Claeys, C., Chung, T. M., Flandre, D., & Raskin, J.-P. (2007). The Length-Dependence of the 1/f Noise of Graded-Channel SOI nMOSFETs. Proceedings of the 22nd Symposium on Microelectronics Technology and Devices - SBMicro′2007, Session “Characterization and Modeling III”, paper # 2.
Roda Neve, C., Lederer, D., & Raskin, J.-P. (2007). Optical crosstalk reduction using a HR-Si substrate with trap-rich passivation layer. EuMC 2007 Proceedings. 37th European Microwave Conference, p. 592-595.
Emam, M., El Kaamouchi, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2007). Conception d’un commutateur d’antenne en technologie Silicium-sur-Isolant 130 nm. Proceedings des Journées Nationales du Réseau Doctoral en Microélectronique - JNRDM’07, p. 37.
Pardoen, T., & Raskin, J.-P. (2007). La technologie MEMS au service de l’extraction des propriétés mécaniques des matériaux aux échelles micro et nano. Proceedings of the ISTM Seminar - Maîtrise et caractérisation locale de microstructures dans les lignes d’interconnexions cuivr. Published. ISTM Seminar - Maîtrise et caractérisation locale de microstructures dans les lignes d’interconnexions cuivre, Grenoble, France.
Moreno Hagelsieb, L., Pampin, R., Bulteel, O., Olbrechts, B., André, N., Rue, B., Raskin, J.-P., & Flandre, D. (2007). Development of New Micro- and Nano- Bio- and Environmental SOI-Sensors in UCL. Proceedings of the Scientific workshop: Microsystems as a Platform for Integrating Micro/Nano/Biotechnologies, Session III, paper 5.
Raskin, J.-P. (2007). Wideband characterization of SOI materials and devices. Solid-State Electronics, 51(9), 1161-1171. https://doi.org/10.1016/j.sse.2007.07.014 (Original work published 2007)
Bol, D., Ambroise, R., Roda Neve, C., Raskin, J.-P., & Flandre, D. (2007). Wide-band simulation and characterization of digital substrate noise in SOI technology. Proccedings 2007 IEEE International SOI Conference, 133-134.
El Kaamouchi, M., Si Moussa, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2007). Zero-temperature-coefficient biasing point of 2.4-GHz LNA in PD SOI CMOS technology. 2007 European Microwave Integrated Circuits Conference, p. 303-306. https://doi.org/10.1109/EMICC.2007.4412709
Pavanello, M. A., Cerdeira, A., Raskin, J.-P., & Flandre, D. (2007). Application of Double Gate Graded-Channel SOI in MOSFET-C Balanced Structures. Proceedings of the 211th Meeting of the Electrochemical Society – ECS’07, Paper 734.
Emam, M., El Kaamouchi, M., Si Moussa, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2007). High temperature antenna switches in 130 nm SOI technology. Proccedings 2007 IEEE International SOI Conference, p. 121-122.
Valentin, R., Dubois, E., Raskin, J.-P., Dambrine, G., Larrieu, G., Breil, N., & Danneville, F. (2007). Investigation of high frequency performances for Schottky-Barrier p-MOSFET. Proceedings of the 2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, pp. 32-35. https://doi.org/10.1109/SMIC.2007.322762
Kilchytska, V., Chung, M., Vovk, Ya. N., Raskin, J.-P., & Flandre, D. (2007). True Silicon-On-Nothing MOSFETs fabricated by Si layer transfer over a pre-etched cavity. Proceedings of EUROSOI 2007, Third Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits. Published. Third Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2007), Leuven, Belgium.
Brevet
Pardoen, T., Fabrègue, D., Raskin, J.-P., André, N., & Coulombier, M. (2007). Internal stress actuated micro- and nanomachines for testing physical properties of micro- and nano-sized material samples (Patent No. PCT/BE2007/000017).
Chapitre de livre
Kilchytska, V., Levacq, D., Lederer, D., Pailloncy, G., Raskin, J.-P., & Flandre, D. (2007). Substrate effect on the output conductance frequency response of SOI MOSFETs (inited paper). In S. Hall, A.N. Nazarov, V.S. Lysenko (eds) (ed.), Nanoscaled Semiconductor-on-Insulator Structures and Devices (pp. 221-238). Kluwer Academic Publishers.
Papier de conférence
Lederer, D., Parvais, B., Mercha, A., Collaert, N., Jurczak, M., Raskin, J.-P., & Decoutere, S. (2006). Dependence of finFET RF performance on fin width. In Drayton, R.F.; (ed.), 2006 Topical Meeting on Silicon Monolithic Integrated Circuits in RFSystems (IEEE Cat. No.06EX1204) (p. 4 pp.). IEEE.
Pampin, R., Foultier, B., Moreno Hagelsieb, L., Heusdens, B., Raskin, J.-P., Destine, J., Remacle, J.-F., & Flandre, D. (2006). Insulated substrate impedance transducers: an innovative semiconductor device applied to labelled DNA sensing. Proceedings of the Nanoelectronics days (ND). Published. Nanoelectronics days (ND), Aachen (Allemagne).
Moldovan, O., Cerdeira, A., Jimenez, D., Raskin, J.-P., Kilchytska, V., Flandre, D., Collaert, N., & Iniguez, B. (2006). Compact Model of Double-Gate MOSFETs for Low Power Analog Applications. Proceedings of XXI Conference on Design of Circuits and integrated Systems (DCIS 2006). Published. XXI Conference on Design of Circuits and integrated Systems (DCIS 2006), Barcelona/Spain.
Méndez, C., De Vincenzo, P., Klapka, I., Rochus, V., Iker, F., André, N., & Raskin, J.-P. (2006). Modeling of the fabrication and operation of 3-D self assembled SOI MEMS. Proceedings of the EuroSIME 2006 – Thermal, mechanical and multi-physics simulation and experiments in micro-electronics and micro-systems, pp. 406-410. https://doi.org/10.1109/ESIME.2006.1643957
Charavel, R., & Raskin, J.-P. (2006). Underetch reduction by highly selective etching of oxide. Proceedings of the IEEE International Conference on Nano/Micro Egineered and Molecular Systems, p. Session 3E2.1-Paper 424.
Lederer, D., & Raskin, J.-P. (2006). On-wafer wideband electrical characterization: a powerful tool for improving the IC technologies. Proceedings of the 7th Diagnostics & Yield Symposium, p. Paper 21.
Lederer, D., & Raskin, J.-P. (2006). Characterization of body node in PD SOI MOSFETs using 4-port VNA measurements. 2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RFSystems (IEEE Cat No. 07EX1459C), 4 pp.
Pavanello, M. A., Cerdeira, A., Martino, J. A., Raskin, J.-P., & Flandre, D. (2006). Impact of Asymmetric Channel Configuration on the Linearity of Double-Gate SOI MOSFETs. Proceedings of the 6th International Caribbean Conference on Devices, Circuits and Systems, 187-192.
Lederer, D., Chung, T. M., Pailloncy, G., & Raskin, J.-P. (2006). On-wafer wideband characterization of advanced MOS devices. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.) Benelux Meeting, p. 17.
Moussa, M. S., Pavageau, C., Simon, P., Danneville, F., Russat, J., Fel, N., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2006). Behavior of a common source traveling wave amplifier versus temperature in SOI technology. 2005 European Microwave Conference, 4 pp.
Pardoen, T., & Raskin, J.-P. (2006). La technologie MEMS au service de l’extraction des propriétés mécaniques des matériaux aux échelles micro et nano. Proceedings of the ISTM Seminar. Published. ISTM Seminar - Maîtrise et caractérisation locale de microstructures dans les lignes d’interconnexions cuivre, ENSEEG, Grenoble, France.
Chung, T. M., Olbrechts, B., Flandre, D., Södervall, U., Bengtsson, S., & Raskin, J.-P. (2006). Planar Double-Gate SOI MOS devices by wafer bonding over pre-patterned cavities. Proceedings of the Second Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’05, pp. 111-112.
Moreno Hagelsieb, L., Foultier, B., Pampin, R., Raskin, J.-P., Remacle, J., & Flandre, D. (2006). Investigation of Al/Al2O3 interdigitated structures on Si biochips towards the elctrical detection of TP53 DNA single point mutations. Proceedings of ERBM3 Collonster, Third Focused Workshop on Electronic Recognition of Bio-molecules. Published. ERBM3 Collonster, Third Focused Workshop on Electronic Recognition of Bio-molecules, Liège (Belgium).
Charavel, R., & Raskin, J.-P. (2006). Buried mask revelation in silicon dioxide for double gate MOS fabrication. 2006 1st IEEE International Conference on Nano/Micro Engineered andMolecular Systems (IEEE Cat No. 06EX1290C), 5 pp.
Rusavsky, V. A., Vasin, A. V., Lysenko, V. S., Nazarov, A. N., Dub, S. N., André, N., & Raskin, J.-P. (2006). Structural and mechanical properties of the amorphous silicon carbide films for MEMS applications. The 5th International Conference on Amorphous & Microcrystalline Semiconductors, St. Petersburg (Russia).
Doria, R., Pavanello, M., Cerdeira, A., Raskin, J.-P., & Flandre, D. (2006). Channel Length Reduction Influence On Harmonic Distortion Of Graded-Channel Gate-All-Around Devices. Proceedings of the 21st Symposium on Microelectronics Technology and Devices - SBMicro2006, Paper B4.
Simoen, E., Claeys, C., Chung, T. M., Flandre, D., & Raskin, J.-P. (2006). Low-frequency noise behavior of graded-channel SOI n-MOSFETs. Second Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’06, Grenoble (France).
Olbrechts, B., Lejeune, B., Bertholet, Y., Pardoen, T., & Raskin, J.-P. (2006). Direct Wafer Bonding enhanced by Ductile Layers inserted near the interface. Proceedings of the 9th International Symposium on Semiconductor Wafer Bonding, Science, Technology and Application - Electrochemical Society Fall Meeting, p. Paper 1381.
Raskin, J.-P. (2006). On-wafer wideband characterization of advanced MOS technologies. 1st European Microwave Integrated Circuits Conference (IEEE Cat.No.06EX1410), 4 pp.
Charavel, R., & Raskin, J.-P. (2006). Tuning of etching rate by implantation: silicon, polysilicon and oxide. Proceedings of the 16th International Conference of Ion Implantation Technology – ITT’06, pp. 325-328. https://doi.org/10.1063/1.2401523
Lederer, D., & Raskin, J.-P. (2006). Bias effects on RF passive structures in HR Si substrates. In Drayton, R.F.; (ed.), 2006 Topical Meeting on Silicon Monolithic Integrated Circuits in RFSystems (IEEE Cat. No.06EX1204) (p. 4 pp.). IEEE.
Raskin, J.-P. (2006). Thin film transfer for the fabrication of multiple gate MOS transistors. Proceeding of the 9th International Symposium on Semiconductor Wafer Bonding, Science, Technology and Application - Electrochemical Society Fall Meeting, p. Paper 1369.
Lederer, D., Aspar, B., Laghae-Blanchard, C., & Raskin, J.-P. (2006). Performance of SOI devices transferred onto passivated HR SOI substrates using a layer transfer technique. 2006 IEEE International SOI Conference, p. 29-30. https://doi.org/10.1109/SOI.2006.284417
Moreno Hagelsieb, L., Laurent, G., Pampin, R., Flandre, D., Raskin, J.-P., Foultier, B., & Remade, J.-F. (2006). On-chip RF detection of DNA hybridization based on interdigitated Al²O³ capacitors. In Ionescu, A.M.; Declercq, M.; Leblebici, Y.; (ed.), Proceedings of ESSDERC 2006. Proceedings of the 36th European Solid-State DeviceResearch Conference (IEEE Cat. No. 06EX1346) (pp. 125-128). IEEE.
Zhang, X., Olbrechts, B., & Raskin, J.-P. (2006). An investigation on the bonding surface energy versus time in low temperature wafer bonding. Proceedings of the The 8th International Conference on Solid-State and Integrated-Circuit Technology, pp. 484-486. https://doi.org/10.1109/ICSICT.2006.306308
Lederer, D., Aspar, B., Laghaé, C., & Raskin, J.-P. (2006). Performance of RF passive structures and SOI MOSFETs transferred on a passivated HR SOI substrate. IEEE International SOI Conference, SOI’06, Niagara Falls, New York (USA).
Coulombier, M., André, N., de Longueville, V., Fabrègue, D., Gets, T., Gravier, S., Houri, S., Safi, A., Raskin, J.-P., & Pardoen, T. (2006). New multipurpose nanomechanical laboratory based on MEMS Technology. Workshop on “Nanomaterials : microstructural and mechanical characterisations, simulations”, Poitiers, France.
Poesen, G., Stiens, J., Raskin, J.-P., Vanden Bossche, M., & Vounckx, R. (2006). Transient effects in optically modulated transmission line switches. Proceedings of the International Topical Meeting on Microwave Photonics – MWP’2006, p. 4 pages - Paper W2P3. https://doi.org/10.1109/MWP.2006.346526
Pardoen, T., Fabrègue, D., Coulombier, M., André, N., & Raskin, J.-P. (2006). Micromechanical Testing Lab-on-chip for Nano-sized Materials. Proceedings of the 2006 Materials Research Society (MRS) Fall Meeting, p. EE 6.25.
Passi, V., Bolten, J., Mollenhauer, T., Wahlbrink, T., Lemme, M.-C., Kurz, H., & Raskin, J.-P. (2006). Suspended Silicon-on-Insulator Nanowires for Fabrication of Quadruple Gate MOSFET’s. Proceedings of the Workshop on Silicon Nanodevices “Beyond CMOS: Emerging Nanodevices, p. Paper 11.
Si Moussa, M., Pavageau, C., Picheta, L., Danneville, F., Russat, J., Fel, N., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2006). Design of a distributed oscillator in 130 nm SOI MOS technology. Proceedings of the 36th European Microwave Conference (IEEE Cat.No.06EX1409), 4 pp.
Si Moussa, M., El Kaamouchi, M., Wybo, G., Bens, A., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2006). Design of a distributed amplifier with on-chip ESD protection circuit in 130 nm SOI CMOS technology. 2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RFSystems (IEEE Cat No. 07EX1459C), 4 pp.
El Kaamouchi, M., Si Moussa, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2006). DTMOS low noise amplifier design in partially depleted SOI CMOS technology. 2006 IEEE International SOI Conference (IEEE Cat. No. 06CH37786), p. 127-128. https://doi.org/10.1109/SOI.2006.284468
Moreno Hagelsieb, L., Laurent, G., Foultier, B., Pampin, R., Remacle, J.-F., Raskin, J.-P., & Flandre, D. (2006). DNA hybridization electrical detection by 3 independent measurement techniques based on interdigitated Al/Al2O3 capacitors. Proceedings of the Ninth World Congress on Biosensors 2006, 380.
Charavel, R., Olbrechts, B., Passi, V., & Raskin, J.-P. (2006). Fabrication of multiple gate MOS devices for high speed and high frequency applications. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.) Benelux Meeting, p. 18.
Si Moussa, M., Pavageau, C., Picheta, L., Danneville, F., Russat, J., Fel, N., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2006). Design of distributed amplifiers and oscillators in 130 nm SOI MOS technology. In Drayton, R.F.; (ed.), 2006 Topical Meeting on Silicon Monolithic Integrated Circuits in RFSystems (IEEE Cat. No.06EX1204) (p. 4 pp.). IEEE.
Olbrechts, B., Flandre, D., & Raskin, J.-P. (2006). Thin-film SOI CMOS for heterogeneous microsystems. Proceedings of the CANEUS 2006 Conference – Micro-Nano Technologies for Aerospace Applications, 9 pages.
Gluszko, G., Lukasiak, L., Kilchytska, V., Chung, T. M., Olbrechts, B., Flandre, D., & Raskin, J.-P. (2006). Charge pumping characterization of SOI PIN diodes. Journal of Telecommunications and Information Technology, 3, 61-66. (Original work published 2007)
Pailloncy, G., & Raskin, J.-P. (2006). New de-embedding technique based on Cold-FET measurement. 1st European Microwave Integrated Circuits Conference (IEEE Cat.No.06EX1410), 4 pp.
Pardoen, T., Fabrègue, D., Coulombier, M., André, N., & Raskin, J.-P. (2006). Micromechanical Testing Lab-on-chip for Nano-sized Materials. Proceedings of the 2006 Materials Research Society (MRS) Fall Meeting. Published. 2006 Materials Research Society (MRS) Fall Meeting, Boston, MA (USA).
Iker, F., André, N., & Raskin, J.-P. (2006). Three-dimensional microsystems co-integrated with SOI-CMOS circuit technology: from MEMS to NEMS. Proceedings of the IEEE International Conference on Nano/Micro Egineered and Molecular Systems, p. Session 3E4.1-Paper 362.
Passi, V., Olbrechts, B., & Raskin, J.-P. (2006). Fabrication of a Quadruple Gate MOSFET in Silicon-on-Insulator technology. Proceedings of the Advanced Research Workshop “Nanoscaled Semiconductor-on-Insulator structures and devices, pp. 11-12.
Farhi, G., Beerens, J., Morris, D., Charlebois, S. A., & Raskin, J.-P. (2006). First Report on Self-Switching-Diodes in SOI. Proceedings of the IEEE International SOI Conference, SOI’2006, pp. 149-150. https://doi.org/10.1109/SOI.2006.284480
Pampin, R., Foultier, B., Moreno Hagelsieb, L., Heusdens, B., Raskin, J.-P., Destine, J., Remacle, J.-F., & Flandre, D. (2006). An ISFET-like innovative device applied to labeled DNA detection. Proceedings of the Third Focused Workshop on Electronic Recognition of Bio-Molecules – ERBM 3. Published. Third Focused Workshop on Electronic Recognition of Bio-Molecules – ERBM 3, University of Liège (Belgium).
El Kaamouchi, M., Si Moussa, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2006). A 2-mW power consumption low noise amplifier in PD SOI CMOS technology for 2.4 GHz applications. 2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RFSystems (IEEE Cat No. 07EX1459C), 4 pp.
Pardoen, T., Fabrègue, D., Bertholet, Y., Iker, F., Olbrechts, B., André, N., & Raskin, J.-P. (2006). Micromechanics and MeMS : a win - win story. Proceedings of the 2006 European Solid Mechanics Conference. Published. 2006 European Solid Mechanics Conference, Budapest, Hongria.
Raskin, J.-P., Iker, F., Andre, N., Olbrecht, B., Fabregue, D., Bertholet, Y., Flandre, D., & Pardoen, T. (2006). Bulk and surface micromachined SOI MEMS: from sensors to testing micromachines. Proceedings of the 4th International Society of Electrochemistry (ISE) Spring Meeting 2006, p. 63.
Raskin, J.-P., Pailloncy, G., & Lederer, D. (2006). On-wafer wideband characterization: from technology improvements to compact models for advanced MOS devices. Proceedings of the Microwave Technology and Techniques Workshop Enabling Future Space Systems, p. 6 pages (paper 30).
Fabrègue, D., André, N., Pardoen, T., Raskin, J.-P., & Coulombier, M. (2006). New internal stress driven micromachines for measuring the mechanical properties of thin films. Proceedings of the DTIP 2006, p. 189-194.
Article de journal
Iker, F., André, N., Pardoen, T., & Raskin, J.-P. (2006). Three-dimensional self-assembled sensors in thin-film SOI technology. IEEE Journal of Microelectromechanical Systems, 15(6), 1687-1697. https://doi.org/10.1109/JMEMS.2006.886002 (Original work published 2006)
Zhang, X., Olbrechts, B., & Raskin, J.-P. (2006). Oxygen plasma and warm nitric acid surface activation for low-temperature wafer bonding. Journal of the Electrochemical Society, 153(12), G1099-G1105. https://doi.org/10.1149/1.2359700 (Original work published 2006)
Jorez, S., Cornet, A., & Raskin, J.-P. (2006). MEMS profilometry by low coherence phase shifting interferometry: Effect of the light spectrum for high precision measurements. Optics Communications, 263(1), 6-11. https://doi.org/10.1016/j.optcom.2006.01.005 (Original work published 2006)
Rengel, R., González, T., Mateos, J., Pardo, D., Dambrine, G., Danneville, F., Raskin, J.-P., & Martin, M. J. (2006). An investigation of noise phenomena in fabricated fully-depleted Silicon-on-Insulator MOSFETs by means of ensemble Monte Carlo simulations. IEEE Transactions on Electron Devices, 53(3), 523-532 (March). (Original work published 2006)
Raskin, J.-P., Flandre, D., Chung, T., Kilchytska, V., & Lederer, D. (2006). Analog/RF performance of multiple gate SOI devices: Wideband simulations and characterization. IEEE Transactions on Electron Devices, 53(5), 1088-1095. https://doi.org/10.1109/TED.2006.871876 (Original work published 2006)
Olbrechts, B., Zhang, X., Bertholet, Y., Pardoen, T., & Raskin, J.-P. (2006). Effect of interfacial SiO2 thickness for low temperature O-2 plasma activated wafer bonding. Microsystem Technologies : micro and nanosystems - information storage and processing systems, 12(5), 383-390. https://doi.org/10.1007/s00542-005-0038-2 (Original work published 2006)
Charavel, R., & Raskin, J.-P. (2006). Etch rate modification of SiO2 by ion damage. Electrochemical and Solid-State Letters, 9(7), G245-G247. https://doi.org/10.1149/1.2200307 (Original work published 2006)
Chung, T. M., & Raskin, J.-P. (2006). DC and AC analyses of novel SOI MOSFET devices using 2-D and 3-D numerical simulations. International Journal of Nanoscience, 5(4-5), 639-644 (May). https://doi.org/10.1142/S0219581X06004917 (Original work published 2006)
Olbrechts, B., Södervall, U., Bengtsson, S., & Raskin, J.-P. (2006). Wafer bonding techniques for DG MOSFET fabrication. ECS Transactions, 3(6), 47-58. (Original work published 2006)
Doria, R. T., Pavanello, M. A., Cerdeira, A., Raskin, J.-P., & Flandre, D. (2006). Channel Length Reduction Influence on Harmonic Distortion of Graded-Channel Gate-All-Around Devices. Electrochemical Society. Transactions, 4(1), 247-256. https://doi.org/10.1149/1.2813497 (Original work published 2006)
Rengel, R., Martin, M., Gonzalez, T., Mateos, J., Pardo, D., Dambrine, G., Raskin, J.-P., & Danneville, F. (2006). A microscopic interpretation of the RF noise performance of fabricated FDSOI MOSFETs. IEEE Transactions on Electron Devices, 53(3), 523-532. https://doi.org/10.1109/TED.2005.863541 (Original work published 2006)
Si Moussa, M., Pavageau, C., Simon, P., Danneville, F., Russat, J., Fel, N., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2006). Behavior of a traveling-wave amplifier versus temperature in SOI technology. IEEE Transactions on Microwave Theory and Techniques, 54(6), 2675-2683. https://doi.org/10.1109/TMTT.2006.872950 (Original work published 2006)
Si Moussa, M., Pavageau, C., Lederer, D., Picheta, L., Danneville, F., Raskin, J.-P., Fel, N., Russat, J., & Vanhoenacker-Janvier, D. (2006). An investigation of high temperature effects on CPW and MSL on SOI substrate for RF applications. Solid-State Electronics, 50(12), 1822-1827. (Original work published 2006)
Si Moussa, M., Pavageau, C., Lederer, D., Picheta, L., Danneville, F., Raskin, J.-P., Fel, N., Russat, J., & Vanhoenacker-Janvier, D. (2006). Behaviour of TFMS and CPW line on SOI substrate versus high temperature for RF applications. Solid-State Electronics, 50(11-12), 1822-1827. https://doi.org/10.1016/j.sse.2006.10.008 (Original work published 2006)
Simoen, E., Claeys, C., Chung, T. M., Flandre, D., Pavanello, M. A., Martino, J. A., & Raskin, J.-P. (2006). Low-frequency noise behaviour of graded-channel SOI nMOSFETs. Solid-State Electronics, 51(2), 260-267. https://doi.org/10.1016/j.sse.2004.01.003 (Original work published 2007)
Olbrechts, B., Lejeune, B., Bertholet, Y., Pardoen, T., & Raskin, J.-P. (2006). Direct Wafer Bonding enhanced by Ductile Layers inserted near the interface. Electrochemical Society. Transactions, 3(6), 279-289. https://doi.org/10.1149/1.2357078 (Original work published 2006)
Chapitre de livre
Pampin, R., Foultier, B., Raskin, J.-P., Remacle, J., & Flandre, D. (2006). DNA Analytical CMOS Systems-on-a-Chip. In American Scientific Publishers (ed.), Encyclopedia of Sensors (p. p. 395-412). C.A.Grimes, E.C.Dickey, and M.V.Pishko.
Monographie
Laconte, J., Flandre, D., & Raskin, J.-P. (2006). Micromachined thin-film sensors for SOI-CMOS co-integration. Springer.
Article de journal
Kilchytska, V., Flandre, D., Lederer, D., Collaert, N., & Raskin, J.-P. (2005). Accurate effective mobility extraction by split C-V technique in SOI MOSFETs: Suppression of the influence of floating-body effects. IEEE Electron Device Letters, 26(10), 749-751. https://doi.org/10.1109/LED.2005.855408 (Original work published 2005)
Kranti, A., Flandre, D., Chung, T., & Raskin, J.-P. (2005). Analysis of quasi double gate method for performance prediction of deep submicron double gate SOI MOSFETs. Semiconductor Science and Technology, 20(5), 423-429. https://doi.org/10.1088/0268-1242/20/5/017 (Original work published 2005)
Kranti, A., Chung, T., & Raskin, J.-P. (2005). Analysis of static and dynamic performance of short-channel double-gate silicon-on-insulator metal-oxide-semiconductor field-effect transistors for improved cutoff frequency. Japanese Journal of Applied Physics. Part 2, Letters & Express Lettres, 44(4B), 2340-2346. https://doi.org/10.1143/JJAP.44.2340 (Original work published 2005)
Kranti, A., Chung, T. M., & Raskin, J.-P. (2005). Gate length scaling and microwave performance of double gate nanotransistors. International Journal of Nanoscience, 4(5-6), 1021-1024. https://doi.org/10.1142/S0219581X05004005 (Original work published 2005)
Zhang, X., & Raskin, J.-P. (2005). Low-temperature wafer bonding: A study of void formation and influence on bonding strength. IEEE Journal of Microelectromechanical Systems, 14(2), 368-382. https://doi.org/10.1109/JMEMS.2004.839027 (Original work published 2005)
Pavanello, M. A., Flandre, D., Martino, J. A., & Raskin, J.-P. (2005). High performance analog operation of double gate transistors with the graded-channel architecture at low temperatures. Solid-State Electronics, 49(10), 1569-1575. https://doi.org/10.1016/j.sse.2005.08.005 (Original work published 2005)
Jorez, S., Laconte, J., Cornet, A., & Raskin, J.-P. (2005). Low-cost optical instrumentation for thermal characterization of MEMS. Measurement Science and Technology, 16(9), 1833-1840. https://doi.org/10.1088/0957-0233/16/9/016 (Original work published 2005)
Eggermont, J.-P., Flandre, D., Raskin, J.-P., & Colinge, J.-P. (2005). Potential and modeling of 1-mM SOI CMOS operational transconductance amplifiers for applications up to 1 GHz. IEEE Journal of Solid State Circuits, 33(4), 640-646 (April). (Original work published 2005)
Parvais, B., Pallandre, A., Jonas, A., & Raskin, J.-P. (2005). Liquid and vapor phase silanes coating for the release of thin film MEMS. IEEE Transactions on Device and Materials Reliability, 5(2), 250-254. https://doi.org/10.1109/TDMR.2005.846976 (Original work published 2005)
Lederer, D., Flandre, D., & Raskin, J.-P. (2005). High frequency degradation of body-contacted PD SOI MOSFET output conductance. Semiconductor Science and Technology, 20(5), 469-472. https://doi.org/10.1088/0268-1242/20/5/025 (Original work published 2005)
Zhang, X., & Raskin, J.-P. (2005). Extended low-temperature plasma-assisted bonding enhances wafer bonding strength uniformity. MRS Bulletin, 30(Issue 10), 688-689. https://doi.org/10.1557/mrs2005.215 (Original work published 2005)
Zhang, X., & Raskin, J.-P. (2005). A dynamic study for wafer-level bonding strength uniformity in low-temperature wafer bonding. Electrochemical and Solid-State Letters, 8(10), G268-G270. https://doi.org/10.1149/1.2012288 (Original work published 2005)
Zhang, X. X., & Raskin, J.-P. (2005). A dynamic study for wafer-level bonding strength uniformity in low temperature wafer bonding. Electrochemical and Solid-State Letters, 8(10), G268-G270 (October). (Original work published 2005)
Lederer, D., & Raskin, J.-P. (2005). Effective resistivity of fully-processed SOI substrates. Solid-State Electronics, 49(3), 491-496. https://doi.org/10.1016/j.sse.2004.12.003 (Original work published 2005)
Iker, F., André, N., Pardoen, T., & Raskin, J.-P. (2005). One-mask CMOS compatible process for the fabrication of three-dimensional self-assembled thin-film SOI microelectromechanical systems. Electrochemical and Solid-State Letters, 8(10), H87-H89. https://doi.org/10.1149/1.2030488 (Original work published 2005)
Dehan, M., & Raskin, J.-P. (2005). Dynamic threshold voltage MOS in partially depleted SOI technology: a wide frequency band analysis. Solid-State Electronics, 49(1), 67-72. https://doi.org/10.1016/j.sse.2004.07.003 (Original work published 2005)
Laurent, G., Raskin, J.-P., & Huynen, I. (2005). Solutions for an electrical DNA detection. Belgian Journal of Electronics and Communications (Revue HF Tijdschrift), 1, 67-68. (Original work published 2005)
Pavanello, M. A., Martino, J. A., Raskin, J.-P., & Flandre, D. (2005). Analysis on the improved analog performance on double gate transistors by using the graded-channel architecture in a wide temperature range. Solid-State Electronics, Elsevier Science, Pergamon, 49(10), 1569-1575 (October). (Original work published 2005)
Si Moussa, M., Pavageau, C., Danneville, F., Russat, J., Fel, N., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2005). Behavior of a common source traveling wave amplifier versus temperature in SOI technology. European Microwave Association. Proceedings, 1, 288-292. (Original work published 2005)
Parvais, B., Cerdeira, A., Schreurs, D., & Raskin, J.-P. (2005). Non-linear performance comparison for FD and PD SOI MOSFETs based on the integral function method and Volterra modelling. International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, 18(4), 283-296. https://doi.org/10.1002/jnm.578 (Original work published 2005)
Ivanov, P., Laconte, J., Raskin, J.-P., Stankova, M., Sotter, E., Llobet, E., Vilanova, X., Flandre, D., & Correig, X. (2005). SOI-CMOS compatible low-power gas sensor using sputtered and drop-coated metal-oxide active layers. Microsystem Technologies : micro and nanosystems - information storage and processing systems, 12(1-2), 160-168. https://doi.org/10.1007/s00542-005-0003-0 (Original work published 2005)
Lederer, D., & Raskin, J.-P. (2005). New substrate passivation method dedicated to HR SOI wafer fabrication with increased substrate resistivity. IEEE Electron Device Letters, 26(11), 805-807. https://doi.org/10.1109/LED.2005.857730 (Original work published 2005)
Papier de conférence
Kilchytska, V., Lederer, D., Simon, P., Collaert, N., Raskin, J.-P., & Flandre, D. (2005). Revised split C-V technique for mobility investigation in advanced devices. 2005 IEEE International SOI Conference (QSIC 2005) (IEEE Cat. No.05CH37694), 110-111.
Moreno-Hagelsieb, L., Pampin, R., Laurent, G., Raskin, J.-P., Flandre, D., Foultier, B., & Remacle, J. (2005). DNA Electrical Detection Based On Si-CMOS Compatible Al Capacitors and Inductors Coated With Metal Oxides (Concentrations lower than 1 nM). Second Focused Workshop on Electronic Recognition of Bio-molecules, Beckman Institute for Advanced Science and Technology, University of Illinois in Urbana, Illinois (USA).
Chung, T. M., Kranti, A., & Raskin, J.-P. (2005). 3-D simulations of multigate SOI MOSFETs in static and dynamic regimes. Proceedings of the First Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’05, pp. 73-74.
Charavel, R., & Raskin, J.-P. (2005). Self alignment method by buried mask implantation for double gate MOS and nano devices fabrication. Belgian Journal of Electronics and Communications (Revue HF Tijdschrift), 57-58.
Olbrechts, B., Castadot, C., Laconte, J., Flandre, D., & Raskin, J.-P. (2005). SOI-CMOS technology for Thin Film Sensors on Membranes. Proceedings of the 5th Round Table on Micro/Nano Technologies for Space (ESTEC 2005), 213-219.
Méndez, C., De Vincenzo, P., Klapka, I., Rochus, V., Iker, F., André, N., & Raskin, J.-P. (2005). 3-D self assembled SOI MEMS: fabrication and numerical simulation. 5th ESA Micro and Nanotechnologies Round Table, 238-244.
Pavageau, C., Si Moussa, M., Siligaris, A., Picheta, L., Danneville, F., Raskin, J.-P., Vanhoenacker-Janvier, D., & et al. (2005). Low power 23-GHz and 27-GHz distributed cascode amplifiers in a standard 120 nm SOI CMOS process. Proceedings of the International Microwave Symposium – IMS 2005, p. 4 pages.
Lederer, D., Collaert, N., & Raskin, J.-P. (2005). FinFET characterization up to 110 GHz. Belgian Journal of Electronics and Communications (Revue HF Tijdschrift), 52-53.
Lederer, D., & Raskin, J.-P. (2005). Couplage en surface dans des substrats de silicium de haute résistivité. Proceedings des Journées Nationales Microondes - JNM′2005, p. Paper 4D9.
Flandre, D., Moreno Hagelsieb, L., Pampin, R., Laurent, G., Raskin, J.-P., Foultier, B., & Remacle, J. (2005). DNA analytical CMOS-compatible capacitive systems. Proceedings of the Fifth Belgian Day On Biomedical Engineering, 19-23.
Lederer, D., Kilchytska, V., Rudenko, T., Collaert, N., Flandre, D., Dixit, A., De Meyer, K., & Raskin, J.-P. (2005). FinFET analog characterization from DC to 110 GHz. Proceedings of the First Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2005), p. 99-100. https://doi.org/10.1016/j.sse.2005.07.011
Iker, F., André, N., Pardoen, T., & Raskin, J.-P. (2005). New on-chip testing method for ultra thin metallic films. Proceedings of the Euromech Colloquium 463 - Size dependent mechanics of materials, p. Poster 5.
Raskin, J.-P., Dixit, A., Collaert, N., Rudenko, T., Chung, T. M., Flandre, D., Kilchytska, V., & Lederer, D. (2005). FinFET: a mature multi-gate MOS technology ? A wideband transistor simulation and characterization approach. Proceedings of the SINANO Workshop 2005, Paper n° 5, 21 pages.
Chung, T. M., Kranti, A., & Raskin, J.-P. (2005). 2-D and 3-D wideband simulations of multi-gate SOI MOSFETs. Proceedings of the 6th European Conference on ULtimate Integration of Silicon - ULIS’05, pp. 83-86.
Moreno Hagelsieb, L., Pampin, R., Laurent, G., Raskin, J.-P., Poleunis, C., Bertrand, P., Flandre, D., Foultier, B., & Remacle, J. (2005). Investigation of the Electrical Detection of hybridized DNA Concentrations lower Than 1 nM, based On CMOS Compatible Al Capacitors Coated With Metal Oxides. Proceedings of the 2nd ERBM Workshop. Published. 2nd ERBM Workshop, Urbana-Champaign University (USA).
Iker, F., Si Moussa, M., André, N., Pardoen, T., & Raskin, J.-P. (2005). CMOS compatible 2-D self-assembled MEMS in thin film SOI technology. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), p. 59.
Si Moussa, M., Pavageau, C., Lederer, D., Picheta, L., Danneville, F., Russat, J., Fel, N., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2005). An investigation of temperature effects on CPW and MSL on SOI substrate for RF applications. 2005 IEEE International SOI Conference (QSIC 2005) (IEEE Cat. No.05CH37694), p. 70-71.
Iker, F., André, N., Proost, J., Pardoen, T., & Raskin, J.-P. (2005). Fabrication and modeling of 3-D self-assembled SOI MEMS using plasticity features. Proceedings, p. 459-462.
Chung, T. M., & Raskin, J.-P. (2005). 3-D numerical simulations of multi-gate MOSFETs. Belgian Journal of Electronics and Communications (Revue HF Tijdschrift), 55-56.
Bertholet, Y., Raskin, J.-P., & Pardoen, T. (2005). Cohesive zone based modelling of Si/Si and SiO2/SiO2 interfaces in the presence of ductile interlayers. Proceedings of ICH11, p. 5087.
Chung, T. M., & Raskin, J.-P. (2005). DC and AC analyses of novel SOI MOSFET devices using 2-D and 3-D numerical simulations. Proceedings of the ”, 3rd International Conference on Materials for Advanced Technologies – ICMAT 2005 and 9th International Conference on Advanced Materials (ICAM 2005), p. Paper G-6-P063.
Si Moussa, M., Pavageau, C., Danneville, F., Russat, J., Fel, N., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2005). Temperature effect on the performance of a traveling wave amplifier in 130 nm SOI technology. In Jerng, A.; (ed.), 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium (IEEECat. No. 05CH37652) (p. p. 495-498). IEEE.
Kilchytska, V., Lederer, D., Simon, P., Collaert, N., Raskin, J.-P., & Flandre, D. (2005). Revised Split C-V Technique for Mobility Investigation in Advanced Devices. In IEEE (ed.), Proceedings of the 2005 IEEE International SOI Conference (pp. 110-111). IEEE. https://doi.org/10.1109/SOI.2005.1563555
Lederer, D., Rozeau, O., & Raskin, J.-P. (2005). Wideband characterization of body-accessed PD SOI MOSFETs with multiport measurements. 2005 IEEE International SOI Conference (QSIC 2005) (IEEE Cat. No.05CH37694), p. 65-66.
Raskin, J.-P. (2005). Wideband characterization and simulation of advanced MOS devices for RF applications. 35th European Microwave Week – 13th GAAS Symposium, 109-112.
Si Moussa, M., Pavageau, C., Danneville, F., Russat, J., Fel, N., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2005). Design of a traveling wave amplifier in 0.13 µm partially depleted SOI. Proceedings of the First Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’05, pp. 143-144.
Flandre, D., Laconte, J., Levacq, D., Afzalian, A., Rue, B., Renaux, C., Iker, F., Olbrechts, B., André, N., & Raskin, J.-P. (2005). SOI CMOS and MEMS for single-chip high-temperature microsystems. Proceedings of the 2005 International Conference on High Temperature Electronics (HITEN 2005), p. Paper n°1.
Iker, F., André, N., Proost, J., Pardoen, T., & Raskin, J.-P. (2005). Fabrication and modeling of 3-D self-assembled SOI MEMS controlled by thermal and plastic strains. Proceedings of MEMS 2005, p. 459-462.
Kilchytska, V., Rudenko, T., Collaert, N., Rooyackers, R., Jurczak, M., Raskin, J.-P., & Flandre, D. (2005). Mobility characterization in FinFETs using split C-V technique. Proceedings of the 6th International Conference on Ultimate integration of Silicon (ULIS 2005), 117-120.
Pavaganau, C., Si Moussa, M., Siligaris, A., Picheta, L., Danneville, F., Raskin, J.-P., Vanhoenacker-Janvier, D., & et al. (2005). Amplificateur distribué en bande K avec technologie CMOS SOI 130 nm. Proceedings des Journées Nationales Microondes - JNM′2005, p. Paper 1C4.
Bertholet, Y., Raskin, J.-P., & Pardoen, T. (2005). Influence of a ductile interlayer on the toughness of hydrophilic wafer bonding. Proceedings of the Eighth International Symposium on Semiconductor Wafer Bonding; science, technology, p. 264-269.
André, N., Iker, F., Jorez, S., & Raskin, J.-P. (2005). CMOS compatible 3D flow and thermal sensors in SOI technology. 2005 IEEE Sensors (IEEE Cat. No.05CH37665C), 4 pp.
Passi, V., & Raskin, J.-P. (2005). Wideband characteristics of multigates MOS devices. The Thirteenth International Workshop on the Physics of Semiconductor Devices - IWPSD-2005, paper 122.
Huynen, I., Saib, A., Laurent, G., Raskin, J.-P., Dardenne, X., & Craeye, C. (2005). Research at UCL in the field of metamaterials for planar circuit and antenna applications. Proceedings of the First Workshop of the METAMORPHOSE Network of Excellence (Metamaterials organised for radio, millimeter wave and photonic superlattice engineering, p. 5 pages (paper 3).
Chapitre de livre
Lederer, D., & Raskin, J.-P. (2005). Temperature dependence of RF losses in HR SOI substrates. In Flandre D., Nazarov A.N., Hemment P.L.F. (ed.), Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environmen (1st ed., p. p. 192-196). Kluwer Academic Publ. -NATO Science Series Elsevier.
Papier de conférence
Parvais, B., Cerdeira, A., Schreurs, D., & Raskin, J.-P. (2004). Nonlinear performance comparison for FD and PD SOI MOSFETs based on the Integral Function Method and Volterra modeling. Proceedings of the MOS-AK/ESSCIRC Compact Modeling Workshop, p. 19 pages.
Kilchytska, V., Collaert, N., Rooyackers, R., Lederer, D., Raskin, J.-P., & Flandre, D. (2004). Perspective of FinFETs for analog applications. Proceedings of the 34rd European Solid-State Device Research Conference (ESSDERC 2004), 65-68. https://doi.org/10.1109/ESSDER.2004.1356489
Iker, F., Si Moussa, M., André, N., Pardoen, T., & Raskin, J.-P. (2004). CMOS compatible 2-D self-assembled MEMS in thin film SOI technology. Proceedings, p. 66.
Moreno Hagelsieb, L., Foultier, B., Laurent, G., Poleunis, C., Bertrand, P., Raskin, J.-P., Remacle, J., & Flandre, D. (2004). Aluminium anodizing process characterization for DNA attachment and electrical detection. In Thomas Laurell (ed.), Proceedings of [Mu]TAS 2004 8th International Conference on Miniaturized Systems for Chemistry and Life Sciences, Malmö, Sweden, September 26-30, 2004 (pp. 395-397). RSC.
Kranti, A., Chung, T. M., & Raskin, J.-P. (2004). Double gate SOI MOSFET – Considerations for improved cut-off frequency. Proceedings of the International Conference on Solid-State Devices and Materials – SSDM’2004, pp. 784-785.
Lederer, D., & Raskin, J.-P. (2004). Temperature dependence of RF losses in HR SOI substrates. NATO Advanced Research Workshop, Science and Technology of Semiconductor-on-Insulator structures and devices operating in a harsh environment, 56-57.
Danneville, F., Pailloncy, G., Iniguez, B., Raskin, J.-P., & Dambrine, G. (2004). Noise modeling and performance of SOI MOSFETs. Proceedings of the IEEE MTT-S International Microwave Symposium – Workshop on high frequency noise in advanced Silicon-based devices: from basics to state-of-the-art device and circuit performances, p. Paper WSN2.
Vanhoenacker-Janvier, D., Lederer, D., Raskin, J.-P., & Dehan, M. (2004). Characterization and optimization of passive microwave devices integrated on Silicon-on-Insulator. Proceedings of the Asia-Pacific Microwave Conference (AMPC), p. 4 pages (paper APMC/04/1/308).
Denef, N., Moreno Hagelsieb, L., Laurent, G., Pampin, R., Foultier, B., Remacle, B., Flandre, D., & Raskin, J.-P. (2004). RF detection of DNA based on CMOS inductive and capacitive sensors. Conference Proceedings. 34th European Microwave Conference (IEEE Cat.No.04EX963), Vol. 2, p. 669-72.
Parvais, B., Delatte, P., Matsuhashi, H., Ichikawa, F., Simon, P., Schreurs, D., Flandre, D., & Raskin, J.-P. (2004). Small- and Large-Signal RF Characterization of Fully-Depleted Accumulation-mode Varactors for Low-Voltage LC-VCO SOI Design. In IEEE (ed.), Proceedings of the 2004 IEEE International SOI Conference (pp. 168-170). IEEE. https://doi.org/10.1109/SOI.2004.1391602
Pailloncy, G., Iniguez, B., Dambrine, G., Dehan, M., Raskin, J.-P., & et al. (2004). Noise Modeling and Performance in 0.15 µm Fully Depleted SOI MOSFET. Proceedings of SPIE vol. 5470, Noise in Devices and Circuits II, pp. 122-130.
Ivanov, P. T., Laconte, J., Raskin, J.-P., Stankova, M., Sotter, E., Llobet, E., Vilanova, X., Flandre, D., & Correig, X. (2004). SOI-CMOS compatible low-power gas sensor using sputtered and drop-coated metal-oxide active layers. Proceedings of the Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2004), 160-168.
Huynen, I., Saib, A., Laurent, G., Raskin, J.-P., Dardenne, X., & Craeye, C. (2004). Research at UCL in the field of metamaterials for planar circuit and antenna applications. Proceedings of the 1st Workshop of the Metamorphose Network of Excellence, p. 5.
Huynen, I., Saib, A., Raskin, J.-P., Dardenne, X., & Craeye, C. (2004). Periodic metamaterials combining ferromagnetic dielectric and/or metallic structures for planar circuits applications. Proceedings of the Bianisotropics 2004 – 10th Conference on Complex Media and Metamaterials, pp. 212-219.
Poesen, G., Koers, G., Raskin, J.-P., Huynen, I., De Raedt, W., Stiens, J., & Vounckx, R. (2004). Models for opto-electronic controlled coplanar waveguides on high resistive BCB coated Si substrates technology up to 110 GHz. Proceedings of the Nefertiti Summer School Optical Architectures for RF signal processing and signal mixing, p. Paper 18.
Bertholet, Y., Zhang, X. X., Raskin, J.-P., & Pardoen, T. (2004). Steady-state measurement of fracture energy in wafer bonding. Proceeedings of the 27th Annual Meeting of The Adhesion Society - From Molecules and Mechanics to Optimization and Design of Adhesives Joints, p. 438-440.
Laconte, J., Iker, F., André, N., Pardoen, T., Proost, J., Flandre, D., & Raskin, J.-P. (2004). Thin films stress extraction using micromachined structures and wafer curvature measurements. Proceedings of the Workshop on advanced microelectronics materials, Materials for Advanced Metallization (MAM 2004), paper 03.2.
Denef, N., Moreno Hagelsieb, L., Laurent, G., Foultier, B., Remacle, J., Flandre, D., & Raskin, J.-P. (2004). RF detection of DNA based on CMOS inductive and capacitive sensors. Proceedings of the 34th European Microwave Week 2004 (EuMC 2004), 669-672.
Charavel, R., & Raskin, J.-P. (2004). Self alignment method by buried mask implantation for Double Gate MOS fabrication and nano devices fabrication. Proceedings of SPIE - Optical Science, Sensors and Systems Technology, Architecture, Applications, pp. 362-372.
Flandre, D., Pampin, R., Hagelsieb, L. M., Laurent, G., Raskin, J.-P., Foultier, B., & Remacle, J. (2004). On-chip DNA electrical detection based on Si-CMOS compatible Al capacitors and inductors coated with metal oxides. Proceedings of the The First Focused Workshop on Electronic Recognition of DNA Molecules, 36 pages.
Raskin, J.-P. (2004). Micromachining techniques for millimeter-wave devices and integrated sensors. Proceedings of the Nefertiti Summer School Optical Architectures for RF signal processing and signal mixing, p. 46 pages.
Flandre, D., Laconte, J., Levacq, D., Afzalian, A., Rue, B., Renaux, C., Iker, F., Olbrechts, B., André, N., & Raskin, J.-P. (2004). SOI technology for single-chip harsh environment microsystems. Proceedings of the Conference on Micro-Nano-Technologies for Aerospace Applications (CANEUS 2004), 157-169.
Lederer, D., Lobet, R., & Raskin, J.-P. (2004). Enhanced high resistivity SOI wafers for RF applications. Proceedings of the 2004 IEEE International SOI Conference, pp. 46-47. https://doi.org/10.1109/SOI.2004.1391549
Kranti, A., & Raskin, J.-P. (2004). Double gate MOSFET devices for analog microwave applications. Proceedings of the Asia-Pacific Microwave Conference (AMPC), p. 4 pages (paper APMC/04/1/502).
Bertholet, Y., Iker, F., Zhang, X. X., Raskin, J.-P., & Pardoen, T. (2004). Steady-state measurement of the interface fracture resistance in wafer bonding. Proceedings of the 15th European Conference of Fracture. Published. 15th European Conference of Fracture, Stockholm, Sweden.
Laconte, J., Rue, B., Raskin, J.-P., & Flandre, D. (2004). Fully CMOS-SOI Compatible Low-Power Directional Flow Sensor. In IEEE, TU Vienna (ed.), Proceedings of the Third IEEE International Conference on Sensors 2004 (pp. 864-867). IEEE. https://doi.org/10.1109/ICSENS.2004.1426307
Laconte, J., Rue, B., Raskin, J.-P., & Flandre, D. (2004). Fully CMOS-SOI compatible low-power directional flow sensor. In Rocha, D.; Sarro, P.M.; Vellekoop, M.J.; (ed.), Proceedings of the IEEE Sensors 2004 (IEEE Cat. No.04CH37603) (p. Vol. 2, p. 864-7). IEEE.
Olbrechts, B., Bertholet, Y., Pardoen, T., & Raskin, J.-P. (2004). Direct wafer bonding issues : surface activation, high and low temperature annealing and insertion of a ductile layer for absorbing constraints. Proceedings of the Workshop on Wafer Bonding for MEMS Technologies, p. 25-26.
Iker, F., Si Moussa, M., André, N., Pardoen, T., & Raskin, J.-P. (2004). CMOS compatible 3-D self assembled microstructures using thin film SOI technology. In Rocha, D.; Sarro, P.M.; Vellekoop, M.J.; (ed.), Proceedings of the IEEE Sensors 2004 (IEEE Cat. No.04CH37603) (p. Vol. 3, p. 1113-16). IEEE.
Pailloncy, G., Iniguez, B., Dambrine, G., Dehan, M., Raskin, J.-P., & et al. (2004). Modélisation de bruit et performances de MOSFETs SOI totalement désertés. Proceedings of the Workshop action spécifique bruit – Bruit en régime linéaire et non-linéaire dans les composants et circuits de télécommunications, pp. 27-28.
Parvais, B., & Raskin, J.-P. (2004). Analytical expressions for distorsion of SOI MOSFETs using the Volterra series. Proceedings of the The European Gallium Arsenide and other Compound Semicondutors Application Symposium (GAAS) as part of the European Microwave Week 2004, pp. 223-226.
Davanzzo Gomes dos Santos, C., Pavanello, M. A., Martino, J. A., Flandre, D., & Raskin, J.-P. (2004). Behaviour of Graded Channel SOI Gate-All-Around NMOSFET Devices at High Temperatures. In Santos E.J.P., Ribas R.P., Swart J. Eds. (ed.), Proceedings of the Nineteenth International Symposium on Microelectronics Technology and Devices (SBMICRO 2004) (pp. 9-14). The Electrochemical Society (ECS).
Bertholet, Y., Iker, F., Zhang, X. X., Raskin, J.-P., & Pardoen, T. (2004). Fracture resistance of interfaces in bonded silicon wafers. Proceedings of the 15th European Conference of Fracture, p. Paper ECF15, 9 pages.
Parvais, B., Cerdeira, A., & Raskin, J.-P. (2004). Application of integral function method for distortion analysis of microwave transistors. Proceedings of the Asia-Pacific Microwave Conference (AMPC), p. 4 pages (paper APMC/04/1/174).
Koers, G., Stiens, J., Poesen, G., Simon, P., Raskin, J.-P., Huynen, I., De Raedt, W., & Vounckx, R. (2004). Optical Modulation of CPW lines on High Resistive BCB coated Si substrates up to 110 GHz. Proceedings of the Workshop Microwave Photonics, p. paper 16.
Laurent, G., Raskin, J.-P., & Huynen, I. (2004). Solutions for an electrical DNA detection. Proceedings of the URSI Forum 2004, pp. 74-75.
Stiens, J., Poesen, G., Koers, G., Simon, P., Raskin, J.-P., Huynen, I., & Vounckx, R. (2004). Opto-electronic control of coplanar transmission lines up to 110 GHz. SPIE Proceedings 5466, Microwave and Terahertz Photonics, pp. 101-108.
Article de journal
Lederer, D., Flandre, D., & Raskin, J.-P. (2004). AC behavior of gate-induced floating body effects in ultrathin oxide PD SOI MOSFETs. IEEE Electron Device Letters, 25(2), 104-106. https://doi.org/10.1109/LED.2003.822658 (Original work published 2004)
Bertholet, Y., Iker, F., Raskin, J.-P., & Pardoen, T. (2004). Steady-state measurement of wafer bonding cracking resistance. Sensors and Actuators A: Physical : an international journal devoted to research and development of physical and chemical transducers, 110(1-3), 157-163. https://doi.org/10.1016/j.sna.2003.09.004 (Original work published 2004)
Pailloncy, G., Iniguez, B., Dambrine, G., Raskin, J.-P., & Danneville, F. (2004). Noise modeling in fully depleted SOI MOSFETs. Solid-State Electronics, 48(5), 813-825. https://doi.org/10.1016/j.sse.2003.12.032 (Original work published 2004)
Laconte, J., Dupont, C., Flandre, D., & Raskin, J.-P. (2004). SOI CMOS compatible low-power microheater optimization for the fabrication of smart gas sensors. IEEE Sensors Journal, 4(5), 670-680. https://doi.org/10.1109/JSEN.2004.833516 (Original work published 2004)
Zhang, X., & Raskin, J.-P. (2004). Low-temperature wafer bonding optimal O-2 plasma surface pretreatment time. Electrochemical and Solid-State Letters, 7(8), G172-G174. https://doi.org/10.1149/1.1763793 (Original work published 2004)
Kranti, A., Flandre, D., Chung, T. M., & Raskin, J.-P. (2004). Laterally asymmetric channel engineering in fully depleted double gate SOI MOSFETs for high performance analog applications. Solid-State Electronics, 48(6), 947-959. https://doi.org/10.1016/j.sse.2003.12.014 (Original work published 2004)
Pailloncy, G., Raynaud, C., Vanmackelberg, M., Danneville, F., Lepilliet, S., Raskin, J.-P., & Dambrine, G. (2004). Impact of downscaling on high-frequency noise performance of bulk and SOI MOSFETs. IEEE Transactions on Electron Devices, 51(10), 1605-1612. https://doi.org/10.1109/TED.2004.834902 (Original work published 2004)
Zhang, X., & Raskin, J.-P. (2004). Investigation on the uniformity of surface energy in silicon direct-bonding technique. Journal of the Electrochemical Society, 151(9), G568-G573. https://doi.org/10.1149/1.1775221 (Original work published 2004)
Laconte, J., Iker, F., Jorez, S., André, N., Proost, J., Pardoen, T., Flandre, D., & Raskin, J.-P. (2004). Thin films stress extraction using micromachined structures and wafer curvature measurements. Microelectronic Engineering, 76(1-4), 219-226. https://doi.org/10.1016/j.mee.2004.07.003 (Original work published 2004)
Parvais, B., & Raskin, J.-P. (2004). Integral Function Method for the Analysis of Harmonic Distortion of SOI MOSFETS. Belgian Journal of Electronics & Communications, 2, 9-11. (Original work published 2004)
Papier de conférence
Rengel, R., Mateos, J., Pardo, D., Gonzalez, T., Martin, M. J., Dambrine, G., Danneville, F., & Raskin, J.-P. (2003). High-Frequency noise in FDSOI MOSFETs: a Monte Carlo investigation. In edited by M. Jamal Deen, Zeynep Çelik-Butler, Michael A. Levinshtein (ed.), Proceedings of SPIE vol. 5113 Noise in Devices and Circuits (p. pp. 379-386).
Lederer, D., Dehan, M., Vanhoenacker-Janvier, D., Flandre, D., & Raskin, J.-P. (2003). Frequency degradation of SOI MOS device output conductance. Proceedings of the 2003 IEEE International SOI Conference, 76-77. https://doi.org/10.1109/SOI.2003.1242905
Kilchytska, V., Chung, T. M., van Meer, H., De Meyer, K., Raskin, J.-P., & Flandre, D. (2003). Investigation of charge control related performances in double-gate SOI MOSFETs. Proceedings of the 11th International Symposium Silicon-on-Insulator Technology and Devices, 225-230.
Levacq, D., Dehan, M., Flandre, D., & Raskin, J.-P. (2003). Figures-of-Merit Of Intrinsic, Standard-Doped And Graded-Channel SOI And SOS MOSFETs For Analog Baseband And RF Applications. Proceedings of the ECS 11th International Symposium on SOI Technology and Devices, 295-300.
Lederer, D., Dehan, M., Vanhoenacker-Janvier, D., Flandre, D., & Raskin, J.-P. (2003). Frequency degradation of SOI MOS device output conductance. 2003 IEEE International SOI Conference. Proceedings (Cat. No.03CH37443), 76-77.
Lederer, D., & Raskin, J.-P. (2003). AC analysis of floating body effects in PD SOI MOSFETs. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), pp. 46-47.
Laurent, G., Moreno Hagelsieb, L., Lederer, D., Lobert, P. E., Flandre, D., Remacle, J.-F., & Raskin, J.-P. (2003). DNA electrical detection based on inductor resonance frequency in standard CMOS technology. In Franca, J.; Freitas, P. (ed.), Proceedings of the 29th European Solid-State Device Research (ESSDERC ’03) (pp. 171-174). IEEE. https://doi.org/10.1109/ESSCIRC.2003.1257141
Kranti, A., Chung, T. M., & Raskin, J.-P. (2003). Gate length scaling and microwave performance of double gate nano-transistors. Proceedings of the International Conference on Nano Science and Technology (ICONSAT 2003), pp. 88-89.
Charavel, R., Olbrechts, B., & Raskin, J.-P. (2003). Stress release of PECVD oxide by RTA. SPIE - the International Society for Optical Engineering. Proceedings, Vol. 5116, p. 596-606. https://doi.org/10.1117/12.498098
Laconte, J., Wilmart, V., Raskin, J.-P., & Flandre, D. (2003). High-sensitivity capacitive humidity sensor using 3-layer patterned polyimide sensing film. Proceedings of IEEE Sensors 2003, 372-377. https://doi.org/10.1109/ICSENS.2003.1278961
Pavanello, M. A., Martino, J. A., Chung, T. M., Kranti, A., Raskin, J.-P., & Flandre, D. (2003). Operation of double gate graded-channel transistors at low temperatures. Proceedings of the Seventh International Symposium on Low Temperature Electronics, 50-60.
Dambrine, G., Raynaud, C., Vanmackelberg, M., Danneville, F., Pailloncy, G., Lepilliet, S., & Raskin, J.-P. (2003). Impact of down scaling on high frequency noise performance of bulk and SOI MOSFETs. Proceedings of SPIE, SPIE International Symposium Fluctuations and Noise, pp. 105-119. https://doi.org/10.1117/12.497141
Parvais, B., Siligaris, A., Cerderia, A., & Raskin, J.-P. (2003). Oscillateurs micro-ondes à faible consommation en technologie CMOS/SOI : de l’étude des dispositifs aux performances. Proceedings XIIIeme Journées Nationales Microondes, p. 514.
Dehan, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2003). Partially depleted SOI dynamic threshold MOSFET for low-voltage and microwave applications. Proceedings of the 203rd Meeting of the Electrochemical Society – 11th Int. Symp. on SOI technology and devices, pp. 289-294.
Rengel, R., Mateos, J., Pardo, D., Gonzalez, T., Martin, M. J., Dambrine, G., Danneville, F., & Raskin, J.-P. (2003). Dynamic and noise behavior of short-gate FD SOI MOSFETs: numerical and experimental analysis. Proceedings of the Conference on Electronic Devices - CDE 2003, pp. V-07-1 to V-07-4.
Jorez, S., Laconte, J., Raskin, J.-P., Cornet, A., Grauby, S., Dilhaire, S., & Claeys, W. (2003). Optical studies for MEMS thermomechanical characterization. Photomec′02, Louvain-la-Neuve (Belgium).
Poesen, G., Koers, G., Simon, P., Raskin, J.-P., Huynen, I., Stiens, J., & Vounckx, R. (2003). Modeling photo-induced plasmas in planar transmission lines for switching millimeter-wave signals. Proceeding of the IEEE International Topical Meeting on Microwave Photonics - MWP 2003, pp. 117-120. https://doi.org/10.1109/MWP.2003.1422841
Parvais, B., & Raskin, J.-P. (2003). Integral function method for the analysis of harmonic distortion of SOI MOSFETs. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), pp. 9-11.
Parvais, B., Cerdeira, A., Schreurs, D., & Raskin, J.-P. (2003). Harmonic distorsion characterization of SOI MOSFETs. Proceedings of the 33nd European Microwave Week EuMW’2003 – GAAS’2003, pp. 357-360.
Lederer, D., Desrumeaux, C., Brunier, F., & Raskin, J.-P. (2003). High resistivity SOI substrates: how high should we go? 2003 IEEE International SOI Conference. Proceedings (Cat. No.03CH37443), p. 50-51.
Parvais, B., Pallandre, A., Jonas, A., & Raskin, J.-P. (2003). A fluoro-ethoxysilane-based stiction-free release process for submicron gap MEMS. Nanotech 2003 Vol. 1 Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 1 - Chapter 13: Wafer and MEMS Processing, pp. 522-525.
Iker, F., Du Bois, B., De Moor, P., & Raskin, J.-P. (2003). Finite element method simulations of MEMS bilayers. Belgian Journal of Electronics and Communications, 44-45.
Cerdeira, A., Aleman, M. A., Estrada, M., Flandre, D., Parvais, B., Raskin, J.-P., & Picun, G. (2003). The Integral Function Method: A New Method to Determine the Non-linear Harmonic Distortion. Proceedings of the 18th International symposium on microelectronics technology and devices 5sbmicro 2003), 131-146.
Chung, T. M., & Raskin, J.-P. (2003). Characterization and modelling of quasi double-gate SOI MOSFETs. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), p. 39.
Zhang, X., & Raskin, J.-P. (2003). Pretreatment effects on void formation for low temperature Si-Si bonded wafers. Proceedings of the Seventh Int. Symp. on Semiconductor Wafer Bonding; science, technology and applications, 203rd Meeting of the Electrochemical Society, pp. 233-238.
Dehan, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2003). Nouvelle procédure d’extraction des éléments du circuit équivalent des transistors MOS SOI submicroniques. Proceedings of the XIIIème Journées Nationales Microondes, pp. 116-119 (paper 1D-4).
Pailloncy, G., Dambrine, G., Danneville, F., Iniguez, B., & Raskin, J.-P. (2003). Noise modelling of 0.25 µm fully depleted SOI MOSFETs. Proceedings of the 17th International Conference on Noise and Fluctuations, INCF 2003, pp. 577-580.
Kranti, A., Chung, T. M., Flandre, D., & Raskin, J.-P. (2003). Analysis of laterally asymmetric channel design in fully depleted double gate (DG) SOI MOSFETs for high performance analog applications. Proceedings of the 33rd European Solid-State Device Research Conference (ESSDERC 2003), 131-134. https://doi.org/10.1109/ESSDERC.2003.1256828
Laconte, J., Wilmart, V., Raskin, J.-P., & Flandre, D. (2003). Capacitive Humidity Sensor Using a Polyimide Sensing Film. Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS 2003, 223-228. https://doi.org/10.1109/DTIP.2003.1287041
Rengel, R., Mateos, J., Pardo, D., Gonzalez, T., Martin, M. J., Dambrine, G., Danneville, F., & Raskin, J.-P. (2003). Microscopic analysis of high-frequency noise behaviour of Fully-Depleted Silicon-on-Insulator MOSFETs. Proceedings of the 17th International Conference on Noise and Fluctuations, ICNF 2003, pp. 585-588.
Charavel, R., Laconte, J., & Raskin, J.-P. (2003). Advantages of p/sup ++/ polysilicon etch stop layer versus p /sup ++/ silicon. SPIE - the International Society for Optical Engineering. Proceedings, Vol. 5116, p. 699-709. https://doi.org/10.1117/12.498107
Pampin, R., Moreno Hagelsieb, L., Lobert, P.-E., Géry, L., Raskin, J.-P., Remacle, J., & Flandre, D. (2003). Integrated Low-Cost Micro-Sensors for DNA Sensitive Electrical Detection. Proceedings of the ASM Conference on Bio-, Micro-, and Nanosystems, 25 - Abstract n°16, 2 posters.
Lederer, D., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2003). Pertes diélectriques et conducteur dans les guides d’onde coplanaires réalisés sur substrat de silicium haute résistivité. Proceedings of the XIIIème Journées Nationales Microondes, pp. 244-247 (paper 2A2-2).
Pailloncy, G., Iniguez, B., Raskin, J.-P., Dambrine, G., & Danneville, F. (2003). Modélisation du bruit pour des MOSFETs 0.25 µm totalement désertés. Proceedings of the XIIIème Journées Nationales Microondes, pp. 588-591 (paper 6A-3).
Charavel, R., & Raskin, J.-P. (2003). Fabrication of self aligned double gate MOS transistor. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), pp. 37-38.
Pavanello, M. A., Martino, J. A., Chung, T. M., Kranti, A., Raskin, J.-P., & Flandre, D. (2003). Impact of the Graded-Channel Architecture on Double Gate Transistors for High-Performance Analog Applications. In S. Cristoloveanu (ed.), Proceedings of the 11th International Symposium Silicon-on-Insulator Technology and Devices (pp. 261-266).
Stiens, G., Koers, G., Poesen, G., Kuijk, M., De Raedt, W., Beyne, E., Huynen, I., Raskin, J.-P., & et al. (2003). Challenges and perspectives for millimeter and submillimeter wave applications. Proceedings of the International Conference on Internet, Processing, Systems, and Interdisciplinary Research 2003, IPSI-2003, p. 25 pages (paper 75).
Article de journal
Kilchytska, V., Flandre, D., Neve, A., Vancaillie, L., Levacq, D., Adriaensen, S., van Meer, H., De Meyer, K., Raynaud, C., Dehan, M., & Raskin, J.-P. (2003). Influence of device engineering on the analog and RF performances of SOI MOSFETs. IEEE Transactions on Electron Devices, 50(3), 577-588. https://doi.org/10.1106/TED.2003-810471 (Original work published 2003)
Dambrine, G., Raynaud, C., Lederer, D., Dehan, M., Rozeaux, O., Vanmackelberg, M., Danneville, F., Lepilliet, S., & Raskin, J.-P. (2003). What are the limiting parameters of deep-submicron MOSFETs for high frequency applications? IEEE Electron Device Letters, 24(3), 189-191. https://doi.org/10.1109/LED.2003.809525 (Original work published 2003)
Flandre, D., & Raskin, J.-P. (2003). Circuits et capteurs intelligents intégrés en technologie CMOS SOI pour environnements et applications hétérogènes. Nano et Micro Technologies, 3(1-2), 183-200. (Original work published 2003)
Iniguez, B., Flandre, D., Raskin, J.-P., Simon, P., & Segura, J. (2003). A review of leakage current in SOI CMOS ICs: impact on parametric testing techniques. Solid-State Electronics, 47(11), 1959-1967. https://doi.org/10.1016/S0038-1101(03)00249-1 (Original work published 2003)
Dehan, M., Raskin, J.-P., Huynen, I., & Vanhoenacker-Janvier, D. (2003). An improved multiline analysis for monolithic inductors. IEEE Transactions on Microwave Theory and Techniques, 51(1), 100-108. https://doi.org/10.1109/TMTT.2002.806922 (Original work published 2003)
Lederer, D., & Raskin, J.-P. (2003). Substrate loss mechanisms for microstrip and CPW transmission lines on lossy silicon wafers. Solid-State Electronics, 47(11), 1927-1936. https://doi.org/10.1016/S0038-1101(03)00253-3 (Original work published 2003)
Kilchytska, V., Flandre, D., Levacq, D., Lederer, D., & Raskin, J.-P. (2003). Floating effective back-gate effect on the small-signal output conductance of SOI MOSFETs. IEEE Electron Device Letters, 24(6), 414-416. https://doi.org/10.1109/LED.2003.813373 (Original work published 2003)
Papier de conférence
Kilchytska, V., Levacq, D., Lederer, D., Raskin, J.-P., & Flandre, D. (2002). Influence of the substrate on the small-signal characteristics of SOI MOSFETs. GSEC Graduate School in Electronics and Communications, Belgium.
Charavel, R., & Raskin, J.-P. (2002). Fabrication of self aligned double gate MOS transistor. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), p. 1 page.
Bertholet, Y., Iker, F., Raskin, J.-P., & Pardoen, T. (2002). Steady state measurement of wafer bonding fracture resistance. Proceedings of the 16th European Conference on Solid-State Transducers. Published. Eurosensors XVI, The 16th European Conference on Solid-State Transducers, Prague.
Iker, F., & Raskin, J.-P. (2002). Development and characterization of microsystems in thin film SOI technology. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), p. 1 page.
Flandre, D., Adriaensen, S., Afzalian, A., Laconte, J., Levacq, D., Renaux, C., Vancaillie, L., Raskin, J.-P., Demeûs, L., Delatte, P., Dessard, V., & Picun, G. (2002). Intelligent SOI CMOS Integrated Circuits and Sensors for Heterogeneous Environments and Applications. Proceedings of the IEEE Sensors 2002, p. 1407-1412. https://doi.org/10.1109/ICSENS.2002.1037327
Dehan, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2002). Comparison of different extraction methods of small-signal parameters for SOI MOSFETs. Proceedings of the 32nd European Microwave Conference, EuMC 2002, pp. 227-230. https://doi.org/10.1109/EUMA.2002.339268
Laconte, J., Dupont, C., Akheyar, A., Raskin, J.-P., & Flandre, D. (2002). Fully CMOS compatible low-power microheater. Proceedings of SPIE - the International Society for Optical Engineering, 634-644.
Bertholet, Y., Iker, F., Raskin, J.-P., & Pardoen, T. (2002). Steady-state measurement and modelling of wafer bonding failure resistance. Proceedings of the 16th European Conference on Solid-State Transducers, p. 1 page.
Parvais, B., Torrese, G., Cerderia, A., Schreurs, D., & Raskin, J.-P. (2002). Harmonic distorsion characterization techniques for SOI MOSFETs. Union Radio-Scientifique Internationale (U.R.S.I.), Royal Military Academy, Brussels (Belgium).
Vanmackelberg, M., Raynaud, C., Faynot, O., Pelloie, J., Tabone, C., Grouillet, A., Martin, F., Dambrine, G., Picheta, L., Mackowiak, E., Llinares, P., Sevenhans, J., Compagne, E., Fletcher, G., Flandre, D., Dessard, V., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2002). 0.25 mu m fully depleted SOI MOSFETs for RF mixed analog-digital circuits, including a comparison with partially depleted devices with relation to high frequency noise parameters. Solid-State Electronics, 46(3), 379-386. (Original work published 2002)
Lederer, D., & Raskin, J.-P. (2002). Substrate loss mechanisms for microstrip and CPW transmission lines on lossy silicon wafers. Proceedings of the International Microwave Symposium – IMS 2002, pp. 685-688.
Koers, G., Poesen, G., Simon, P., Raskin, J.-P., Stiens, J., Huynen, I., & Vounckx, R. (2002). Photo-induced switching of microwave and millimeter-wave signals on coplanar waveguides. Proceedings of Seventh Annual Symposium of the IEEE/LEOS Benelux chapter, pp. 257-260.
Kilchytska, V., Levacq, D., Lederer, D., Raskin, J.-P., & Flandre, D. (2002). Substrate effects on the small-signal characteristics of SOI MOSFET’s. Proceedings of the 32nd European Solid-State Device Research Conference (ESSDERC 2002), 519-522. https://doi.org/10.1109/ESSDERC.2002.194982
Laconte, J., Dupont, C., Flandre, D., & Raskin, J.-P. (2002). SOI CMOS compatible low-power microheater optimization and fabrication for smart gas sensor implementations. Proceedings of IEEE Sensors 2002. First IEEE International Conferenceon Sensors (Cat. No.02CH37394), 1395-1400. https://doi.org/10.1109/ICSENS.2002.1037325
Dehan, M., & Raskin, J.-P. (2002). An asymmetric channel SOI nMOSFET for improving DC and microwave characteristics. Solid-State Electronics, 46(7), 1005-1011. (Original work published 2002)
Iniguez, B., Danneville, F., & Raskin, J.-P. (2002). SOI MOS models. Proceedings of the Biannual Agilent Workshop on modeling – IC-CAP 2002, p. 30 pages.
Vancaillie, L., Kilchytska, V., Levacq, D., Adriaensen, S., van Meer, H., De Meyer, K., Torrese, G., Raskin, J.-P., & Flandre, D. (2002). Influence of HALO implantation on analog performances and comparison between bulk, Partially-Depleted and Fully-Depleted MOSFETs. Proceedings of the 2002 IEEE International SOI Conference, 161-162. https://doi.org/10.1109/SOI.2002.1044459
Lederer, D., & Raskin, J.-P. (2002). Analysis of shunt and series substrate losses for CPW transmission lines made on lossy silicon wafers. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), p. 1 page.
Chung, T. M., & Raskin, J.-P. (2002). Characterization and modelling of graded channel single gate and gate-all-around SOI MOSFETs. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), p. 1 page.
Dehan, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2002). Characterization and modeling of integrated inductors and alternative MOSFETs in SOI technology. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), p. 3 pages.
Raskin, J.-P. (2002). SOI for RFIC Design. Proceedings of the 3rd International Symposium on Quality Electronic Design – IEEE ISQED 2002, pp. 1-55.
Article de journal
Vanmackelberg, M., Raynaud, C., Faynot, O., Pelloie, J.-L., Tabone, C., Grouillet, A., Martin, F., Dambrine, G., Picheta, L., Mackowiak, E., Llinares, P., Sevenhans, J., Compagne, E., Fletcher, G., Flandre, D., Dessard, V., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2002). 0.25 µm Fully-Depleted SOI MOSFET’s for RF mixed analog-digital circuits, including a comparison with Partially-Depleted devices for High Frequency noise parameters. Solid-State Electronics, 46(3), 379-386. https://doi.org/10.1016/S0038-1101(01)00120-4 (Original work published 2002)
Parvais, B., Torrese, G., Cerderia, A., Schreurs, D., & Raskin, J.-P. (2002). Comparison of harmonic distortion characterization techniques for SOI MOSFETs. Acta Technica Belgica. Revue H F: Electricite Courants Faibles. Electronique Telecommunications, 4, 43-55. (Original work published 2002)
Ellis, T. J., & Raskin, J.-P. (2002). A broadband CPW-to-microstrip modes coupling technique. International Journal of Infrared and Millimeter Waves, 23(9), 1357-1369. https://doi.org/10.1023/A:1020201709868 (Original work published 2002)
Rengel, R., Mateos, J., Pardo, D., Gonzalez, T., Martin, M., Dambrine, G., Danneville, F., & Raskin, J.-P. (2002). Numerical and experimental study of a 0.25 mu m fully-depleted silicon-on-insulator MOSFET: static and dynamic radio-frequency behaviour. Semiconductor Science and Technology, 17(11), 1149-1156. https://doi.org/10.1088/0268-1242/17/11/303 (Original work published 2002)
Dehan, M., & Raskin, J.-P. (2002). An asymmetric channel SOI nMOSFET for improving DC and microwave characteristics. Solid-State Electronics, 46(Issue 7), 1005-1011. https://doi.org/10.1016/S0038-1101(02)00034-5 (Original work published 2002)
Quevy, E., Flandre, D., Parvais, B., Raskin, J.-P., Buchaillot, L., & Collard, D. (2002). A modified Bosch-type process for precise surface micromachining of polysilicon. Journal of Micromechanics and Microengineering, 12(3), 328-333. https://doi.org/10.1088/0960-1317/12/3/320 (Original work published 2002)
Iniguez, B., & Raskin, J.-P. (2002). Deep-submicron drain current to radio frequency silicon on insulator metal oxide semiconductor field-effect transistor macromodel for designing microwave circuits. International Journal of R F and Microwave Computer-Aided Engineering, 12(5), 428-438. https://doi.org/10.1002/mmce.10045 (Original work published 2002)
Torrese, G., Huynen, I., Raskin, J.-P., & Vander Vorst, A. (2002). Numerical simulation of high-speed p-i-n photodiodes under large illumination power. Acta Technica Belgica. Revue H F: Electricite Courants Faibles. Electronique Telecommunications, 2, 68-70. (Original work published 2002)
Brevet
Nève, A., Raskin, J.-P., & Flandre, D. (2002). Fabrication method of semiconductor devices (Patent No. PCT/BE02/00043).
Chapitre de livre
Flandre, D., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2002). SOI CMOS Transistors for RF and Microwave Applications. In Deen M. Jamal et Fjeldly Tor A (eds.) (ed.), CMOS RF modeling, characterization and applications (p. p. 273-362). Word Scientific Publishing Co.
Papier de conférence
Iniguez, B., Raskin, J.-P., Simon, P., Flandre, D., & Segura, J. (2001). Analysis and future trends of Iddq testing for silicon on insulator CMOS ICs. Proceedings of the 2001 IEEE International Workshop on Current and Defect Based Testing (DBI′2001), 40-44.
Parvais, B., Goffioul, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2001). Oscillateurs RF intégrés en technologie CMOS/SOI. Proceedings des 12èmes Journées Nationales Micro-ondes – JNM’2001, p. 2 pages (paper 4D-18).
Dehan, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2001). Alternative architectures of SOI MOSFET for improving DC and microwave characteristics. 31st European Microwave Conference 2001. Conference Proceedings, Vol. 1, p. 21-4.
Dehan, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2001). An asymmetric channel SOI nMOSFET for improving DC and microwave characteristics. Ultimate Integration of Silicon - ULIS′2001 Workshop, Grenoble (France).
Parvais, B., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2001). Design of integrated voltage-controlled-oscillators in CMOS/SOI technology. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), p. 41.
Dehan, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2001). SOI MOSFET architecture for improving DC and microwave characteristics. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), p. 21.
Iniguez, B., Raskin, J.-P., Demeûs, L., Nève de Mévergnies, A., Goffioul, M., Simon, P., Vanhoenacker-Janvier, D., & Flandre, D. (2001). A new fully-depleted SOI MOSFET macro-model valid from DC to RF. Electrochemical Society. Proceedings, 3, 193-198. (Original work published 2001)
Iniguez, B., Goffioul, M., Parvais, B., & Raskin, J.-P. (2001). Deep-submicron DC to RF SOI MOSFET macro-model for designing non-linear RF circuits. Proceedings of the 6th International Workshop on Integrated Nonlinear Microwave and Millimeterwave circuits INMMC’2001, p. 2 pages.
Torrese, G., Huynen, I., Raskin, J.-P., & Vander Vorst, A. (2001). Numerical simulation of high-speed p-i-n photodiodes under large illumination power. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), pp. 6-8.
Torrese, G., Huynen, I., Raskin, J.-P., & Vander Vorst, A. (2001). Analysis and design of p-i-n travelling wave photodetectors for high power and wide-bandwidth applications. Proceedings of the 6th Annual Meeting of the IEEE/LEOS Benelux Chapter, pp. 93-96.
Laconte, J., Akheyar, A., Parvais, B., Afzalian, A., Dupont, C., Remus, V., Raskin, J.-P., & Flandre, D. (2001). Co-intégration de nouvelles techniques de micro-fabrication et du procédé CMOS/SOI standard en vue de réaliser des microsystèmes. Les MEMS : quelles compétences pour quels secteurs en Wallonie ?, Casteau Resort Hotel, Mons (Belgium).
Iniguez, B., Raskin, J.-P., Simon, P., Flandre, D., & Segura, J. (2001). Leakage components in fully-depleted SOI CMOS technology: implications on IDDQ testing. 2001 IEEE International Workshop on Defect Based Testing (DBT 2001), Marina del Rey, Los Angeles (USA).
Laconte, J., Akheyar, A., Flandre, D., & Raskin, J.-P. (2001). Microsystems in SOI Technology. Electralis 2001, THe Campus, Liège (Belgium).
Saib, A., Vanhoenacker-Janvier, D., Raskin, J.-P., Crahay, A., & Huynen, L. (2001). Microwave tunable filters and nonreciprocal devices using magnetic nanowires. Proceedings of the 2001 1st IEEE Conference on Nanotechnology.IEEE-NANO 2001 (Cat. No.01EX516), p. 260-265. https://doi.org/10.1109/NANO.2001.966430
Lederer, D., & Raskin, J.-P. (2001). Substrate loss mechanisms for microstrip and CPW transmission lines on lossy silicon wafers. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), p. 18.
Dehan, M., Parvais, B., Dambrine, G., & Raskin, J.-P. (2001). Intérêts de la technologie CMOS SOI pour les applications micro-ondes faible tension faible consommation. Proceedings des 3ème Journées Francophones d’Etudes Faible Tension Faible Consommation FTFC’2001, pp. 63-72.
Raskin, J.-P. (2001). Introduction aux micro-systèmes (MEMS). Proceedings of the Micro & Nano: What challenges for the industry?, Workshop, pp. 1-65.
Flandre, D., Adriaensen, S., Akheyar, A., Demeûs, L., Delatte, P., Dessard, V., Iniguez, B., Nève, A., Laconte, J., Picun, G., Rauly, E., Renaux, C., Dehan, M., Parvais, B., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2001). Sensors implementations in Silicon-on-Insulator CMOS compatible technology for micropower, radio-frequency or high-temperature applications. Proceedings du Colloque Micro/nano: quels défis pour l’industrie ? Published. Colloque Micro/nano: quels défis pour l’industrie ?, Louvain-la-Neuve (Belgium).
Vanmackelberg, M., Raynaud, C., Raskin, J.-P., Bracale, A., Jomaah, J., & Dambrine, G. (2001). Les MOS en technologie SOI pour les applications hyperfréquences : “Partially Depleted” ou “Fully Depleted” ? Proceedings of the Journées Nationales Micro-ondes – JNM’2001, p. 2 pages (paper 3C-3).
Marenk, M., Raskin, J.-P., & Ristolainen, E. (2001). High-frequency modeling of SOI transistors with BSIM3SOI. ECCTD’O1- “Circuit Paradigm in the 21st Century”, Espoo (Finland).
Flandre, D., Adriaensen, S., Akheyar, A., Crahay, A., Demeus, L., Delatte, P., Dessard, V., Iniguez, B., Neve, A., Katschmarskyj, B., Loumaye, P., Laconte, J., Martinez, I., Picun, G., Rauly, E., Renaux, C., Spote, D., Zitout, M., Dehan, M., et al. (2001). Fully depleted SOI CMOS technology for heterogeneous micropower, high-temperature or RF microsystems. Solid-State Electronics, 45(4), 541-549. https://doi.org/10.1016/S0038-1101(01)00084-3 (Original work published 2001)
Toresse, G., Clerckx, B., Raskin, J.-P., & Vander Vorst, A. (2001). Analytical models for high bit-rate lightwave system. Proceedings of the Sixth Annual Symposium of the IEEE/LEOS Benelux chapter, pp. 89-92.
Iniguez, B., Raskin, J.-P., Simon, P., Flandre, D., & Segura, J. (2001). Testing SOI CMOS IC’s with Parametric Testing Methods: a Fundamental Analysis. Proceedings of the XVI Conference on Design of Circuits and Integrated Systems (DCIS 2001), 636-640.
Saib, A., Vanhoenacker-Janvier, D., Raskin, J.-P., Crahay, A., & Huynen, I. (2001). Microwave tunable filters and non reciprocal devices using magnetic nanowires. Proceedings of the 1st IEEE Conference on Nanotechnology (IEEE-NANO2001), pp. 260-265, session M2.1 : Nano-devices II.
Article de journal
Flandre, D., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2001). SOI CMOS transistors for RF and microwave applications. International Journal of High Speed Electronics, 11(4), 1159-1248. https://doi.org/10.1142/S0129156401001076 (Original work published 2001)
Iniguez, B., Flandre, D., Raskin, J.-P., Demeus, L., Neve, A., Vanhoenacker-Janvier, D., Simon, P., & Goffioul, M. (2001). Deep-submicrometer DC-to-RF SOI MOSFET macro-model. IEEE Transactions on Electron Devices, 48(9), 1981-1988. https://doi.org/10.1109/16.944186 (Original work published 2001)
Raskin, J.-P. (2001). Micromachined W-Band Passive Components for communication applications. MST News, 2/01, 13-15. (Original work published 2001)
Raskin, J.-P., Laconte, P., Akheyar, A., Adriaensen, S., Nève, A., Martinez, I., Dehan, M., Parvais, B., Vanhoenacker-Janvier, D., Demeûs, L., Delatte, P., Dessard, V., & Flandre, D. (2001). Fully-Depleted SOI CMOS Technology for Heterogeneous Micropower, High-Temperature or RF Microsystems. Belgian Journal of Electronics & communications, 2, 53-68. (Original work published 2001)
Raskin, J.-P. (2001). Microelectromechanical Systems: from microfabrication techniques to smart sensors. Belgian Journal of Electronics & Communications, 2, 2-8. (Original work published 2001)
Papier de conférence
Raynaud, C., Flandre, D., Dessard, V., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2000). 70 GHz fmax fully-depleted SOI MOSFET’s for low-power wireless applications. Proceedings of the 30th European Microwave Week GaAS 2000, 268-271.
Raskin, J.-P., Vanhoenacker-Janvier, D., Dehan, M., Goffioul, P., Simon, P., Iniguez, B., Renaux, C., & Flandre, D. (2000). SOI CMOS for Low-Voltage, Low-Power Microwave Applications. Proceedings of the EUROSOI 2000 Meeting on Silicon-on-Insulator Devices, 35-38.
Torrese, G., Ajram, S., Raskin, J.-P., Rolland, P. A., & Vander Vorst, A. (2000). Trans-impedance two stages OEIC receiver using PIN photodetector. Proceedings of the Fifth Annual Symposium of the IEEE/LEOS Benelux Chapter, pp. 47-50.
Goffioul, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2000). Direct extraction techniques of technological parameters and microwave small-signal model for sub-quarter micron SOI MOSFET’s. Proceedings of the 5th Symposium Diagnostics and Yield, SOI – materials, devices and characterization, p. 8 pages.
Goffioul, M., Dambrine, G., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2000). Comparison of microwave performances for fully and partially depleted sub-quarter micron SOI MOSFET’s. Proceedings of the 5th Symposium Diagnostics and Yield, SOI – materials, devices and characterization, p. 8 pages.
Brown, A., Raskin, J.-P., Khuri-Yakub, B. T., & Rebeiz, G. M. (2000). Novel parametric-effect MEMS amplifiers/transducers. Solid-State Sensor and Actuator Workshop, Hilton Head Island, South Carolina (USA).
Raskin, J.-P., Khuri-Yakub, B. T., & Rebeiz, G. M. (2000). Novel parametric-effect MEMS amplifiers/transducers. In Borgmann, H.; (ed.), ACTUATOR 2000. 7th International Conference on New Actuators andInternational Exhibition on Smart Actuators and Drive Systems.Conference Proceedings (p. p. 494-497). Messe bremen gmbh.
Goffioul, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2000). Microwave integrated CMOS oscillators on silicon-on-insulator substrate. GAAS 2000. Conference Proceedings, 4 pp.
Article de journal
Goffioul, M., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2000). Direct extraction techniques of technological parameters and microwave small-signal model for sub-quarter micron SOI MOSFET’s. Research Journal Telecommunication and Information Technology, 3(4), 59-66. (Original work published 2000)
Raskin, J.-P., Gauthier, G., Katehi, L. P. B., & Rebeiz, G. M. (2000). W-Band Single Layer Vertical Transitions. IEEE Transactions on Microwave Theory and Techniques, 48(1), 161-164. https://doi.org/10.1109/22.817487 (Original work published 2000)
Raskin, J.-P., Gilon, R., Dambrine, G., Chen, J., Vanhoenacker-Janvier, D., & Colinge, JP. (2000). Accurate characterization of silicon-on-insulator MOSFETs for the design of low-voltage, low-power RF integrated circuits. Analog Integrated Circuits and Signal Processing, 25(2), 133-155. https://doi.org/10.1023/A:1008380615900 (Original work published 2000)
Goffioul, M., Dambrine, G., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2000). Comparison of microwave performances for fully and partially depleted sub-quarter micron SOI MOSFET’s. Journal of Telecommunications and Information Technology, 3(4), 72-80. (Original work published 2000)
Gauthier, G., Raskin, J.-P., & Rebeiz, G. (2000). A 140-170-GHz Low-Noise Uniplanar Subharmonic Schottky-Receiver. IEEE Transactions on Microwave Theory and Techniques, 48(8), 1416-1419. https://doi.org/10.1109/22.859491 (Original work published 2000)
Raskin, J.-P., Brown, A., Khuri-Yakub, B. T., & Rebeiz, G. M. (2000). A novel parametric-effect MEMS amplifier. IEEE Journal of Microelectromechanical Systems, 9(4), 528-537 (December). https://doi.org/10.1109/84.896775 (Original work published 2000)
Raskin, J.-P., Gauthier, G., Katehi, L. P. B., & Rebeiz, G. M. (2000). Mode conversion at CPW-to-microstrip line transitions. IEEE Transactions on Microwave Theory and Techniques, 48(1), 158-160. https://doi.org/10.1109/22.817486 (Original work published 2000)
Article de journal
Flandre, D., Colinge, JP., Chen, J., De Ceuster, D., Eggermont, JP., Ferreira, L., Gentinne, B., Jespers, PGA., Viviani, A., Gillon, R., Raskin, J.-P., Vander Vorst, A., Vanhoenacker-Janvier, D., & Silveira, F. (1999). Fully-depleted SOI CMOS technology for low-voltage, low-power mixed digital/analog/microwave circuits. Analog Integrated Circuits and Signal Processing, 21(3), 213-228. https://doi.org/10.1023/A:1008321919587 (Original work published 1999)
Dambrine, G., Raskin, J.-P., Picheta, L., Vanhoenacker-Janvier, D., Colinge, J.-P., & Cappy, A. (1999). High frequency four noise parameters of Silicon-on-Insulator-based technology MOSFET: Prospects for application to low noise RF integrated circuits. Electron Technology - Internet Journal, 32(1/2), 81-87. (Original work published 1999)
Dambrine, G., Raskin, J.-P., Danneville, F., Vanhoenacker-Janvier, D., Colinge, JP., & Cappy, A. (1999). High-frequency four noise parameters of silicon-on-insulator-based technology MOSFET for the design of low-noise RF integrated circuits. IEEE Transactions on Electron Devices, 46(8), 1733-1741. https://doi.org/10.1109/16.777164 (Original work published 1999)
Gauthier, G., Raskin, J.-P., Katehi, L. P. B., & Rebeiz, G. M. (1999). A 94 GHz Aperture-Coupled Micromachined Microstrip Antenna. IEEE Transactions on Antennas and Propagation, 47(12), 1761-1766. https://doi.org/10.1109/8.817650 (Original work published 1999)
Raskin, J.-P., Dambrine, G., & Vanhoenacker-Janvier, D. (1999). Accurate SOI MOSFET Characterization at Microwave Frequencies. Electron Technology, 32(1/2), 72-80. (Original work published 1999)
Papier de conférence
Ellis, T., Raskin, J.-P., Katehi, L. P., & Rebeiz, G. M. (1999). A Wideband CPW-to-microstrip Transition for Millimeter-wave Packaging. Proceedings of the IEEE MTT-S International Microwave Symposium, pp. 629-632. https://doi.org/10.1109/MWSYM.1999.779840
Ellis, T., Raskin, J.-P., Rebeiz, G. M., & Katehi, L. P. (1999). A Wideband CPW-fed aperture-coupled at Millimeter-Wave Frequencies. Proceedings of the IEEE Antennas and Propagation Society International Symposium, 1999, pp. 1220-1223. https://doi.org/10.1109/APS.1999.789533
Dambrine, G., Raskin, J.-P., Danneville, F., Vanhoenacker-Janvier, D., Colinge, J.-P., & Cappy, A. (1999). Silicon-on-Insulator-Based Technology MOSFET: Prospects For Application to Low Noise RF Integrated Circuits. Proceedings of the 26th General Assembly of the International Union of Radio Science (URSI), p. 669.
Gauthier, G., Raskin, J.-P., & Rebeiz, G. M. (1999). A 140 - 170 GHz Low-Noise Uniplanar Subharmonic Schottky-Receiver. Proceedings of the IEEE MTT-S International Microwave Symposium, p. 4 pages.
Article de journal
Eggermont, J.-P., Flandre, D., Raskin, J.-P., & Colinge, J.-P. (1998). Potential and modeling of 1-mu m SOI CMOS operational transconductance amplifiers for applications up to 1 GHz. IEEE Journal of Solid State Circuits, 33(4), 640-643. https://doi.org/10.1109/4.663571 (Original work published 1998)
Gillon, R., Colinge, J.-P., Flandre, D., Raskin, J.-P., & Vanhoenacker-Janvier, D. (1998). Silicon-on-Insulator for RF and microwave low-power applications. Microwave engineering Europe, 49-54. (Original work published 1998)
Raskin, J.-P., Gillon, R., Chen, J., Vanhoenacker-Janvier, D., & Collinge, J.-P. (1998). Accurate SOI MOSFET characterisation at microwave frequencies for device performance optimisation and analogue modeling. IEEE Transactions on Electron Devices, 45(5), 1017-1025. (Original work published 1998)
Raskin, J.-P., Gillon, R., Chen, J., Vanhoenacker-Janvier, D., & Colinge, JP. (1998). Accurate SOI MOSFET characterization at microwave frequencies for device performance optimization and analog modeling. IEEE Transactions on Electron Devices, 45(5), 1017-1025. https://doi.org/10.1109/16.669514 (Original work published 1998)
Papier de conférence
Katehi, L. P. B., Rebeiz, G. M., Raskin, J.-P., Robertson, S. V., Weller, T. M., Yook, J.-G., Gauthier, G., Henderson, R., & Herrick, K. (1998). Micromachined W-Band Power Cube. Antenna Applications Symposium, Monticello, Illinois (USA).
Demeûs, L., Chen, J., Eggermont, J.-P., Gillon, R., Raskin, J.-P., Vanhoenacker-Janvier, D., & Flandre, D. (1998). Advanced SOI CMOS technology for RF applications. Proceedings of the URSI International Symposium on Signals, Systems, and Electronics, 1998 (ISSSE 1998), 134-139. https://doi.org/10.1109/ISSSE.1998.738053
Raskin, J.-P., Gillon, R., Dambrine, G., & Vanhoenacker-Janvier, D. (1998). Direct extraction of the Non-Quasi-Static small-signal model of MOSFET’s. Proceedings of the 28th European Microwave Conference proceedings EuMC ’98, pp. 727-732.
Raskin, J.-P., Dambrine, G., & Vanhoenacker-Janvier, D. (1998). Accurate SOI MOSFET characterization at microwave frequencies. Proceedings of the 4th Symposium Diagnostics and Yield, SOI – materials, devices and characterization, p. 2 pages.
Gillon, R., Colinge, J.-P., Flandre, D., Raskin, J.-P., & Vanhoenacker-Janvier, D. (1998). Silicon-on-insulator for RF and microwave low-power applications. Proceedings of the Microwave Eng. Workshop on New technologies for RF devices, Session 2, paper 3.
Dambrine, G., Raskin, J.-P., Danneville, F., Vanhoenacker-Janvier, D., Colinge, J.-P., Picheta, L., & Cappy, A. (1998). Silicon-on-Insulator-Based Technology MOSFET: Prospects For Application to Low Noise RF Integrated Circuits. Proceedings of the 28th European Microwave Conference proceedings EuMC ’98, pp. 721-726. https://doi.org/10.1109/EUMA.1998.338076
Article de journal
Eggermont, J.-P., Flandre, D., Raskin, J.-P., & Colinge, J.-P. (1997). Potential and Modeling of 1 µm - 1 GHz SOI CMOS OTAs. Electronics Letters, 33(9), 774-775 (April). (Original work published 1997)
Chen, J., Colinge, J.-P., Flandre, D., Gillon, R., Raskin, J.-P., & Vanhoenacker-Janvier, D. (1997). Comparison of TiSi2, CoSi2, and NiSi for thin-film silicon-on-insulator applications. Journal of the Electrochemical Society, 144(7), 2437-2442. https://doi.org/10.1149/1.1837833 (Original work published 1997)
Raskin, J.-P., Viviani, A., Flandre, D., & Colinge, J.-P. (1997). Substrate crosstalk reduction using SOI technology. IEEE Transactions on Electron Devices, 44(12), 2252-2261. https://doi.org/10.1109/16.644646 (Original work published 1997)
Raskin, J.-P., Dambrine, G., & Gillon, R. (1997). Direct extraction of the series equivalent circuit parameters for the small-signal model of SOI MOSFET’s. IEEE Microwave and Guided Wave Letters, 7(12), 408-410. https://doi.org/10.1109/75.645191 (Original work published 1997)
Eggermont, J.-P., Flandre, D., Raskin, J.-P., & Colinge, J.-P. (1997). Potential and modelling of 1 mu m 1GHz SOI CMOS OTAs. Electronics Letters, 33(9), 774-775. https://doi.org/10.1049/el:19970517 (Original work published 1997)
Papier de conférence
Raskin, J.-P., & Dambrine, G. (1997). Une nouvelle méthode d’extraction directe des paramètres petits signaux d’un transistor à effet de champ, application aux MOSFET SOI. Proceedings des Journées Nationales Microondes, pp. 586-587.
Raskin, J.-P. (1997). Modeling, characterization and optimization of MOSFET’s for the synthesis of SOI MMIC’s. Union Radio-Scientifique Internationale (U.R.S.I.), pp. 43-45.
Huynen, I., Raskin, J.-P., Vanhoenacker-Janvier, D., & Colinge, J.-P. (1997). Modeling and measurements of inductive elements on SIMOX substrates. Proceedings of the 27th European Microwave Conference proceedings EuMC ’97, pp. 1008-1013.
Gillon, R., Raskin, J.-P., Vanhoenacker-Janvier, D., Colinge, J.-P., & Dambrine, G. (1997). Characterization of SOI MOSFETs at microwave frequencies. Proceedings of the 48th Electrochemical Society Meeting - SOI symposium, pp. 149-154.
Raskin, J.-P., Eggermont, J.-P., Vanhoenacker-Janvier, D., & Colinge, J.-P. (1997). Synthetic microwave inductors in SOI technology. Proceedings of the 1997 IEEE International SOI Conference, pp. 90-91. https://doi.org/10.1109/SOI.1997.634947
Chen, J., Colinge, J.-P., Flandre, D., Gillon, R., Raskin, J.-P., & Vanhoenacker-Janvier, D. (1997). Investigation of salicide processes for thin-film SOI microwave applications. Proceedings of the 8th International Symposium on SOI technology and devices (ECS 1997), 98-103.
Huynen, I., Raskin, J.-P., Gillon, R., Vanhoenacker-Janvier, D., & Colinge, J.-P. (1997). Integrated microwave inductors on Silicon-on-Insulator substrates. Proceedings of the 27th European Microwave Conference, EuMC ’97, pp. 1008-1013. https://doi.org/10.1109/EUMA.1997.337928
Thèse
Raskin, J.-P. (1997). Modeling, characterization and optimization of MOSFET’s and passive elements for the synthesis of SOI MMIC’s.
Papier de conférence
Raskin, J.-P., Gillon, R., Vanhoenacker-Janvier, D., & Colinge, J.-P. (1996). Direct extraction method of SOI MOSFET transistor’s parameters. Proceedings of the 7th International Symposium on SOI Technology and Devices, pp. 225-230.
Colinge, J.-P., Chen, J., Flandre, D., Raskin, J.-P., Gillon, R., & Vanhoenacker-Janvier, D. (1996). A low-voltage, low-power microwave SOI MOSFET. Proceedings of the IEEE International SOI Conference, 1996, 128-129. https://doi.org/10.1109/SOI.1996.552527
Raskin, J.-P., Huynen, I., Gillon, R., Vanhoenacker-Janvier, D., & Colinge, J.-P. (1996). An efficient design tool for transmission line on SIMOX substrates. Proceedings of the 1996 IEEE International SOI Conference, pp. 128-129. https://doi.org/10.1109/SOI.1996.552477
Gillon, R., Raskin, J.-P., Vanhoenacker-Janvier, D., & Colinge, J.-P. (1996). Determining the reference impedance of on-wafer TLR calibrations on lossy substrates. Proceedings of the 26th European Microwave Conference proceedings EuMC ’96, pp. 170-173. https://doi.org/10.1109/EUMA.1996.337545
Raskin, J.-P. (1996). Modelling, synthesis and optimization of a microwave integrated oscillator in SOI technology. Union Radio-Scientifique Internationale (U.R.S.I.), p. page 88.
Raskin, J.-P., Gillon, R., Vanhoenacker-Janvier, D., & Colinge, J.-P. (1996). Direct extraction method of SOI MOSFET transistor’s parameters. Proceedings of the International Conference on Microelectronic Test Structures, ICMTS 1996, p. 191-194. https://doi.org/10.1109/ICMTS.1996.535644
Papier de conférence
Raskin, J.-P. (1995). Le transistor MOSFET SOI dans le domaine des micro-ondes : modèle linéaire et choix technologiques. Union Radio-Scientifique Internationale, p. 55.
Gillon, R., Raskin, J.-P., Vanhoenacker-Janvier, D., & Colinge, J.-P. (1995). Modelling and Optimizing the SOI MOSFET in view of MMIC applications. Proceedings of the 25th European Microwave Conference proceedings EuMC ’95, p. 543-547.
Raskin, J.-P., Viviani, A., Flandre, D., Colinge, J.-P., & Vanhoenacker-Janvier, D. (1995). Extended study of crosstalk in SOI-SIMOX substrates. Proceedings of the International Electron Devices Meeting 1995 (IEDM 1995), 713-716. https://doi.org/10.1109/IEDM.1995.499318
Raskin, J.-P., Vanhoenacker-Janvier, D., Colinge, J.-P., & Flandre, D. (1995). Coupling effects in high-resistivity SIMOX substrates for VHF and microwave applications. Proceedings of the IEEE International SOI Conference, 1995, 62-63.
Gillon, R., Raskin, J.-P., Colinge, J.-P., Chen, J., & Vanhoenacker-Janvier, D. (1995). Low Power / High Frequency devices on SOI. Proceedings of the N.U.T.E.K. CONSORTIA Workshop on Si-Processing and High Frequency Devices, p. 10 pages.
Papier de conférence
Raskin, J.-P. (1994). Modélisation et optimisation des paramètres du transistor MOSFET, en technologie SOI, à hautes fréquences. Union Radio-Scientifique Internationale, p. 117.
